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51

[IEEE 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) - Toronto, ON, Canada (2014.8.18-2014.8.21)] 14th IEEE International Conference on Nanotechnology - Alternating current approach on Si nanograting FETs for pH sensitivity improvement

Honglei Wang,, Yuchen Liang,, Pengyuan Zang,, Young, Chadwin D., Hu, Walter

Year:

2014

Language:

english

File:

PDF, 424 KB

english, 2014

52

In-situ CdS/CdTe Heterojuntions Deposited by Pulsed Laser Deposition

Avila-Avendano, Jesus, Mejia, Israel, Alshareef, Husam N., Guo, Zaibing, Young, Chadwin, Quevedo-Lopez, Manuel

Journal:

Thin Solid Films

Year:

2016

Language:

english

File:

PDF, 808 KB

english, 2016

53

[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Session 6: Capacitances

Tuinhout, Hans P., Young, Chadwin

Year:

2016

File:

PDF, 142 KB

2016

54

[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy (24-26 May 2006)] 2006 IEEE International Conference on IC Design and Technology - Characterization of HfSiON Gate Dielectric with TiN Gate on Multi-Gate MOSFET

Weize Xiong,, Chadwin Young,, Matthew, K., Cleavelin, C.R., Schulz, T., Schruefer, K., Patruno, P.

Year:

2006

Language:

english

File:

PDF, 2.83 MB

english, 2006

55

[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - Foreword

Year:

2010

Language:

english

File:

PDF, 29 KB

english, 2010

56

[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Top-gated MoS2 capacitors and transistors with high-k dielectrics for interface study

Zhao, Peng, Azcatl, Angelica, Bolshakov-Barrett, Pavel, Wallace, Robert M., Young, Chadwin D., Hurley, Paul K.

Year:

2016

Language:

english

File:

PDF, 8.15 MB

english, 2016

57

Effects of annealing on top-gated MoS 2 transistors with HfO 2 dielectric

Zhao, Peng, Azcatl, Angelica, Bolshakov, Pavel, Moon, Jiyoung, Hinkle, Christopher L., Hurley, Paul K., Wallace, Robert M., Young, Chadwin D.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.44 MB

english, 2017

58

[IEEE 2017 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2017.5.14-2017.5.17)] 2017 IEEE International Memory Workshop (IMW) - Low Temperature (400°c) Ferroelectric Hf0.5Zr0.5O2 Capacitors for Next-Generation FRAM Applications

Kim, Si Joon, Narayan, Dushyant, Lee, Jae-Gil, Mohan, Jaidah, Lee, Joy S., Lee, Jaebeom, Young, Chadwin D., Kim, Jiyoung, Summerfelt, Scott R., San, Tamer, Colombo, Luigi

Year:

2017

Language:

english

File:

PDF, 981 KB

english, 2017

59

Improvement in top-gate MoS 2 transistor performance due to high quality backside Al 2 O 3 layer

Bolshakov, Pavel, Zhao, Peng, Azcatl, Angelica, Hurley, Paul K., Wallace, Robert M., Young, Chadwin D.

Journal:

Applied Physics Letters

Year:

2017

Language:

english

File:

PDF, 840 KB

english, 2017

60

Low temperature (100 °C) atomic layer deposited-ZrO 2 for recessed gate GaN HEMTs on Si

Byun, Young-Chul, Lee, Jae-Gil, Meng, Xin, Lee, Joy S., Lucero, Antonio T., Kim, Si Joon, Young, Chadwin D., Kim, Moon J., Kim, Jiyoung

Journal:

Applied Physics Letters

Year:

2017

Language:

english

File:

PDF, 1.84 MB

english, 2017

61

(Invited) Investigation of Critical Interfaces in Few-Layer MoS 2 Field Effect Transistors with High-k Dielectrics

Young, Chadwin D, Bolshakov, P., Zhao, P., Smyth, C., Khosravi, A., Hurley, P. K., Hinkle, Christopher L, Wallace, Robert M

Journal:

ECS Transactions

Year:

2017

Language:

english

File:

PDF, 395 KB

english, 2017

62

Large ferroelectric polarization of TiN/Hf 0.5 Zr 0.5 O 2 /TiN capacitors due to stress-induced crystallization at low thermal budget

Kim, Si Joon, Narayan, Dushyant, Lee, Jae-Gil, Mohan, Jaidah, Lee, Joy S., Lee, Jaebeom, Kim, Harrison S., Byun, Young-Chul, Lucero, Antonio T., Young, Chadwin D., Summerfelt, Scott R., San, Tamer, Co

Journal:

Applied Physics Letters

Year:

2017

Language:

english

File:

PDF, 2.81 MB

english, 2017

63

Electrical characterization of the temperature dependence in CdTe/CdS heterojunctions deposited in-situ by pulsed laser deposition

Avila-Avendano, Jesus, Quevedo-Lopez, Manuel, Young, Chadwin

Journal:

Applied Physics Letters

Year:

2018

Language:

english

File:

PDF, 1.24 MB

english, 2018

64

Evaluation of border traps and interface traps in HfO2/MoS2 gate stacks by capacitance - Voltage analysis

Zhao, Peng, Khosravi, Ava, Azcatl, Angelica, Bolshakov, Pavel, Mirabelli, Gioele, Caruso, Enrico, Hinkle, Chris, Hurley, Paul K, Wallace, Robert M, young, chadwin

Journal:

Year:

2018

Language:

english

File:

PDF, 789 KB

english, 2018

65

Effect of film thickness on the ferroelectric and dielectric properties of low-temperature (400 °C) Hf 0.5 Zr 0.5 O 2 films

Kim, Si Joon, Mohan, Jaidah, Lee, Jaebeom, Lee, Joy S., Lucero, Antonio T., Young, Chadwin D., Colombo, Luigi, Summerfelt, Scott R., San, Tamer, Kim, Jiyoung

Journal:

Applied Physics Letters

Year:

2018

Language:

english

File:

PDF, 1.67 MB

english, 2018

66

[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - Reliability and modeling: What to simulate and how?

Zhang, Rui, Yang, Kexin, Metaev, Elnatan, Pesic, Milan, Lloyd, Jim, Ring, Matt, Paliwoda, Peter, Tan, Sheldon, Young, Chadwin, Verzellesi, Giovanni, Puzzilli, Giuseppina, Puschkarsky, Katja, LaRow, Ch

Year:

2017

File:

PDF, 62 KB

2017

67

[IEEE 2018 IEEE International Memory Workshop (IMW) - Kyoto, Japan (2018.5.13-2018.5.16)] 2018 IEEE International Memory Workshop (IMW) - Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors with Low-Voltage Operation and High Reliability for Next-Generation FRAM Applications

Kim, Si Joon, Mohan, Jaidah, Young, Chadwin D., Colombo, Luigi, Kim, Jiyoung, Summerfelt, Scott R., San, Tamer

Year:

2018

Language:

english

File:

PDF, 2.40 MB

english, 2018

68

Metrology Study of Sub 20Å Oxynitride by Corona-Oxide-Silicon (COS) and Conventional C-V Approaches

Hung, Pui Yee, Brown, George A., Zhang, Michelle, Bennett, Joe, AL-Shareef, Husam N., Young, Chadwin, Oroshiba, Chris, Diebold, Alain

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 100 KB

english, 2002

69

[IEEE 2018 International Conference on IC Design & Technology (ICICDT) - Otranto, Italy (2018.6.4-2018.6.6)] 2018 International Conference on IC Design & Technology (ICICDT) - Electrical characterization of process induced effects on non-silicon devices

Young, Chadwin D., Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Zhao, Peng, Khosravi, Ava, Mejia, Israel, Quevedo-Lopez, Manuel, Hinkle, Christopher L., Wallace, Robert M.

Year:

2018

Language:

english

File:

PDF, 1.17 MB

english, 2018

70

[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Sensitivity of high-k encapsulated MoS2 transistors to I-V measurement execution time

Bolshakov, Pavel, Khosravi, Ava, Zhao, Peng, Wallace, Robert M., Young, Chadwin D., Hurley, Paul K.

Year:

2018

Language:

english

File:

PDF, 1.01 MB

english, 2018

71

[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - 2D materials in electronics devices

Young, Chadwin, Ring, Matt, Lloyd, Jim, Jayanthinarasimham, Avyaya, LaRow, Charles, Shluger, Alexander

Year:

2017

File:

PDF, 58 KB

2017

72

Low-voltage operation and high endurance of 5-nm ferroelectric Hf 0.5 Zr 0.5 O 2 capacitors

Kim, Si Joon, Mohan, Jaidah, Kim, Harrison Sejoon, Lee, Jaebeom, Young, Chadwin D., Colombo, Luigi, Summerfelt, Scott R., San, Tamer, Kim, Jiyoung

Journal:

Applied Physics Letters

Year:

2018

Language:

english

File:

PDF, 2.35 MB

english, 2018

73

Wafer Scale Graphene Field Effect Transistors on Thin Thermal Oxide

Ravichandran, Arul Vigneswar, Lee, Jaebeom, Cheng, Lanxia, Lucero, Antonio Tomas, Young, Chadwin D, Colombo, Luigi, Venugopal, Archana, Polley, Arup, Kim, Jiyoung

Journal:

ECS Transactions

Year:

2018

Language:

english

File:

PDF, 387 KB

english, 2018

74

A New Analytical Tool for the Study of Radiation Effects in 3-Dimensional Integrated Circuits: Near-Zero Field Magnetoresistance Spectroscopy

Ashton, James P., Moxim, Stephen J., Lenahan, Patrick M., McKay, Colin G., Waskiewicz, Ryan J., Myers, Kenneth J., Flatti, Michael E., Harmon, Nicholas, Young, Chadwin D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 1.69 MB

english, 2018

75

Relatively Low-Temperature Processing and Its Impact on Device Performance and Reliability

