Volume 359; Issue 2

Main
Thin Solid Films
Volume 359; Issue 2

Thin Solid Films

Volume 359; Issue 2

1

A chemical method for the deposition of Bi2S3 thin films from a non-aqueous bath

R.S. Mane, B.R. Sankapal, C.D. Lokhande

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 160 KB

english, 2000

2

Electrophotographic layers of trigonal Se in the binder obtained by reduction of SeO2 by hydrazine

N.I. Ibragimov, Z.M. Abutalibova, V.G. Agaev

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 79 KB

english, 2000

3

A study of Si1−xGex/Si quantum-well intermixing by photocurrent spectroscopy

Cheng Li, Qinqing Yang, Yonghai Chen, Hongjie Wang, Jizheng Wang, Jinzhong Yu, Qiming Wang

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 137 KB

english, 2000

4

Preparation of single phase tungsten carbide by annealing of sputtered tungsten-carbon layers

H Romanus, V Cimalla, J.A Schaefer, L Spieß, G Ecke, J Pezoldt

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 330 KB

english, 2000

5

Microstructure and properties of the CdS thin films prepared by electrostatic spray assisted vapour deposition (ESAVD) method

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 454 KB

english, 2000

6

Preparation of conducting layers of substituted polyacetylenes by solid-phase polymerization of Langmuir–Blodgett layers

F.N. Dultsev, S.M. Repinsky, L.L. Sveshnikova

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 189 KB

english, 2000

7

Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry

M.L. Monaghan, T. Nigam, M. Houssa, S. De Gendt, H.P. Urbach, P.K. de Bokx

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 218 KB

english, 2000

8

Electrical explosion of cold thin metal films

M.K. Marakhtanov, A.M. Marakhtanov

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 2.82 MB

english, 2000

9

Annealing effects on the structure and mechanical properties of r.f.-sputtered Cr–B hard thin films

M Zhou, M Nose, Y Makino, K Nogi

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 538 KB

english, 2000

10

The atomic displacements on surface generated by low-energy projectile

Z.Q. Ma, Y. Kido

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 163 KB

english, 2000

11

Surface roughness of pyrolytic tin dioxide films evaluated by different methods

Gunnar A. Niklasson, Daniel Rönnow, Maria Strømme Mattsson, Lisen Kullman, Hans Nilsson, Arne Roos

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 269 KB

english, 2000

12

Fine trimming of SmS film resistance by XeCl laser ablation

P. Miodushevsky, M.L. Protopapa, F. De Tomasi, M.R. Perrone, S. Tundo, L. Vasanelli

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 122 KB

english, 2000

13

Thermally stimulated exoelectronic emission of CVD diamond films

D. Briand, P. Iacconi, M. Benabdesselam, D. Lapraz, R. Bindi, P.W. May, C.A. Rego, A. Afzal

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 139 KB

english, 2000

14

Optical and mechanical properties of TiO2/SiO2/organically modified silane composite films prepared by sol–gel processing

Wenxiu Que, Z Sun, Y Zhou, Y.L Lam, Y.C Chan, C.H Kam

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 261 KB

english, 2000

15

Comparative study of CdS thin films deposited by single, continuous, and multiple dip chemical processes

I.O Oladeji, L Chow, J.R Liu, W.K Chu, A.N.P Bustamante, C Fredricksen, A.F Schulte

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 159 KB

english, 2000

16

Plasma deposition of amorphous carbon films on copper

S. Chiu, S. Turgeon, B. Terreaul, A. Sarkissian

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 425 KB

english, 2000

17

Control of microstructure coarsening of a Ti substrate during diamond film deposition using Ar/H2/CH4 gas mixture

Yongqing Fu, Nee Lam Loh, Bibo Yan, Chang Q Sun, Peter Hing

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 989 KB

english, 2000

18

Visible luminescence from photo-chemically etched silicon

Naokatsu Yamamoto, Hiroshi Takai

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 257 KB

english, 2000

19

Oxidation, grain growth and reflow characteristics of copper thin films prepared by chemical vapor deposition

S.-Y. Lee, S.-H. Choi, C.-O. Park

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 814 KB

english, 2000

20

Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition

Y Leprince-Wang, D Souche, K Yu-Zhang, S Fisson, G Vuye, J Rivory

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 731 KB

english, 2000

21

Solid-phase crystallization of hydrogenated amorphous silicon/hydrogenated microcrystalline silicon bilayers deposited by plasma-enhanced chemical vapor deposition

Chan-Do Park, Hae-Yeol Kim, Min-Hee Cho, Kuk-Jin Jan, Jai-Young Lee

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 2.19 MB

english, 2000

22

Stress, porosity measurements and corrosion behaviour of AlN films deposited on steel substrates

F. Vacandio, Y. Massiani, P. Gergaud, O. Thomas

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 241 KB

english, 2000

23

Material characterization of Cu(Ti)–polyimide thin film stacks

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 269 KB

english, 2000

24

Structure and in-depth concentrations in excimer laser irradiated Pb–Co codeposited films

S Luby, E Majkova, M Jergel, R Senderak, E D'Anna, G Leggieri, A Luches, M Martino

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 1.51 MB

english, 2000

25

Hardness measurements of Ti and TiC multilayers: a model

D Chicot, Y Bénarioua, J Lesage

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 293 KB

english, 2000

26

Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy

Furong Zhu, C.H.A. Huan, Keran Zhang, A.T.S. Wee

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 359 KB

english, 2000

27

A comparative study of oxygen/organosilicon plasmas and thin SiOxCyHz films deposited in a helicon reactor

K. Aumaille, C. Vallée, A. Granier, A. Goullet, F. Gaboriau, G. Turban

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 418 KB

english, 2000

28

Cracking and residual stress in hybrid coatings on float glass

J Malzbender, G de With

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 415 KB

english, 2000

29

The structure of thin Cr film prepared by the vacuum evaporation method

C. Kaito, H. Nakamura, S. Kimura, Y. Kimura, T. Nakada, Y. Saito

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 539 KB

english, 2000

30

Index

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 66 KB

english, 2000

31

Index

Journal:

Thin Solid Films

Year:

2000

File:

PDF, 54 KB

2000

32

Erratum to “Effect of diatomic islands on step morphological stability of a terrace edge in molecular beam epitaxy” [Thin Solid Films 353 (1999) 174–181]

Senpuu Lin, Chi-Chuan Hwang, Hsin-Sen Chu

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 45 KB

english, 2000

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