Volume 38; Issue 3

Microelectronics Reliability

Volume 38; Issue 3

1

Full length article

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 90 KB

english, 1998

2

Full length article

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 110 KB

english, 1998

3

Calculation of thermoelastic stresses in microelectronics

Lieven Matthys, Erwin De Baetselier, Wouter Dobbelaere, Wim Goedertier, Gilbert De Mey

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 336 KB

english, 1998

4

Study of Cu diffusion in an Al–1 wt.%Si–0.5 wt.%Cu bond pad with an Al–1 wt.%Si bond wire attached using scanning electron microscopy

P. Cosemans, J. D'Haen, A. Witvrouw, J. Proost, M. D'Olieslaeger, W. De Ceuninck, K. Maex, L. De Schepper

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 3.16 MB

english, 1998

5

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 53 KB

1998

6

EBIC analysis of SiC mesa diodes

M. Jargelius, U. Gustafsson, M. Bakowski

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 306 KB

english, 1998

7

A general isodegrading model for predicting mechanical equipment reliability and performance degradation

Yongxiang Zhao, Qing Gao, Jinnuo Wang

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 220 KB

english, 1998

8

Comparison of modulation doped effect in negative differential resistance field effect transistors (NDRFETs)

Rong-Chau Liu, Wen-Chau Liu

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 140 KB

english, 1998

9

Qualification of plastic encapsulated microcircuits (PEM) for avionicsBased on ``Plastic Encapsulated Microcircuits (PEM) Qualification Testing'', by J. A. Scalise, which appeared in the Proceedings of the 46th Electronic Components and Technology Conference, Orlando, FL, U.S.A., 28–31 May 1996, pp. 392–397. © 1996 IEEE.

Joseph A. Scalise

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 606 KB

english, 1998

10

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 45 KB

1998

11

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 43 KB

1998

12

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 56 KB

1998

13

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 43 KB

1998

14

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 54 KB

1998

15

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 57 KB

1998

16

A new on-chip digital BIST for analog-to-digital converters

Mehdi Ehsanian, Bozena Kaminska, Karim Arabi

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 970 KB

english, 1998

17

Why use PEMs in military equipment: users' response

Edward B. Hakim

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 193 KB

english, 1998

18

Analysis of conditional MTTF of fault-tolerant systems

Hoon Choi, Wei Wang, Kishor S. Trivedi

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 249 KB

english, 1998

19

Performance/dependability modelling using stochastic reward models: transient behaviour

Andreas Brenner, U.Dinesh Kumar

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 152 KB

english, 1998

20

Electromigration under time-varying current stress

Jiang Tao, Boon-Khim Liew, Jone F. Chen, Nathan W. Cheung, Chenming Hu

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 661 KB

english, 1998

21

Walk-out phenomena in 6H-SiC mesa diodes with SiO2/Si3N4 passivation and charge trapping in dry and wet oxides on N-type 6H-SiC

M. Bakowski, U. Gustafsson, Z. Ovuka

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 404 KB

english, 1998

22

Comparison of surface recombination effect in GaAs-based heterostructure-emitter and heterostructure-base transistors (HEHBTs)

Rong-Chau Liu, Wen-Chau Liu

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 468 KB

english, 1998

23

An improved neural network realization for reliability analysis

C.-S. Cheng, Y.-T. Hsu, C.-C. Wu

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 288 KB

english, 1998

24

A novel method for extraction of VDMOSFET model parameters using neural networks

T. Trajković, P. Igić, N. Stojadinović

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 255 KB

english, 1998

25

Anomalous I–V and pulse noise in reverse biased p–n junctions

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 236 KB

english, 1998

26

Combining functional and structural approaches in test generation for digital systems

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 368 KB

english, 1998

27

World Abstracts on Microelectronics and Reliability

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 1.38 MB

1998

28

Book Review

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 68 KB

1998