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Volume 133
Main
Solid-State Electronics
Volume 133
Solid-State Electronics
Volume 133
1
Study on the electrical degradation of AlGaN/GaN MIS-HEMTs induced by residual stress of SiN x passivation
Bai, Zhiyuan
,
Du, Jiangfeng
,
Liu, Yong
,
Xin, Qi
,
Liu, Yang
,
Yu, Qi
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 1.11 MB
Your tags:
english, 2017
2
A new high-voltage interconnection shielding method for SOI monolithic ICs
Zhang, Long
,
Zhu, Jing
,
Sun, Weifeng
,
Huang, Xuequan
,
Zhao, Minna
,
Chen, Jiajun
,
Shi, Longxing
,
Chen, Jian
,
Ding, Desheng
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 1.11 MB
Your tags:
english, 2017
3
Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays
Bae, Min Soo
,
Park, Chuntaek
,
Shin, Dongseok
,
Lee, Sang Myung
,
Yun, Ilgu
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 1002 KB
Your tags:
english, 2017
4
Properties of N-rich Silicon Nitride Film Deposited by Plasma-Enhanced Atomic Layer Deposition
Jhang, Pei-Ci
,
Lu, Chi-Pin
,
Shieh, Jung-Yu
,
Yang, Ling-Wu
,
Yang, Tahone
,
Chen, Kuang-Chao
,
Lu, Chih-Yuan
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 440 KB
Your tags:
english, 2017
5
The electrical performance and gate bias stability of an amorphous InGaZnO thin-film transistor with HfO 2 high-k dielectrics
Wang, Ruo Zheng
,
Wu, Sheng Li
,
Li, Xin Yu
,
Zhang, Jin Tao
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 989 KB
Your tags:
english, 2017
6
Charge based, continuous compact model for the channel current in organic thin-film transistors for all regions of operation
Hain, Franziska
,
Graef, Michael
,
Iñíguez, Benjamín
,
Kloes, Alexander
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 1.49 MB
Your tags:
english, 2017
7
Reliability improvement in GaN HEMT power device using a field plate approach
Wu, Wen-Hao
,
Lin, Yueh-Chin
,
Chin, Ping-Chieh
,
Hsu, Chia-Chieh
,
Lee, Jin-Hwa
,
Liu, Shih-Chien
,
Maa, Jer-shen
,
Iwai, Hiroshi
,
Chang, Edward Yi
,
Hsu, Heng-Tung
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 2.14 MB
Your tags:
english, 2017
8
Low frequency noise investigation of 2–3 μm GaSb-based laser diodes
Glemža, Justinas
,
Pralgauskaitė, Sandra
,
Palenskis, Vilius
,
Matukas, Jonas
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 948 KB
Your tags:
english, 2017
9
Study on the influence of γ-ray total dose radiation effect on the electrical properties of the uniaxial strained Si nanometer NMOSFET
Hao, Minru
,
Hu, Huiyong
,
Wang, Bin
,
Liao, Chenguang
,
Kang, Haiyan
,
Su, Han
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 2.08 MB
Your tags:
english, 2017
10
Strong Fermi-level pinning induced by argon inductively coupled plasma treatment and post-metal deposition annealing on 4H-SiC
Tsui, Bing-Yue
,
Cheng, Jung-Chien
,
Yen, Cheng-Tyng
,
Lee, Chawn-Ying
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 2.05 MB
Your tags:
english, 2017
11
GaN-based Schottky barrier ultraviolet photodetectors with graded doping on patterned sapphire substrates
Mou, Wenjie
,
Zhao, Linna
,
Chen, Leilei
,
Yan, Dawei
,
Ma, Huarong
,
Yang, Guofeng
,
Gu, Xiaofeng
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 1.60 MB
Your tags:
english, 2017
12
Forming operation in Ge-rich Ge x Sb y Te z phase change memories
Palumbo, Elisabetta
,
Zuliani, Paola
,
Borghi, Massimo
,
Annunziata, Roberto
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 3.52 MB
Your tags:
english, 2017
13
Editorial Board
Journal:
Solid-State Electronics
Year:
2017
Language:
english
File:
PDF, 55 KB
Your tags:
english, 2017
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