Tsiatouhas, Y.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

51

[IEEE Comput. Soc 2002 3rd International Symposium on Quality Electronic Design - San Jose, CA, USA (18-21 March 2002)] Proceedings International Symposium on Quality Electronic Design - Extending the viability of I/sub DDQ/ testing in the deep submicron era

Tsiatouhas, Y., Haniotakis, Th., Nicolos, D., Arapoyanni, A.

Year:

2002

Language:

english

File:

PDF, 298 KB

english, 2002

52

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Double node charge sharing SEU tolerant latch design

Katsarou, Katerina, Tsiatouhas, Yiorgos

Year:

2014

File:

PDF, 583 KB

2014

53

[IEEE 2012 19th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2012) - Seville, Seville, Spain (2012.12.9-2012.12.12)] 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - Testing wireless transceivers' RF front-ends utilizing defect-oriented BIST techniques

Dermetzoglou, L., Liaperdos, J., Arapoyanni, A., Tsiatouhas, Y.

Year:

2012

Language:

english

File:

PDF, 470 KB

english, 2012

54

[IEEE 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Liberec, Czech Republic (2009.04.15-2009.04.17)] 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing

Sfikas, Yiorgos, Tsiatouhas, Yiorgos

Year:

2009

Language:

english

File:

PDF, 575 KB

english, 2009

55

Built-In Self-Test, Diagnosis, and Repair of MultiMode Power Switches

Wang, Ran, Zhang, Zhaobo, Kavousianos, Xrysovalantis, Tsiatouhas, Yiorgos, Chakrabarty, Krishnendu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 1.41 MB

english, 2014

56

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - A BIST scheme for testing and repair of multi-mode power switches

Zhang, Zhaobo, Kavousianos, Xrysovalantis, Tsiatouhas, Yiorgos, Chakrabarty, Krishnendu

Year:

2011

Language:

english

File:

PDF, 493 KB

english, 2011

57

[IEEE 2000 Southwest Symposium on Mixed-Signal Design - San Diego, CA, USA (27-29 Feb. 2000)] 2000 Southwest Symposium on Mixed-Signal Design (Cat. No.00EX390) - A class of easily path delay fault testable circuits

Haniotakis, T., Kalligeros, E., Nikolos, D., Sidiropulos, G., Tsiatouhas, Y., Vergos, H.T.

Year:

2000

Language:

english

File:

PDF, 516 KB

english, 2000

58

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - A Scan Flip-Flop for Low-Power Scan Operation

Tsiatouhas, Yiorgos, Arapoyanni, Angela, Skias, Dionisis

Year:

2007

Language:

english

File:

PDF, 1.38 MB

english, 2007

59

[IEEE 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - Grenoble, France (Sept. 12-16, 2005)] Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - A built-in I/sub DDQ/ testing circuit

Matakias, S., Tsiatouhas, Y., Arapoyanni, A., Haniotakis, Th., Prenat, G., Mir, S.

Year:

2005

Language:

english

File:

PDF, 236 KB

english, 2005

60

[IEEE Comput. Soc 2000 IEEE International Workshop on Defect Based Testing - Montreal, Que., Canada (30 April 2000)] Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637) - A new scheme for effective I/sub DDQ/ testing in deep submicron

Tsiatouhas, Y., Moisiadis, Y., Haniotakis, T., Nikolos, D., Arapoyanni, A.

Year:

2000

Language:

english

File:

PDF, 456 KB

english, 2000

61

Adjustable RF Mixers' Alternate Test Efficiency Optimization by the Reduction of Test Observables

Liaperdos, John, Arapoyanni, Angela, Tsiatouhas, Yiorgos

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 1.01 MB

english, 2013

62

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - NBTI aging tolerance in pipeline based designs NBTI

Katsarou, Katerina, Tsiatouhas, Yiorgos, Arapoyanni, Angela

Year:

2013

File:

PDF, 232 KB

2013

63

[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - A Built-In Self-Test Scheme for Differential Ring Oscillators

Dermentzoglou, L., Tsiatouhas, Y., Arapoyanni, A.

