IEEE Transactions on Semiconductor Manufacturing

1

Novel 4 GHz Interleaved SRAM Cells With Asymmetrical Precharge in 45 nm PDSOI Technology

Joshi, Rajiv V., Kanj, Rouwaida, Saroop, Sudesh

Journal:

Year:

2014

Language:

english

File:

PDF, 13.68 MB

english, 2014

2

Capability Assessment for Weibull In-Cell Touch Panel Manufacturing Processes With Variance Change

Yu-Ting Tai,, Wen Lea Pearn,, Kai-Bin Huang,, Lu-Wei Liao,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 9.43 MB

english, 2014

3

On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories

Covi, Erika, Cabrini, Alessandro, Vendrame, Loris, Bortesi, Luca, Gastaldi, Roberto, Torelli, Guido

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 19.77 MB

english, 2014

4

Modeling the Growth of Tin Dioxide Using Spray Pyrolysis Deposition for Gas Sensor Applications

Filipovic, Lado, Selberherr, Siegfried, Mutinati, Giorgio C., Brunet, Elise, Steinhauer, Stephan, Kock, Anton, Teva, Jordi, Kraft, Jochen, Siegert, Jorg, Schrank, Franz, Gspan, Christian, Grogger, Wer

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 22.09 MB

english, 2014

5

Investigation of Complex Looping Process for Thermosonic Wire Bonding

Fuliang Wang,, Yun Chen,, Lei Han,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 15.42 MB

english, 2014

6

Rapidly Void Detection in TSVs With 2-D X-Ray Imaging and Artificial Neural Networks

Fuliang Wang,, Feng Wang,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 7.71 MB

english, 2014

7

Characterization and Understanding of High Valued Polysilicon Resistor Resistance Variation Across a Resistor Bank With Parallel Resistor Fingers

Yuk Tsang,, Shiono, Ryoichi, Pfeffer, Gary, Kwan, Steven

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 8.34 MB

english, 2014

8

Influence of the On-Chip Metallization on Self-Heating in Integrated Power Technologies

Pfost, Martin, Boianceanu, Cristian, Lascau, Ioana, Simon, Dan-Ionut, Sosin, Sebastian

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 8.89 MB

english, 2014

9

Analysis of Soft Failures in Low-Resistance Interconnect Vias Using Doubly Nesting Arrays

Shinkawata, Hiroki, Sato, Shingo, Tsuda, Atsushi, Yoshizawa, Tomoaki, Ohno, Takio

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 8.86 MB

english, 2014

10

Analysis and Characterization of Capacitance Variation Using Capacitance Measurement Array

Peiyong Zhang,, Chenhui Feng,, Huiyan Wang,, Wentao Shan,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 2.05 MB

english, 2014

11

Variability Modeling and Process Optimization for the 32 nm BEOL Using In-Line Scatterometry Data

Faruk, M. Golam, Angyal, Matthew S., Ogunsola, Oluwafemi, Watts, David K., Wilkins, R.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 14.33 MB

english, 2014

12

Deposition of Charged Particles on a Flat Plate in Parallel Flow in the Presence of an Electric Field

Handol Lee,, Se-Jin Yook,, Kwan-Soo Lee,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 5.47 MB

english, 2014

13

Special Section on the 2013 International Conference on Microelectronic Test Structures (ICMTS)

Takeuchi, Kiyoshi

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 648 KB

english, 2014

14

Maintenance Scheduling of Plasma Etching Chamber in Wafer Fabrication for High-Yield Etching Process

Le Minh Duc,, Cher Ming Tan,, Ming Luo,, Leng, Ian Chan Hian

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 6.32 MB

english, 2014

15

Fault Detection via Sparse Representation for Semiconductor Manufacturing Processes

Likun Ren,, Weimin Lv,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 9.71 MB

english, 2014

16

Accurate Automatic Defect Detection Method Using Quadtree Decomposition on SEM Images

Youngjoo Lee,, Jeongjin Lee,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 12.23 MB

english, 2014

17

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

An-Chen Lee,, Jeng-Haur Horng,, Tzu-Wei Kuo,, Nan-Hung Chou,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 11.57 MB

english, 2014

18

Heavy Aluminum Wire Wedge Bonding Strength Prediction Using a Transducer Driven Current Signal and an Artificial Neural Network

Fuliang Wang,, Junhui Li,, Shaohua Liu,, Lei Han,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 11.25 MB

english, 2014

19

Petri Net-Based Optimal One-Wafer Cyclic Scheduling of Hybrid Multi-Cluster Tools in Wafer Fabrication

FaJun Yang,, NaiQi Wu,, Yan Qiao,, MengChu Zhou,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 7.15 MB

english, 2014

20

Temperature Distribution Analysis of CMOS LSI With On-Chip Sensing Device Arrays

Matsuda, Toshihiro, Hanai, Hiroki, Tohjo, Takeshi, Iwata, Hideyuki, Kondo, Daiji, Hatakeyama, Tomoyuki, Ishizuka, Masaru, Ohzone, Takashi

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 15.53 MB

english, 2014

21

myIEEE

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

File:

PDF, 771 KB

2014

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