Volume 26; Issue 3

Microelectronics Reliability

Volume 26; Issue 3

1

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 139 KB

english, 1986

2

Publications, notices, calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 230 KB

english, 1986

3

Guest editorial

Charles E. Jowett

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 52 KB

english, 1986

4

Cost analysis of an electronic repairable redundant system with critical human errors

P.P. Gupta, R.K. Gupta

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 261 KB

english, 1986

5

Evaluation of MTTF and reliability of a power plant by BF technique

P.P. Gupta, Rakesh Kumar Sharma

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 318 KB

english, 1986

6

Reliability analysis of a system with preventive maintenance, inspection and two types of repair

L.R. Goel, G.C. Sharma, Praveen Gupta

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 299 KB

english, 1986

7

Profit analysis of a two-unit standby system with two types of repair and preventive maintenance

L.R. Goel, Rakesh Gupta, A.K. Rastogi

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 369 KB

english, 1986

8

On the applications of phase type distribution to a complex two-unit standby redundant system

M. Gururajan, R. Natarajan, P. Chandrasekhar

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 267 KB

english, 1986

9

RAM analysis of a navigational system by Markov technique: A case study

P. Kamaleswara Rao, K.S. Balasubramanya

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 321 KB

english, 1986

10

Cost-benefit analysis of one-server two-unit hot standby system with imperfect switch subject to adjustable repair

M.N. Gopalan, S.S. Waghmare

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

11

Bounds on system reliability when components are dependent

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 192 KB

english, 1986

12

Stochastic analysis of a complex two-unit system with non-instantaneous switchover and imperfect repair

Bala Srinivasan, K.S. Bhat, M. Gururajan

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 240 KB

english, 1986

13

Generic qualification of semi-custom IC product families

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 364 KB

english, 1986

14

Top-frequency calculation of multi-state fault trees including interstate frequencies

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 88 KB

english, 1986

15

Cost-benefit analysis and joint availability measures

M.N. Gopalan, S.S. Waghmare

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 218 KB

english, 1986

16

Higher moments in cost-benefit analysis

M.N. Gopalan, S.S. Waghmare

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 206 KB

english, 1986

17

Cost-benefit analysis of a one-server two-unit system subject to shock and degradation

M.N. Gopalan, T.K. Ramesh

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 527 KB

english, 1986

18

Cost-benefit analysis of a one out of n : G system with repair and preventive maintenance

M.N. Gopalan, H.E. Nagarwalla

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 439 KB

english, 1986

19

A method to evaluate reliability of three-state device networks

Balbir S. Dhillon, Subramanyam N. Rayapati

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 666 KB

english, 1986

20

Stochastic behaviour of a repairable system operating under fluctuating weather

Manju Agarwal, Ashok Kumar, S.C. Garg

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 355 KB

english, 1986

21

VLSI signal processing: A bit-serial approach: Authors: Peter Denyer and David Renshaw Publishers: Addison-Wesley publishing company, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ, England. Price: £ 19.95. (ISBN 0 201-14404-2). Publication: October 1985

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 51 KB

english, 1986

22

Analysis and testing in production of circuit boards and plated plastics: Authors: A.F. Bogenschutz and U. George Publishers: Finishing publications limited, 28, High Street, Teddington, Middlesex TW11 8EW, England. Price: £ 27.00 (plus £ 1 postage) U.S. $ 54.00 (plus $ 1.50 postage) (ISBN 0 904477 08-8) 1985

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 51 KB

english, 1986

23

Reliability and maintainability management: Authors: Balbir S. Dhillon and Hans Reiche Publishers: Van nostrand reinhold company, 135, West 50th Street, New York, New York 10020, United States of America. Price: US $ 36.95. (ISBN 0-442-27637-0) 1985

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 44 KB

english, 1986

24

Quality control, reliability, and engineering design: Author: Balbir S. Dhillon Publishers: MarCel Dekker, Inc., 270, Madison Avenue, New York, New York 10016, United States of America. Price: US $ 49.50. (ISBN 0-8247-7278-4) 1985

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 46 KB

english, 1986

25

Thermal design of electronic circuit boards and packages: Author: D. J. Dean Publishers: Electrochemical publications LTD 8, Barns Street, AYR, Scotland, KA7 1XA. Price: £ 63.00 (plus £ 2.00 postage and packing) (ISBN 901150 18 5) 1985

