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51

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - 300mm FinFET results utilizing conformal, damage free, ultra shallow junctions (Xj∼5nm) formed with molecular monolayer doping technique

Ang, K.-W., Barnett, J., Loh, W.-Y., Huang, J., Min, B.-G., Hung, P. Y., Ok, I., Yum, J. H., Bersuker, G., Rodgers, M., Kaushik, V., Gausepohl, S., Hobbs, C., Kirsch, P. D., Jammy, R.

Year:

2011

Language:

english

File:

PDF, 3.75 MB

english, 2011

52

Nucleation and growth study of atomic layer deposited HfO[sub 2] gate dielectrics resulting in improved scaling and electron mobility

Kirsch, P. D., Quevedo-Lopez, M. A., Li, H. -J., Senzaki, Y., Peterson, J. J., Song, S. C., Krishnan, S. A., Moumen, N., Barnett, J., Bersuker, G., Hung, P. Y., Lee, B. H., Lafford, T., Wang, Q., Gay,

Journal:

Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 615 KB

english, 2006

53

interface

Sharia, Onise, Demkov, Alexander A., Bersuker, Gennadi, Lee, B. H.

Journal:

Physical Review B

Year:

2008

Language:

english

File:

PDF, 941 KB

english, 2008

54

[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Issues associated with p-type band-edge effective work function metal electrodes: Fermi-level pinning and flatband roll-off

Wen, Huang-Chun, Choi, Kisik, Park, C. S., Majhi, Prashant, Harris, H. Rusty, Niimi, Hiro, Park, D. Hong-Bae, Bersuker, Gennadi, Lysaght, Patrick, Kwong, D. L., Song, S.C., Lee, Byoung Hun, Jammy, Raj

Year:

2007

Language:

english

File:

PDF, 1.11 MB

english, 2007

55

AC Variability and Endurance Measurement Technique for Resistive Switching Memories

Deora, S., Bersuker, G., Matthews, K., Gilmer, D. C., Kirsch, P. D.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 968 KB

english, 2014

56

[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Identification of electrically active non-visual defects in advanced devices

Bersuker, Gennadi

Year:

2012

Language:

english

File:

PDF, 103 KB

english, 2012

57

The Jahn–Teller Effect || Pseudo Jahn–Teller, product Jahn–Teller, and Renner–Teller effects

Bersuker, Isaac

Year:

2006

Language:

english

File:

PDF, 627 KB

english, 2006

58

(Invited) Electrical Characterization and Reliability Assessment of Double-Gate FinFETs

Young, C. D., Akarvardar, K., Matthews, K., Baykan, M. O., Pater, J., Ok, I., Ngai, T., Ang, K.-W., Minakais, M., Bersuker, G., Deora, S., Hobbs, C., Kirsch, P., Jammy, R.

Journal:

ECS Transactions

Year:

2013

Language:

english

File:

PDF, 207 KB

english, 2013

59

Characterization of Ultra-Thin Hf-based Alternative Dielectric Layers for Si CMOS by Z-contrast Imaging and Electron Energy-Loss Spectroscopy in STEM

Agustin, Melody P, Foran, Brendan, Bersuker, Gennadi, Barnett, Joel, Stemmer, Susanne

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 984 KB

english, 2004

60

Mechanism of Electron Trapping and Characteristics of Traps in $\hbox{HfO}_{2}$ Gate Stacks

Bersuker, Gennadi, Sim, J. H., Park, Chang Seo, Young, Chadwin D., Nadkarni, Suvid V., Choi, Rino, Lee, Byoung Hun

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 935 KB

english, 2007

61

Chemical Processing and Materials Compatibility of High-K Dielectric Materials for Advanced Gate Stacks

Guan, J.J., Gale, Glenn W., Bersuker, G., Jackson, M., Huff, Howard R.

Journal:

Solid State Phenomena

Year:

2001

File:

PDF, 333 KB

2001

62

In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories

Shi, Yuanyuan, Ji, Yanfeng, Hui, Fei, Nafria, Montserrat, Porti, Marc, Bersuker, Gennadi, Lanza, Mario

Journal:

Advanced Electronic Materials

Year:

2015

Language:

english

File:

PDF, 916 KB

english, 2015

63

Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter

Jiao, G. F., Lu, J. W., Campbell, J. P., Ryan, J. T., Cheung, Kin P., Young, C. D., Bersuker, G.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 825 KB

english, 2014

64

Conductive filament structure in HfO2 resistive switching memory devices

Privitera, S., Bersuker, G., Lombardo, S., Bongiorno, C., Gilmer, D.C.

