Volume 50; Issue 1

Microelectronics Reliability

Volume 50; Issue 1
3

Using Boolean satisfiability for computing soft error rates in early design stages

S.Z. Shazli, M.B. Tahoori
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 1.01 MB
english, 2010
9

DMOS FET parameter drift kinetics from microscopic modeling

F. Alagi
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 504 KB
english, 2010
15

Inside front cover - Editorial board

Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 41 KB
english, 2010
16

A brief review of selected aspects of the materials science of ball bonding

C.D. Breach, F.W. Wulff
Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 3.38 MB
english, 2010
20

Calendar

Journal:
Microelectronics Reliability
Year:
2010
Language:
english
File:
PDF, 44 KB
english, 2010