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51

Relation between mating or ovulation and the duration of gestation in dogs

Toshihiko Tsutsui, Tatusya Hori, Nobuyuki Kirihara, Eiichi Kawakami, P.W. Concannon

Journal:

Year:

2006

Language:

english

File:

PDF, 140 KB

english, 2006

52

Receptors for C-type natriuretic peptide in cultured rat glial cells

Hideyuki Kobayashi, Tsunetaka Mizuki, Masato Tsutsui, Kouichiro Minami, Nobuyuki Yanagihara, Tomoaki Yuhi, Futoshi Izumi

Journal:

Year:

1993

Language:

english

File:

PDF, 331 KB

english, 1993

53

Stimulation of norepinephrine transporter function by fasudil, a Rho kinase inhibitor, in cultured bovine adrenal medullary cells

Noriaki Satoh, Yumiko Toyohira, Hideaki Itoh, Han Zhang, Susumu Ueno, Masato Tsutsui, Kojiro Takahashi, Nobuyuki Yanagihara

Journal:

Naunyn-Schmiedeberg's Archives of Pharmacology

Year:

2012

Language:

english

File:

PDF, 451 KB

english, 2012

54

Cementogenic potential of multipotential mesenchymal stem cells purified from the human periodontal ligament

Torii, Daisuke, Konishi, Kiyoshi, Watanabe, Nobuyuki, Goto, Shinichi, Tsutsui, Takeki

Journal:

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

55

Gate Technology Contributions to Collapse of Drain Current in AlGaN/GaN Schottky HEMT

Kawanago, Takamasa, Kakushima, Kuniyuki, Kataoka, Yoshinori, Nishiyama, Akira, Sugii, Nobuyuki, Wakabayashi, Hitoshi, Tsutsui, Kazuo, Natori, Kenji, Iwai, Hiroshi

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.72 MB

english, 2014

56

Behavioral roles of the striatonigral neural pathway in reinforcement learning

Fukabori, Ryoji, Kai, Nobuyuki, Kobayashi, Kenta, Okada, Kana, Yasoshima, Yasunobu, Tsutsui, Yuji, Kobayashi, Kazuto

Journal:

Neuroscience Research

Year:

2009

Language:

english

File:

PDF, 97 KB

english, 2009

57

Striatal direct pathway modulates response time in execution of conditional discrimination

Fukabori, Ryoji, Okada, Kana, Nishizawa, Kayo, Kai, Nobuyuki, Kobayashi, Kenta, Uchigashima, Motokazu, Watanabe, Masahiko, Tsutsui, Yuji, Kobayashi, Kazuto

Journal:

Neuroscience Research

Year:

2011

Language:

english

File:

PDF, 127 KB

english, 2011

58

The role of dopamine D2 receptor-expressing neurons in the nucleus accumbens core in operant matching

Kai, Nobuyuki, Fukabori, Ryoji, Tsutsui, Yuji, Uchigashima, Motokazu, Watanebe, Masahiko, Shiota, Akira, Ueda, Masatsugu, Kobayashi, Kazuto

Journal:

Neuroscience Research

Year:

2010

Language:

english

File:

PDF, 82 KB

english, 2010

59

Amelioration of reversal learning caused by the loss of cholinergic interneuron in the dorsomedial striatum

Okada, Kana, Kai, Nobuyuki, Shiota, Akira, Ueda, Masatsugu, Tsutsui, Yuji, Kobayashi, Kazuto

Journal:

Neuroscience Research

Year:

2010

Language:

english

File:

PDF, 69 KB

english, 2010

60

Lesions of the nucleus accumbens core modulate development of matching behavior

Kai, Nobuyuki, Tsutsui, Yuji, Kobayashi, Kazuto

Journal:

BMC Neuroscience

Year:

2014

Language:

english

File:

PDF, 484 KB

english, 2014

61

Nuclear Magnetic Moment of the First Excited State ( I = 2 + ) of 238 U

Tsutsui, Satoshi, Nasu, Saburo, Nakada, Masami, Masaki, Nobuyuki M., Saeki, Masakatsu, Ikushima, Kenji, Yasuoka, Hiroshi, Nakamura, Akio

Journal:

Journal of the Physical Society of Japan

Year:

1998

Language:

english

File:

PDF, 174 KB

english, 1998

62

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Effect of Oxygen for Ultra-Thin La2O3 Film Deposition

