M Horn-von Hoegen: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

51

Ultra-fast electron diffraction at surfaces: From nanoscale heat transport to driven phase transitions

Hanisch-Blicharski, A., Janzen, A., Krenzer, B., Wall, S., Klasing, F., Kalus, A., Frigge, T., Kammler, M., Horn-von Hoegen, M.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.43 MB

english, 2013

52

Al-induced faceting of Si(113)

Klein, Claudius, Heidmann, Inga, Nabbefeld, Tobias, Speckmann, Moritz, Schmidt, Thomas, Meyer zu Heringdorf, Frank-J., Falta, Jens, Horn-von Hoegen, Michael

Journal:

Surface Science

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

53

Manipulation of Electronic Transport in the Bi(111) Surface State

Jnawali, G., Klein, C., Wagner, Th., Hattab, H., Zahl, P., Acharya, D. P., Sutter, P., Lorke, A., Horn-von Hoegen, M.

Journal:

Physical Review Letters

Year:

2012

Language:

english

File:

PDF, 301 KB

english, 2012

54

Au Stabilization and Coverage of Sawtooth Facets on Si Nanowires Grown by Vapor−Liquid−Solid Epitaxy

Wiethoff, Christian, Ross, Frances M., Copel, Matthew, Horn-von Hoegen, Michael, Meyer zu Heringdorf, Frank-J.

Journal:

Year:

2008

Language:

english

File:

PDF, 565 KB

english, 2008

55

Towards perfect Ge δ layers on Si(001)

Falta, J., Bahr, D., Materlik, G., Müller, B. H., Horn-von Hoegen, M.

Journal:

Applied Physics Letters

Year:

1996

Language:

english

File:

PDF, 331 KB

english, 1996

56

Reciprocal space mapping by spot profile analyzing low energy electron diffraction

Meyer zu Heringdorf, Frank-J., Horn-von Hoegen, Michael

Journal:

Review of Scientific Instruments

Year:

2005

Language:

english

File:

PDF, 690 KB

english, 2005

57

Surfactant-mediated epitaxy of Ge on Si(111): Beyond the surface

Schmidt, Th., Kröger, R., Clausen, T., Falta, J., Janzen, A., Kammler, M., Kury, P., Zahl, P., Horn-von Hoegen, M.

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 814 KB

english, 2005

58

Stress reduction and interface quality of buried Sb δ doping layers on Si(001)

Falta, J., Bahr, D., Hille, A., Materlik, G., Kammler, M., Horn-von Hoegen, M.

Journal:

Applied Physics Letters

Year:

1996

Language:

english

File:

PDF, 443 KB

english, 1996

59

Thermal activation of dislocation array formation

Janzen, A., Dumkow, I., Horn-von Hoegen, M.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 490 KB

english, 2001

60

Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction

Krenzer, B., Hanisch-Blicharski, A., Schneider, P., Payer, Th., Möllenbeck, S., Osmani, O., Kammler, M., Meyer, R., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2009

Language:

english

File:

PDF, 937 KB

english, 2009

61

Nucleation and initial growth in the semimetallic homoepitaxial system of Bi on Bi(111)

Jnawali, G., Wagner, Th., Hattab, H., Möller, R., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2009

Language:

english

File:

PDF, 282 KB

english, 2009

62

Thermal response of epitaxial thin Bi films on Si(001) upon femtosecond laser excitation studied by ultrafast electron diffraction

Hanisch, A., Krenzer, B., Pelka, T., Möllenbeck, S., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2008

Language:

english

File:

PDF, 386 KB

english, 2008

63

Homoepitaxial growth of Bi(111)

Jnawali, G., Hattab, H., Bobisch, C. A., Bernhart, A., Zubkov, E., Möller, R., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2008

Language:

english

File:

PDF, 1.27 MB

english, 2008

64

Real-Time View of Mesoscopic Surface Diffusion

Roos, K. R., Roos, K. L., Lohmar, I., Wall, D., Krug, J., Horn-von Hoegen, M., Meyer zu Heringdorf, F.-J.

