Volume 45; Issue 4

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Vacuum
Volume 45; Issue 4

Vacuum

Volume 45; Issue 4

1

Publisher's note

Journal:

Year:

1994

Language:

english

File:

PDF, 36 KB

english, 1994

2

Introduction—analysis by a combination of ion-beam (accelerator based) and surface specific techniques (IB-SA93)

Journal:

Year:

1994

Language:

english

File:

PDF, 118 KB

english, 1994

3

Analysis of hydrogen isotopes in materials by secondary ion mass spectrometry and nuclear microanalysis

Journal:

Year:

1994

Language:

english

File:

PDF, 1.53 MB

english, 1994

4

RBS, AES and XPS analysis of ion beam induced nitridation of Si and SiGe alloys

W De Coster, B Brijs, H Bender, J Alay, W Vandervorst

Journal:

Year:

1994

Language:

english

File:

PDF, 900 KB

english, 1994

5

The nature of the state of hydrogen on the surface and in the bulk of natural and synthetic diamond (using ion beam techniques)

JPF Sellschop, SH Connell, CCP Madiba, E Sideras-haddad, S Kalbitzer, S Jans, P Oberschactsiek, K Bharuth-Ram, J Schneider, R Kiefl

Journal:

Year:

1994

Language:

english

File:

PDF, 695 KB

english, 1994

6

Energetic ion scattering analysis and glow discharge optical spectrometry characterization of amorphous hydrogenated carbon films elaborated by PACVD

T Petit, A Chevarier, N Chevarier, L Deshayes, M Charbonnier, M Romand

Journal:

Year:

1994

Language:

english

File:

PDF, 566 KB

english, 1994

7

Surface structure analysis by time-of-flight ISS: influence of primary ion nature and energy for scattering on Cu(110)

L Houssiau, P Bertrand

Journal:

Year:

1994

Language:

english

File:

PDF, 367 KB

english, 1994

8

AlTi reactive interdiffusion studied by STIMS and RBS

P Maugis, Y Serruys

Journal:

Year:

1994

Language:

english

File:

PDF, 532 KB

english, 1994

9

Machining influence on the surface of some roughness samples

L Popa-Simil, A Ivan, M Dumitru, E Ivanov, C Gornic, C Benea, V Dima

Journal:

Year:

1994

Language:

english

File:

PDF, 36 KB

english, 1994

10

Formation of CrSi2 studied by Rutherford backscattering spectrometry

S Tobbeche, C Benazzouz, N Boussaa, M Zilabdi, A Benouatas, A Bouabellou, R Halimi

Journal:

Year:

1994

Language:

english

File:

PDF, 186 KB

english, 1994

11

Characterization of IrO2SnO2 thin layers by electron and ion spectroscopies

M Rubel, R Haasch, P Mrozek, A Wieckowski, C De Pauli, S Trasatti

Journal:

Year:

1994

Language:

english

File:

PDF, 934 KB

english, 1994

12

Deuterium interaction with silicon-graphite materials exposed to the tokamak plasma

M Rubel, B Emmoth, P Wienhold, N Almqvist, CH Wu

Journal:

Year:

1994

Language:

english

File:

PDF, 681 KB

english, 1994

13

Redeposition effects on the target plates of the JET tokamak

JP Coad, B Farmery

Journal:

Year:

1994

Language:

english

File:

PDF, 578 KB

english, 1994

14

Characterization of titanium-aluminum nitride thin films by ion beam techniques and X-ray diffraction

FC Stedile, FL Freire Jr, WH Schreiner, IJR Baumvol

Journal:

Year:

1994

Language:

english

File:

PDF, 708 KB

english, 1994

15

Resolution enhancement of secondary ion microprobe images using Fourier deconvolution

H Wang, P Van Espen

Journal:

Year:

1994

Language:

english

File:

PDF, 389 KB

english, 1994

16

A study of the thermally induced carbonization of phenolformaldehyde by combined ion beam and surface specific analyses

D Ila, GM Jenkins, LR Holland, L Evelyn, H Jena

Journal:

Year:

1994

Language:

english

File:

PDF, 323 KB

english, 1994

17

Author index of articles

Journal:

Year:

1994

Language:

english

File:

PDF, 42 KB

english, 1994

18

Memory switching phenomena in thin films of chalcogenide semiconductors

NA Hegab, M Fadel, K Sedeek

Journal:

Year:

1994

Language:

english

File:

PDF, 356 KB

english, 1994

19

Nucleation and growth of Ta oxide in nonstationary thermal field—III. Self-organized structures controlled by convection

S Lugomer, M Stipančić

Journal:

Year:

1994

Language:

english

File:

PDF, 1.67 MB

english, 1994

20

Simulation of reactive sputtering from a concentric dual-source magnetron in roll-to-roll coating processes

CD Tsiogas, JN Avaritsiotis

Journal:

Year:

1994

Language:

english

File:

PDF, 1010 KB

english, 1994

21

Inhomogeneity in semiconductor films: an analysis from optical studies

AB Maity, D Bhattacharyya, S Chaudhuri, AK Pal

Journal:

Year:

1994

Language:

english

File:

PDF, 691 KB

english, 1994

22

Calculation of the relocation function's moments during low energy ion beam mixing

GV Kornich, VP Pintchuk

Journal:

Year:

1994

Language:

english

File:

PDF, 209 KB

english, 1994

23

Conference report

VE Yurasova, A Pisarev

Journal:

Year:

1994

Language:

english

File:

PDF, 120 KB

english, 1994

24

Conferences on related topics

Journal:

Year:

1994

Language:

english

File:

PDF, 261 KB

english, 1994

25

IUVSTA Welch scholarship

Journal:

Year:

1994

Language:

english

File:

PDF, 86 KB

english, 1994

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