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 41 KB

english, 1986

26

Photomask and reticle defect detection : Peter H. Singer. Semiconductor Int. 66 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

27

Computer analysis of wire bond pull test data : R. A. S. Taylor. Semiconductor Int. 202 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

28

Bibliography of literature on chemical systems reliability : Balbir S. Dhillon and K. Ugwu. Microelectron. Reliab. 24 (6) 1087 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

29

Cutting chip-testing costs : Sharad C. Seth and Vishwani D. Agrawal. IEEE Spectrum, 38 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

30

Defect characterization of a silicon gate CMOS process : Jacques Laneuville, Jean Marcoux, Jon Orchard-Webb and Alain Comeau. Semiconductor Int. 250 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

31

Raman micro-analysis of integrated circuit contamination : Robert Z. Muggli and Mark E. Andersen. Solid St. Technol. 287 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

32

Unavailability analysis of periodically tested components of dormant systems : S. H. Sim. IEEE Trans. Reliab. R-34 (1) 88 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

33

A normal approximation to distributions of likelihood ratio statistics in life testing, reliability and multivariate analysis of variance : N. Singh. Microelectron. Reliab. 24 (4) 697 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

34

Computers that are “never” down : Glenn Zorpette. IEEE Spectrum 46 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 86 KB

english, 1986

35

On closure of the IFR class under formation of cohenrent systems : Francisco J. Samaniego. IEEE Trans. Reliab. R-34 (1) 69 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 220 KB

english, 1986

36

Present worth of service cost for consumer product warranty : Kyung S. Park and Seung R. Yee. IEEE Trans. Reliab. R-33 (5) 424 (December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

37

Nonlinear integer goal programming applied to optimal system reliability : C. L. Hwang, Hoon Byung Lee, F. A. Tillman and Chang Hoon Lie. IEEE Trans. Reliab. R-33 (5) 431 (December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

38

Quantile estimates in complete and censored samples from extreme-value and Weibull distributions : Khatab M. Hassanein, A. K. Md. Ehsanes Saleh and Edward F. Brown. IEEE Trans. Reliab. R-33 (5) 370 (December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

39

Normal probability plotting—a tool for trouble shooting : P. K. Perumallu. QR J., India. 103 (September 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

40

More accurate maintainability predictions : David Bakken and James M. Banghart. Proc. a. Reliab. Maintanab. Symp. 44 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

41

Correct the process, not the product : Tim Fuller. Electron. Prod. 73 (September 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

42

Polyimide discoloration—a failure analysis study : T. E. Svarney and J. F. Turner. Solid St. Technol. 171 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

43

A low-cost concept for the testing of microprocessor-controlled assemblies : D. Funke and G. W. Wostenkuhler. Feinwerktechnik Messtechnik 92 (8) 385 (1984) (in German)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

44

Models for the reliability of memory with ECC : Robert A. Rutledge. Proc. a. Reliab. Maintainab. Symp. 57 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

45

Relating factory and field reliability and maintainability measures : Preston R. Macdiarmid. Proc. a. Reliab. Maintainab. Symp. 177 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

46

AV-8B design for maintainability : Raymond J. Anderson. Proc. a. Reliab. Maintainab. Symp. 28 91985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

47

A fast algorithm to formulate Markov system equations : J. Luis Roca. Microelectron. Reliab. 24 (5) 897 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

48

Minimum distance estimation of the three parameters of the Gamma distribution : Jon R. Hobbs, Albert H. Moore and William James. IEEE Trans Reliab. R-33 (3) 237 (August 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

49

A generalization of Freund's model for a repairable paired component based on a bivariate Geiger Muller (G.M.) counter : Suddhendu Biswas and Gurprit Nair. Microelectron. Reliab. 24 (4) 671 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

50

Algebraical algorithm for computing complex systems reliability : J. Luis Roca. Microelectron. Reliab. 24 (5) 901 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

51

Simulation properties of the Bayesian and maximum likelihood estimators of availability : Way Kuo. Microelectron. Reliab. 24 (6) 1057 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

52

Generalised availability measures for a multi-unit repairable system with standby failure : P. K. Kapur, N. L. Butani and Renu Bala. Microelectron. Reliab. 24 (4) 637 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

