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Volume 35; Issue 12
Main
Vacuum
Volume 35; Issue 12
Vacuum
Volume 35; Issue 12
1
Editorial
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 45 KB
Your tags:
english, 1985
2
Vacuum and thin films—seeing the wood for the trees!
L. Holland
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 243 KB
Your tags:
english, 1985
3
A very short response time electronic system for the measurement of surface potential changes by means of a static capacitor method
A.J. Bachtin
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 790 KB
Your tags:
english, 1985
4
EFSA—a new evaluation method of the depth resolution in depth profiling of multilayer structures
D. Marton
,
J. László
,
J. Giber
,
F.G. Rüdenauer
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 387 KB
Your tags:
english, 1985
5
Structural peculiarities in high-dose Ar+ implanted silicon
S. Simov
,
M. Kalitzova
,
P. Danesh
,
N. Pashov
,
P. Bonhomme
,
G. Balossier
,
A. Djakov
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 1.64 MB
Your tags:
english, 1985
6
Thin films prepared by sputtering MgF2 in an rf planar magnetron
L. Martinů
,
H. Biederman
,
L. Holland
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 547 KB
Your tags:
english, 1985
7
An investigation of silver diffusion through gold films by Auger electron spectroscopy
You-ying Liu
,
Li Wang
,
Jen-zung Zhan
,
Lin Chui
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 158 KB
Your tags:
english, 1985
8
A simple/universal rf-generator module system for use in plasma processing
Sven-Åke Eriksson
,
Anders Westman
,
Soren Berg
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 259 KB
Your tags:
english, 1985
9
The use of Schottky barrier diodes for the detection of surface contamination and damage in the fabrication of GaAs MESFETS
D.A. Allan
,
P.J. Smith
,
J.A. Bowie
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 421 KB
Your tags:
english, 1985
10
Limitation of Ti/TiN diffusion barrier layers in silicon technology
H. Norström
,
S. Nygren
,
P. Wiklund
,
M. Östling
,
R. Buchta
,
C.S. Petersson
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 1.35 MB
Your tags:
english, 1985
11
Transmission electron microscopy of Li+ implanted Al films
Amarjit Singh
,
Emile J Knystautas
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 4.86 MB
Your tags:
english, 1985
12
Few collisions approach for threshold sputtering
Y. Yamamura
,
J. Bohdansky
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 983 KB
Your tags:
english, 1985
13
Angular distributions of molecular flux from orifices of various thickness
K. Nanbu
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 308 KB
Your tags:
english, 1985
14
A new low-energy ion implanter for bombardment of cylindrical surfaces
M. Renier
,
A.A. Lucas
,
S.E. Donnelly
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 192 KB
Your tags:
english, 1985
15
Atomic absorption evaporation flow rate measurements of alkali metal dispensers
M. Succi
,
R. Canino
,
B. Ferrario
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 407 KB
Your tags:
english, 1985
16
Problems on computer processing of SIMS spectra
J. Antal
,
S. Kugler
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 438 KB
Your tags:
english, 1985
17
Formation of buried insulating layers by high dose oxygen implantation under controlled temperature conditions
M. Bruel
,
J. Margail
,
J. Stoemenos
,
P. Martin
,
C. Jaussaud
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 1.77 MB
Your tags:
english, 1985
18
Directional effects in kinetic ion-electron emission
B.A. Brusilovsky
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 2.18 MB
Your tags:
english, 1985
19
An improved mass spectrometer inlet system for the analysis of air sensitive materials
R.D. Pilkington
,
J.R. Upton
,
J. Delaney
,
D. Price
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 97 KB
Your tags:
english, 1985
20
Special series on irradiation enhanced adhesion—part I
J.S. Colligon
Journal:
Vacuum
Year:
1985
File:
PDF, 34 KB
Your tags:
1985
21
Oxygen-ion-assisted deposition of thin gold films
P.J. Martin
,
W.G. Sainty
,
R.P. Netterfield
,
A.N. Buckley
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 485 KB
Your tags:
english, 1985
22
Thin film adhesion improvement under photon irradiation
A.J. Kellock
,
G.L. Nyberg
,
J.S. Williams
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 474 KB
Your tags:
english, 1985
23
Background of the workshop on residual gas analyzer calibration
Charles R Tilford
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 122 KB
Your tags:
english, 1985
24
Quadrupole mass spectrometers: design considerations and performance: Peter H Dawson, Division of Microstructural Sciences, National Research Council of Canada, Ottawa, Ontario, Canada K1A 0R6
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 122 KB
Your tags:
english, 1985
25
The limitations of the quadrupole mass spectrometer when used for gas analysis: J H Leck, Department of Electrical Engineering and Electronics, The University of Liverpool, Liverpool L69 3Bx, UK
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 251 KB
Your tags:
english, 1985
26
Characteristics of time-of-flight mass spectrometers: Bruce Kendall, Department of Physics, Pennsylvania State University, University Park, Pennsylvania 16802, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1985
27
Fragmentation and isotopic abundance as a means for identifying vacuum gaseous species and for monitoring partial pressure analyser operation: L C Beavis, Photovoltaic Concentrator Research Division, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1985
28
