Volume 29; Issue 9

IEEE Electron Device Letters

Volume 29; Issue 9

1

Design of Tunneling Field-Effect Transistors Using Strained-Silicon/Strained-Germanium Type-II Staggered Heterojunctions

Nayfeh, O.M., Chleirigh, C.N., Hennessy, J., Gomez, L., Hoyt, J.L., Antoniadis, D.A.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 539 KB

english, 2008

2

The Gate Leakage Current in Graphene Field-Effect Transistor

Mao, Ling-Feng, Li, Xi-Jun, Wang, Zi-Ou, Wang, Jin-Yan

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 275 KB

english, 2008

3

Electromigration Studies of Cu/Carbon Nanotube Composite Interconnects Using Blech Structure

Chai, Yang, Chan, Philip C. H., Fu, Yunyi, Chuang, Y. C., Liu, C. Y.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 328 KB

english, 2008

4

High-Performance Flexible Hybrid Field-Effect Transistors Based on Cellulose Fiber Paper

Fortunato, Elvira, Correia, Nuno, Barquinha, Pedro, Pereira, LuÃs, Goncalves, GonÃalo, Martins, Rodrigo

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 358 KB

english, 2008

5

Effective Crosstalk Isolation With Post-CMOS Selectively Grown Porous Silicon Technique for Radio Frequency System-on-Chip (SOC) Applications

Li, Chen, Liao, Huailin, Wang, Chuan, Huang, Ru, Wang, Yangyuan

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 528 KB

english, 2008

6

Electrical Characteristics of Near-Interface Traps in 3C-SiC Metal–Oxide–Semiconductor Capacitors

F. C. J. Kong, S. Dimitrijev, J. Han

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 126 KB

english, 2008

7

12-kV p-Channel IGBTs With Low On-Resistance in 4H-SiC

Q. Zhang, M. Das, J. Sumakeris, R. Callanan, A. Agarwal

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 391 KB

english, 2008

8

Demonstration of $L_{g} \sim \hbox{55}\ \hbox{nm}$ pMOSFETs With $\hbox{Si/Si}_{0.25}\hbox{Ge}_{0.75}/\hbox{Si}$ Channels, High $I_{\rm on}/I_{\rm off}\ (≫ \hbox{5} \times \hbox{10}^{4})$ , and Controlled Short Channel Effects (SCEs)

S. Lee, P. Majhi, J. Oh, B. Sassman, C. Young, A. Bowonder, W. Loh, K. Choi, B. Cho, H. Lee, P. Kirsch, H. R. Harris, W. Tsai, S. Datta, H. Tseng, S. K. Banerjee, R. Jammy

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 577 KB

english, 2008

9

Polymeric Substrate Spin-Cast diF-TESADT OTFT Circuits

S. K. Park, D. A. Mourey, S. Subramanian, J. E. Anthony, T. N. Jackson

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 467 KB

english, 2008

10

A Millisecond-Anneal-Assisted Selective Fully Silicided (FUSI) Gate Process

D. Lin, M. Wang, M. Cheng, Y. Sheu, B. Tarng, C. Chu, C. Nieh, C. Lo, W. Tsai, R. Lin, S. Wang, K. Cheng, C. Wu, M. Lei, C. Wu, C. H. Diaz, M. Chen

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 602 KB

english, 2008

11

Using Piezoresistance Model With $C$– $R$ Conversion for Modeling of Strain-Induced Mobility

Y. L. Tsang, A. G. O'neill, B. J. Gallacher, S. H. Olsen

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 153 KB

english, 2008

12

UV-Enhanced a-Si:H Metal–Semiconductor–Metal Photodetector

I. Khodami, F. Taghibakhsh, K. S. Karim

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 179 KB

english, 2008

13

Method for Extracting Gate-Voltage-Dependent Source Injection Resistance of Modified Schottky Barrier (MSB) MOSFETs

