Volume 48; Issue 10

Microelectronics Reliability

Volume 48; Issue 10

1

Tim Kogel, Rainer Leupers, Heinrich Meyr, ,Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processors Platforms (2006) Springer,Dordercht 1-4020-4825-4 Hardcover, 199 pp., plus XIV.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 65 KB

english, 2008

2

Negative bias temperature instability (NBTI) recovery with bake

Anastasios A. Katsetos

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 472 KB

english, 2008

3

Effects of continuously applied stress on tin whisker growth

Chih-Kuang Lin, Tung-Hsien Lin

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 536 KB

english, 2008

4

Tensile tests of micro anchors anodically bonded between Pyrex glass and aluminum thin film coated on silicon wafer

Yu-Qun Hu, Ya-Pu Zhao, Tongxi Yu

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 341 KB

english, 2008

5

Effect of crystallographic defects on the reverse performance of 4H–SiC JBS diodes

A. Grekov, Qingchun Zhang, Husna Fatima, Anant Agarwal, T. Sudarshan

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 961 KB

english, 2008

6

Electrothermal compact macromodel of monolithic switching voltage regulator MC34063A

Janusz Zarębski, Krzysztof Górecki

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 343 KB

english, 2008

7

FPGA-based switch-level fault emulation using module-based dynamic partial reconfiguration

Peter Ming-Han Lee, Reza Sedaghat

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1002 KB

english, 2008

8

Key reliability concerns with lead-free connectors

Tadahiro Shibutani, Ji Wu, Qiang Yu, Michael Pecht

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1.22 MB

english, 2008

9

An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1 μm metal–oxide–semiconductor transistors by quasi-ballistic transport theory

W.S. Lau, Peizhen Yang, V. Ho, L.F. Toh, Y. Liu, S.Y. Siah, L. Chan

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 859 KB

english, 2008

10

Leakage currents and dielectric breakdown of Si1−x−yGexCy thermal oxides

A. Cuadras, B. Garrido, J.R. Morante, L. Fonseca

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 241 KB

english, 2008

11

High-temperature performance of AlGaN/GaN HFETs and MOSHFETs

D. Donoval, M. Florovič, D. Gregušová, J. Kováč, P. Kordoš

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 206 KB

english, 2008

12

Investigation of diode geometry and metal line pattern for robust ESD protection applications

You Li, Juin J. Liou, Jim Vinson

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 163 KB

english, 2008

13

Dynamic study of the thermal laser stimulation response on advanced technology structures

A. Reverdy, M. de la Bardonnie, P. Poirier, H. Murray, P. Perdu, A. Boukkali

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 848 KB

english, 2008

14

Characterization of defects in flexible circuits with ultrasonic atomic force microscopy

Vijayaraghava Nalladega, Shamachary Sathish, Amarjit S. Brar

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1.84 MB

english, 2008

15

High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization

Rolf Johannessen, Frøydis Oldervoll, Frode Strisland

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1.11 MB

english, 2008

16

A note on “using intuitionistic fuzzy sets for fault-tree analysis on printed circuit board assembly”

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 122 KB

english, 2008

17

Inside front cover - Editorial board

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 88 KB

english, 2008

18

Calendar

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 125 KB

english, 2008

19

Richard Zurawski,Editors, ,Integration Technologies for Industrial Automated Systems (2007) CRC Taylor and Francis Group,Boca Raton 0-8493-9262-4 Plus XX 552 pp., Hardcover.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 66 KB

english, 2008

20

Heat dissipation effect of Al plate embedded substrate in network system

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1.74 MB

english, 2008

21

Saline soak tests to determine the short-term reliability of an in situ thin film resistance temperature detector

Julian W. Post, A. Bhattacharyya

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1.43 MB

english, 2008

22

Two-dimensional dopant profiling in semiconductor devices by electron holography and chemical etching delineation techniques with the same specimen

Ulugbek Shaislamov, Jun-Mo Yang, Jung Ho Yoo, Hyun-Sang Seo, Kyung-Jin Park, Chel-Jong Choi, Tae-Eun Hong, Beelyong Yang

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 297 KB

english, 2008

23

Fractal description of dendrite growth during electrochemical migration

Csaba Dominkovics, Gábor Harsányi

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 1.61 MB

english, 2008

24

Accurate negative bias temperature instability lifetime prediction based on hole injection

Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 338 KB

english, 2008

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски