Volume 5; Issue S1

18

Growth of InN By MBE

Year:
2000
Language:
english
File:
PDF, 285 KB
english, 2000
19

High-Temperature Reliability of GaN Electronic Devices

Year:
2000
Language:
english
File:
PDF, 169 KB
english, 2000
20

High Temperature Hardness of Bulk Single Crystal GaN

Year:
2000
Language:
english
File:
PDF, 84 KB
english, 2000