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Volume 84; Issue 3
Main
Microelectronic Engineering
Volume 84; Issue 3
Microelectronic Engineering
Volume 84; Issue 3
1
High spatial and energy resolution characterization of lateral inhomogeneous Schottky barriers by conductive atomic force microscopy
F. Giannazzo
,
F. Roccaforte
,
V. Raineri
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 240 KB
Your tags:
english, 2007
2
Convergent beam electron diffraction for strain determination at the nanoscale
F. Houdellier
,
C. Roucau
,
M.-J. Casanove
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 493 KB
Your tags:
english, 2007
3
Experimental characterization of proteins immobilized on Si-based materials
Sebania Libertino
,
Manuela Fichera
,
Venera Aiello
,
Giuliana Statello
,
Patrick Fiorenza
,
Fulvia Sinatra
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.02 MB
Your tags:
english, 2007
4
Evaluation of trap creation and charging in thin SiO2 using both SCM and C-AFM
W. Polspoel
,
W. Vandervorst
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 662 KB
Your tags:
english, 2007
5
Markers prepared by focus ion beam technique for nanopositioning procedures
H. Romanus
,
J. Schadewald
,
V. Cimalla
,
M. Niebelschütz
,
T. Machleidt
,
K.-H. Franke
,
L. Spiess
,
O. Ambacher
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.11 MB
Your tags:
english, 2007
6
On the reliability of scanning probe based electrostatic force measurements
Markus Ratzke
,
Jürgen Reif
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 262 KB
Your tags:
english, 2007
7
Evaluation of the junction delineation accuracy and reproducibility with the SSRM technique
Pierre Eyben
,
Danielle Vanhaeren
,
Tom Janssens
,
Thomas Hantschel
,
Wilfried Vandervorst
,
Kanna Adachi
,
Kazunari Ishimaru
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 573 KB
Your tags:
english, 2007
8
Structural and electrical characterization of gold nanoclusters in thin SiO2 films: Realization of a nanoscale tunnel rectifier
F. Ruffino
,
M.G. Grimaldi
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.29 MB
Your tags:
english, 2007
9
Hierarchical roughness makes superhydrophobic states stable
Nosonovsky Michael
,
Bharat Bhushan
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 379 KB
Your tags:
english, 2007
10
Two-dimensional dopant imaging of silicon carbide devices by secondary electron potential contrast
M. Buzzo
,
M. Ciappa
,
J. Millan
,
P. Godignon
,
W. Fichtner
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 570 KB
Your tags:
english, 2007
11
High resolution electrical characterisation of organic photovoltaic blends
O. Douhéret
,
A. Swinnen
,
M. Breselge
,
I. Van Severen
,
L. Lutsen
,
D. Vanderzande
,
J. Manca
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 741 KB
Your tags:
english, 2007
12
Sidewall damage in silica-based low-k material induced by different patterning plasma processes studied by energy filtered and analytical scanning TEM
O. Richard
,
F. Iacopi
,
H. Bender
,
G. Beyer
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.04 MB
Your tags:
english, 2007
13
Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method
D. Häussler
,
E. Spiecker
,
W. Jäger
,
M. Störmer
,
R. Bormann
,
C. Michaelsen
,
J. Wiesmann
,
G. Zwicker
,
R. Benbalagh
,
J.-M. André
,
P. Jonnard
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.01 MB
Your tags:
english, 2007
14
Scanning capacitance microscopy and the role of localized charges in dielectric films: Infering or challenging?