53

Random tendencies and event dependencies : Ki Punches. IEEE Trans. Reliab. R-33 (3) 202 (August 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

54

Field performance of a military signal processor : Duane R, Dura. Proc. a. Reliab. Maintainab. Symp. 104 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

55

Reliability testing and the bottom like : Ken Lindner. Proc. a. Reliab. Maintainab. Symp. 336 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 137 KB

english, 1986

56

Reliability and availability analysis of an n-unit outdoor power system subject to adjustable repair facility: J. Natesan, K. Thulasiraman and M. N. S. Swamy. Microelectron. Reliab. 24 (6) 1039 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 270 KB

english, 1986

57

Software reliability analysis based on a nonhomogeneous error detection rate model : Shigeru Yamada, Hiroyuki Narihisa and Hiroshi Ohtera. Microelectron. Reliab. 24 (5) 915 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

58

Combined hardware/software reliability predictions : Eugene Fiorentino and Edward C. Soistman. Proc. a. Reliab. Maintainab. Symp. 169 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

59

On Markov maintenance problems : Yukio Hatoyama. IEEE Trans. Reliab. R-33 (4) 280 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

60

Application of the approximate solution of Poisson's equation to derive new formulae for impurity profile determination by the C-V method : Andrzej Ostrowski. Electron Technol. 15 (3/4) 57 (1982)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

61

Surrogate constraints algorithm for reliability optimization problems with multiple constraints : Yuji Nakagawa, Mitsunori Hikita and Hiroshi Kamada. IEEE Trans. Reliab. R-33 (4) 301 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

62

SYSREL: reliability of complex redundant systems : J. T. Lapointe and A. M. Forry. Proc. a. Reliab. Maintainab. Symp. 63 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

63

Computer aided stress analysis of digital circuits : Michael W. Bannan and James M. Banghart. Proc. a. Reliab. Maintainab. Symp. 217 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

64

Cost effective accelerated testing and analysis : Tim C. Preston. Proc. a. Reliab. Maintainab. Symp. 432 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

65

Complex system RMA and T, using Markov models : Randall E. Fleming, Jill V. Josselyn, Linda Jo Dolny and Ronald L. de Hoff. Proc. a. Reliab. Maintainab. Symp. 125 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

66

Some remarks on optimum inspection policies : Naoto Kaio and Shunji Osaki. IEEE Trans. Reliab. R-33 (4) 277 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

67

Analysis of incomplete data in competing risks model : Masami Miyakawa. IEEE Trans. Reliab. R-33 (4) 293 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

68

Reliability in communications satellites : Vincent J. Mancino and Walter J. Slusark, Jr. RCA Rev. 45 303 (June 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

69

Inspection intervals for fail-safe structure : P. J. Young. IEEE Trans. Reliab. R-33 (2) 165 (June 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

70

On the use of power function in the life-time analysis : A. D. Dharmadhikari and Yash P. Gupta. Microelectron. Reliab. 24 (6) 1035 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

71

Improved schedules by using data collected under preventive maintenance : D. J. Sherwin. IEEE Trans. Reliab. R-33 (4) 315 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 135 KB

english, 1986

72

Cost-benefit analysis of a two-unit cold standby system subject to slow switch : M. N. Gopalan, R. Radhakrishnan and A. Vijayakumar. Microelectron. Reliab. 24 (6), 1019 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 265 KB

english, 1986

73

Disjoint Boolean products via Shannon's expansion : W. G. Schneeweiss. IEEE Trans. Reliab. R-33 (4) 329 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

74

Maintenance system computer modeling. A logistic tool to influence system front end designs : Dayle D. Rhodes. Proc. a. Reliab. Maintainab. Symp. 369 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

75

Computer-assisted testing system for power supply units—reduce quality assurance costs : R. Bertram and E. Kohlhauser. Feinwerktechnik Messtechnik 92 (8) 394 (1984) (in German)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

76

MIL-STD-781D and MIL-HDBK-781—A final report : E. W. Wallace, Jr. and Carl Sontz. Proc. a. Reliab. Maintainab. Symp. 418 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

77

The team approach to products liability prevention and defense : Lawrence A. Hoffman. Proc. a. Reliab. Maintainab. Symp. 6 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

