Eklow, B.: search on Z-Library

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51

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Optimized reasoning-based diagnosis for non-random, board-level, production defects

O'Farrill, C., Moakil-Chbany, M., Eklow, B.

Year:

2005

Language:

english

File:

PDF, 278 KB

english, 2005

52

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - On effective TSV repair for 3D-stacked ICs

Li Jiang,, Qiang Xu,, Eklow, B.

Year:

2012

Language:

english

File:

PDF, 176 KB

english, 2012

53

A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3D-Stacked ICs

Agrawal, Mukesh, Chakrabarty, Krishnendu, Eklow, Bill

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 2.36 MB

english, 2015

54

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Boundary-scan: Built to last? Panel synopsis

Year:

2007

Language:

english

File:

PDF, 42 KB

english, 2007

55

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Re-using chip level DFT at board level

Gu, Xinli, Rearick, Jeff, Eklow, Bill, Keim, Martin, Qian, Jun, Jutman, Artur, Chakrabarty, Krishnendu, Larsson, Erik

Year:

2012

Language:

english

File:

PDF, 101 KB

english, 2012

56

ions

Böhm, S., Schippers, S., Shi, W., Müller, A., Djurić, N., Dunn, G. H., Zong, W., Jelenković, B., Danared, H., Eklöw, N., Glans, P., Schuch, R.

Journal:

Physical Review A

Year:

2001

Language:

english

File:

PDF, 256 KB

english, 2001

57

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FALCON: Rapid statistical fault coverage estimation for complex designs

Mirkhani, Shahrzad, Abraham, Jacob A., Vo, Toai, Jun, Hongshin, Eklow, Bill

Year:

2012

Language:

english

File:

PDF, 838 KB

english, 2012

58

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs

Wang, Ran, Chakrabarty, Krishnendu, Eklow, Bill

Year:

2013

Language:

english

File:

PDF, 1.11 MB

english, 2013

59

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs

Agrawal, Mukesh, Chakrabarty, Krishnendu, Eklow, Bill

Year:

2014

Language:

english

File:

PDF, 536 KB

english, 2014

60

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - No Fault Found: The root cause

Larsson, Erik, Eklow, Bill, Davidsson, Scott, Aitken, Rob, Jutman, Artur, Lotz, Christophe

Year:

2015

File:

PDF, 103 KB

2015

61

Magnetic field dependence in electron–deuteron recombination at very low relative energy

N. Eklöw, P. Glans, W. Zong, R. Schuch, H. Danared

Journal:

Hyperfine Interactions

Year:

2000

Language:

english

File:

PDF, 50 KB

english, 2000

62

Formation and efflux of glutathione disulfide studied in isolated rat hepatocytes

Lena Eklöw, Hjördis Thor, Sten Orrenius

Journal:

Year:

1981

Language:

english

File:

PDF, 393 KB

english, 1981

63

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - An update on IEEE 1149.6 - successes and issues

Year:

2005

Language:

english

File:

PDF, 336 KB

english, 2005

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