Tachi, Kiichi, Iwai, H., Hattori, Takeo, Sugii, Nobuyuki, Tsutsui, Kazuo, Ahemt, Parhat, Kakushima, Kuniyuki

Year:

2006

Language:

english

File:

PDF, 203 KB

english, 2006

63

Enhanced flexibility of place discrimination learning by targeting striatal cholinergic interneurons

Okada, Kana, Nishizawa, Kayo, Fukabori, Ryoji, Kai, Nobuyuki, Shiota, Akira, Ueda, Masatsugu, Tsutsui, Yuji, Sakata, Shogo, Matsushita, Natsuki, Kobayashi, Kazuto

Journal:

Nature Communications

Year:

2014

Language:

english

File:

PDF, 2.70 MB

english, 2014

64

Multi-Scale Monte Carlo Simulation of Soft Errors Using PHITS-HyENEXSS Code System

Abe, Shin-ichiro, Watanabe, Yukinobu, Shibano, Nozomi, Sano, Nobuyuki, Furuta, Hiroshi, Tsutsui, Masafumi, Uemura, Taiki, Arakawa, Takahiko

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 962 KB

english, 2012

65

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system

Abe, Shin-ichiro, Watanabe, Yukinobu, Shibano, Nozomi, Sano, Nobuyuki, Furuta, Hiroshi, Tsutsui, Masafumi, Uemura, Taiki, Arakawa, Takahiko

Year:

2011

Language:

english

File:

PDF, 1.12 MB

english, 2011

66

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Neutron-induced soft error analysis in MOSFETs from a 65nm to a 25 nm design rule using multi-scale Monte Carlo simulation method

Abe, Shin-ichiro, Watanabe, Yukinobu, Shibano, Nozomi, Sano, Nobuyuki, Furuta, Hiroshi, Tsutsui, Masafumi, Uemura, Taiki, Arakawa, Takahiko

Year:

2012

Language:

english

File:

PDF, 627 KB

english, 2012

67

Hole Mobility of Fluorene-Based Dyes

Era, Masanao, Kakiyama, Nobuyuki, Noto, Mitsuharu, Lee, Sang Ho, Tsutsui, Tetsuo

Journal:

Molecular Crystals and Liquid Crystals Science and Technology Section A Molecular Crystals and Liquid Crystals

Year:

2001

Language:

english

File:

PDF, 158 KB

english, 2001

68

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - La-based oxides for high-k gate dielectric application

Ahmet, Parhat, Kakushima, Kuniyuki, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, Hiroshi

Year:

2006

Language:

english

File:

PDF, 143 KB

english, 2006

69

Significance of nitric oxide synthases: Lessons from triple nitric oxide synthases null mice

Tsutsui, Masato, Tanimoto, Akihide, Tamura, Masahito, Mukae, Hiroshi, Yanagihara, Nobuyuki, Shimokawa, Hiroaki, Otsuji, Yutaka

Journal:

Journal of Pharmacological Sciences

Year:

2015

Language:

english

File:

PDF, 2.97 MB

english, 2015

70

ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - Electrical Properties of Rare-Earth Oxides and La

Kouda, Miyuki, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2011

Language:

english

File:

PDF, 705 KB

english, 2011

71

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Annealing Effect on the Electrical Properties of La

Kanda, Takashi, Zade, Dariush, Lin, Yueh C., Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Chang, Edward Y., Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2011

Language:

english

File:

PDF, 167 KB

english, 2011

72

ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Fabrication of SB-MOSFETs on SOI Substrate Using Ni Silicide Containing Er Interlayer

Hosoda, Wataru, Ozawa, Kenji, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2010

Language:

english

File:

PDF, 277 KB

english, 2010

73

[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Annealing Reaction for Ni Silicidation of Si Nanowire

Arai, Hideaki, Kamimura, Hideyuki, Sato, Soshi, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2009

Language:

english

File:

PDF, 873 KB

english, 2009

74

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Characterization of Metal Schottky Junction for In

Hosoi, Ryuji, Suzuki, Yuya, Zadeh, Darius, Kakushima, Kuniyuki, Ahmet, Parhat, Kataoka, Yoshinori, Nishiyama, Akira, Sugii, Nobuyuki, Tsutsui, Kazuo, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2012

Language:

english

File:

PDF, 329 KB

english, 2012

75

ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Electrical Characteristics of Rare Earth (La, Ce, Pr and Tm) Oxides/Silicates Gate Dielectric

Matano, Katsuya, Funamizu, Kiyohisa, Kouda, Miyuki, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2010

Language:

english

File:

PDF, 168 KB

english, 2010

76

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Electrical Characteristics of Metal/High-k MOS Devices Using Effective Oxygen Control for Sub-1nm EOT

Okamoto, Koichi, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Chandorkar, Arun, Hattori, Takeo, Iwai, H.

