Volume 38; Issue 2

IEEE Electron Device Letters

Volume 38; Issue 2

1

Modeling the Effect of Interface Roughness on the Performance of Tunnel FETs

Sant, Saurabh, Schenk, Andreas

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 221 KB

english, 2017

2

Evidence of Supercoupling Effect in Ultrathin Silicon Layers Using a Four-Gate MOSFET

Cristoloveanu, S., Athanasiou, S., Bawedin, M., Galy, Ph.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 855 KB

english, 2017

3

Black Phosphorus p- and n-MOSFETs With Electrostatically Doped Contacts

Robbins, Matthew C., Koester, Steven J.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 786 KB

english, 2017

4

A Small-Area and Low-Power Scan Driver Using a Coplanar a-IGZO Thin-Film Transistor With a Dual-Gate for Liquid Crystal Displays

Kim, Do-Sung, Kwon, Oh-Kyong

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 497 KB

english, 2017

5

A Surface-Potential-Based DC Model of Amorphous Oxide Semiconductor TFTs Including Degeneration

Fang, Jielin, Deng, Wanling, Ma, Xiaoyu, Huang, Junkai, Wu, Weijing

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 2.01 MB

english, 2017

6

Long-Term Depression Mimicked in an IGZO-Based Synaptic Transistor

Wang, Jiabin, Li, Yuxing, Yin, Changqing, Yang, Yi, Ren, Tian-Ling

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 635 KB

english, 2017

7

Band-Bending Effect in the Characterization of Subgap Density-of-States in Amorphous TFTs Through Fully Electrical Techniques

Lee, Heesung, Kim, Jaewon, Choi, Sungju, Kim, Seong Kwang, Kim, Junyeap, Park, Jaewon, Choi, Sung-Jin, Kim, Dae Hwan, Kim, Dong Myong

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 766 KB

english, 2017

8

Highly Enhanced Performance of Network Channel Polysilicon Thin-Film Transistors

Lee, Hojoon, Lee, Junyoung, Baek, Sangwon, Jeong, Woong Hee, Lee, Yongsu, Yang, Taehoon, Lee, Jeong-Soo

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 617 KB

english, 2017

9

Influence of Fast Charging on Accuracy of Mobility in ${a}$ -InHfZnO Thin-Film Transistor

Kim, Taeho, Choi, Rino, Jeon, Sanghun

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 326 KB

english, 2017

10

A Novel Operation Scheme Enabling Easy Integration of Selector and Memory

He, Wei, Yang, Hongxin, Song, Li, Huang, Kejie, Zhao, Rong

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 787 KB

english, 2017

11

A Study of Vertical Thin Poly-Si Channel Transfer Gate Structured CMOS Image Sensors

Park, Sung-Kun, Yang, Yun-Hui, Lee, Cha-Young, Kwon, Young-Jun, Shin, Tae-Sun, Park, Jae Hyeon, Hong, Chris, Cho, In-Wook, Yoo, Kyung-Dong

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 475 KB

english, 2017

12

A Spintronic Voltage-Controlled Stochastic Oscillator for Event-Driven Random Sampling

Lee, H., Grezes, C., Lee, A., Ebrahimi, F., Khalili Amiri, P., Wang, K. L.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 3.69 MB

english, 2017

13

Functionally Complete Boolean Logic in 1T1R Resistive Random Access Memory

Wang, Zhuo-Rui, Su, Yu-Ting, Li, Yi, Zhou, Ya-Xiong, Chu, Tian-Jian, Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Sze, Simon M., Miao, Xiang-Shui

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 738 KB

english, 2017

14

Numerical Simulation for Operation of Flexible Thin-Film Transistors With Bending

Asadirad, Mojtaba, Pouladi, Sara, Shervin, Shahab, Oh, Seung Kyu, Lee, Keon Hwa, Kim, Jeomoh, Lee, Sung-Nam, Gao, Ying, Dutta, Pavel, Selvamanickam, Venkat, Ryou, Jae-Hyun

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 1.02 MB

english, 2017

15

High-Performance 500 V Quasi- and Fully-Vertical GaN-on-Si pn Diodes

Zhang, Yuhao, Piedra, Daniel, Sun, Min, Hennig, Jonas, Dadgar, Armin, Yu, Lili, Palacios, Tomas

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 721 KB

english, 2017

16

An Improved X-Band Triaxial Klystron Amplifier for Gigawatt Long-Pulse High-Power Microwave Generation

Ju, Jinchuan, Zhang, Jun, Shu, Ting, Zhong, Huihuang

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 723 KB

english, 2017

17

Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach

Sharma, Prateek, Tyaginov, Stanislav, Rauch, Stewart E., Franco, Jacopo, Makarov, Alexander, Vexler, Mikhail I., Kaczer, Ben, Grasser, Tibor

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 899 KB

english, 2017

18

A WO 3 Nanoparticles NO Gas Sensor Prepared by Hot-Wire CVD

Lin, Chih-Hung, Chang, Shoou-Jinn, Hsueh, Ting-Jen

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 620 KB

english, 2017

19

Nb Doped TiO 2 Protected Back-Channel-Etched Amorphous InGaZnO Thin Film Transistors

Zhang, Letao, Zhou, Xiaoliang, Yang, Huan, He, Hongyu, Wang, Longyan, Zhang, Min, Zhang, Shengdong

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 480 KB

english, 2017

20

Reduction of the Cell-to-Cell Variability in Hf 1-x Al x O y Based RRAM Arrays by Using Program Algorithms

Perez, E., Grossi, A., Zambelli, C., Olivo, P., Roelofs, R., Wenger, Ch.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 262 KB

english, 2017

21

Optimization of RRAM-Based Physical Unclonable Function With a Novel Differential Read-Out Method

Pang, Yachuan, Wu, Huaqiang, Gao, Bin, Deng, Ning, Wu, Dong, Liu, Rui, Yu, Shimeng, Chen, An, Qian, He

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 1.12 MB

english, 2017

22

Fabrication and Modeling of a Capacitor Microfluidically Tuned by Water

Habbachi, Nizar, Boussetta, Hatem, Boukabache, Ali, Kallala, Mohamed Adel, Pons, Patrick, Besbes, Kamel

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 715 KB

english, 2017

23

Realization of High Color Uniformity for Phosphor-Converted White Light-Emitting Diodes Through a Stamp-Printed Phosphor Coating

Zhang, Zefeng, Zheng, Huai, Liu, Sheng

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 1.24 MB

english, 2017

24

Propagation of Non-Reciprocal Magnetostatic Surface Wave in a 20-nm-Thick Single Crystalline Yttrium Iron Garnet Film

Jeon, H. M., Brockdorf, K., Howe, B. M., Myers, J., Mou, S., Zhuang, Y.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 758 KB

english, 2017

25

AlGaN/GaN MIS-HEMTs of Very-Low ${V}_{\sf {{th}}}$ Hysteresis and Current Collapse With In-Situ Pre-Deposition Plasma Nitridation and LPCVD-Si3N4 Gate Insulator

Zhang, Zhili, Li, Weiyi, Fu, Kai, Yu, Guohao, Zhang, Xiaodong, Zhao, Yanfei, Sun, Shichuang, Song, Liang, Deng, Xuguang, Xing, Zheng, Yang, Lei, Ji, Rongkun, Zeng, Chunhong, Fan, Yaming, Dong, Zhihua,

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 854 KB

english, 2017

26

Characterization of Dynamic Self-Heating in GaN HEMTs Using Gate Resistance Measurement

Cutivet, Adrien, Cozette, Flavien, Bouchilaoun, Meriem, Chakroun, Ahmed, Arenas, Osvaldo, Lesecq, Marie, De Jaeger, Jean-Claude, Jaouad, Abdelatif, Boone, Francois, Maher, Hassan

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 605 KB

english, 2017

27

Performance Enhancements in p-Type Al-Doped Tin-Oxide Thin Film Transistors by Using Fluorine Plasma Treatment

Chen, Po-Chun, Chiu, Yu-Chien, Liou, Guan-Lin, Zheng, Zhi-Wei, Cheng, Chun-Hu, Wu, Yung-Hsien

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 433 KB

english, 2017

28

Microcrystalline Silicon Photodiode For Large Area NIR Light Detection Applications

Khosropour, Alireza, Sazonov, Andrei

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 665 KB

english, 2017

29

1/f-Noise in AlGaN/GaN Nanowire Omega-FinFETs

Vodapally, Sindhuri, Jang, Young In, Kang, In Man, Cho, In-Tak, Lee, Jong-Ho, Bae, Youngho, Ghibaudo, Gerard, Cristoloveanu, Sorin, Im, Ki-Sik, Lee, Jung-Hee

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 545 KB

english, 2017

30

Influence of Intercell Trapped Charge on Vertical NAND Flash Memory

Choi, Woo Young, Kwon, Hyug Su, Kim, Yong Jun, Lee, Byungin, Yoo, Hyunseung, Choi, Sangmoo, Cho, Gyu-Seog, Park, Sung-Kye

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 1.24 MB

english, 2017

31

High-Performance Ti-Doped Zinc Oxide TFTs With Double-Layer Gate Dielectric Fabricated at Low Temperature

Cui, Guodong, Han, Dedong, Cong, Yingying, Dong, Junchen, Yu, Wen, Zhang, Shengdong, Zhang, Xing, Wang, Yi

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 822 KB

english, 2017

32

Single-Resonator Dual-Frequency BEOL-Embedded CMOS-MEMS Oscillator With Low-Power and Ultra-Compact TIA Core

Riverola, Martin, Sobreviela, Guillermo, Torres, Francesc, Uranga, Arantxa, Barniol, Nuria

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 1.37 MB

english, 2017

33

A Novel Low V F Super Barrier Rectifier (SBR) With an N-Enhancement Layer

Chen, Wensuo, Zhang, Peijian, Zhong, Yi, Tan, Kaizhou, Liao, Ruijin, Zeng, Zheng, Zhang, Bo

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 808 KB

english, 2017

34

Heterogeneous Interconnect Stitching Technology With Compressible MicroInterconnects for Dense Multi-Die Integration

Zhang, Xuchen, Jo, Paul K., Zia, Muneeb, May, Gary S., Bakir, Muhannad S.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 1.00 MB

english, 2017

35

IEEE Electron Device Letters

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 109 KB

english, 2017

36

New Distortion Correction Algorithm for Two-Dimensional Tetra-Lateral Position-Sensitive Silicon Photomultiplier

Zhao, Tianqi, Li, Baicheng, Li, Chenhui, Wang, Ruiheng, Miao, Quanlong, Liang, Kun, Yang, Ru, Han, Dejun

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 555 KB

english, 2017

37

2017 IEEE Compound Semiconductor Symposium

Journal:

IEEE Electron Device Letters

Year:

2017

File:

PDF, 1.72 MB

2017

38

Silicon Nanoelectronics Workshop

Journal:

IEEE Electron Device Letters

Year:

2017

File:

PDF, 2.11 MB

2017

39

Table of contents

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 211 KB

english, 2017

40

EDS Meetings Calendar

Journal:

IEEE Electron Device Letters

Year:

2017

File:

PDF, 2.07 MB

2017

41

IEEE Electron Device Letters information for authors

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 119 KB

english, 2017

42

Table of contents

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 278 KB

english, 2017

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