Vacuum measurement calibration system at PPPL: W R Blanchard and D Doersam, Plasma Physics Laboratory, Princeton University, PO Box 451, Princeton, NJ 08544, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 130 KB
Your tags:
english, 1985
29
Calibration of a gas-analytical MS by defined gas bursts: R Dobrozemsky, Osterreichisches Forschungszentrum Seibersdorf, A-2444 Seibersdorf, Austria
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 268 KB
Your tags:
english, 1985
30
Calibration of ultra sensitive helium leak dectectors: Lyle L Bergquist, Martin Marietta Denver Aerospace, PO Box 179, Denver, CO 80201, USA and Y Tito Sasaki, Quantum Mechanics, PO Box 1579, Sonoma, CA 95476, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1985
31
The spinning rotor viscosity gauge as a basis for the calibration of residual gas analysers and mass spectromers: Guenther Reich, Leybold-Heraeus, Cologne, West Germany
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1985
32
Sector mass spectrometer calibration methods applied to residual gas analysers: R E Ellefson, Mound Laboratories, Monsanto Research Corp, Miamisburg, OH 45342, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1985
33
Performance of vacuum transfer standards: R W Hyland, K E McCulloh, C R Tilford and S D Wood, National Bureau of Standards, Gaithersburg, MD 20899, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 281 KB
Your tags:
english, 1985
34
Use of quadrupole RGA's in standard leak calibrations: Tim Moss, Sandia National Laboratory, Box 5800, Albuquerque, N M 87185, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 144 KB
Your tags:
english, 1985
35
Long-term changes in the sensitivity of quadrupole mass spectrometers: H F Dylla, W R Blanchard, P H LaMarche, P McCarthy, Plasma Physics Laboratory, PO Box 451, Princeton University, Princeton, NJ 08544, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 144 KB
Your tags:
english, 1985
36
Experiences in the use of magnetic-sector and quadrupole-field mass spectrometers: Anita Calcatelli, Istituto di Metrologia ‘G Colonnetti’, Strada Delle Cacce, 73, 10135, Torino, Italy
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 281 KB
Your tags:
english, 1985
37
Experience with several quadrupole residual gas analysers: H C Hseuh, 911B Brookhaven National Laboratory, Upton, New York 11973 USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1985
38
Mass spectrometry as a quantitative diagnostic for plasma discharges in fusion research: W P Poschenrieder, Max-Planck-Institut für Plasmaphysik, D-8046 Garching, West Germany
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1985
39
Multiple head RGA installation on an electron storage ring: Ron Reid, SERC Daresbury Laboratory, Warrington WA4 4AD, UK
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1985
40
Vacuum compatibility criteria used at SURF-II, the NBS Electron Storage Ring: Lanny R Hughey, National Bureau of Standards, Gaithersburg, MD 20899, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 273 KB
Your tags:
english, 1985
41
Mass spectrometry of atmospheric gases: Konrad Mauersberger, University of Minnesota, Minneapolis, MN 55455, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 136 KB
Your tags:
english, 1985
42
RGA experience with NSLS: Conrad L Foerster, NSLS Bldg 728, Brookhaven National Laboratory, Upton, New York 11973, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 136 KB
Your tags:
english, 1985
43
RGA calibration methods and experience: David Holkeboer and G Lenavitt, Inficon Leybold-Heraeus, East Syracuse, NY 13057, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 136 KB
Your tags:
english, 1985
44
The use of quadrupole mass spectrometers for investigation of surface reactions: Harold Winters, IBM, San José, 5600 Cottle Rd, San José, CA 95193, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 277 KB
Your tags:
english, 1985
45
Application of quadrupole mass spectrometry as a process control technique in plasma processes: Nalin Kumar and K Pourrezaei, Drexel University, Philadelphia, PA 19104, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 143 KB
Your tags:
english, 1985
46
Mass spectrometer measurement of moisture in semiconductor devices—calibration and procedures: Stan Ruthberg, National Bureau of Standards, Gaithersburg, MD 20899, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 143 KB
Your tags:
english, 1985
47
Surface science applications of residual gas analyzers: Richard L Kurtz and T E Madey, Surface Science Division, National Bureau of Standards, Gaithersburg, MD 20899, USA
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 143 KB
Your tags:
english, 1985
48
UK requirements for small mass spectrometer calibration: Peter Nash, National Laboratory, Teddington, TW11 0LW, UK
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 143 KB
Your tags:
english, 1985
49
Present status of quantitative residual gas analysis in Japan: Masatoshi Ono, Electrotechnical Laboratory, 1-1-4, Umezonno Sakura-mura, Ibaraki 305, Japan
Journal:
Vacuum
Year:
1985
File:
PDF, 26 KB
Your tags:
1985
50
Coatings on glass: H K Pulker, Elsevier Science Publishers BV, Amsterdam. 484 pp.
W. Steckelmacher
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 65 KB
Your tags:
english, 1985
51
New patents
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 1.83 MB
Your tags:
english, 1985
52
Obituary
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 152 KB
Your tags:
english, 1985
53
Editorial: Software survey section
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 124 KB
Your tags:
english, 1985
54
Volume contents and author index, volume 35, 185
Journal:
Vacuum
Year:
1985
Language:
english
File:
PDF, 715 KB
Your tags:
english, 1985
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