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51

Mise en evidence et localisation des protons dans les bioxydes de plomb PbO2α et β chimiques et électrochimiques

P. Boher, P. Garnier, J.R. Gavarri

Journal:

Journal of Solid State Chemistry

Year:

1984

File:

PDF, 721 KB

1984

52

Monoxyde quadratique PbOα(I): Description de la transition structurale ferroe´lastique

P. Boher, P. Garnier, J.R. Gavarri, A.W. Hewat

Journal:

Journal of Solid State Chemistry

Year:

1985

File:

PDF, 503 KB

1985

53

Dilatation thermique, anisotropie structurale, et polymorphisme des sulfates de plomb PbSO4, nPbO (n = 0, 1, 2, 4)

P. Boher, P. Garnier, B.F. Mentzen

Journal:

Journal of Solid State Chemistry

Year:

1985

File:

PDF, 604 KB

1985

54

Monoxyde PbOα(II): Élasticité et vibrations anisotropes; modélisation; constantes élastiques

J.R. Gavarri, P. Boher, A.W. Hewat

Journal:

Journal of Solid State Chemistry

Year:

1985

File:

PDF, 777 KB

1985

55

Proton motions in battery lead dioxides

J.R. Gavarri, P. Garnier, P. Boher, A.J. Dianoux, G. Chedeville, B. Jacq

Journal:

Journal of Solid State Chemistry

Year:

1988

Language:

english

File:

PDF, 833 KB

english, 1988

56

Influence of the surface treatments by multipolar plasma on the slow state tunnel kinetics at the In0.53Ga0.47As/Si3N4 interfaces

J.M. López-Villegas, A. Cornet, J.R. Morante, M. Renaud, P. Boher

Journal:

Surface Science Letters

Year:

1991

Language:

english

File:

PDF, 63 KB

english, 1991

57

Quasielastic neutron scattering study of proton motions in chemical and electrochemical PbO2 oxides

J.R. Gavarri, P. Garnier, P. Boher, A.J. Dianoux

Journal:

Solid State Ionics

Year:

1988

Language:

english

File:

PDF, 758 KB

english, 1988

58

Single shot excimer laser annealing of amorphous silicon for AMLCD

Pierre Boher, Jean Louis Stehle, Marc Stehle, Bruno Godard

Journal:

Applied Surface Science

Year:

1996

Language:

english

File:

PDF, 592 KB

english, 1996

59

In situ spectroscopic ellipsometry: present status and future needs for thin film characterisation and process control

Pierre Boher, Jean Louis Stehle

Journal:

Materials Science and Engineering: B

Year:

1996

Language:

english

File:

PDF, 499 KB

english, 1996

60

New High Spatial Resolution and Tissue Equivalent Two-dimensional Dosimeter for IMRT Quality Control

Boher, P.M., Collomb Patton, V., Leroux, T., Fontbonne, J., Vela, A., Batalla, A.

Journal:

International Journal of Radiation Oncology*Biology*Physics

Year:

2008

Language:

english

File:

PDF, 41 KB

english, 2008

61

Prostate Brachytherapy with Iodine 125 Implants in Patients with Intermediate Risk Prostate Cancer: A Highly Efficient Treatment when Compared with High Dose External Beam Radiotherapy

S. Naji, T. Duberge, J. Boher, F. Bladou, M. Resbeut, G. Gravis, J. Walz, J. Hannoun Levi

Journal:

International Journal of Radiation Oncology*Biology*Physics

Year:

2009

Language:

english

File:

PDF, 42 KB

english, 2009

62

UV–VIS and mid-IR ellipsometer characterization of layers used in OLED devices

E. Hartmann, P. Boher, Ch. Defranoux, L. Jolivet, M.-O. Martin

Journal:

Journal of Luminescence

Year:

2004

Language:

english

File:

PDF, 345 KB

english, 2004

63

Effect of gamma irradiation and cooking on cowpea bean grains (Vigna unguiculata L. Walp)

Keila dos Santos Cople Lima, Luciana Boher e Souza, Ronoel Luiz de Oliveira Godoy, Tanos Celmar Costa França, Antônio Luís dos Santos Lima

Journal:

Radiation Physics and Chemistry

Year:

2011

Language:

english

File:

PDF, 659 KB

english, 2011

64

Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics

P Boher, P Evrard, O Condat, C Dos Reis, C Defranoux, E Bellandi

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 193 KB

english, 2004

65

Infrared spectroscopic ellipsometry applied to the characterization of nano-structures of silicon IC manufacturing

P Boher, M Bucchia, C Guillotin, C Defranoux

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 350 KB

english, 2004

66

Combined characterization of group IV heterostructures and materials by spectroscopic ellipsometry and grazing X-ray reflectance

P. Boher, J.L. Stehle, L. Hennet

Journal:

Thin Solid Films

Year:

1997

File:

PDF, 499 KB

1997

67

Combined characterization of conductive materials by infrared spectroscopic ellipsometry and grazing X-ray reflectance

Pierre Boher, Michel Luttmann, Jean Louis Stehle, Louis Hennet

Journal:

Thin Solid Films

Year:

1998

Language:

english

File:

PDF, 282 KB

english, 1998

68

Atomic scale characterization of semiconductors by in-situ real time spectroscopic ellipsometry

Pierre Boher, Jean Louis Stehle

Journal:

Thin Solid Films

Year:

1998

Language:

english

File:

PDF, 431 KB

english, 1998

69

Single shot excimer laser crystallization and LPCVD silicon TFTs

Y Helen, K Mourgues, F Raoult, T Mohammed-Brahim, O Bonnaud, R Rogel, S Prochasson, P Boher, D Zahorski

Journal:

Thin Solid Films

Year:

1999

Language:

english

File:

PDF, 248 KB

english, 1999

70

Carbon dependence of the dielectric response function in epitaxial SiGeC layers grown on Si

J. Bonan, F. Meyer, E. Finkman, P. Warren, P. Boher

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 207 KB

english, 2000

71

Analysis of the friction and wear behavior of hot work tool scale: application to the hot rolling process

C Vergne, C Boher, C Levaillant, R Gras

Journal:

Year:

2001

Language:

english

File:

PDF, 1.07 MB

english, 2001

72

Wear of die materials in full scale plastic injection moulding of glass fibre reinforced polycarbonate

J. Bergstrom, F. Thuvander, P. Devos, C. Boher

Journal:

Year:

2001

Language:

english

File:

PDF, 656 KB

english, 2001

73

Degradations in a high-speed sliding contact in transient regime

O. Lesquois, J.J. Serra, P. Kapsa, S. Serror, C. Boher

Journal:

Year:

1996

Language:

english

File:

PDF, 768 KB

english, 1996

74

Low-k dielectrics: a non-destructive characterization by infrared spectroscopic ellipsometry

P. Boher, C. Defranoux, M. Bucchia, C. Guillotin

Journal:

Microelectronic Engineering

Year:

2003

Language:

english

File:

PDF, 773 KB

english, 2003

75

SOPRA SE300: a new tool for high accuracy characterization of multilayer structures

Pierre Boher, Marc Bucchia, Jean Pierre Rey, Jean Louis Stehle

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 923 KB

english, 1999

76

Influence of the nitrogen content on the field emission properties of a-CNx films prepared by pulsed laser deposition

E Fogarassy, T Szorenyi, F Antoni, J.P Stoquert, G Pirio, J Olivier, P Legagneux, P Boher, O Pons-Y-Moll

Journal:

Applied Surface Science

Year:

2002

Language:

english

File:

PDF, 160 KB

english, 2002

77

A new process to manufacture thin SiGe and SiGeC epitaxial films on silicon by ion implantation and excimer laser annealing

Pierre Boher, Jean Louis Stehle, E Fogarassy

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 221 KB

english, 1999

78

Characterization of CNx films deposited by pulsed laser ablation using spectroscopic ellipsometry

Pierre Boher, E. Fogarassy, T. Szörényi, F. Antoni

Journal:

Surface and Coatings Technology

Year:

2002

Language:

english

File:

PDF, 202 KB

english, 2002

79

Tribological study of diamond coatings on titanium alloys

D. Rats, L. Vandenbulcke, C. Boher, G. Farges

Journal:

Surface and Coatings Technology

Year:

1997

Language:

english

File:

PDF, 711 KB

english, 1997

80

Ti/TiN multilayers for hard coatings applications: in-situ characterization by real time spectroscopic ellipsometry

Pierre Boher, Jean Louis Stehle, Sid Labdi, Philippe Houdy

Journal:

Surface and Coatings Technology

Year:

1998

Language:

english

File:

PDF, 432 KB

english, 1998

81

Non-destructive characterisation of doped Si and SiGe epilayers using FTIR spectroscopic ellipsometry (FTIR-SE)

C Pickering, W.Y Leong, J.L Glasper, P Boher, J.-P Piel

Journal:

Materials Science and Engineering: B

Year:

2002

Language:

english

File:

PDF, 487 KB

english, 2002

82

Two-stage design of clinical trials involving recurrent events

Richard J. Cook, Pierre-Jerome Bergeron, Jean-Marie Boher, Yang Liu

Journal:

Statistics in Medicine

Year:

2009

Language:

english

File:

PDF, 197 KB

english, 2009

83

Etude des transitions de phase du sulfate dibasique de plomb PbSO4, 2PbO: Influence de la vitesse de montee en temperature et de L'histoire thermique

P. Boher, P. Grégoire, P. Garnier, B. F. Mentzen

Journal:

Journal of Thermal Analysis and Calorimetry

Year:

1987

File:

PDF, 724 KB

1987

84

Thermal stability of amorphous carbon films deposited by pulsed laser ablation

S. Rey, F. Antoni, B. Prevot, E. Fogarassy, J.C. Arnault, J. Hommet, F. Le Normand, P. Boher

Journal:

Applied Physics A: Materials Science & Processing

Year:

2000

Language:

english

File:

PDF, 159 KB

english, 2000

85

Super-lateral-growth regime analysis in long-pulse-duration excimer-laser crystallization of a-Si films on SiO2