Year:

2005

Language:

english

File:

PDF, 607 KB

english, 2005

64

A Design Technique for Energy Reduction in NORA CMOS Logic

Limniotis, Konstantinos, Tsiatouhas, Yiorgos, Haniotakis, Themistoklis, Arapoyanni, Angela

Journal:

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications

Year:

2006

Language:

english

File:

PDF, 786 KB

english, 2006

65

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Stuck-at fault diagnosis in scan chains

Dounavi, Helen-Maria, Tsiatouhas, Yiorgos

Year:

2014

Language:

english

File:

PDF, 317 KB

english, 2014

66

[IEEE 2006 13th IEEE International Conference on Electronics, Circuits and Systems - Nice, France (2006.12.10-2006.12.13)] 2006 13th IEEE International Conference on Electronics, Circuits and Systems - A Pipeline Architecture Incorporating a Low-Cost Error Detection and Correction Mechanism

Floros, A., Tsiatouhas, Y., Arapoyanni, A., Haniotakis, Th.

Year:

2006

Language:

english

File:

PDF, 380 KB

english, 2006

67

[IEEE Comput. Soc Seventh International On-Line Testing Workshop. IOLTW 2001 - Taormina, Italy (9-11 July 2001)] Proceedings Seventh International On-Line Testing Workshop - Concurrent detection of soft errors based on current monitoring

Tsiatouhas, Y., Haniotakis, T., Nikolos, D., Efstathiou, C.

Year:

2001

Language:

english

File:

PDF, 477 KB

english, 2001

68

[IEEE Comput. Soc Meeting on Design Automation and Test in Europe - Paris, France (27-30 March 2000)] Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) - A versatile built-in self test scheme for delay fault testing

Tsiatouhas, Y., Haniotakis, Th., Nikolos, D., Arapoyanni, A.

Year:

2000

File:

PDF, 57 KB

2000

69

[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings - Munich, Germany (9-12 March 1999)] Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) - Path delay fault testing of ICs with embedded intellectual property blocks

Nikolos, D., Haniotakis, T., Vergos, H.T., Tsiatouhas, Y.

Year:

1999

Language:

english

File:

PDF, 65 KB

english, 1999

70

[IEEE IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) - Tampa, FL, USA (11-12 May 2005)] IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) - The Use of Pre-Evaluation Phase in Dynamic CMOS Logic

Rao, A., Haniotakis, Th., Tsiatouhas, Y., Djemil, H.

Year:

2005

Language:

english

File:

PDF, 58 KB

english, 2005

71

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers

Dermentzoglou, L., Karagounis, A., Arapoyanni, A., Tsiatouhas, Y.

Year:

2007

Language:

english

File:

PDF, 379 KB

english, 2007

72

[IEEE Comput. Soc 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Austin, TX, USA (2-4 Nov. 1998)] Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) - C-testable one-dimensional ILAs with respect to path delay faults: theory and applications

Haniotakis, Th., Tsiatouhas, Y., Nikolos, D.

Year:

1998

Language:

english

File:

PDF, 63 KB

english, 1998

73

[IEEE ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems - Jounieh, Lebanon (17-20 Dec. 2000)] ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) - A state assignment algorithm for finite state machines

Skias, D., Haniotakis, T., Tsiatouhas, Y., Arapoyanni, A.

Year:

2000

Language:

english

File:

PDF, 411 KB

english, 2000

74

Path delay fault testing of multiplexer-based shifters

Vergos, H. T., Tsiatouhas, Y., Haniotakis, Th., Nikolos, D., Nicolaidis, M.

Journal:

International Journal of Electronics

Year:

2001

Language:

english

File:

PDF, 289 KB

english, 2001

75

Placement and Routing in Computer Aided Design of Standard Cell Arrays by Exploiting the Structure of the Interconnection Graph

Fudos, Ioannis, Kavousianos, Xrysovalantis, Markouzis, Dimitrios, Tsiatouhas, Yiorgos

Journal:

Computer-Aided Design and Applications

Year:

2008

Language:

english

File:

PDF, 478 KB

english, 2008

76

Robust test generation for transistor stuck-open faults in CMOS complex gates

TSIATOUHAS, Y., PASCHALIS, A., NIKOLOS, D., HALATSIS, C.