78

Analysis of redundant systems with human errors : Balbir S. Dhillon and S. N. Rayapati. Proc. a. Reliab. Maintainab. Symp. 315 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

79

s-Expected number of inspections and repairs of a single server n-unit system subject to arbitrary failure: R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab. 24 (4) 651 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

80

Performance/reliability measures for fault-tolerant computing systems : Shunji Osaki. IEEE Trans. Reliab. R-33 (4) 268 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

81

Mission effectiveness model for a system with several mission types : Chang Hoon Lie, Way Kuo, Frank A. Tillman and C. L. Hwang. IEEE Trans. Reliab. R-33 (4) 346 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 261 KB

english, 1986

82

A new discrete Weibull distribution : William E. Stein and Ronald Dattero. IEEE Trans. Reliab. R-33 (2) 196 (June 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

83

Reliability analysis of two special three-state devices : J. L. Roca. Microelectron. Reliab. 24 (5) 899 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

84

Economy of redundancy in telecommunication systems : B. Tigerman and L. M. Ericsson. Proc. a. Reliab. Maintainab. Symp. 342 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

85

The top-event's failure frequency for non-coherent multi-state fault trees : A. Bossche. Microelectron. Reliab. 24 (4) 707 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

86

Ageing acceleration under multiple stresses : Joel A. Nachlas, Blair A. Binney and Stephen S. Gruber. Proc. a. Reliab. Maintainab. Symp. 438 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

87

New maintainability prediction technique : Robert L. Vannatter. Proc. a. Reliab. Maintainab. Symp. 39 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

88

On the analysis of accelerated life test data : Nathan Johnson, Jr. Proc. a. Reliab. Maintainab. Symp. 460 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

89

One method for interval estimation of Weibull shape parameter : D. M. Brkich. Microelectron. Reliab. 24 (4) 659 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

90

Fault isolation methodology for supportability : Frank J. Moreno and David L. Reinert. Proc. a. Reliab. Maintainab. Symp. 50 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

91

An alternative index for the reliability of telecommunication networks : D. Trstensky and P. Bowron. IEEE Trans. Reliab. R-33 (4) 343 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 130 KB

english, 1986

92

Network topology for maximizing the terminal reliability in a computer communication network : Y. C. Chopra, B. S. Sohi, R. K. Tiwari and K. K. Aggarwal. Microelectron. Reliab. 24 (5) 911 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 251 KB

english, 1986

93

Stochastic models for evaluating probability of system failure due to human error : Balbir S. Dhillon. Microelectron. Reliab. 24 (5) 921 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

94

Reliability evaluation of systems with crtitical human error : Balbir S. Dhillon and R. B. Misra. Microelectron. Reliab. 24 (4) 743 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

95

Policies for system-level diagnosis in a non-hierarchic distributed system : Roberto Negrini, Mariagiovanna Sami and Nello Scarabottolo. IEEE Trans. Reliab. R-33 (4) 333 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

96

Simplified algorithm for optimum availability allocation and redundancy optimization subject to cost constraint : K. K. Govil. Microelectron. Reliab. 24 (5) 935 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

97

Preventing maintenance induced failures : Miguel A. Ramirez. Proc. a. Reliab. Maintainab. Symp. 138 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

98

A problem with computerized systems : Claude F. Veraa. Proc. a. Reliab. Maintainab. Symp. 150 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

99

Semiconductor research: an industry-university venture : Chuck Murray. Semiconductor Int. 176 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

100

Materials measurements: present abilities and future needs : Robert I. Scace. Solid St. Technol. 155 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

101

MOS meets radiation challenge : Carl Gusert and Kenneth A. Marks. Electronics Week, 89 (1 January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

102

A two micron metal interconnect process over severe topography : F. C. Chien, R. L. Brown, G. N. Burton and M. B. Vora. Semiconductor Int. 78 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

103

Linewidth measurement aids process control : Peter H. Singer. Semiconductor Int. 66 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 119 KB

english, 1986

104

A review of nitrogen trifluoride for dry etching in microelectronics processing : Bogdan Golja, John A. Barkanic and Andrew Hoff. Microelectron. J. 16 (1) 5 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 246 KB

english, 1986

105

Trends in automated diffusion furnace systems for large wafers : Joseph C. Maliakal, Daniel J. Fischer, Jr. and Arthur Waugh. Solid St. Technol. 105 (December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

