Volume 258; Issue 21

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Applied Surface Science
Volume 258; Issue 21

Applied Surface Science

Volume 258; Issue 21

1

Application of deposited by ALD HfO2 and Al2O3 layers in double-gate dielectric stacks for non-volatile semiconductor memory (NVSM) devices

Robert Mroczyński, Andrzej Taube, Sylwia Gierałtowska, Elżbieta Guziewicz, Marek Godlewski

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.10 MB

english, 2012

2

Passivation of Si-based structures in HCN and KCN solutions

Emil Pinčík, Hikaru Kobayashi, Jaroslav Rusnák, Masao Takahashi, Milan Mikula, Woo Byoung Kim, Michal Kučera, Robert Brunner, Stanislav Jurečka

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.51 MB

english, 2012

3

Growth of thin zirconium oxide films on the 6H–SiC(0 0 0 1) surface

K. Idczak, P. Mazur, L. Markowski, M. Skiścim, M. Musiał

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 678 KB

english, 2012

4

Electrical characterization of surface and interface potentials on SiC

J. Mizsei, A. Czett

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.12 MB

english, 2012

5

The effect of KCN passivation on IR spectra of a-Si based structures

Martin Kopani, Milan Mikula, Naozumi Fujiwara, Masao Takahashi, Emil Pinčík

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 380 KB

english, 2012

6

Critical issues for interfaces to p-type SiC and GaN in power devices

F. Roccaforte, A. Frazzetto, G. Greco, F. Giannazzo, P. Fiorenza, R. Lo Nigro, M. Saggio, M. Leszczyński, P. Pristawko, V. Raineri

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.09 MB

english, 2012

7

Theoretical analysis of semiconductor surface passivation by adsorption of alkaline-earth metals and chalcogens

G.P. Srivastava, A.Z. AlZahrani, D. Usanmaz

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.26 MB

english, 2012

8

Ab initio studies of electronic and optical properties of graphene and graphene–BN interface

C. Yelgel, G.P. Srivastava

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 778 KB

english, 2012

9

Surface passivation function of indium-tin-oxide-based nanorod structural sensors

Tzu-Shun Lin, Ching-Ting Lee, Hisn-Ying Lee, Chih-Chien Lin

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 585 KB

english, 2012

10

S-termination effects for the catalytic activities of Pd on GaN(0 0 0 1) surfaces

T. Konishi, Y. Ueta, M. Hirayama, N. Nishiwaki, S. Tsukamoto

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 311 KB

english, 2012

11

Electronic interface properties of silicon substrates after ozone based wet-chemical oxidation studied by SPV measurements

Heike Angermann, Klaus Wolke, Christiane Gottschalk, Ana Moldovan, Maurizio Roczen, Jens Fittkau, Martin Zimmer, Jochen Rentsch

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 813 KB

english, 2012

12

High-temperature stability of c-Si surface passivation by thick PECVD Al2O3 with and without hydrogenated capping layers

Pierre Saint-Cast, Daniel Kania, René Heller, Saskia Kuehnhold, Marc Hofmann, Jochen Rentsch, Ralf Preu

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.01 MB

english, 2012

13

Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

A. Domanowska, M. Miczek, R. Ucka, M. Matys, B. Adamowicz, J. Żywicki, A. Taube, K. Korwin-Mikke, S. Gierałtowska, M. Sochacki

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 703 KB

english, 2012

14

The effect of Si substrate preparation on surface morphology and surface composition of In2O3 ultrathin films deposited by rheotaxial growth and vacuum oxidation

P. Kościelniak, M. Sitarz, E. Maciak, J. Szuber

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

15

Photoemission studies of the surface electronic properties of L-CVD SnO2 ultra thin films

M. Kwoka, L. Ottaviano, J. Szuber

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 576 KB

english, 2012

16

Ab-initio modeling of oxygen on the surface passivation of 3CSiC nanostructures

J.L. Cuevas, A. Trejo, M. Calvino, E. Carvajal, M. Cruz-Irisson

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 1.75 MB

english, 2012

17

Properties of charge states in MOS structure with ultrathin oxide layer

Stanislav Jurečka, Hikaru Kobayashi, Masao Takahashi, Taketoshi Matsumoto, Emil Pinčík

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 690 KB

english, 2012

18

Preface

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 85 KB

english, 2012

19

Editorial Board

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 28 KB

english, 2012

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