books search
books
articles search
articles
Donate
Log In
Log In
to access more features
personal recommendations
Telegram Bot
download history
send to Email or Kindle
manage booklists
save to favorites
Explore
Journals
Contribution
Donate
Litera Library
Donate paper books
Add paper books
Open LITERA Point
Volume 50; Issue 1
Main
Microelectronics Reliability
Volume 50; Issue 1
Microelectronics Reliability
Volume 50; Issue 1
1
Modeling of multi-layered structure containing heterogeneous material layer with randomly distributed particles using infinite element method
De-Shin Liu
,
Zhen-Wei Zhuang
,
Ching-Yang Chen
,
Cho-Liang Chung
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.20 MB
Your tags:
english, 2010
2
Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate
Bo-Ching He
,
Chun-Hu Cheng
,
Hua-Chiang Wen
,
Yi-Shao Lai
,
Ping-Feng Yang
,
Meng-Hung Lin
,
Wen-Fa Wu
,
Chang-Pin Chou
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 751 KB
Your tags:
english, 2010
3
Using Boolean satisfiability for computing soft error rates in early design stages
S.Z. Shazli
,
M.B. Tahoori
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.01 MB
Your tags:
english, 2010
4
Finite volume based CFD simulation of pressurized flip-chip underfill encapsulation process
C.Y. Khor
,
M. Abdul Mujeebu
,
M.Z. Abdullah
,
F. Che Ani
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.72 MB
Your tags:
english, 2010
5
A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling conditions
Dominik Herkommer
,
Jeff Punch
,
Michael Reid
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.91 MB
Your tags:
english, 2010
6
Fracture phenomena induced by Front-End/Back-End interactions: Dedicated failure analysis and numerical developments
Sébastien Gallois-Garreignot
,
Vincent Fiori
,
D. Nelias
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.54 MB
Your tags:
english, 2010
7
ESD protection for thin gate oxides in 65 nm
Guido Notermans
,
Theo Smedes
,
Željko Mrčarica
,
Peter de Jong
,
Ralph Stephan
,
Hans van Zwol
,
Dejan Maksimovic
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 658 KB
Your tags:
english, 2010
8
Doping compensation for increased robustness of fast recovery silicon diodes
J. Vobecký
,
V. Záhlava
,
V. Komarnitskyy
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 689 KB
Your tags:
english, 2010
9
DMOS FET parameter drift kinetics from microscopic modeling
F. Alagi
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 504 KB
Your tags:
english, 2010
10
Simulation of electrical characteristics of InP double-heterojunction bipolar transistors with InGaAsSb base
Yang-Hua Chang
,
Rong-Hao Syu
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 236 KB
Your tags:
english, 2010
11
Accuracy of simplified printed circuit board finite element models
Robin Alastair Amy
,
Guglielmo S. Aglietti
,
Guy Richardson
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.40 MB
Your tags:
english, 2010
12
Total-dose-induced edge effect in SOI NMOS transistors with different layouts
Jie Liu
,
Jicheng Zhou
,
Hongwei Luo
,
Xuedong Kong
,
Yunfei En
,
Qian Shi
,
Yujuan He
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 366 KB
Your tags:
english, 2010
13
Rapid assessment of BGA life under vibration and bending, and influence of input parameter uncertainties
Mei-Ling Wu
,
Donald Barker
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 815 KB
Your tags:
english, 2010
14
Hydrogen passivation effects under negative bias temperature instability stress in metal/silicon-oxide/silicon-nitride/silicon-oxide/silicon capacitors for flash memories
Hee-Dong Kim
,
Ho-Myoung An
,
Yujeong Seo
,
Yongjie Zhang
,
Jong Sun Park
,
Tae Geun Kim
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 449 KB
Your tags:
english, 2010
15
Inside front cover - Editorial board
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 41 KB
Your tags:
english, 2010
16
A brief review of selected aspects of the materials science of ball bonding
C.D. Breach
,
F.W. Wulff
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 3.38 MB
Your tags:
english, 2010
17
Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation
Hui-Wen Tsai
,
Ming-Dou Ker
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.92 MB
Your tags:
english, 2010
18
Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes
İ. Dökme
,
Ş. Altındal
,
T. Tunç
,
İ. Uslu
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 968 KB
Your tags:
english, 2010
19
Design of experiments to investigate reliability for solder joints PBGA package under high cycle fatigue
Mei-Ling Wu
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.39 MB
Your tags:
english, 2010
20
Calendar
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 44 KB
Your tags:
english, 2010
1
Follow
this link
or find "@BotFather" bot on Telegram
2
Send /newbot command
3
Specify a name for your chatbot
4
Choose a username for the bot
5
Copy an entire last message from BotFather and paste it here
×
×