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Volume 32; Issue 11
Main
IEEE Electron Device Letters
Volume 32; Issue 11
IEEE Electron Device Letters
Volume 32; Issue 11
1
Thirteenth IEEE International Vacuum Electronics Conference and Ninth IEEE International Vacuum Electron Sources Conference (IVEC-IVESC 2012)
Journal:
IEEE Electron Device Letters
Year:
2011
File:
PDF, 1015 KB
Your tags:
2011
2
Ge/SiGe Quantum Well p-i-n Structures for Uncooled Infrared Bolometers
Atar, F.B.
,
Yesilyurt, A.
,
Onbasli, M.C.
,
Hanoglu, O.
,
Okyay, A.K.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 395 KB
Your tags:
english, 2011
3
Vertically Integrated Unidirectional Biristor
Dong-Il Moon
,
Sung-Jin Choi
,
Sungho Kim
,
Jae-Sub Oh
,
Young-Su Kim
,
Yang-Kyu Choi
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 406 KB
Your tags:
english, 2011
4
Vertical InGaAs/InP Tunnel FETs With Tunneling Normal to the Gate
Zhou, Guangle
,
Lu, Yeqing
,
Li, Rui
,
Zhang, Qin
,
Hwang, Wan Sik
,
Liu, Qingmin
,
Vasen, Tim
,
Chen, Chen
,
Zhu, Haijun
,
Kuo, Jenn-Ming
,
Koswatta, Siyuranga
,
Kosel, Tom
,
Wistey, Mark
,
Fay, Patrick
,
Seabaugh
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 497 KB
Your tags:
english, 2011
5
Pocket Implant-Dependent Channel Mobility in Advanced p-MOSFETs With Strain Engineering
Choi, Youn Sung
,
Ekbote, Shashank
,
Baldwin, Greg
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 416 KB
Your tags:
english, 2011
6
300-GHz InAlN/GaN HEMTs With InGaN Back Barrier
Lee, Dong Seup
,
Gao, Xiang
,
Guo, Shiping
,
Kopp, David
,
Fay, Patrick
,
Palacios, Tomás
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 477 KB
Your tags:
english, 2011
7
pH Sensing Characteristics of Extended-Gate Field-Effect Transistor Based on Al-Doped ZnO Nanostructures Hydrothermally Synthesized at Low Temperatures
Yang, Po-Yu
,
Wang, Jyh-Liang
,
Chiu, Po-Chun
,
Chou, Jung-Chuan
,
Chen, Cheng-Wei
,
Li, Hung-Hsien
,
Cheng, Huang-Chung
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 396 KB
Your tags:
english, 2011
8
InAlN/GaN HEMTs on Sapphire Substrate With 2.9-W/mm Output Power Density at 18 GHz
Lecourt, F.
,
Ketteniss, N.
,
Behmenburg, H.
,
Defrance, N.
,
Hoel, V.
,
Eickelkamp, M.
,
Vescan, A.
,
Giesen, C.
,
Heuken, M.
,
De Jaeger, J.-C.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 129 KB
Your tags:
english, 2011
9
Voltage-Pulse-Induced Switching Dynamics in $ \hbox{VO}_{2}$ Thin-Film Devices on Silicon
Seo, Giwan
,
Kim, Bong-Jun
,
Ko, Changhyun
,
Cui, Yanjie
,
Lee, Yong Wook
,
Shin, Jun-Hwan
,
Ramanathan, Shriram
,
Kim, Hyun-Tak
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 420 KB
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english, 2011
10
Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In–Ga–Zn–O Thin-Film Transistors
Chen, Wei-Tsung
,
Lo, Shih-Yi
,
Kao, Shih-Chin
,
Zan, Hsiao-Wen
,
Tsai, Chuang-Chuang
,
Lin, Jian-Hong
,
Fang, Chun-Hsiang
,
Lee, Chung-Chun
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 336 KB
Your tags:
english, 2011
11
High-Performance $\hbox{Ni}/\hbox{Lu}_{2}\hbox{O}_{3}/ \hbox{TaN}$ Metal–Insulator–Metal Capacitors
S. Mondal
,
T. Pan
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 377 KB
Your tags:
english, 2011
12
Buffer Thickness Contribution to Suppress Vertical Leakage Current With High Breakdown Field (2.3 MV/cm) for GaN on Si
I. B. Rowena
,
S. L. Selvaraj
,
T. Egawa
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 446 KB
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english, 2011
13
CMOS-Compatible Vertical-Silicon-Nanowire Gate-All-Around p-Type Tunneling FETs With $\leq 50$-mV/decade Subthreshold Swing
Gandhi, Ramanathan
,
Chen, Zhixian
,
Singh, Navab
,
Banerjee, Kaustav
,
Lee, Sungjoo
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 314 KB
Your tags:
english, 2011
14
Fully Gravure Printed Half Adder on Plastic Foils
J. Noh
,
S. Kim
,
K. Jung
,
J. Kim
,
S. Cho
,
G. Cho
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 357 KB
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english, 2011
15
Low-Voltage Organic/Inorganic Hybrid Transparent Thin-Film Transistors Gated by Chitosan-Based Proton Conductors
B. Zhou
,
J. Sun
,
X. Han
,
J. Jiang
,
Q. Wan
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 337 KB
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english, 2011
16
Excellent Selector Characteristics of Nanoscale $ \hbox{VO}_{2}$ for High-Density Bipolar ReRAM Applications
Son, Myungwoo
,
Lee, Joonmyoung
,
Park, Jubong
,
Shin, Jungho
,
Choi, Godeuni
,
Jung, Seungjae
,
Lee, Wootae
,
Kim, Seonghyun
,
Park, Sangsu
,
Hwang, Hyunsang
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 421 KB
Your tags:
english, 2011
17
Highly Scaled Vertical Cylindrical SONOS Cell With Bilayer Polysilicon Channel for 3-D nand Flash Memory
G. Van Den Bosch
,
G. S. Kar
,
P. Blomme
,
A. Arreghini
,
A. Cacciato
,
L. Breuil
,
A. De Keersgieter
,
V. Paraschiv
,
C. Vrancken
,
B. Douhard
,
O. Richard
,
S. Van Aerde
,
I. Debusschere
,
J. Van Houdt
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 440 KB
Your tags:
english, 2011
18
Observation of Extreme-Ultraviolet-Irradiation-Induced Damages on High-Dielectric-Constant Dielectrics
B. Tsui
,
P. Li
,
C. Yen
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 451 KB
Your tags:
english, 2011
19
Effect of $\hbox{Ge}_{2}\hbox{Sb}_{2}\hbox{Te}_{5}$ Thermal Barrier on Reset Operations in Filament-Type Resistive Memory
W. Lee
,
M. Siddik
,
S. Jung
,
J. Park
,
S. Kim
,
J. Shin
,
J. Lee
,
S. Park
,
M. Son
,
H. Hwang
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 419 KB
Your tags:
english, 2011
20
Surface-Potential-Based Analytic DC $I$ –$V$ Model With Effective Electron Density for $a$-IGZO TFTs Considering the Parasitic Resistance
J. Park
,
Y. Kim
,
S. Kim
,
H. Bae
,
D. H. Kim
,
D. M. Kim
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 197 KB
Your tags:
english, 2011
21
Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density
M. Bae
,
Y. Kim
,
D. Kong
,
H. K. Jeong
,
W. Kim
,
J. Kim
,
I. Hur
,
D. M. Kim
,
D. H. Kim
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 324 KB
Your tags:
english, 2011
22
A Physical Model for Work-Function Variation in Ultra-Short Channel Metal-Gate MOSFETs
S. H. Rasouli
,
C. Xu
,
N. Singh
,
K. Banerjee
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 258 KB
Your tags:
english, 2011
23
Application of Post-$\hbox{HfO}_{2}$ Fluorine Plasma Treatment for Improvement of $\hbox{In}_{0.53}\hbox{Ga}_{0.47} \hbox{As}$ MOSFET Performance
Chen, Yen-Ting
,
Wang, Yanzhen
,
Xue, Fei
,
Zhou, Fei
,
Lee, Jack C.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 422 KB
Your tags:
english, 2011
24
Electrical and Photosensivity Characteristics of Hybrid/Composite ZnO Nanorod Transistors
Peng, Shi-Ming
,
Su, Yan-Kuin
,
Ji, Liang-Wen
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 304 KB
Your tags:
english, 2011
25
Scaling of Silicon Phase-Change Oscillators
Cywar, Adam
,
Dirisaglik, Faruk
,
Akbulut, Mustafa
,
Bakan, Gokhan
,
Steen, Steven
,
Silva, Helena
,
Gokirmak, Ali
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 422 KB
Your tags:
english, 2011
26
Realization of Ni Fully Silicided Gate on Vertical Silicon Nanowire MOSFETs for Adjusting Threshold Voltage $({V}_{T})$
Chen, Z. X.
,
Singh, N.
,
Lo, G. Q.
,
Kwong, D.-L.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 399 KB
Your tags:
english, 2011
27
Low-Temperature, Ion Beam-Assisted SiC Thin Films With Antireflective ZnO Nanorod Arrays for High-Temperature Photodetection
Lien, Wei-Cheng
,
Tsai, Dung-Sheng
,
Chiu, Shu-Hsien
,
Senesky, Debbie G.
,
Maboudian, Roya
,
Pisano, Albert P.
