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Volume 101; Issue none
Main
Microelectronic Engineering
Volume 101; Issue none
Microelectronic Engineering
Volume 101; Issue none
1
A study of degradation of indium tin oxide thin films on glass for display applications
W.S. Leung
,
Y.C. Chan
,
S.M. Lui
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 1.22 MB
Your tags:
english, 2013
2
Electrical transport properties of ZnO nanofibers
Jae Young Park
,
Ju-Jin Kim
,
Sang Sub Kim
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 680 KB
Your tags:
english, 2013
3
Exploration on chemical mechanical planarization of ZnO functional thin films for novel devices
Kailiang Zhang
,
Taofeng Zhang
,
Fang Wang
,
Yujie Yuan
,
Yuzhuo Li
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 1.18 MB
Your tags:
english, 2013
4
Writing metal on SiO2 by laser through culture supernatant of Acidithiobacillus ferrooxidans 13820
H. Hocheng
,
T.C. Lin
,
U.U. Jadhav
,
W.S. Wong
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 931 KB
Your tags:
english, 2013
5
Laser-assisted ultrathin die packaging: Insights from a process study
Val R. Marinov
,
Orven Swenson
,
Yuriy Atanasov
,
Nathan Schneck
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 856 KB
Your tags:
english, 2013
6
Optical characterizations and reverse-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode
Hsiang Chen
,
Yih-Min Yeh
,
Chuan Hao Liao
,
Chun Wei Lin
,
Chuan-Haur Kao
,
Tien-Chang Lu
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 599 KB
Your tags:
english, 2013
7
Measurement and simulation of the pull-off strength at the separation of miniaturized 3D connectors consisting of silicon masters with undercuts and PDMS replicas
J. Zajadacz
,
P. Lorenz
,
M. Ehrhardt
,
K. Zimmer
,
S. Möllenbeck
,
K. Dhima
,
H.-C. Scheer
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 596 KB
Your tags:
english, 2013
8
Fabrication of two-dimensional hard X-ray diffraction gratings
S. Rutishauser
,
M. Bednarzik
,
I. Zanette
,
T. Weitkamp
,
M. Börner
,
J. Mohr
,
C. David
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 843 KB
Your tags:
english, 2013
9
Inside Front Cover - Editorial Board
Journal:
Microelectronic Engineering
Year:
2013
Language:
english
File:
PDF, 30 KB
Your tags:
english, 2013
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