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Volume 97; Issue 3
Main
Thin Solid Films
Volume 97; Issue 3
Thin Solid Films
Volume 97; Issue 3
1
Interlamellar contact within plasma-sprayed coatings
R McPherson
,
B.V Shafer
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 274 KB
Your tags:
english, 1982
2
The ranges of isomorphous substitutions in thin films of CdSexTe1−x solid solutions
V.A. Sanitarov
,
L.A. Aleksandrova
,
I.P. Kalinkin
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 643 KB
Your tags:
english, 1982
3
Structure-property relationships in microlaminate TiC/TiB2 condensates
B.A Movchan
,
A.V Demchishin
,
G.F Badilenko
,
R.F Bunshah
,
C Sans
,
C Deshpandey
,
H.J Doerr
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 344 KB
Your tags:
english, 1982
4
Vapor growth and properties of thin film ZnSxSe1−x
Wallace B. Leigh
,
Bruce W. Wessels
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 660 KB
Your tags:
english, 1982
5
Detection of pinholes in R.F.-diode-sputtered SiO2 films
Takeo Hattori
,
Yutaka Utsugi
,
Hiroshi Yamauchi
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 232 KB
Your tags:
english, 1982
6
Preparation of thin CuInS2 films via a two-stage process
J.J.M Binsma
,
H.A van der Linden
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 688 KB
Your tags:
english, 1982
7
Field emission microscopy study of silver adsorption on tungsten single-crystal planes
Cr. Conţescu
,
M.I. Vass
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 1.03 MB
Your tags:
english, 1982
8
The influence of some evaporation parameters on the structure and properties of thin aluminium films
J.E Curran
,
J.S Page
,
U Pick
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 1.36 MB
Your tags:
english, 1982
9
Early gate failures in biased GaAs field effect transistors from electromigration-induced damage superimposed on kirkendall voids
Varan Singh
,
Prem Swarup
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 660 KB
Your tags:
english, 1982
10
A new standardless quantitative electron probe microanalysis technique applied to III–V compound semiconductors
K.P. Zangalis
,
A. Christou
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 552 KB
Your tags:
english, 1982
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