106

Purification of deionized water by oxidation with ozone : Carl Nebel and William W. Nezgod. Solid St. Technol. 185 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

107

Reduction lenses for submicron lithography : Takashi Omata. Solid St. Technol. 173 (September 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

108

Alternatives to furnace annealing : Ron Iscoff. Semiconductor Int. 78 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

109

Damage effects in dry etching : S. J. Fonash. Solid St. Technol. 201 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

110

SMIF technology reduces clean room requirements : Mihir Parikh and Anthony C. Bonora. Semiconductor Int. 222 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

111

Layer to layer interconnections: impact on VLSI circuits : H. B. Harrison, G. Sai-Halasz and G. K. Reeves. Semiconductor Int. 240 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

112

The work center works for wafer fab : Nick Sabo and Jerry Secrest. Semiconductor Int. 194 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

113

Annealing and diffusion of fine geometry CMOS technologies : D. J. Godrey. Semiconductor Int. 216 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

114

Designing an advanced copper-alloy leadframe material : Young G. Kim and Chung Ryu. Semiconductor Int. 250 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

115

Evaluating low-particulate chemicals : Donald W. Johnson. Semiconductor Int. 168 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

116

X-ray lithography and mask technology : Pieter Burggraaf. Semiconductor Int. 92 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

117

Inspection strategies for IX-reticles : George W. Brooks and Larry S. Zurbrick. Semiconductor Int. 80 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

118

Manufacturing one micron : Robert Carlson. Solid St. Technol. 141 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

119

Gallium arsenide digital IC processing—a manufacturing perspective : Ajit G. Rode and J. Gordon Roper. Solid St. Technol. 209 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

120

Pellicles 1985: an update : Ron Iscoff. Semiconductor Int. 110 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 125 KB

english, 1986

121

Manufacturing technology for GaAs monolithic microwave integrated circuits : T. Andrade. Solid St. Technol. 199 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 253 KB

english, 1986

122

Water purification criteria for semiconductor manufacturing : Ron Iscoff.Semiconductor Int. 66 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

123

Changes in oxygen precipitation density during wafer processing : Paul D. Hicken. Semiconductor Int. 190 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

124

VLSI system design by the numbers : Gaetano Borriello, Randy H. Katz, Alan G. Bell and Lynn Conway. IEEE Spectrum 44 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

125

Modular implementation of interconnecting networks in VLSI : S. K. Paranjpe and R. Mitra. J. Instn electron. Radio Engrs 55 (1) 11 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

126

Current status of X-ray lithography. Part II : Armand P. Neukermans. Solid St. Technol. 213 (November 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

127

Defects in photomasks : S. N. Gupta, A. K. Bagchi and N. N. Kundu. Microelectron. J. 16 1 22 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

128

Surface mount pcb interconnection system doubles track density : Electronic Prod. 25 (November/December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

129

KWIRE: a multiple-technology, user-reconfigurable wiring tool for VLSI : P. C. Elmendorf. IBM J. Res. Dev. 28 (5) 603 (September 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

130

LPCVD process equipment evaluation using statistical methods : R. C. Rosst. Solid St. Technol. 227 (November 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

131

Arsenosilicate glass as an interlayer dielectric : G. W. B. Ashwell and S. J. Wright. Semiconductor Int. 132 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

132

Molding compounds: meeting the needs : Pieter Burggraaf. Semiconductor Int. 60 (December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

133

Vibration control wafer manufacturing facilities : Donald E. Baxa and Richard A. Dykstra. Semiconductor Int. 123 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

134

Numerical simulation of optical etch rate monitoring of VLSI circuits by personal computer : Jean Canteloup and Michel Lespinasse. Vacuum 35 (2) 83 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

135

Ion milling cures wet-etchant woes : Phil C. Lostimolo. Microwaves RF 95 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

136

A review of LPCVD metallization for semiconductor devices : M. J. Cooke. Vacuum 35 (2) 67 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 131 KB

english, 1986

137

Economics in wafer processing automation : G. Dan Hutcheson. Semiconductor Int. 52 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

138

Advances in dry etching processes—a review : S. J. Fonash. Solid St. Technol. 150 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

