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Volume 60
Main
Microelectronics Reliability
Volume 60
Microelectronics Reliability
Volume 60
1
Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series
Lee, Chie-In
,
Lin, Yan-Ting
,
Lin, Wei-Cheng
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 314 KB
Your tags:
english, 2016
2
Editorial Board
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 37 KB
Your tags:
english, 2016
3
A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors
Dai, Mingzhi
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 467 KB
Your tags:
english, 2016
4
La2O3 gate dielectrics for AlGaN/GaN HEMT
Chen, J.
,
Kawanago, T.
,
Wakabayashi, H.
,
Tsutsui, K.
,
Iwai, H.
,
Nohata, D.
,
Nohira, H.
,
Kakushima, K.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 765 KB
Your tags:
english, 2016
5
Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light
Rutkauskas, M.
,
Farrell, C.
,
Dorrer, C.
,
Marshall, K.L.
,
Crawford, T.
,
Lundquist, T.R.
,
Vedagarbha, P.
,
Erington, K.
,
Bodoh, D.
,
Reid, D.T.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 796 KB
Your tags:
english, 2016
6
Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water
Wang, X.Y.
,
Cheng, Q.
,
Ma, X.P.
,
Zhang, H.
,
Li, M.X.
,
Chen, T.N.
,
Zhang, P.
,
Shao, J.Q.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.05 MB
Your tags:
english, 2016
7
Pulse plated silver metallization on porosified LTCC substrates for high frequency applications
Steinhäußer, Frank
,
Talai, Armin
,
Sandulache, Gabriela
,
Weigel, Robert
,
Koelpin, Alexander
,
Hansal, Wolfgang
,
Bittner, Achim
,
Schmid, Ulrich
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.94 MB
Your tags:
english, 2016
8
An examination on the direct concentration approach to simulating moisture diffusion in a multi-material system
Liu, Dapeng
,
Wang, Jing
,
Liu, Ruiyang
,
Park, S.B.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 721 KB
Your tags:
english, 2016
9
Damage effects on low noise amplifiers with microwave pulses
Zhang, Cunbo
,
Zhang, Jiande
,
Wang, Honggang
,
Du, Guangxing
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 2.59 MB
Your tags:
english, 2016
10
Comparative study of low-frequency noise in 0.18μm and 0.35μm gate-length nMOSFETs with gate area of 1.1μm2
Hu, Chih-Chan
,
Chau, Yuan-Fong Chou
,
Lim, Chee Ming
,
Tan, Kuang-Hsiung
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.32 MB
Your tags:
english, 2016
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