51

Charge distribution and chemical bonding in CdGeP2 and CdGeAs2

Year:
1984
Language:
english
File:
PDF, 232 KB
english, 1984
55

Pseudopotential band structure of

Year:
1982
Language:
english
File:
PDF, 438 KB
english, 1982
70

Electronic energies of

Year:
1983
Language:
english
File:
PDF, 84 KB
english, 1983
77

Reversible dielectric breakdown of thin gate oxides in MOS devices

Year:
1993
Language:
english
File:
PDF, 493 KB
english, 1993
85

High field dynamic stress of thin SiO2 films

Year:
1995
Language:
english
File:
PDF, 600 KB
english, 1995
86

Characterization of interface states in thin films of thermally grown SiO2

Year:
1984
Language:
english
File:
PDF, 292 KB
english, 1984