Journal:

International Journal of Electronics

Year:

1995

Language:

english

File:

PDF, 259 KB

english, 1995

77

Soft error interception latch: double node charge sharing SEU tolerant design

Katsarou, K., Tsiatouhas, Y.

Journal:

Electronics Letters

Year:

2015

Language:

english

File:

PDF, 206 KB

english, 2015

78

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Power efficient scan testing by exploiting existing error tolerance circuitry in a design

Anastasiou, Anthi, Tsiatouhas, Yiorgos

Year:

2014

Language:

english

File:

PDF, 207 KB

english, 2014

79

Timing Error Tolerance in Small Core Designs for SoC Applications

Valadimas, Stefanos, Tsiatouhas, Yiorgos, Arapoyanni, Angela

Journal:

IEEE Transactions on Computers

Year:

2015

Language:

english

File:

PDF, 875 KB

english, 2015

80

[IEEE ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems - Jounieh, Lebanon (17-20 Dec. 2000)] ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) - New memory sense amplifier designs in CMOS technology

Tsiatouhas, Y., Chrisanthopoulos, A., Kamoulakos, G., Haniotakis, T.

Year:

2000

Language:

english

File:

PDF, 345 KB

english, 2000

81

[ACM Press the conference - Paris, France (2000.03.27-2000.03.30)] Proceedings of the conference on Design, automation and test in Europe - DATE '00 - A versatile built-in self test scheme for delay fault testing (poster paper)

Tsiatouhas, Y., Haniotakis, Th., Nikolos, D., Arapoyanni, A.

Year:

2000

Language:

english

File:

PDF, 62 KB

english, 2000

82

[IEEE 2003 10th IEEE International Conference on Electronics, Circuits, and Systems - Sharjah, United Arab Emirates (14-17 Dec. 2003)] 10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 - A low power NORA circuit design technique based on charge recycling

Tsiatouhas, Y., Limniotis, K., Arapoyanni, A., Haniotakis, T.

Year:

2003

Language:

english

File:

PDF, 450 KB

english, 2003

83

Soft error immune latch under SEU related double-node charge collection

K. Katsarou, Y. Tsiatouhas

Year:

2015

Language:

english

File:

PDF, 541 KB

english, 2015

84

[IEEE ICECS'99. 6th IEEE International Conference on Electronics, Circuits and Systems - Pafos, Cyprus (5-8 Sept. 1999)] ICECS'99. Proceedings of ICECS '99. 6th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.99EX357) - Novel domino logic designs

Haniotakis, T., Tsiatouhas, Y., Arapoyanni, A.

Year:

1999

Language:

english

File:

PDF, 196 KB

english, 1999

85

[IEEE ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems - Malta (2-5 Sept. 2001)] ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) - A new flash memory sense amplifier in 0.18 μm CMOS technology

Chrisanthopoulos, A., Moisiadis, Y., Varagis, A., Tsiatouhas, Y., Arapoyanni, A.

Year:

2001

Language:

english

File:

PDF, 357 KB

english, 2001

86

Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs

Sfikas, Yiorgos, Tsiatouhas, Yiorgos

Journal:

IEEE Transactions on Computers

Year:

2015

Language:

english

File:

PDF, 180 KB

english, 2015

87

[IEEE 2003 10th IEEE International Conference on Electronics, Circuits, and Systems - Sharjah, United Arab Emirates (14-17 Dec. 2003)] 10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 - A novel scheme for testing radio frequency voltage controlled oscillators

Dermentzoglou, L., Tsiatouhas, Y., Arapoyanni, A.

Year:

2003

Language:

english

File:

PDF, 306 KB

english, 2003

88

[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - On resistive open defect detection in DRAMs: The charge accumulation effect

Sfikas, Yiorgos, Tsiatouhas, Yiorgos, Taouil, Mottaqiallah, Hamdioui, Said

Year:

2015

Language:

english

File:

PDF, 859 KB

english, 2015

89

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A hierarchical architecture for concurrent soft error detection based on current sensing

Tsiatouhas, Y., Arapoyanni, A., Nikolos, D., Haniotakis, T.