B. Tsui, C. Lu, H. Liu

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 233 KB

english, 2008

14

Chu, Rongming, Shen, Likun, Fichtenbaum, Nicholas, Brown, David, Chen, Zhen, Keller, Stacia, DenBaars, Steven P., Mishra, Umesh K.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 339 KB

english, 2008

15

Goncalves, Dina, Prazeres, Duarte M. F., Chu, Virginia, Conde, JoÃo Pedro

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 387 KB

english, 2008

16

Microwave ZnO Thin-Film Transistors

Bayraktaroglu, Burhan, Leedy, Kevin, Neidhard, Robert

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 371 KB

english, 2008

17

Flash Cell Arrays

Park, Mincheol, Lee, Chang-Sub, Hur, Sung-Hoi, Kim, Keonsoo, Lee, Won-Seong

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 424 KB

english, 2008

18

On-Resistance Degradation Induced by Hot-Carrier Injection in LDMOS Transistors With STI in the Drift Region

Chen, Jone F., Tian, Kuen-Shiuan, Chen, Shiang-Yu, Wu, Kuo-Ming, Liu, C. M.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 329 KB

english, 2008

19

A “Bottom-Up” Redefinition for Mobility and the Effect of Poor Tube–Tube Contact on the Performance of CNT Nanonet Thin-Film Transistors

Pimparkar, Ninad, Alam, Muhammad Ashraful

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 430 KB

english, 2008

20

Electroabsorption Modulators Suitable for 100-Gb/s Ethernet

Chacinski, Marek, Westergren, Urban, Willen, Bo, Stoltz, BjÖrn, Thylen, Lars

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 274 KB

english, 2008

21

Heterostructure Barriers in Wrap Gated Nanowire FETs

Froberg, Linus E., Rehnstedt, Carl, Thelander, Claes, Lind, Erik, Wernersson, Lars-Erik, Samuelson, Lars

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 265 KB

english, 2008

22

Power Trench MOSFET Devices on Metal Substrates

Wang, Qi, Li, Minhua, Sokolov, Yuri, Black, Arthur, Yilmaz, Hamza, Mancelita, Jan V., Nanatad, Romel

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 359 KB

english, 2008

23

On the Impact of Defects Close to the Gate Electrode on the Low-Frequency $\hbox{1}/f$ Noise

Magnone, Paolo, Pantisano, Luigi, Crupi, Felice, Trojman, Lionel, Pace, Calogero, Giusi, Gino

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 218 KB

english, 2008

24

Abrupt Delta-Doped InP/GaInAs/InP DHBTs With 0.45-$\mu\hbox{m}$-Wide T-Shaped Emitter Contacts

Cohen Elias, Doron, Gavrilov, Arkadi, Cohen, Shimon, Kraus, Shraga, Sayag, Avi, Ritter, Dan

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 584 KB

english, 2008

25

Degeneration of CMOS Power Cells After Hot-Carrier and Load Mismatch Stresses

Liu, Chien-Hsuan, Wang, Ruey-Lue, Su, Yan-Kuin, Tu, Chih-Ho, Juang, Ying-Zong

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 484 KB

english, 2008

26

Abrupt NMOS Inverter Based on Punch-Through Impact Ionization With Hysteresis in the Voltage Transfer Characteristics

Moselund, Kirsten E., Bouvet, Didier, Ionescu, Adrian Mihai

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 432 KB

english, 2008

27

Effect of Oxygen Pressure on the Electrical Properties of $\hbox{Bi}_{5} \hbox{Nb}_{3}\hbox{O}_{15}$ Films Grown by RF Magnetron Sputtering

Cho, Kyung-Hoon, Choi, Chang-Hak, Choi, Joo-Young, Seong, Tae-Geun, Nahm, Sahn, Kang, Chong-Yun, Yoon, Seok-Jin, Kim, Jong-Hee

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 539 KB

english, 2008

28

Metal-Core Printed Circuit Board With Alumina Layer by Aerosol Deposition Process

Cho, Hyun Min, Kim, Hyeong Joon

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 434 KB

english, 2008

29

Two-Pulse $C$–$V$ : A New Method for Characterizing Electron Traps in the Bulk of $ \hbox{SiO}_{2}/\hbox{high-}\kappa$ Dielectric Stacks

Zhang, W. D., Govoreanu, B., Zheng, X. F., Ruiz Aguado, D., Rosmeulen, M., Blomme, P., Zhang, J. F., Van Houdt, J.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 235 KB

english, 2008

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски