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Volume 85; Issue 8
Main
Microelectronic Engineering
Volume 85; Issue 8
Microelectronic Engineering
Volume 85; Issue 8
1
A nanoscale nonvolatile memory device made from RbAg4I5 solid electrolyte grown on a Si substrate
X.F. Liang
,
Y. Chen
,
B. Yang
,
J. Yin
,
Z.G. Liu
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 218 KB
Your tags:
english, 2008
2
Advanced tungsten plug process for beyond nanometer technology
Tuung Luoh
,
Chin-Ta Su
,
Ta-Hung Yang
,
Kuang-Chao Chen
,
Chih-Yuan Lu
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.44 MB
Your tags:
english, 2008
3
Reactive-ion etching of Ge2Sb2Te5 in CF4/Ar plasma for non-volatile phase-change memories
Gaoming Feng
,
Bo Liu
,
Zhitang Song
,
Songlin Feng
,
Bomy Chen
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.95 MB
Your tags:
english, 2008
4
Modeling the formation of spontaneous wafer direct bonding under low temperature
Zirong Tang
,
Tielin Shi
,
Guanglan Liao
,
Shiyuan Liu
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 213 KB
Your tags:
english, 2008
5
Microstructural study of copper free air balls in thermosonic wire bonding
C.J. Hang
,
C.Q. Wang
,
Y.H. Tian
,
M. Mayer
,
Y. Zhou
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 679 KB
Your tags:
english, 2008
6
Electrical method of measuring physical thickness and nitrogen concentration of silicon oxynitride gate dielectric for MOSFETs
J.H. Do
,
H.S. Kang
,
B.K. Kang
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 279 KB
Your tags:
english, 2008
7
Fully strained Si0.75Ge0.25 epitaxial films with HfSiO gate dielectrics for high mobility channel metal-oxide semiconductor devices
Jungwoo Oh
,
Prashant Majhi
,
Raj Jammy
,
Raymond Joe
,
Takuya Sugawara
,
Yasushi Akasaka
,
Takanobu Kaitsuka
,
Tsunetoshi Arikado
,
Masayuki Tomoyasu
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 639 KB
Your tags:
english, 2008
8
Characterization of bonded silicon-on-aluminum-nitride wafers with RBS, TEM and HRXRD techniques
Chuanling Men
,
Chenglu Lin
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 477 KB
Your tags:
english, 2008
9
Electrical and photovoltaic properties of a n-Si/chitosan/Ag photodiode
Kemal Akkılıç
,
Fahrettin Yakuphanoglu
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 346 KB
Your tags:
english, 2008
10
Mirror electron microscope for inspecting nanometer-sized defects in magnetic media
T. Shimakura
,
Y. Takahashi
,
M. Sugaya
,
T. Ohnishi
,
M. Hasegawa
,
H. Ohta
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 588 KB
Your tags:
english, 2008
11
A study on the improved performances of OLED using CMP process parameters determined by DOE method
Yong-Jin Seo
,
Gwon-Woo Choi
,
Woo-Sun Lee
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.25 MB
Your tags:
english, 2008
12
Electrochemistry on microcircuits. II: Copper dendrites in oxalic acid
C. Gabrielli
,
L. Beitone
,
C. Mace
,
E. Ostermann
,
H. Perrot
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.48 MB
Your tags:
english, 2008
13
Electrochemistry on microcircuits. I: Copper microelectrodes in oxalic acid media
C. Gabrielli
,
L. Beitone
,
C. Mace
,
E. Ostermann
,
H. Perrot
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 2008
14
Filling trenches on a SiO2 substrate with Cu using a hot refractory anode vacuum arc
I.I. Beilis
,
D. Grach
,
A. Shashurin
,
R.L. Boxman
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 499 KB
Your tags:
english, 2008
15
Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
P. Magnone
,
V. Subramanian
,
B. Parvais
,
A. Mercha
,
C. Pace
,
M. Dehan
,
S. Decoutere
,
G. Groeseneken
,
F. Crupi
,
S. Pierro
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 208 KB
Your tags:
english, 2008
16
Quantum-mechanical effects in nanometer scale MuGFETs
Se Re Na Yun
,
Chong Gun Yu
,
Jong Tae Park
,
Jean Pierre Colinge
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 761 KB
Your tags:
english, 2008
17
A Hafnium interlayer method to improve the thermal stability of NiSi film
Xiong-wei Yue
,
Li-chun Zhang
,
Yu-zhi Gao
