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51

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry

Duparré, Angela, Geyl, Roland, Nečas, David, Ohlídal, Ivan, Vodák, Jiří, Ohlídal, Miloslav, Franta, Daniel

Year:

2015

Language:

english

File:

PDF, 1.28 MB

english, 2015

52

Making Public Shame Bearable and Entertaining: Ritualised Shaming in Reality Television

HÃ¡jek, Martin, FrantÃ¡l, Daniel, SimbartlovÃ¡, KateÅina

Journal:

Cultural Sociology

Year:

2020

File:

PDF, 149 KB

2020

53

Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries

Daniel Franta, Ivan Ohlı́dal

Journal:

Optics Communications

Year:

1998

Language:

english

File:

PDF, 268 KB

english, 1998

54

Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers

Ohlídal, Ivan, Vohánka, Jiří, Čermák, Martin, Franta, Daniel

Journal:

Surface Topography: Metrology and Properties

Year:

2019

Language:

english

File:

PDF, 984 KB

english, 2019

55

Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers

Ohlídal, Ivan, Vohánka, Jiří, Čermák, Martin, Franta, Daniel

Journal:

Surface Topography: Metrology and Properties

Year:

2019

File:

PDF, 984 KB

2019

56

Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films

Ivan Ohlídal, Daniel Franta, Martin Šiler, František Vižd’a, Miloslav Frumar, Jaroslav Jedelský, Jaroslav Omasta

Journal:

Journal of Non-Crystalline Solids

Year:

2006

Language:

english

File:

PDF, 284 KB

english, 2006

57

Ellipsometric parameters and reflectances of thin films with slightly rough boundaries

Franta, Daniel, Ohlídal, Ivan

Journal:

Journal of Modern Optics

Year:

1998

Language:

english

File:

PDF, 1.22 MB

english, 1998

58

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Wide spectral range characterization of antireflective coatings and their optimization

Duparré, Angela, Geyl, Roland, Franta, Daniel, Nečas, David, Ohlídal, Ivan, Jankuj, Jiří

Year:

2015

File:

PDF, 1.40 MB

2015

59

SPIE Proceedings [SPIE Eleventh Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics - Stara Lesna, Slova (Monday 21 September 1998)] 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics - Comparison of optical and nonoptical methods for measuring surface roughness

Ohlidal, Ivan, Ohlidal, Miloslav, Franta, Daniel, Tykal, Miroslav, Hrabovsky, Miroslav, Strba, Anton, Urbanczyk, Waclaw

Year:

1999

Language:

english

File:

PDF, 802 KB

english, 1999

60

Hemoglobin Digestion in Blood-Feeding Ticks: Mapping a Multipeptidase Pathway by Functional Proteomics

Martin Horn, Martina Nussbaumerová, Miloslav Šanda, Zuzana Kovářová, Jindřich Srba, Zdeněk Franta, Daniel Sojka, Matthew Bogyo, Conor R. Caffrey, Petr Kopáček, Michael Mareš

Journal:

Chemistry & Biology

Year:

2009

Language:

english

File:

PDF, 1.07 MB

english, 2009

61

Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges

Monika Karásková, Lenka Zajíčková, Vilma Buršíková, Daniel Franta, David Nečas, Olga Bláhová, Jiří Šperka

Journal:

Surface and Coatings Technology

Year:

2010

Language:

english

File:

PDF, 1.05 MB

english, 2010

62

Composition and Functional Properties of Organosilicon Plasma Polymers from Hexamethyldisiloxane and Octamethylcyclotetrasiloxane

Zajickova, Lenka, Kucerova, Zuzana, Bursikova, Vilma, Franta, Daniel, Perina, Vratislav, Mackova, Anna

Journal:

MRS Proceedings

Year:

2007

Language:

english

File:

PDF, 134 KB

english, 2007

63

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

Duparré, Angela, Geyl, Roland, Ohlídal, Miloslav, Ohlidal, Ivan, Nečas, David, Vodák, Jiří, Franta, Daniel, Nádaský, Pavel, Vižd'a, František

Year:

2015

File:

PDF, 734 KB

2015

64

Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region

Franta, Daniel, Franta, Pavel, Vohánka, Jiří, Čermák, Martin, Ohlídal, Ivan

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 2.12 MB

english, 2018

65

Réactions de transformation des extrémités actives de polystyrène «vivant», en présence d'additifs polaires

Danielle Decker, Jean-Pierre Roth, Emile Franta

Journal:

Macromolecular Chemistry and Physics

Year:

1972

File:

PDF, 296 KB

1972

66

Dynamics of digestive proteolytic system during blood feeding of the hard tickIxodes ricinus