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.55 MB

english, 2015

65

Ultrasonic evaluation of the Jahn–Teller effect parameters. Application to ZnSe:Cr 2 +

Gudkov, V V, Bersuker, I B, Zhevstovskikh, I V, Korostelin, Yu V, Landman, A I

Journal:

Journal of Physics Condensed Matter

Year:

2011

Language:

english

File:

PDF, 475 KB

english, 2011

66

Ultra-Short Pulse Current–Voltage Characterization of the Intrinsic Characteristics of High-κ Devices

Young, Chadwin D., Zhao, Yuegang, Pendley, Michael, Lee, Byoung Hun, Matthews, Kenneth, Sim, Jang Hoan, Choi, Rino, Brown, George A., Murto, Robert W., Bersuker, Gennadi

Journal:

Japanese Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 363 KB

english, 2005

67

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Threading dislocations in III-V semiconductors: Analysis of electrical conduction

Iglesias, V., Porti, M., Couso, C., Wu, Q., Claramunt, S., Nafria, M., Miranda, E., Domingo, N., Bersuker, G., Cordes, A.

Year:

2015

Language:

english

File:

PDF, 1.01 MB

english, 2015

68

[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - New insights on the origin of Resistive switching in HfO2 thin films: The role of local mechanical strength

Yuanyuan Shi,, Yanfeng Ji,, Fei Hui,, Nafria, Montserrat, Porti, Marc, Bersuker, Gennadi, Lanza, Mario

Year:

2015

Language:

english

File:

PDF, 813 KB

english, 2015

69

Giant permittivity and electrostriction induced by dynamic Jahn-Teller and pseudo Jahn-Teller effects

Bersuker, Isaac B.

Journal:

Applied Physics Letters

Year:

2015

Language:

english

File:

PDF, 262 KB

english, 2015

70

[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Electrical Characterization Methodologies for the Assessment of High-k Gate Dielectric Stacks

Young, Chadwin D., Bersuker, Gennadi, Heh, Dawei, Neugroschel, Arnost, Choi, Rino, Kang, Chang Yong, Tun, Joey, Lee, Byoung Hun

Year:

2007

Language:

english

File:

PDF, 872 KB

english, 2007

71

Conductive paths through polycrystalline BaTiO 3 : Scanning probe microscopy study

Ayvazian, Talin, Bersuker, Gennadi, Lingley, Zachary R., Brodie, Miles J., Foran, Brendan J.

Journal:

Applied Physics Letters

Year:

2016

Language:

english

File:

PDF, 3.81 MB

english, 2016

72

Vibronic (pseudo Jahn-Teller) theory of ferroelectricity: Novel aspects and applications

Bersuker, I. B.

Journal:

Year:

2018

Language:

english

File:

PDF, 4.51 MB

english, 2018

73

Advances in Non-Volatile Memory and Storage Technology || Metal-oxide resistive random access memory (RRAM) technology: Material and operation details and ramifications

Year:

2019

Language:

english

File:

PDF, 18.82 MB

english, 2019

74

Ultrasonic Determination of the Jahn–Teller Effect Parameters in Impurity-Containing Crystals

Averkiev, N. S., Bersuker, I. B., Gudkov, V. V., Zhevstovskikh, I. V., Sarychev, M. N., Zherlitsyn, S., Yasin, S., Korostelin, Yu. V., Surikov, V. T.

Journal:

Journal of Experimental and Theoretical Physics

Year:

2019

Language:

english

File:

PDF, 1.26 MB

english, 2019

75

Limitations of density functional theory in application to degenerate states

Bersuker, Isaac B.