Reinhard Beyer
,
Bernd Schmidt
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 838 KB
Your tags:
english, 2007
15
Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy
M.J. Hÿtch
,
F. Houdellier
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 676 KB
Your tags:
english, 2007
16
Carrier concentration and mobility profiling in quantum wells by scanning probe microscopy
F. Giannazzo
,
V. Raineri
,
S. Mirabella
,
G. Impellizzeri
,
F. Priolo
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 164 KB
Your tags:
english, 2007
17
Scanning spreading resistance microscopy of defect engineered low dose SIMOX samples
Lasse Vines
,
Reinhard Kögler
,
Andrej Yu. Kuznetsov
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 429 KB
Your tags:
english, 2007
18
A new methodology for quantifying the multi-scale similarity of images
M. Dalla Costa
,
M. Bigerelle
,
D. Najjar
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 954 KB
Your tags:
english, 2007
19
Combined shear-force/field emission microscope for local electrical surface investigation
Andrzej Sikora
,
Teodor Gotszalk
,
Roman Szeloch
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.00 MB
Your tags:
english, 2007
20
Breakdown kinetics at nanometer scale of innovative MOS devices by conductive atomic force microscopy
Patrick Fiorenza
,
Raffaella Lo Nigro
,
Vito Raineri
,
Dario Salinas
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 216 KB
Your tags:
english, 2007
21
Reliability of SiO2 and high-k gate insulators: A nanoscale study with conductive atomic force microscopy
M. Porti
,
L. Aguilera
,
X. Blasco
,
M. Nafrı´a
,
X. Aymerich
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 357 KB
Your tags:
english, 2007
22
Atomic force microscope characterization of PAH/PAZO multilayers
Quirina Ferreira
,
Paulo J. Gomes
,
Yuri Nunes
,
Manuel J.P. Maneira
,
Paulo A. Ribeiro
,
Maria Raposo
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 2.12 MB
Your tags:
english, 2007
23
Quantitative electron energy loss spectroscopy of Si nanoclusters embedded in SiOx
G. Nicotra
,
C. Bongiorno
,
L. Caristia
,
S. Coffa
,
C. Spinella
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 333 KB
Your tags:
english, 2007
24
Nanoscale imaging and metrology of devices and innovative materials
Corrado Spinella
,
Vito Raineri
,
Wilfried Vandervorst
,
Mauro Ciappa
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 62 KB
Your tags:
english, 2007
25
Inside Front Cover - Editorial Board
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 33 KB
Your tags:
english, 2007
26
Table of Contents
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 75 KB
Your tags:
english, 2007
27
EMRS Volume list
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 16 KB
Your tags:
english, 2007
28
Contents Continued
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 15 KB
Your tags:
english, 2007
29
Nanotribology and nanomechanics of MEMS/NEMS and BioMEMS/BioNEMS materials and devices
Bharat Bhushan
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 5.50 MB
Your tags:
english, 2007
30
Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy
D. Passeri
,
A. Bettucci
,
M. Germano
,
M. Rossi
,
A. Alippi
,
A. Fiori
,
E. Tamburri
,
S. Orlanducci
,
M.L. Terranova
,
J.J. Vlassak
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 472 KB
Your tags:
english, 2007
31
Preparation of defined structures on very thin foils for characterization of AFM probes
H. Romanus
,
J. Schadewald
,
V. Cimalla
,
M. Niebelschütz
,
T. Machleidt
,
K.-H. Franke
,
L. Spiess
,
O. Ambacher
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 921 KB
Your tags:
english, 2007
32
Applications of quantitative image analysis to the description of the morphology of ZrO2 including 10% Eu3+ and their polyurethane nanocomposites
Joanna Ryszkowska
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 808 KB
Your tags:
english, 2007
33
Optical properties of proteins and protein adsorption study
S. Lousinian
,
S. Logothetidis
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 1.57 MB
Your tags:
english, 2007
34
Quantitative analysis of thin film compositions using EFTEM combined with RBS and ERDA
J.K.N. Lindner
,
M. Häberlen
,
F. Schwarz
,
G. Thorwarth
,
C. Hammerl
,
W. Assmann
,
B. Stritzker
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 985 KB
Your tags:
english, 2007
35
Confocal Raman and TEM measurements at the same area on nanoparticles
M. Cazayous
,
C. Langlois
,
T. Oikawa
,
C. Ricolleau
,
A. Sacuto
Journal:
Microelectronic Engineering
Year:
2007
Language:
english
File:
PDF, 475 KB
Your tags:
english, 2007
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