139

Data analysis uses RS/1 to ease process development : Kim Kokkonen. Semiconductor Int. 140 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

140

Information, communication, and control in flexible wafer fabrication automation : James G. Harper, Glenn B. Burkhardt and Robert R. Nelson. Solid St. Technol. 119 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

141

High-voltage semicustom component arrays : Simon Emary. Electron. Power 52b (July 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

142

A method for the automatic translation of algorithms from a high-level language into self-timed integrated circuits : Steven H. Kelem. IEEE Circuits Devices 17 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

143

Silicon material criteria for VLSI electronics : Howard R. Huff and Fumio Shimura. Solid St. Technol. 103 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

144

Raman scattering and short range order in amorphous germanium : J. S. Lannin, N. Maley and S. T. Kshirsagar. Solid St. Commun. 53 (11) 939 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

145

Techniques for ultratrace metals analyses in dopant materials : H. J. Graf and W. L. Reynolds. Solid St. Technol. 141 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

146

Developments in thin polyoxides for non-volatile memories : Sun Chiao, Wayne Shih, C. Wang and Tarsaim Batra. Semiconductor Int. 156 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 118 KB

english, 1986

147

Reproducibility of properties of SnOx thin films prepared by reactive sputtering: Grazyna Beensh-Marchwicka and Lubomila Krol-Stepniewska. Electrocomponent Sci. Technol. 11 271 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 252 KB

english, 1986

148

Spectroscopy of excitons bound to isoelectronic defect complexes in silicon : E. C. Lightowlers and G. Davies. Solid St. Commun. 53 (12) 1055 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

149

Avalanche breakdown in narrow gap semiconductors in crossed fields : E. V. Bogdanov, N. B. Brandt, L. S. Fleyshman and V. L. Popov. Solid St. Commun. 53 (11) 947 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

150

Highly excited states of donor centres in silicon : Solid St. Commun. 54 (1) 57 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

151

Heavy doping effects on bandgaps, effective intrinsic carrier concentrations and carrier mobilities and lifetimes : Herbert S. Bennett. Solid-St. Electron. 28 (1/2) 193 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

152

Energy-gap reduction in heavily doped silicon: causes and consequences : Sokrates T. Pantelides, Annabella Selloni and Roberto Car. Solid-St. Electron. 28 (1/2) 17 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

153

Gettering in processed silicon : D. K. Sadana. Semiconductor Int. 362 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

154

Characterizing plasma phosphorus-doped oxides : Jana Houskova, Kim-Khanh N. Ho and Marjorie K. Balazs. Semiconductor Int. 236 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

155

Protective thin film coatings by plasma polymerization : R. K. Sadhir and H. E. Saunders. Semiconductor Int. 110 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

156

Determination of diffusion characteristics using two- and four-point probe measurements : Roger Brennan and David Dickey. Solid St. Technol. 125 (December 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

157

On experimental data of the TCR of TFRs and their relation to theoretical models of conduction mechanism : I. Storbeck and M. Wolf. Electrocomponent Sci. Technol. 11 255 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 134 KB

english, 1986

158

Fabrication of damage free micropatterns in silicon : R. P. Gupta, P. R. Deshmukh, W. S. Khokle and Amarjit Singh. Microelectron. Reliab. 24 (4) 623 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 256 KB

english, 1986

159

Digital control of Czochralski silicon crystal growth : K. M. Kim, A. Kran, K. Riedling and P. Smetana. Solid St. Technol. 165 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

160

Silicon-containing polymer: its plasma deposition and photolithographic processing : Zdenek Novotny. TESLA Electron. 2 56 (1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

161

Influence of the dopant density profile on minority-carrier current in shallow, heavily doped emitters of silicon bipolar devices : Andres Cuevas, Jerry G. Fossum and Rosa T. Young. Solid-St. Electron. 28 (3) 247 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

162

Recovering precious metal from scrap generated by the hybrid manufacturing process : Dan Epstein. Solid St. Technol. 177 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

163

Electrochemical migration in thick-film IC-S : Gabor Ripka and Gabor Harsanyi. Electrocomponent Sci. Technol. 11 281 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

164

Effect of atmosphere composition on metallizing Al2O3 substrates with Mo-Mn paste : Edward A. Hayduk, Jr. Solid St. Technol. 321 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