Young, Chadwin D, Bolshakov, Pavel, Rodriguez Davila, Rodolfo A, Zhao, Peng, Smyth, C., Quevedo-Lopez, M, Wallace, Robert M

Journal:

ECS Transactions

Year:

2019

Language:

english

File:

PDF, 908 KB

english, 2019

76

High-stability pH sensing with few-layer MoS2 field-effect transistor

Wang, Honglei, Zhao, Peng, Zeng, Xuan, young, chadwin, Hu, Walter

Journal:

Year:

2019

Language:

english

File:

PDF, 986 KB

english, 2019

77

Engineering the interface chemistry for scandium electron contacts in WSe2 transistors and diodes

Smyth, Christopher M, Walsh, Lee, Bolshakov, Pavel, Catalano, Massimo, Schmidt, Michael, Sheehan, Brendan, Addou, Rafik, Wang, Luhua, Kim, Jiyoung, Kim, Moon J, young, chadwin, Hinkle, Christopher, Wa

Journal:

Year:

2019

Language:

english

File:

PDF, 851 KB

english, 2019

78

Understanding the Impact of Annealing on Interface and Border Traps in the Cr/HfO 2 /Al 2 O 3 /MoS 2 System

Zhao, Peng, Padovani, Andrea, Bolshakov, Pavel, Khosravi, Ava, Larcher, Luca, Hurley, Paul K., Hinkle, Christopher L, Wallace, Robert M., Young, Chadwin D.

Journal:

ACS Applied Electronic Materials

Year:

2019

Language:

english

File:

PDF, 1.36 MB

english, 2019

79

High-stability pH sensing with few-layer MoS2 field-effect transistor

Wang, Honglei, Zhao, Peng, Zeng, Xuan, young, chadwin, Hu, Walter

Journal:

Year:

2019

File:

PDF, 986 KB

2019

80

Understanding the Impact of Annealing on Interface and Border Traps in the Cr/HfO 2 /Al 2 O 3 /MoS 2 System

Zhao, Peng, Padovani, Andrea, Bolshakov, Pavel, Khosravi, Ava, Larcher, Luca, Hurley, Paul K., Hinkle, Christopher L, Wallace, Robert M., Young, Chadwin D.

Journal:

ACS Applied Electronic Materials

Year:

2019

File:

PDF, 1.36 MB

2019

81

[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Understanding the Effects of Low-Temperature Passivation and Annealing on ZnO TFTs Test Structures

Rodriguez-Davila, Rodolfo A., Bolshakov, Pavel, Young, Chadwin D., Quevedo-Lopez, Manuel

Year:

2019

File:

PDF, 852 KB

2019

82

[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Proposed one-dimensional passive array test circuit for parallel kelvin measurement with efficient area use

Rerecich, Matthew, Young, Chadwin D.

Year:

2019

Language:

english

File:

PDF, 664 KB

english, 2019

83

Effect of hydrogen derived from oxygen source on low-temperature ferroelectric TiN/Hf 0.5 Zr 0.5 O 2 /TiN capacitors

Kim, Si Joon, Mohan, Jaidah, Kim, Harrison Sejoon, Lee, Jaebeom, Hwang, Su Min, Narayan, Dushyant, Lee, Jae-Gil, Young, Chadwin D., Colombo, Luigi, Goodman, Gary, Wan, Alan S., Cha, Pil-Ryung, Summerf

Journal:

Applied Physics Letters

Year:

2019

Language:

english

File:

PDF, 1.62 MB

english, 2019

84

Direct Observation of Large Atomic Polar Displacements in Epitaxial Barium Titanate Thin Films

Wu, HsinWei, Lu, Sirong, Aoki, Toshihiro, Ponath, Patrick, Wang, Jian, Young, Chadwin, Ekerdt, John G., McCartney, Martha R., Smith, David J.

Journal:

Advanced Materials Interfaces

Year:

2020

File:

PDF, 1.40 MB

2020

85

A Comprehensive Study on the Effect of TiN Top and Bottom Electrodes on Atomic Layer Deposited Ferroelectric Hf0.5Zr0.5O2 Thin Films

Kim, Si Joon, Mohan, Jaidah, Kim, Harrison Sejoon, Hwang, Su Min, Kim, Namhun, Jung, Yong Chan, Sahota, Akshay, Kim, Kihyun, Yu, Hyun-Yong, Cha, Pil-Ryung, Young, Chadwin D., Choi, Rino, Ahn, Jinho, K

Journal:

Year:

2020

File:

PDF, 2.53 MB

2020

86

Dielectric breakdown in epitaxial BaTiO 3 thin films

Wu, HsinWei, Ponath, Patrick, Lin, Edward L., Wallace, Robert M., Young, Chadwin, Ekerdt, John G., Demkov, Alexander A., McCartney, Martha R., Smith, David J.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2020

File:

PDF, 1.97 MB

2020