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Volume 49; Issue 8
Main
Microelectronics Reliability
Volume 49; Issue 8
Microelectronics Reliability
Volume 49; Issue 8
1
Experimental investigations and model study of moisture behaviors in polymeric materials
X.J. Fan
,
S.W.R. Lee
,
Q. Han
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 861 KB
Your tags:
english, 2009
2
Modeling and characterization of molding compound properties during cure
K.M.B. Jansen
,
C. Qian
,
L.J. Ernst
,
C. Bohm
,
A. Kessler
,
H. Preu
,
M. Stecher
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 373 KB
Your tags:
english, 2009
3
Numerical analysis of delamination and cracking phenomena in multi-layered flexible electronics
O. van der Sluis
,
R.A.B. Engelen
,
P.H.M. Timmermans
,
G.Q. Zhang
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.63 MB
Your tags:
english, 2009
4
Simulation based analysis of secondary effects on solder fatigue
Rainer Dudek
,
Ralf Doering
,
Christine Bombach
,
Bernd Michel
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.10 MB
Your tags:
english, 2009
5
Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads
Pradeep Lall
,
Madhura Hande
,
Chandan Bhat
,
Vikrant More
,
Rahul Vaidya
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.57 MB
Your tags:
english, 2009
6
Guest Editorial: 2008 EuroSimE international conference on thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems
Artur Wymysłowski
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 99 KB
Your tags:
english, 2009
7
A CMOS circuit for evaluating the NBTI over a wide frequency range
R. Fernández-García
,
B. Kaczer
,
G. Groeseneken
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.58 MB
Your tags:
english, 2009
8
A study on the improved programming characteristics of flash memory with Si3N4/SiO2 stacked tunneling dielectric
L. Liu
,
J.P. Xu
,
L.L. Chen
,
P.T. Lai
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 373 KB
Your tags:
english, 2009
9
SCRAP: Sequential circuits reliability analysis program
S.J. Seyyed Mahdavi
,
K. Mohammadi
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 590 KB
Your tags:
english, 2009
10
A detailed study of current–voltage characteristics in Au/SiO2/n-GaAs in wide temperature range
H. Altuntaş
,
Ş. Altındal
,
H. Shtrikman
,
S. Özçelik
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 459 KB
Your tags:
english, 2009
11
The damped dynamics of printed circuit board and analysis of distorted and deformed half-sine excitation
E.H. Wong
,
Yiu-Wing Mai
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 932 KB
Your tags:
english, 2009
12
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs
Zhen-Ying Hsieh
,
Mu-Chun Wang
,
Chih Chen
,
Jia-Min Shieh
,
Yu-Ting Lin
,
Shuang-Yuan Chen
,
Heng-Sheng Huang
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 616 KB
Your tags:
english, 2009
13
Inside front cover - Editorial board
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 41 KB
Your tags:
english, 2009
14
Calendar
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 46 KB
Your tags:
english, 2009
15
Call for Papers for the MIEL 2010 Conference
Journal:
Microelectronics Reliability
Year:
2009
File:
PDF, 398 KB
Your tags:
2009
16
Solder interconnect reliability under drop impact loading conditions using High-speed Cold Bump Pull
J.J.M. Zaal
,
H.P. Hochstenbach
,
W.D. van Driel
,
G.Q. Zhang
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 1.14 MB
Your tags:
english, 2009
17
Performance properties in thick film silicate dielectric layers using molecular modeling
Nancy Iwamoto
,
Ahila Krishnamoorthy
,
Richard Spear
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 995 KB
Your tags:
english, 2009
18
Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs
Wei Bian
,
Jin He
,
Lining Zhang
,
Jian Zhang
,
Mansun Chan
Journal:
Microelectronics Reliability
Year:
2009
Language:
english
File:
PDF, 794 KB
Your tags:
english, 2009
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