Volume 124; Issue 3-4

Thin Solid Films

Volume 124; Issue 3-4
1

Aluminium epitaxy on Si(111) and Si(100) using an ionized cluster beam

I Yamada, H Inokawa, T Takagi
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 489 KB
english, 1985
5

Effect of γ irradiation on the properties of Fabry-Perot interference filters

H Zorc, M Peršin
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 218 KB
english, 1985
6

Oxidation of plasma-deposited hydrogenated amorphous silicon

B Drevillon, F Vaillant
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 284 KB
english, 1985
7

Improved depth resolution by sample rotation during Auger electron spectroscopy depth profiling

A Zalar
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 520 KB
english, 1985
8

Depth profiling of thin films using a Grimm-type glow discharge lamp

A Bengtson, L Danielsson
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 252 KB
english, 1985
9

Analysis of thin film composition using laser-induced ion mass analysis

K.K Mahavadi, G.J Smith, W.I Milne
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 237 KB
english, 1985
10

Preferential sputtering effects in tantalum nitride thin films

C Palacio, J.M Sanz, J.M Martínez-Duart
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 241 KB
english, 1985
11

Thin film thickness measurement: A comparison of various techniques

A Piegari, E Masetti
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 463 KB
english, 1985
12

The use of a spectrophotometer for the optical monitoring of thin films

G Emiliani, D Flori, E Masetti, A Piegari
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 273 KB
english, 1985
14

Topographic characterization of vacuum-deposited films by optical methods

M.J Verkerk, I.J.M.M Raaijmakers
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 309 KB
english, 1985
15

Evaluation of the microroughness of large flat or curved optics by replication

D.L Gourley, H.E Gourley, J.M Bennett
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 369 KB
english, 1985
18

The role of hydrogen in silicon nitride and silicon oxynitride films

Dirk Schalch, Arthur Scharmann, Robert Wolfrat
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 383 KB
english, 1985
19

Photodensification in amorphous PSe thin films

L.K Malhotra, Ajay Kumar, K.L Chopra
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 299 KB
english, 1985
21

Hardness, adhesion and abrasion resistance of TiO2 films on glass

A.J Perry, H.K Pulker
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 1.83 MB
english, 1985
22

Measurement of the adhesion of silver films to glass substrates

Akira Kikuchi, Shigeru Baba, Akira Kinbara
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 283 KB
english, 1985
23

Characterization of reactively sputtered BeO films

Dirk Schalch, Arthur Scharmann, Albrecht Weiß
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 420 KB
english, 1985
24

Author index

Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 76 KB
english, 1985
25

Contents of vol. 124

Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 135 KB
english, 1985
26

Adhesion measurements of thin metal films on plastics

R.E Van de Leest
Journal:
Thin Solid Films
Year:
1985
Language:
english
File:
PDF, 318 KB
english, 1985