,
He, Jr-Hau
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 422 KB
Your tags:
english, 2011
28
Enhanced Current Drivability of CVD Graphene Interconnect in Oxygen-Deficient Environment
Kang, Chang Goo
,
Lee, Sang Kyung
,
Lee, Young Gon
,
Hwang, Hyeon Jun
,
Cho, Chunhum
,
Lim, Sung Kwan
,
Heo, Jinseong
,
Chung, Hyun-Jong
,
Yang, Heejun
,
Seo, Sunae
,
Lee, Byoung Hun
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 292 KB
Your tags:
english, 2011
29
Low-Voltage Electric-Double-Layer TFTs on $ \hbox{SiO}_{2}$-Covered Paper Substrates
Dou, Wei
,
Jiang, Jie
,
Sun, Jia
,
Zhou, Bin
,
Wan, Qing
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 404 KB
Your tags:
english, 2011
30
Forming-Free $\hbox{TiO}_{2}$-Based Resistive Switching Devices on CMOS-Compatible W-Plugs
Hermes, C.
,
Bruchhaus, R.
,
Waser, R.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 428 KB
Your tags:
english, 2011
31
Sub-10-nm Tunnel Field-Effect Transistor With Graded Si/Ge Heterojunction
Shih, Chun-Hsing
,
Chien, Nguyen Dang
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 559 KB
Your tags:
english, 2011
32
Variability of Inversion-Mode and Junctionless FinFETs due to Line Edge Roughness
Leung, Greg
,
Chui, Chi On
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 400 KB
Your tags:
english, 2011
33
AlGaN-on-Si-Based 10-$\mu\hbox{m}$ Pixel-to-Pixel Pitch Hybrid Imagers for the EUV Range
Malinowski, Pawel E.
,
Duboz, Jean-Yves
,
De Moor, Piet
,
John, Joachim
,
Minoglou, Kyriaki
,
Srivastava, Puneet
,
Semond, Fabrice
,
Frayssinet, Eric
,
Giordanengo, Boris
,
BenMoussa, Ali
,
Kroth, Udo
,
Gottwald
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 392 KB
Your tags:
english, 2011
34
Reset Statistics of NiO-Based Resistive Switching Memories
Long, Shibing
,
Cagli, Carlo
,
Ielmini, Daniele
,
Liu, Ming
,
Sune, Jordi
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 305 KB
Your tags:
english, 2011
35
Fully Room-Temperature-Fabricated Low-Voltage Operating Pentacene-Based Organic Field-Effect Transistors With HfON Gate Insulator
Liao, Min
,
Ishiwara, Hiroshi
,
Ohmi, Shun-ichiro
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 267 KB
Your tags:
english, 2011
36
High-Performance AlGaN/GaN Schottky Diodes With an AlGaN/AlN Buffer Layer
Lee, Geng-Yen
,
Liu, Hsueh-Hsing
,
Chyi, Jen-Inn
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 366 KB
Your tags:
english, 2011
37
Thin-Film Thermocouple Array for Time-Resolved Local Temperature Mapping
Liu, Haixiao
,
Sun, Weiqiang
,
Chen, Qing
,
Xu, Shengyong
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 341 KB
Your tags:
english, 2011
38
Impact Ionization Coefficients in $\hbox{Al}_{0.52} \hbox{In}_{0.48}\hbox{P}$
Ong, Jennifer S. L.
,
Ng, Jo S.
,
Krysa, Andrey B.
,
David, John P. R.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 192 KB
Your tags:
english, 2011
39
Comparison of the Low-Frequency Noise of Bulk Triple-Gate FinFETs With and Without Dynamic Threshold Operation
de Andrade, Maria Glória Caño
,
Martino, João Antonio
,
Simoen, Eddy
,
Claeys, Cor
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 230 KB
Your tags:
english, 2011
40
An Improved Si Tunnel Field Effect Transistor With a Buried Strained $\hbox{Si}_{1-x}\hbox{Ge}_{x}$ Source
Zhao, Q. T.
,
Hartmann, J. M.
,
Mantl, S.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 404 KB
Your tags:
english, 2011
41
150-GHz RF SOI-CMOS Technology in Ultrathin Regime on Organic Substrate
Lecavelier des Etangs-Levallois, Aurélien
,
Dubois, Emmanuel
,
Lesecq, Marie
,
Danneville, François
,
Poulain, Laurent
,
Tagro, Yoann
,
Lepilliet, Sylvie
,
Gloria, Daniel
,
Raynaud, Christine
,
Troadec, David
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 577 KB
Your tags:
english, 2011
42
Temperature- and Doping-Dependent Anisotropic Stationary Electron Velocity in Wurtzite GaN
Sridharan, Sriraaman
,
Christensen, Adam
,
Venkatachalam, Anusha
,
Graham, Samuel
,
Yoder, P. D.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 146 KB
Your tags:
english, 2011
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