Year:

2008

Language:

english

File:

PDF, 675 KB

english, 2008

77

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - TiN/W/La

Ahmet, Parhat, Kitayama, D., Kaneda, T., Suzuki, T., Koyanagi, T., Kouda, M., Mamatrishat, M., Kawanago, T., Kakushima, Kuniyuki, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hatt

Year:

2011

Language:

english

File:

PDF, 222 KB

english, 2011

78

ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - Dependence of Interface-State Density on Three Dimensional Silicon Structure Measured by Charge-Pumping Method

Nakajima, Kazuhiro, Sato, Soshi, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2011

Language:

english

File:

PDF, 221 KB

english, 2011

79

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Evaluation of Interfacial State Density of MOS Capacitor with Three-Dimensional Channel by Conductance Method

Li, Wei, Nakajima, Kazuhiro, Dou, Chunmeng, Kakushima, Kuniyuki, Ahmet, Parhat, Nishiyama, Akira, Sugii, Nobuyuki, Tsutsui, Kazuo, Kataoka, Yoshinori, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2012

Language:

english

File:

PDF, 330 KB

english, 2012

80

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Metal Inserted Poly-Si Stacks with La

Kawanago, Takamasa, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2011

Language:

english

File:

PDF, 264 KB

english, 2011

81

Effects of N[sub 2]-Based Annealing on the Reliability Characteristics of Tungsten/La[sub 2]O[sub 3]/Silicon Capacitors

Molina, Joel, Tachi, Kiichi, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, Hiroshi

Journal:

Journal of The Electrochemical Society

Year:

2007

Language:

english

File:

PDF, 388 KB

english, 2007

82

[ECS ISTC/CSTIC 2009 (CISTC) - Shanghai, China (March 19 - March 20, 2009)] ECS Transactions - Electrical Characterization of W/Hfo2 MOSFETs with La2O3 Incorporation

Fujisawa, Hiroki, Srivastava, Asutosh, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Sarkar, Chandan K., Iwai, Hiroshi

Year:

2009

Language:

english

File:

PDF, 431 KB

english, 2009

83

[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Al/La2O3 Analysis of Post Metallization Annealed MISFET by XPS

Kuroki, Yusuke, Ng, Jin Aun, Kakushima, Kuniyuki, Sugii, Nobuyuki, Tsutsui, Kazuo, Iwai, H.

Year:

2006

Language:

english

File:

PDF, 337 KB

english, 2006

84

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Effect of Ultrathin Si Passivation Layer for Ge MOS Structure with La

Song, Jaeyeol, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, H.

Year:

2008

Language:

english

File:

PDF, 761 KB

english, 2008

85

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Electrical Properties of Yttrium-Titanium Oxide High-k Gate Dielectric on Ge

Bera, Milan K., Ahmet, P., Kakushima, K., Tsutsui, K., Sugii, Nobuyuki, Nishiyama, Akira, Hattori, T., Iwai, H.

Year:

2010

Language:

english

File:

PDF, 279 KB

english, 2010

86

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Effect of Remote-Surface-Roughness Scattering on Electron Mobility in MOSFETs with High-k Dielectrics

Mamatrishat, Mamat, Kouda, Miyuki, Kawanago, Takamasa, Kakushima, K., Ahmet, P., Aierken, Abuliemu, Tsutsui, K., Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Iwai, H.

Year:

2010

Language:

english

File:

PDF, 181 KB

english, 2010

87

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Impact of Thin La2O3 Insertion for HfO2 MOSFET

Kakushima, Kuniyuki, Okamoto, Kouichi, Adachi, Manabu, Tachi, Kiichi, Sato, Soushi, Kawanago, Takamasa, Song, Jaeyeol, Ahmet, Parhat, Sugii, Nobuyuki, Tsutsui, Kazuo, Hattori, Takeo, Iwai, Hiroshi

Year:

2008

Language:

english

File:

PDF, 796 KB

english, 2008

88

Influence of Structural Parameters on Electrical Characteristics of Schottky Tunneling Field-Effect Transistor and Its Scalability

Wu, Yan, Dou, Chunmeng, Wei, Feng, Kakushima, Kuniyuki, Ohmori, Kenji, Ahmet, Parhat, Watanabe, Takanobu, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Yamada, Keisaku, Kataoka, Yo

Journal:

Japanese Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 744 KB

english, 2013

89

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Impact of Alkali-Earth-Elements Incorporation on V

Koyanagi, Tomotsune, Kakushima, K., Ahmet, P., Tsutsui, K., Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, T., Iwai, H.