Journal:

Journal of Computational Chemistry

Year:

1997

Language:

english

File:

PDF, 238 KB

english, 1997

76

Pharmacophore Identification and Bioactivity Prediction for Group I Metabotropic Glutamate Receptor Agonists by the Electron-Conformational QSAR Method

Eran Rosines, Isaac B. Bersuker, James E. Boggs

Journal:

Molecular Informatics

Year:

2001

Language:

english

File:

PDF, 257 KB

english, 2001

77

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Introduction: Subject and Methods

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 520 KB

english, 2010

78

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Appendixes

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 508 KB

english, 2010

79

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Frontmatter

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 596 KB

english, 2010

80

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Atomic States

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 804 KB

english, 2010

81

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Stereochemistry and Crystal Chemistry

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 1.04 MB

english, 2010

82

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Electronic Structure Investigated by Physical Methods

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 1.54 MB

english, 2010

83

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Electronic Control of Molecular Shapes and Transformations via Vibronic Coupling

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 1.18 MB

english, 2010

84

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Reactivity and Catalytic Action

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 1.35 MB

english, 2010

85

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Electronic Structure and Chemical Bonding

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 1.54 MB

english, 2010

86

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Symmetry Ideas and Group-Theoretical Description

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 636 KB

english, 2010

87

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Electron Transfer, Redox Properties, and Electron-Conformational Effects

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 819 KB

english, 2010

88

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Formula Index

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 457 KB

english, 2010

89

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Crystal Field Theory

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 966 KB

english, 2010

90

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Subject Index

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 440 KB

english, 2010

91

Electronic Structure and Properties of Transition Metal Compounds (Introduction to the Theory) || Answers and Solutions

Bersuker, Isaac B.

Year:

2010

Language:

english

File:

PDF, 646 KB

english, 2010

92

ChemInform Abstract: Improved Electron-Conformational Method of Pharmacophore Identification and Bioactivity Prediction. Application to Angiotensin Converting Enzyme Inhibitors.

Isaac B. Bersuker, Sueleyman Bahceci, James E. Boggs

Journal:

Year:

2001

File:

PDF, 25 KB

2001

93

ChemInform Abstract: Modern Aspects of the Jahn—Teller Effect Theory and Applications to Molecular Problems

Isaac B. Bersuker

Journal:

Year:

2001

File:

PDF, 24 KB

2001

94

ChemInform Abstract: Methods of Combined Quantum/Classical (QM/MM) Modeling for Large Organometallic and Metallobiochemical Systems.

Isaac B. Bersuker

Journal:

Year:

2002

File:

PDF, 24 KB

2002

95

Structural and electronic origin of meat odour of organic hetero-atomic compounds

A. S. Dimoglo, M. Yu. Gorbachov, I. B. Bersuker, A. I. Greni, L. E. Vysotskaya, O. V. Stepanova, E. Yu. Lukash

Journal:

Molecular Nutrition & Food Research

Year:

1988

Language:

english

File:

PDF, 517 KB

english, 1988

96

Study of the electronic and structural properties of the chemical compounds in garlic aroma

Prof. I. B. Bersuker, Dr. A. S. Dimoglo, Dr. M. Yu. Gorbachov, Prof. Dr. A. I. Greni, Dr. L. E. Vysotskaya, T. V. Mikhailova

Journal:

Molecular Nutrition & Food Research

Year:

1989

Language:

english

File:

PDF, 278 KB

english, 1989

97

Electron delocalization in trinuclear mixed-valence clusters

S.A. Borshch, I.N. Kotov, I.B. Bersuker

Journal:

Chemical Physics Letters

Year:

1982

Language:

english

File:

PDF, 255 KB

english, 1982

98

A vibronic model for exchange-coupled mixed-valence dimers

S.A. Borshch, I.N. Kotov, I.B. Bersuker

Journal:

Chemical Physics Letters

Year:

1984

Language:

english

File:

PDF, 467 KB

english, 1984

99

Pseudo Jahn—Teller origin of square-planar configuration instability of main-group-element hydrides

I.B. Bersuker, N.N. Gorinchoi, V.Z. Polinger

Journal:

Journal of Molecular Structure

Year:

1992

Language:

english

File:

PDF, 1017 KB

english, 1992

100

The origin of the isotropic EPR spectrum of a Jahn-Teller impurity in crystals

G.I. Bersuker, V.Z. Polinger

Journal:

Solid State Communications

Year:

1981

Language:

english

File:

PDF, 219 KB

english, 1981

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