165

Improved DUV multilayer resist process : C. H. Ting and K. L. Liauw. Semiconductor Int. 102 (November 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

166

Formation of titanium silicide by rapid thermal annealing : D. Pramanik, M. Deal, A. N. Saxena and Owen K. T. Wu. Semiconductor Int. 94 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

167

Rapid thermal processing of gate dielectrics : Arnon Gat and Jaime Nulman. Semiconductor Int. 120 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

168

Codeposition vs layering of sputtered silicide films : Lee Kammerdiner and Mike Reeder. Semiconductor Int. 122 (August 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 121 KB

english, 1986

169

Electromigration testing of thin films at the wafer level : Janet M. Towner. Solid St. Technol. 197 (October 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 248 KB

english, 1986

170

A flexible approach for generation of arbitrary etch profiles in multilayer films : A. S. Bergendahl, D. H. Harmon and N. T. Pascoe. Solid St. Technol. 107 (November 1984)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

171

Grain boundary scattering and thermopower of thin films : Neeraj Jain. Vacuum 35 (3) 127 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

172

Hybrid alignment: 5:1 stepper with 1:1 scanner : Fumiaki Ushiyama, Toshio En Do and Seiichi Iwamatsu. Semiconductor Int. 180 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

173

Stability observations and surface analysis of air fired nickel thick film conductors : R. B. Pranchov and D. S. Campbell. Electrocomponent Sci. Technol. 11 291 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

174

A low cost, thick film multilayer hybrid system : Trevor R. Allington, Helene E. Schmidt, Lyle H. Slack and Barry E. Taylor. Solid St. Technol. 180 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

175

Thick, multilayer elements widen antenna bandwidths : Timothy Holzheimer and T. O. Miles. Microwaves RF 93 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

176

Excimer laser applications in contact printing : Elmar Cullmann Semiconductor Int. 332 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

177

Electron image projection for 0.5μm geometries : K. H. Nicholas. Semiconductor Int. 338 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 127 KB

english, 1986

178

CW laser annealing of boron implanted polycrystalline silicon : S. Peterstrom, G. Holmen and G. Alestig. Solid-St. Electron. 28 (4) 339 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

179

Raman scattering studies in phosphorus implanted and laser annealed boron doped Si : G. Contreras, M. Cardona and A. Axmann. Solid St. Commun. 53 (10) 861 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

180

Bonding of fluorine-implanted and annealed silicon : L. E. Mosley, M. A. Paesler, G. Lucovsky, A. Waltiner and J. J. Wortman. Solid St. Commun. 53 (6) 513 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

181

Activation and redistribution of implants in Polysi by RTP : R. Chow and R. A. Powell. Semiconductor Int. 108 (May 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 128 KB

english, 1986

182

Rapid determination of ionic contaminants : Phil Pecevich. Semiconductor Int. 112 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

183

Submicron optical lithography: 1-line wafer stepper and photoresist technology : V. Miller and H. L. Stover. Solid St. Technol. 127 (January 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

184

Laser-assisted dry etching : P. D. Brewer, G. M. Reksten and R. M. Osgood, Jr. Solid St. Technol. 273 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 128 KB

english, 1986

185

Superfine IC geometries : Michael F. Leahy. IEEE Spectrum 36 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 128 KB

english, 1986

186

Single wafer high rate RIE employing magnetron discharge : Steve Schultheis. Solid St. Technol. 233 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

187

Rapid evaluation of submicron laser spots : M. T. Gale and H. Meier. RCA Rev. 46 56 (March 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

188

The convergent effect of the annealing temperatures of electron irradiated defects in FZ silicon grown in hydrogen : Qin Guogang and Hua Zonglu. Solid St. Commun. 53 (11) 975 (1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

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english, 1986

189

Effects of planar channeling using modern ion implantation equipment : Norman L. Turner, Michael Current, T. C. Smith and Dave Crane, Solid St. Technol. 163 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 128 KB

english, 1986

190

Automation of implanter equipment : Ollie C. Woodward and Robert Pipe. Solid St. Technol. 177 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 128 KB

english, 1986

191

Wafer characterization with laser microprobe mass spectroscopy : John M. McMahon. Semiconductor Int. 144 (April 1985)