Journal:

Physical Review Letters

Year:

2008

Language:

english

File:

PDF, 665 KB

english, 2008

65

Surfactant induced reversible changes of surface morphology

Horn-von Hoegen, M., Müller, B. H., Al-Falou, A., Henzler, M.

Journal:

Physical Review Letters

Year:

1993

Language:

english

File:

PDF, 836 KB

english, 1993

66

Spatial Variation of Au Coverage as the Driving Force for Nanoscopic Pattern Formation

Meyer zu Heringdorf, Frank-J., Schmidt, Th., Heun, S., Hild, R., Zahl, P., Ressel, B., Bauer, E., Horn-von Hoegen, M.

Journal:

Physical Review Letters

Year:

2001

Language:

english

File:

PDF, 340 KB

english, 2001

67

phase transition is first-order

Klasing, F., Frigge, T., Hafke, B., Krenzer, B., Wall, S., Hanisch-Blicharski, A., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2014

Language:

english

File:

PDF, 587 KB

english, 2014

68

Frigge et al. Reply:

Frigge, T., Wall, S., Krenzer, B., Wippermann, St., Sanna, S., Klasing, F., Hanisch-Blicharski, A., Kammler, M., Schmidt, W. G., Horn-von Hoegen, M.

Journal:

Physical Review Letters

Year:

2013

Language:

english

File:

PDF, 404 KB

english, 2013

69

Step and kink correlations on vicinal Ge(100) surfaces investigated by electron diffraction

Tegenkamp, C., Wollschläger, J., Pfnür, H., Meyer zu Heringdorf, F.-J., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2002

Language:

english

File:

PDF, 849 KB

english, 2002

70

Fringe fields in nonlinear photoemission microscopy

Chelaru, L. I., Horn-von Hoegen, M., Thien, D., Meyer zu Heringdorf, F.-J.

Journal:

Physical Review B

Year:

2006

Language:

english

File:

PDF, 309 KB

english, 2006

71

Ag-induced multistep formation on Si(001)

Fölsch, S., Winau, D., Meyer, G., Rieder, K. H., Horn-von Hoegen, M., Schmidt, T., Henzler, M.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 546 KB

english, 1995

72

Precise calibration for surface stress induced optical deflection measurements

Kury, P., Zahl, P., Hoegen, M. Horn-von

Journal:

Review of Scientific Instruments

Year:

2004

Language:

english

File:

PDF, 545 KB

english, 2004

73

Adsorbate Induced Change of Equilibrium Surface during Crystal Growth: Si on Si(111)/H

Horn-von Hoegen, Michael, Golla, Anke

Journal:

Physical Review Letters

Year:

1996

Language:

english

File:

PDF, 145 KB

english, 1996

74

Ultrathin epitaxially grown bismuth (111) membranes

Payer, T., Rajković, I., Ligges, M., von der Linde, D., Horn-von Hoegen, M., Meyer zu Heringdorf, F.-J.

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 446 KB

english, 2008

75

Strain-relief mechanism in surfactant-grown epitaxial germanium films on Si(111)

LeGoues, F. K., Horn-Von Hoegen, M., Copel, M., Tromp, R. M.

Journal:

Physical Review B

Year:

1991

Language:

english

File:

PDF, 2.77 MB

english, 1991

76

Lattice-matching periodic array of misfit dislocations: Heteroepitaxy of Bi(111) on Si(001)

Jnawali, G., Hattab, H., Meyer zu Heringdorf, F.-J., Krenzer, B., Horn-von Hoegen, M.

