Volume 46; Issue 2.3

IBM Journal of Research and Development

Volume 46; Issue 2.3

1

CMOS design near the limit of scaling

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 410 KB

english, 2002

2

Vertically scaled MOSFET gate stacks and junctions: How far are we likely to go?

Osburn, C. M., Kim, I., Han, S. K., De, I., Yee, K. F., Gannavaram, S., Lee, S. J., Lee, C.-H., Luo, Z. J., Zhu, W., Hauser, J. R., Kwong, D.-L., Lucovsky, G., Ma, T. P., Ozturk, M. C.

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 310 KB

english, 2002

3

Why BiCMOS and SOI BiCMOS?

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 179 KB

english, 2002

4

CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics

Wu, E. Y., Nowak, E. J., Vayshenker, A., Lai, W. L., Harmon, D. L.

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 263 KB

english, 2002

5

SOI technology for the GHz era

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 583 KB

english, 2002

6

Power-constrained CMOS scaling limits

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 369 KB

english, 2002

7

Challenges and future directions for the scaling of dynamic random-access memory (DRAM)

Mandelman, J. A., Dennard, R. H., Bronner, G. B., DeBrosse, J. K., Divakaruni, R., Li, Y., Radens, C. J.

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 982 KB

english, 2002

8

Reliability limits for the gate insulator in CMOS technology

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 274 KB

english, 2002

9

New insights into carrier transport in n-MOSFETs

Lochtefeld, A., Djomehri, I. J., Samudra, G., Antoniadis, D. A.

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 228 KB

english, 2002

10

Process modeling for future technologies

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 134 KB

english, 2002

11

Preparation of manuscripts for the IBM Journal of Research and Development

Guella, Graziano, Mancini, Ines, Pietra, Francesco

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 34 KB

english, 2002

12

Beyond the conventional transistor

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 2.08 MB

english, 2002

13

Preface

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 30 KB

english, 2002

14

Maintaining the benefits of CMOS scaling when scaling bogs down

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 498 KB

english, 2002

15

Effect of increasing chip density on the evolution of computer architectures

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 163 KB

english, 2002