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 146 KB

english, 1986

192

A performance survey of production ion implanters : M. I. Current and W. A. Keenan. Solid St. Technol. 139 (February 1985)

Journal:

Microelectronics Reliability

Year:

1986

File:

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1986

193

4532402 Method and apparatus for positioning a focused beam on an integrated circuit

JamesW Overbeck

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 79 KB

english, 1986

194

4532423 IC tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested

Toru Tojo, Kazuyoshi Sugihara

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 160 KB

english, 1986

195

4532611 Redundant memory circuit

Roger Countryman

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 81 KB

english, 1986

196

4533192 Integrated circuit test socket

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 81 KB

english, 1986

197

4534605 Symmetrical, single point drive for contacts of an integrated circuit tester

NicolasJ Cedrone, KennethR Lee

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 81 KB

english, 1986

198

4541169 Method for making studs for interconnecting metallization layers at different levels in a semiconductor chip

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 73 KB

english, 1986

199

4542340 Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells

Satya Chakravarti, PaulL Garbarino, DonaldA Miller

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 73 KB

english, 1986

200

4542341 Electronic burn-in system

Anthony Santomango, NicholasN Hatheway

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 138 KB

english, 1986

201

4538170 Power chip package

AlexanderJ Yerman

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 66 KB

english, 1986

202

4538247 Redundant rows in integrated circuit memories

Kalyanasundaram Venkateswaran

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 66 KB

english, 1986

203

4538923 Test circuit for watch LSI

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 145 KB

english, 1986

204

4539517 Method for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs

LaurenceP Flora

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

205

4539622 Hybrid integrated circuit device

Hidehik Akasaki

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

206

4539632 Programmable maintenance timer system

JohnC Hansen, Lloyd Johnson

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 167 KB

english, 1986

207

4539642 Fail-safe speed control system for motor vehicles

Yoshikazu Mizuno, Akira Ikuma

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 88 KB

english, 1986

208

4539878 Method and apparatus for trimming the leads of electronic components

Frank Linker, Frank Linjer

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 88 KB

english, 1986

209

4540227 Test equipment interconnection system

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 167 KB

english, 1986

210

4540857 Circuit testing of telephone grids or the like

DonaldF Parsons, GeraldJ Parsons, BrianD Greenwald, Elizabeth Parsons

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

211

4543592 Semiconductor integrated circuits and manufacturing process thereof

Manabu Itsumi, Kohei Ehara, Susumu Muramoto, Seitaro Matsuo

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

212

4543594 Fusible link employing capacitor structure

AmrM Mohsen, DwightL Crook

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 162 KB

english, 1986

213

4544882 Apparatus for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 81 KB

english, 1986

214

4544983 Overvoltage protection device

James Anderson, Michael Coleman, Frederick Livermore

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 81 KB

english, 1986

215

4545851 Etching method for semiconductor devices

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 160 KB

english, 1986

216

4546404 Storage unit for an integrated circuit tester

NicholasJ Cedrone, KennethR Lee

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

217

4547028 Low profile test clip

Thomas Morgan, Joh Tengler

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 80 KB

english, 1986

218

4548451 Pinless connector interposer and method for making the same

GarryM Benarr, TerryA Burns, William Walker

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 85 KB

english, 1986

219

4549101 Circuit for generating test equalization pulse

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 85 KB

english, 1986

220

4549200 Repairable multi-level overlay system for semiconductor device

MarioE Ecker, LeonardT Olson

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 85 KB

english, 1986

221

4549249 Overhead lighting system for one or more visual display terminals

SylvanR Shemitz

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 151 KB

english, 1986

222

4550289 Semiconductor integrated circuit device

Katsuhik Kabashima, Yoshihiro Takemae, Shigeki Nozaki, Tsuyoshi Ohira, Hatsuo Miyahara, Masakazu Kanai, Seiji Enomoto

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 66 KB

english, 1986

223

8504966 CMOS spare circuit

DonaldGordon Clemons, MichaelVicent DePaolis Jr, MichaelVicent DePaolis Jr

Journal:

Microelectronics Reliability

Year:

1986

Language:

english

File:

PDF, 66 KB

english, 1986

224

Erratum

Journal:

Microelectronics Reliability

Year:

1986

File:

PDF, 11 KB

1986

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