Journal:

Physical Review B

Year:

2007

Language:

english

File:

PDF, 1.95 MB

english, 2007

77

Atomistic Picture of Charge Density Wave Formation at Surfaces

Wall, Simone, Krenzer, Boris, Wippermann, Stefan, Sanna, Simone, Klasing, Friedrich, Hanisch-Blicharski, Anja, Kammler, Martin, Schmidt, Wolf Gero, Horn-von Hoegen, Michael

Journal:

Physical Review Letters

Year:

2012

Language:

english

File:

PDF, 2.53 MB

english, 2012

78

Third-generation conical spot profile analyzing low-energy electron diffraction

P. Zahl, M. Horn-von Hoegen

Year:

2002

Language:

english

File:

PDF, 1002 KB

english, 2002

79

Strain relief during Ge hut cluster formation on Si(001) studied by high-resolution LEED and surface-stress-induced optical deflection

Horn-von Hoegen, M., Müller, B. H., Grabosch, T., Kury, P.

Journal:

Physical Review B

Year:

2004

Language:

english

File:

PDF, 1.01 MB

english, 2004

80

Reconstruction-dependent orientation of Ag(111) films on Si(001)

Fölsch, S., Meyer, G., Winau, D., Rieder, K. H., Horn-von Hoegen, M., Schmidt, T., Henzler, M.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 729 KB

english, 1995

81

Mode conversion and long-lived vibrational modes in lead monolayers on silicon (111) after femtosecond laser excitation: A molecular dynamics simulation

Sakong, Sung, Kratzer, Peter, Wall, Simone, Kalus, Annika, Horn-von Hoegen, Michael

Journal:

Physical Review B

Year:

2013

Language:

english

File:

PDF, 4.14 MB

english, 2013

82

Comparing ultrafast surface and bulk heating using time-resolved electron diffraction

Streubühr, C., Kalus, A., Zhou, P., Ligges, M., Hanisch-Blicharski, A., Kammler, M., Bovensiepen, U., Horn-von Hoegen, M., von der Linde, D.

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 513 KB

english, 2014

83

Compact and transferable threefold evaporator for molecular beam epitaxy in ultrahigh vacuum

Kury, P., Hild, R., Thien, D., Günter, H.-L., Meyer zu Heringdorf, F.-J., Hoegen, M. Horn-von

Journal:

Review of Scientific Instruments

Year:

2005

Language:

english

File:

PDF, 775 KB

english, 2005

84

Silver induced faceting of Si(112)

Nabbefeld, T., Wiethoff, C., Meyer zu Heringdorf, F.-J., Horn-von Hoegen, M.

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 2.65 MB

english, 2010

85

Scattering at magnetic and nonmagnetic impurities on surfaces with strong spin-orbit coupling

Lükermann, D., Sologub, S., Pfnür, H., Klein, C., Horn-von Hoegen, M., Tegenkamp, C.

Journal:

Physical Review B

Year:

2012

Language:

english

File:

PDF, 1.47 MB

english, 2012

86

Enhanced Sb segregation in surfactant-mediated-heteroepitaxy: High-mobility, low-doped Ge on Si

Reinking, D., Kammler, M., Horn-von Hoegen, M., Hofmann, K. R.

Journal:

Applied Physics Letters

Year:

1997

Language:

english

File:

PDF, 247 KB

english, 1997

87

Lost in reciprocal space? Determination of the scattering condition in spot profile analysis low-energy electron diffraction

Klein, C., Nabbefeld, T., Hattab, H., Meyer, D., Jnawali, G., Kammler, M., zu Heringdorf, F.-J. Meyer, Golla-Franz, A., Müller, B. H., Schmidt, Th., Henzler, M., Horn-von Hoegen, M.

Journal:

Review of Scientific Instruments

Year:

2011

Language:

english

File:

PDF, 856 KB

english, 2011

88

Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures

Kury, P., Zahl, P., Horn-von Hoegen, M., Voges, C., Frischat, H., Günter, H.-L., Pfnür, H., Henzler, M.