Year:

2010

Language:

english

File:

PDF, 270 KB

english, 2010

90

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - TiN Capping Effect on High Temperature Annealed RE-Oxide MOS Capacitors for Scaled EOT

Kitayama, Daisuke, Koyanagi, Tomotsune, Kakushima, K., Ahmet, P., Tsutsui, K., Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, T., Iwai, H.

Year:

2010

Language:

english

File:

PDF, 232 KB

english, 2010

91

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Leakage Current Characteristics of Ultra-Shallow Junctions Formed by B

Sauddin, Hendriansyah, Sasaki, Yuichiro, Ito, Hiroyuki, Mizuno, Bunji, Ahmet, Parhat, Kakushima, Kuniyuki, Sugii, Nobuyuki, Tsutsui, Kazuo, Iwai, Hiroshi

Year:

2006

Language:

english

File:

PDF, 289 KB

english, 2006

92

[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Electrical Properties of Lanthanum-scandate Gate Dielectric Directly Deposited on Ge

Bera, M.K. K., Song, J., Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, Hiroshi

Year:

2009

Language:

english

File:

PDF, 878 KB

english, 2009

93

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Study on Stress Memorization by Argon Implantation and Annealing

Hino, Masafumi, Nagata, Kouki, Yoshida, Tetsuya, Kosemura, Daisuke, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Ogura, Atsushi, Hattori, Takeo, Iwai, H.

Year:

2008

Language:

english

File:

PDF, 1.70 MB

english, 2008

94

Silicate Reaction Control at Lanthanum Oxide and Silicon Interface for Equivalent Oxide Thickness of 0.5 nm: Adjustment of Amount of Residual Oxygen Atoms in Metal Layer

Kitayama, Daisuke, Kubota, Toru, Koyanagi, Tomotsune, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Journal:

Japanese Journal of Applied Physics

Year:

2011

Language:

english

File:

PDF, 659 KB

english, 2011

95

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Observation of Tunneling FET Operation in MOSFET with NiSi/Si Schottky Source/Channel Interface

Wu, Yan, Shigemori, Naoto, Sato, Soushi, Kakushima, K., Ahmet, P., Tsutsui, K., Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, T., Iwai, H.

Year:

2011

Language:

english

File:

PDF, 872 KB

english, 2011

96

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Suppression of Lateral Encroachment of Ni Silicide into Si Nanowires Using Nitrogen Incorporation

Shigemori, Naoto, Satou, Sousi, Kakushima, K., Ahmet, P., Tsutsui, K., Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, T., Iwai, H.

Year:

2011

Language:

english

File:

PDF, 576 KB

english, 2011

97

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - La2O3 Gate Dielectric Thin Film with Sc2O3 Buffer Layer for High Temperature Annealing

Shiino, Yasuhiro, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, H.

Year:

2006

Language:

english

File:

PDF, 163 KB

english, 2006

98

[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Electrical Breakdown and Reliability of Metal Gate - La2O3 Thin Films after Post Deposition Annealing in N2

Molina, Joel, Tsutsui, Kazuo, Iwai, H., Kakushima, Kuniyuki, Sugii, Nobuyuki, Ahmet, Parhat

Year:

2006

Language:

english

File:

PDF, 667 KB

english, 2006

99

[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Improvement of Interface Properties of W/La2O3/Si MOS Structure Using Al Capping Layer

Tachi, Kiichi, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, Hiroshi

Year:

2007

Language:

english

File:

PDF, 516 KB

english, 2007

100

ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Performance of Silicon Ballistic Nanowire MOSFET with Diverse Orientations and Diameters

Abudukelimu, Abudureheman, Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Nishiyama, Akira, Sugii, Nobuyuki, Natori, Kenji, Hattori, Takeo, Iwai, Hiroshi

Year:

2010

Language:

english

File:

PDF, 157 KB

english, 2010

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