Volume 103

6

The impact of stress-induced defects on MOS electrostatics and short-channel effects

Year:
2015
Language:
english
File:
PDF, 989 KB
english, 2015
8

On the effect of technology scaling on variation-resilient sub-threshold circuits

Year:
2015
Language:
english
File:
PDF, 1.69 MB
english, 2015
38

A novel scaling theory for fully depleted pi-gate (ΠG) MOSFETs

Year:
2015
Language:
english
File:
PDF, 645 KB
english, 2015
40

Editorial Board

Year:
2015
Language:
english
File:
PDF, 62 KB
english, 2015