Year:

2002

Language:

english

File:

PDF, 391 KB

english, 2002

90

[IEEE ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems - Malta (2-5 Sept. 2001)] ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) - New test pattern generation units for NPSF oriented memory built-in self test

Chrisarithopoulos, A., Haniotakis, T., Tsiatouhas, Y., Arapoyanni, A.

Year:

2001

Language:

english

File:

PDF, 400 KB

english, 2001

91

A design for testability technique for mixed-signal differential circuits*

Dermentzoglou, L, Tsiatouhas, Y, Arapoyanni, A

Journal:

Journal of Physics Conference Series

Year:

2005

Language:

english

File:

PDF, 163 KB

english, 2005

92

[IEEE 2016 5th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Thessaloniki, Greece (2016.5.12-2016.5.14)] 2016 5th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Optimized built-in self-calibration of RF SoCs

Liaperdos, J., Arapoyanni, A., Tsiatouhas, Y.

Year:

2016

Language:

english

File:

PDF, 943 KB

english, 2016

93

[IEEE 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Pittsburgh, PA, USA (2016.7.11-2016.7.13)] 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Low-Power and High Performance Sinusoidal Clocked Dynamic Circuit Design

Katreepalli, Raghava, Chemanchula, Hemanth, Haniotakis, Themistoklis, Tsiatouhas, Yiorgos

Year:

2016

Language:

english

File:

PDF, 706 KB

english, 2016

94

[IEEE ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems - Jounieh, Lebanon (17-20 Dec. 2000)] ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) - A test pattern generation unit for memory NPSF built-in self test

Chrisanthopoulos, A., Kamoulakos, G., Tsiatouhas, Y., Arpoyanni, A.

Year:

2000

Language:

english

File:

PDF, 374 KB

english, 2000

95

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Fast Deployment of Alternate Analog Test Using Bayesian Model Fusion

Liaperdos, John, Stratigopoulos, Haralampos-G., Abdallah, Louay, Tsiatouhas, Yiorgos, Arapoyanni, Angela, Li, Xin

Year:

2015

Language:

english

File:

PDF, 203 KB

english, 2015

96

[IEEE 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Monte Carlo, Monaco (2016.12.11-2016.12.14)] 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Timing error mitigation in microprocessor cores

Valadimas, Stefanos, Arapoyanni, Angela, Tsiatouhas, Yiorgos

Year:

2016

Language:

english

File:

PDF, 969 KB

english, 2016

97

[IEEE 2016 Conference on Design of Circuits and Integrated Systems (DCIS) - Granada, Spain (2016.11.23-2016.11.25)] 2016 Conference on Design of Circuits and Integrated Systems (DCIS) - Improved alternate test accuracy using weighted training sets

Liaperdos, J., Arapoyanni, A., Tsiatouhas, Y.

Year:

2016

Language:

english

File:

PDF, 332 KB

english, 2016

98

[IEEE 2017 6th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Thessaloniki, Greece (2017.5.4-2017.5.6)] 2017 6th International Conference on Modern Circuits and Systems Technologies (MOCAST) - BTI and HCI degradation detection in SRAM cells

Sfikas, Yiorgos, Tsiatouhas, Yiorgos

Year:

2017

Language:

english

File:

PDF, 600 KB

english, 2017

99

[IEEE Comput. Soc Ninth Great Lakes Symposium on VLSI - Ypsilanti, MI, USA (4-6 March 1999)] Proceedings Ninth Great Lakes Symposium on VLSI - On path delay fault testing of multiplexer-based shifters

Vergos, H.T., Tsiatouhas, Y., Haniotakis, T., Nikolos, D., Nicolaidis, M.

Year:

1999

Language:

english

File:

PDF, 51 KB

english, 1999

100

[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Variation tolerant BTI monitoring in SRAM cells

Sfikas, Yiorgos, Tsiatouhas, Yiorgos

Year:

2017

File:

PDF, 314 KB

2017