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Volume 42; Issue 7
Main
Microelectronics Reliability
Volume 42; Issue 7
Microelectronics Reliability
Volume 42; Issue 7
1
Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model
P.M. Igic
,
P.A. Mawby
,
M.S. Towers
,
W. Jamal
,
S. Batcup
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 288 KB
Your tags:
english, 2002
2
Using statistical design of experiment to investigate the effect of firing parameters on the electrical and magnetic properties of Mn–Zn ferrite
K.I Arshak
,
D.P Egan
,
K Phelan
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 221 KB
Your tags:
english, 2002
3
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions
B. Trégon
,
Y. Ousten
,
Y. Danto
,
L. Bechou
,
B. Parmentier
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 578 KB
Your tags:
english, 2002
4
The effect of sputtered interface metallic layers on reinforced core laminate making build-up structures
Paavo Jalonen
,
Aulis Tuominen
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 153 KB
Your tags:
english, 2002
5
Low cost flex substrates for miniaturized electronic assemblies
F. Barlow
,
A. Lostetter
,
A. Elshabini
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 418 KB
Your tags:
english, 2002
6
Editorial
Wallace T Anderson
,
Roberto Menozzi
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 27 KB
Your tags:
english, 2002
7
Reliability of metamorphic HEMTs on GaAs substrates
P.F Marsh
,
C.S Whelan
,
W.E Hoke
,
R.E Leoni III
,
T.E Kazior
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 262 KB
Your tags:
english, 2002
8
Modeling gallium arsenide heterojunction bipolar transistor ledge variations for insight into device reliability
Tim Henderson
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 441 KB
Your tags:
english, 2002
9
Methods of reducing defects in GaAs ICs
William J Roesch
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 467 KB
Your tags:
english, 2002
10
Reliability study of the electroless Ni–P layer against solder alloy
M.O Alam
,
Y.C Chan
,
K.C Hung
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 780 KB
Your tags:
english, 2002
11
Effect of misalignment on electrical characteristics of ACF joints for flip chip on flex applications
S.H Fan
,
Y.C Chan
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 419 KB
Your tags:
english, 2002
12
A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs
Hongxia Liu
,
Yue Hao
,
Jiangang Zhu
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 469 KB
Your tags:
english, 2002
13
A multiprocess performance analysis chart based on the incapability index Cpp: an application to the chip resistors
W.L Pearn
,
C.H Ko
,
K.H Wang
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 103 KB
Your tags:
english, 2002
14
Hierarchical test generation for combinational circuits with real defects coverage
T Cibáková
,
M Fischerová
,
E Gramatová
,
W Kuzmicz
,
W.A Pleskacz
,
J Raik
,
R Ubar
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 252 KB
Your tags:
english, 2002
15
Analysis and design of thin film resonator ladder filters
A.T Kollias
,
J.N Avaritsiotis
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 203 KB
Your tags:
english, 2002
16
Characterization method of thermomechanical parameters for microelectronic materials
O. Perat
,
J.M. Dorkel
,
E. Scheid
,
P. Temple Boyer
,
Y.S. Chung
,
A. Peyre-Lavigne
,
M. Zecri
,
P. Tounsi
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 247 KB
Your tags:
english, 2002
17
The effects of buffer thickness on GaAs MESFET characteristics: channel–substrate current, drain breakdown, and reliability
Frank Gao
,
Ravi Chanana
,
Tom Nicholls
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 555 KB
Your tags:
english, 2002
18
Multiple quantum well PIN optoelectronic devices and a method of restoring failed device characteristics
K Ikossi
,
W.S Rabinovich
,
D.S Katzer
,
S.C Binari
,
J Mittereder
,
P.G Goetz
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 307 KB
Your tags:
english, 2002
19
The Computer Engineering Handbook; Vojin Oklobdzija. CRC Press, Boca Raton, 2002. Hardcover, pp. 1338, plus XXII & 1-23 ISBN 0-8493-0885-2
Mile Stojcev
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 35 KB
Your tags:
english, 2002
20
Study of the optimal layout of cooling fins in forced convection cooling
Octavio Leon
,
Gilbert De Mey
,
Erik Dick
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 307 KB
Your tags:
english, 2002
21
Transient thermal analysis of multilayered structures using Green's functions
Marcin Janicki
,
Gilbert De Mey
,
Andrzej Napieralski
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 213 KB
Your tags:
english, 2002
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