E. Fogarassy, S. de Unamuno, B. Prevot, P. Boher, M. Stehle, D. Pribat

Journal:

Applied Physics A: Materials Science & Processing

Year:

1999

Language:

english

File:

PDF, 450 KB

english, 1999

86

Field emission properties of a-CNxfilms prepared by pulsed laser deposition

E. Fogarassy, T. Szorényi, F. Antoni, G. Pirio, J. Olivier, P. Legagneux, P. Boher

Journal:

Applied Physics A: Materials Science & Processing

Year:

2003

Language:

english

File:

PDF, 207 KB

english, 2003

87

Frontotemporal dementia and parkinsonism with the P301Staugene mutation in a Jewish family

Alexander Lossos, Avinoam Reches, Aya Gal, Joel P. Newman, Dov Soffer, John Moshe Gomori, Moshe Boher, Dana Ekstein, Iftah Biran, Zeev Meiner, Oded Abramsky, Hanna Rosenmann

Journal:

Journal of Neurology

Year:

2003

Language:

english

File:

PDF, 1.56 MB

english, 2003

88

Gradual reduction of BUBR1 protein levels results in premature sister-chromatid separation then in aneuploidy

Elodie Bohers, Nasrin Sarafan-Vasseur, Aurélie Drouet, Marianne Paresy, Jean-Baptiste Latouche, Jean-Michel Flaman, Richard Sesboüé, Thierry Frebourg

Journal:

Year:

2008

Language:

english

File:

PDF, 316 KB

english, 2008

89

Implications of Model Misspecification in Robust Tests for Recurrent Events

J. Boher, R. J. Cook

Journal:

Lifetime Data Analysis

Year:

2006

Language:

english

File:

PDF, 386 KB

english, 2006

90

Modèle de décomposition thermique des bioxydes de plomb: Rôle des protons, relation avec la structure de l'oxyde pseudocubique PbO1.57

P. Boher, P. Garnier, J.R. Gavarri, D. Weigel

Journal:

Journal of Solid State Chemistry

Year:

1984

File:

PDF, 892 KB

1984

91

Influence des impuretés sur la stabilité thermique et la structure dex oxydes de plomb Pb3O4 et PbOα

P. Boher, P. Garnier

Journal:

Journal of Solid State Chemistry

Year:

1984

File:

PDF, 260 KB

1984

92

InGaAs/Si3N4 interface obtained in ultrahigh vacuum multipolar plasma: In-situ control by ellipsometry and electrical characterization

P. Boher, M. Renaud, J.M. Lopez-Villegas, J. Schneider, J.P. Chane

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 434 KB

english, 1987

93

Isolation quality in passivated semi-insulating GaAs analyzed by leakage current transients

J. Gual, J. Samitier, J.R. Morante, J. Anton, P. Boher, M. Renaud

Journal:

Applied Surface Science

Year:

1989

Language:

english

File:

PDF, 212 KB

english, 1989

94

Physical characterization of mixed HfAlOx layers by complementary analysis techniques

H Bender, Th Conard, O Richard, B Brijs, J Pétry, W Vandervorst, C Defranoux, P Boher, N Rochat, C Wyon, P Mack, J Wolstenholme, R Vitchev, L Houssiau, J-J Pireaux, A Bergmaier, G Dollinger

Journal:

Materials Science and Engineering: B

Year:

2004

Language:

english

File:

PDF, 267 KB

english, 2004

95

VUV spectroscopic ellipsometry applied to the characterization of high-k dielectrics

P Boher, C Defranoux, P Heinrich, J Wolstenholme, H Bender

Journal:

Materials Science and Engineering: B

Year:

2004

Language:

english

File:

PDF, 215 KB

english, 2004

96

Influence of oxides on friction in hot rolling: Experimental investigations and tribological modelling

C. Vergne, C. Boher, R. Gras, C. Levaillant

Journal:

Year:

2006

Language:

english

File:

PDF, 1.71 MB

english, 2006

97

Wear mechanisms of WC–Co cutting tools from high-speed tribological tests

T. Kagnaya, C. Boher, L. Lambert, M. Lazard, T. Cutard

Journal:

Year:

2009

Language:

english

File:

PDF, 1.80 MB

english, 2009

98

A wear model based on cumulative cyclic plastic straining

C. Boher, O. Barrau, R. Gras, F. Rezai-Aria

Journal:

Year:

2009

Language:

english

File:

PDF, 1.92 MB

english, 2009

99

Single shot excimer laser crystallization of silicon films deposited by LPCVD

K. Kis-Sion, T. Mohammed-Brahim, D. Briand, M. Sarret, F. Lebihan, B. Fortin, O. Bonnaud, P. Boher, M. Stehle, J.L. Stehle

Journal:

Thin Solid Films

Year:

1997

Language:

english

File:

PDF, 315 KB

english, 1997

100

Analysis of the friction and wear behaviour of hot work tool steel for forging

O Barrau, C Boher, R Gras, F Rezai-Aria

Journal:

Year:

2003

Language:

english

File:

PDF, 1.17 MB

english, 2003