Journal:

Review of Scientific Instruments

Year:

2004

Language:

english

File:

PDF, 1.25 MB

english, 2004

89

Epitaxial Ag wires with a single grain boundary for electromigration

Sindermann, S., Witt, C., Spoddig, D., Hoegen, M. Horn-von, Dumpich, G., Heringdorf, F.-J. Meyer zu

Journal:

Review of Scientific Instruments

Year:

2011

Language:

english

File:

PDF, 803 KB

english, 2011

90

Surfactants in Si(111) homoepitaxy

Horn-von Hoegen, M., Falta, J., Copel, M., Tromp, R. M.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 281 KB

english, 1995

91

Epitaxial growth of the topological insulator Bi2Se3 on Si(111): Growth mode, lattice parameter, and strain state

Vyshnepolsky, M., Klein, C., Klasing, F., Hanisch-Blicharski, A., Horn-von Hoegen, M.

Journal:

Applied Physics Letters

Year:

2013

Language:

english

File:

PDF, 2.01 MB

english, 2013

92

Less Strain Energy despite Fewer Misfit Dislocations: The Impact of Ordering

Schmidt, Th., Kröger, R., Flege, J. I., Clausen, T., Falta, J., Janzen, A., Zahl, P., Kury, P., Kammler, M., Horn-von Hoegen, M.

Journal:

Physical Review Letters

Year:

2006

Language:

english

File:

PDF, 429 KB

english, 2006

93

Defect self-annihilation in surfactant-mediated epitaxial growth

Horn-von Hoegen, M., LeGoues, F. K., Copel, M., Reuter, M. C., Tromp, R. M.

Journal:

Physical Review Letters

Year:

1991

Language:

english

File:

PDF, 536 KB

english, 1991

94

Domain Sensitive Contrast in Photoelectron Emission Microscopy

Thien, D., Kury, P., Horn-von Hoegen, M., Meyer zu Heringdorf, F.-J., van Heys, J., Lindenblatt, M., Pehlke, E.

Journal:

Physical Review Letters

Year:

2007

Language:

english

File:

PDF, 1.15 MB

english, 2007

95

Space charge effects in photoemission electron microscopy using amplified femtosecond laser pulses

Buckanie, N M, Göhre, J, Zhou, P, von der Linde, D, Horn-von Hoegen, M, Meyer zu Heringdorf, F-J

Journal:

Journal of Physics Condensed Matter

Year:

2009

Language:

english

File:

PDF, 1.19 MB

english, 2009

96

Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons

Kahl, Philip, Wall, Simone, Witt, Christian, Schneider, Christian, Bayer, Daniela, Fischer, Alexander, Melchior, Pascal, Horn-von Hoegen, Michael, Aeschlimann, Martin, Meyer zu Heringdorf, Frank-J.

Journal:

Year:

2014

Language:

english

File:

PDF, 4.74 MB

english, 2014

97

X-Ray Characterization of Buried δ Layers

Falta, J., Bahr, D., Materlik, G., Müller, B. H., Horn-Von Hoegen, M.

Journal:

Surface Review and Letters

Year:

1998

Language:

english

File:

PDF, 349 KB

english, 1998

98

LEEM / PEEM Study of Anisotropic Diffusion Fields in the Ag/Si(001) System

Wall, Dirk, Roos, Kelly Ryan, Horn-von Hoegen, Michael, Meyer zu Heringdorf, Frank-Joachim

Journal:

MRS Proceedings

Year:

2008

Language:

english

File:

PDF, 518 KB

english, 2008

99

Extreme Phonon Softening in Laser-excited Bismuth – Towards an Inverse Peierls-transition

Lu, Wei, Nicoul, Matthieu, Shymanovich, Uladzimir, Tarsevitch, Alexander, Kammler, Martin, Horn-von Hoegen, Michael, von der Linde, Dietrich, Sokolowski-Tinten, Klaus

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 196 KB

english, 2009

100

Ultra-fast Time-Resolved Electron Diffraction of Strongly Driven Phase Transitions on Silicon Surfaces

Möllenbeck, Simone, Hanisch-Blicharski, Anja, Schneider, Paul, Ligges, Manuel, Zhou, Ping, Kammler, Martin, Krenzer, Boris, Horn-von Hoegen, Michael

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 1024 KB

english, 2009