Volume 49; Issue 8

Microelectronics Reliability

Volume 49; Issue 8

1

Experimental investigations and model study of moisture behaviors in polymeric materials

X.J. Fan, S.W.R. Lee, Q. Han

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 861 KB

english, 2009

2

Modeling and characterization of molding compound properties during cure

K.M.B. Jansen, C. Qian, L.J. Ernst, C. Bohm, A. Kessler, H. Preu, M. Stecher

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 373 KB

english, 2009

3

Numerical analysis of delamination and cracking phenomena in multi-layered flexible electronics

O. van der Sluis, R.A.B. Engelen, P.H.M. Timmermans, G.Q. Zhang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.63 MB

english, 2009

4

Simulation based analysis of secondary effects on solder fatigue

Rainer Dudek, Ralf Doering, Christine Bombach, Bernd Michel

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.10 MB

english, 2009

5

Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads

Pradeep Lall, Madhura Hande, Chandan Bhat, Vikrant More, Rahul Vaidya

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.57 MB

english, 2009

6

Guest Editorial: 2008 EuroSimE international conference on thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems

Artur Wymysłowski

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 99 KB

english, 2009

7

A CMOS circuit for evaluating the NBTI over a wide frequency range

R. Fernández-García, B. Kaczer, G. Groeseneken

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.58 MB

english, 2009

8

A study on the improved programming characteristics of flash memory with Si3N4/SiO2 stacked tunneling dielectric

L. Liu, J.P. Xu, L.L. Chen, P.T. Lai

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 373 KB

english, 2009

9

SCRAP: Sequential circuits reliability analysis program

S.J. Seyyed Mahdavi, K. Mohammadi

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 590 KB

english, 2009

10

A detailed study of current–voltage characteristics in Au/SiO2/n-GaAs in wide temperature range

H. Altuntaş, Ş. Altındal, H. Shtrikman, S. Özçelik

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 459 KB

english, 2009

11

The damped dynamics of printed circuit board and analysis of distorted and deformed half-sine excitation

E.H. Wong, Yiu-Wing Mai

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 932 KB

english, 2009

12

Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs

Zhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 616 KB

english, 2009

13

Inside front cover - Editorial board

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 41 KB

english, 2009

14

Calendar

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 46 KB

english, 2009

15

Call for Papers for the MIEL 2010 Conference

Journal:

Microelectronics Reliability

Year:

2009

File:

PDF, 398 KB

2009

16

Solder interconnect reliability under drop impact loading conditions using High-speed Cold Bump Pull

J.J.M. Zaal, H.P. Hochstenbach, W.D. van Driel, G.Q. Zhang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.14 MB

english, 2009

17

Performance properties in thick film silicate dielectric layers using molecular modeling

Nancy Iwamoto, Ahila Krishnamoorthy, Richard Spear

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 995 KB

english, 2009

18

Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs

Wei Bian, Jin He, Lining Zhang, Jian Zhang, Mansun Chan

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 794 KB

english, 2009