Volume 60

Microelectronics Reliability

Volume 60

1

Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 314 KB

english, 2016

2

Editorial Board

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 37 KB

english, 2016

3

A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 467 KB

english, 2016

4

La2O3 gate dielectrics for AlGaN/GaN HEMT

Chen, J., Kawanago, T., Wakabayashi, H., Tsutsui, K., Iwai, H., Nohata, D., Nohira, H., Kakushima, K.

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 765 KB

english, 2016

5

Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light

Rutkauskas, M., Farrell, C., Dorrer, C., Marshall, K.L., Crawford, T., Lundquist, T.R., Vedagarbha, P., Erington, K., Bodoh, D., Reid, D.T.

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 796 KB

english, 2016

6

Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water

Wang, X.Y., Cheng, Q., Ma, X.P., Zhang, H., Li, M.X., Chen, T.N., Zhang, P., Shao, J.Q.

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 1.05 MB

english, 2016

7

Pulse plated silver metallization on porosified LTCC substrates for high frequency applications

Steinhäußer, Frank, Talai, Armin, Sandulache, Gabriela, Weigel, Robert, Koelpin, Alexander, Hansal, Wolfgang, Bittner, Achim, Schmid, Ulrich

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 1.94 MB

english, 2016

8

An examination on the direct concentration approach to simulating moisture diffusion in a multi-material system

Liu, Dapeng, Wang, Jing, Liu, Ruiyang, Park, S.B.

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 721 KB

english, 2016

9

Damage effects on low noise amplifiers with microwave pulses

Zhang, Cunbo, Zhang, Jiande, Wang, Honggang, Du, Guangxing

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 2.59 MB

english, 2016

10

Comparative study of low-frequency noise in 0.18μm and 0.35μm gate-length nMOSFETs with gate area of 1.1μm2

Hu, Chih-Chan, Chau, Yuan-Fong Chou, Lim, Chee Ming, Tan, Kuang-Hsiung

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 1.32 MB

english, 2016