,
Hai-yan Jin
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 321 KB
Your tags:
english, 2008
18
Stencil-assisted reactive ion etching for micro and nano patterning
B. Viallet
,
J. Grisolia
,
L. Ressier
,
M.A.F. Van Den Boogaart
,
J. Brugger
,
T. Lebraud
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.32 MB
Your tags:
english, 2008
19
Role of abrasives in high selectivity STI CMP slurries
R. Manivannan
,
S. Ramanathan
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 179 KB
Your tags:
english, 2008
20
Observation of Ni silicide formations and field emission properties of Ni silicide nanowires
Joondong Kim
,
Eung-Sug Lee
,
Chang-Soo Han
,
Youngjin Kang
,
Dojin Kim
,
Wayne A. Anderson
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 791 KB
Your tags:
english, 2008
21
Characteristics of thin lanthanum lutetium oxide high-k dielectrics
Dina H. Triyoso
,
David C. Gilmer
,
Jack Jiang
,
Ravi Droopad
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 671 KB
Your tags:
english, 2008
22
Hf–O–N and HfO2 barrier layers for Hf–Ti–O gate dielectric thin films
K. Ramani
,
R.K. Singh
,
V. Craciun
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 465 KB
Your tags:
english, 2008
23
Investigation of atomic vapour deposited TiN/HfO2/SiO2 gate stacks for MOSFET devices
Ch. Wenger
,
M. Lukosius
,
I. Costina
,
R. Sorge
,
J. Dabrowski
,
H.-J. Müssig
,
S. Pasko
,
Ch. Lohe
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 353 KB
Your tags:
english, 2008
24
Characterization of various alloying metal oxide nanoparticles embedded in HfOxNy as charge trapping nodes in nonvolatile memory devices
Chien-Wei Liu
,
Chin-Lung Cheng
,
Jin-Tsong Jeng
,
Bau-Tong Dai
,
Sung-Wei Huang
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 486 KB
Your tags:
english, 2008
25
Effective formation of interface controlled Y2O3 thin film on Si(1 0 0) in a metal–(ferroelectric)–insulator–semiconductor structure
Kwang-Ho Kwon
,
Chang Ki Lee
,
Jun-Kyu Yang
,
Sun Gyu Choi
,
Ho Jung Chang
,
Hyeongtag Jeon
,
Hyung-Ho Park
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 203 KB
Your tags:
english, 2008
26
Microfabricated SERS-arrays with sharp-edged metallic nanostructures
Uwe Huebner
,
R. Boucher
,
H. Schneidewind
,
D. Cialla
,
J. Popp
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 628 KB
Your tags:
english, 2008
27
Characterization of polycrystalline 3C–SiC thin film diodes for extreme environment applications
Gwiy-Sang Chung
,
Jeong-Hak Ahn
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 652 KB
Your tags:
english, 2008
28
Bonding wire characterization using automatic deformability measurement
C.J. Hang
,
I. Lum
,
J. Lee
,
M. Mayer
,
C.Q. Wang
,
Y. Zhou
,
S.J. Hong
,
S.M. Lee
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 507 KB
Your tags:
english, 2008
29
Calculation from the current–voltage and capacitance–voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method
M. Sağlam
,
A. Ateş
,
B. Güzeldir
,
M.A. Yıldırım
,
A. Astam
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 196 KB
Your tags:
english, 2008
30
Secondary electron detection for distributed axis electron beam systems
S. Tanimoto
,
D.S. Pickard
,
C. Kenney
,
R.F.W. Pease
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 1.20 MB
Your tags:
english, 2008
31
Efficiency of reducing and oxidizing ash plasmas in preventing metallic barrier diffusion into porous SiOCH
N. Posseme
,
T. Chevolleau
,
T. David
,
M. Darnon
,
J.P. Barnes
,
O. Louveau
,
C. Licitra
,
D. Jalabert
,
H. Feldis
,
M. Fayolle
,
O. Joubert
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 997 KB
Your tags:
english, 2008
32
Electrical and interface state density properties of the 4H-nSiC/[6,6]-phenyl C61-butyric acid methyl ester/Au diode
M.E. Aydin
,
Fahrettin Yakuphanoglu
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 487 KB
Your tags:
english, 2008
33
Inside Front Cover - Editorial Board
Journal:
Microelectronic Engineering
Year:
2008
Language:
english
File:
PDF, 59 KB
Your tags:
english, 2008
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