Zdeněk Franta, Helena Frantová, Jitka Konvičková, Martin Horn, Daniel Sojka, Michael Mareš, Petr Kopáček

Journal:

Parasites & Vectors

Year:

2010

Language:

english

File:

PDF, 1.27 MB

english, 2010

67

Temperature-dependent dispersion model of float zone crystalline silicon

Franta, Daniel, Dubroka, Adam, Wang, Chennan, Giglia, Angelo, Vohánka, Jiří, Franta, Pavel, Ohlídal, Ivan

Journal:

Applied Surface Science

Year:

2017

Language:

english

File:

PDF, 2.00 MB

english, 2017

68

Optical properties of the crystalline silicon wafers described using the universal dispersion model

Franta, Daniel, Vohánka, Jiří, Bránecký, Martin, Franta, Pavel, Čermák, Martin, Ohlídal, Ivan, Čech, Vladimír

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2019

Language:

english

File:

PDF, 2.48 MB

english, 2019

69

Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces

Daniel Franta, Ivan Ohlídal

Journal:

Optics Communications

Year:

2005

Language:

english

File:

PDF, 236 KB

english, 2005

70

Optical quantities of rough films calculated by Rayleigh-Rice theory

Daniel Franta, Ivan Ohlídal, David Necas

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 246 KB

english, 2008

71

Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method

Petr Klapetek, Ivan Ohlídal, Daniel Franta, Pavel Pokorný

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 229 KB

english, 2002

72

Optical characterization of chalcogenide thin films

Daniel Franta, Ivan Ohlı́dal, Miloslav Frumar, Jaroslav Jedelský

Journal:

Applied Surface Science

Year:

2001

Language:

english

File:

PDF, 135 KB

english, 2001

73

IrAE – An asparaginyl endopeptidase (legumain) in the gut of the hard tick Ixodes ricinus

Daniel Sojka, Ondřej Hajdušek, Jan Dvořák, Mohammed Sajid, Zdeněk Franta, Eric L. Schneider, Charles S. Craik, Marie Vancová, Veronika Burešová, Matthew Bogyo, Kelly B. Sexton, James H. McKerrow, Cono

Journal:

International Journal for Parasitology

Year:

2007

Language:

english

File:

PDF, 1.17 MB

english, 2007

74

SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Advances in Optical Thin Films II - Characterization of optical thin films exhibiting defects

Franta, Daniel, Amra, Claude, Kaiser, Norbert, Ohlídal, Ivan, Macleod, H. Angus

Year:

2005

Language:

english

File:

PDF, 406 KB

english, 2005

75

Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range

Siefke, Thomas, Kroker, Stefanie, Pfeiffer, Kristin, Puffky, Oliver, Dietrich, Kay, Franta, Daniel, Ohlídal, Ivan, Szeghalmi, Adriana, Kley, Ernst-Bernhard, Tünnermann, Andreas

Journal:

Advanced Optical Materials

Year:

2016

Language:

english

File:

PDF, 1.52 MB

english, 2016

76

Optical characterization of non-stoichiometric silicon nitride films

David Necas, Vratislav Perina, Daniel Franta, Ivan Ohlídal, Josef Zemek

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 193 KB

english, 2008

77

The reflectance of non-uniform thin films

Nečas, David, Ohlídal, Ivan, Franta, Daniel

Journal:

Journal of Optics A Pure and Applied Optics

Year:

2009

Language:

english

File:

PDF, 498 KB

english, 2009

78

Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model

Ohlídal, Ivan, Vohánka, Jiří, Mistrík, Jan, Čermák, Martin, Vižd'a, František, Franta, Daniel

Journal:

Thin Solid Films

Year:

2019

Language:

english

File:

PDF, 9.60 MB

english, 2019

79

Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films

Daniel Franta, Martin Hrdlicka, David Necas, Miloslav Frumar, Ivan Ohlídal, Martin Pavli šta

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 326 KB

english, 2008

80

Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model

Daniel Franta, Ivan Ohlı́dal, Miloslav Frumar, Jaroslav Jedelský

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 114 KB

english, 2003

81

Optical Characterization of Nonabsorbing and Weakly Absorbing Thin Films with the Wavelengths Related to Extrema in Spectral Reflectances

Ohlídal, Ivan, Franta, Daniel, Ohlídal, Miloslav, Navrátil, Karel

Journal:

Year:

2001

Language:

english

File:

PDF, 137 KB

english, 2001

82

IrAM—An α2-macroglobulin from the hard tick Ixodes ricinus: Characterization and function in phagocytosis of a potential pathogen Chryseobacterium indologenes

Veronika Buresova, Ondrej Hajdusek, Zdenek Franta, Daniel Sojka, Petr Kopacek

Journal:

Developmental & Comparative Immunology

Year:

2009

Language:

english

File:

PDF, 1.56 MB

english, 2009

83

Two secreted cystatins of the soft tick Ornithodoros moubata: differential expression pattern and inhibitory specificity

Grunclová, Lenka, Horn, Martin, Vancová, Marie, Sojka, Daniel, Franta, Zdeněk, Mareš, Michael, Kopáček, Petr

Journal:

Biological Chemistry

Year:

2006

Language:

english

File:

PDF, 371 KB

english, 2006

84

Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies

Ivan Ohlídal, David Necas, Daniel Franta

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 260 KB

english, 2008

85

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Advances in Thin Film Coatings for Optical Applications - Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O

Ohlidal, Ivan, Ohlidal, Miloslav, Franta, Daniel, Cudek, Vladimir, Bursikova, Vilma, Siler, Martin, Kruschwitz, Jennifer D. T., Oliver, James B.

Year:

2004

Language:

english

File:

PDF, 183 KB

english, 2004

86

Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry

Franta, Daniel, Kotilainen, Minna, Krumpolec, Richard, Ohlídal, Ivan

Journal:

Applied Surface Science

Year:

2016

Language:

english

File:

PDF, 1.79 MB

english, 2016

87

SynthèSe de copolymères triséquencés polybutyramide-polystyrène et polybutyramide-polyisoprène

Michel Schmitt, Emile Franta, Paul Rempp, Daniel Froelich

Journal:

Macromolecular Chemistry and Physics

Year:

1981

File:

PDF, 477 KB

1981

88

IrCL1 – The haemoglobinolytic cathepsin L of the hard tick, Ixodes ricinus

Zdenek Franta, Daniel Sojka, Helena Frantova, Jan Dvorak, Martin Horn, Jindrich Srba, Pavel Talacko, Michael Mares, Eric Schneider, Charles S. Craik, James H. McKerrow, Conor R. Caffrey, Petr Kopacek

Journal:

International Journal for Parasitology

Year:

2011

Language:

english

File:

PDF, 934 KB

english, 2011

89

Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

Vohánka, Jiří, Ohlídal, Ivan, Ohlídal, Miloslav, Šustek, Štěpán, Čermák, Martin, Šulc, Václav, Vašina, Petr, Ženíšek, Jaroslav, Franta, Daniel

Journal:

Year:

2019

File:

PDF, 1.81 MB

2019

90

Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions

Journal:

Journal of Applied Physics

Year:

2020

File:

PDF, 1.52 MB

2020

91

Optical characterization of sol–gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions

Daniel Franta, Ivan Ohlídal, Jan Mistrík, Tomuo Yamaguchi, Gu Jin Hu, Ning Dai

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 134 KB

english, 2005

92

Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering

Ohl&#x000ED, dal, Miloslav, Unc&#x002C7, ovsky&#x000B4, , Marek, Ohl&#x000ED, dal, Ivan, Franta, Daniel

Journal:

Journal of Modern Optics

Year:

1999

Language:

english

File:

PDF, 306 KB

english, 1999

93

Dispersion model of two-phonon absorption: application to c-Si

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan

Journal:

Optical Materials Express

Year:

2014

Language:

english

File:

PDF, 964 KB

english, 2014

94

Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

Daniel Franta, Ivan Ohlı́dal, Petr Klapetek, Pere Roca i Cabarrocas

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 122 KB

english, 2004

95

Models of dielectric response in disordered solids

Franta, Daniel, Nečas, David, Zajíčková, Lenka

Journal:

Year:

2007

Language:

english

File:

PDF, 330 KB

english, 2007

96

ChemInform Abstract: METALLIERUNG VON KOHLENWASSERSTOFFEN DURCH EINWIRKUNG VON METALLHYDROXIDEN IN HEXAMETHYLPHOSPHORTRIAMID

ROTH, JEAN-PIERRE, DECKER, DANIELLE, FRANTA, EMILE, REMPP, PAUL

Journal:

Chemischer Informationsdienst

Year:

1972

File:

PDF, 199 KB

1972

97

Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films

Nečas, David, Ohlídal, Ivan, Franta, Daniel, Ohlídal, Miloslav, Čudek, Vladimír, Vodák, Jiří

Journal:

Year:

2014

Language:

english

File:

PDF, 701 KB

english, 2014

98

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Dispersion model for optical thin films applicable in wide spectral range

Duparré, Angela, Geyl, Roland, Franta, Daniel, Nečas, David, Ohlídal, Ivan, Giglia, Angelo

Year:

2015

Language:

english

File:

PDF, 691 KB

english, 2015

99

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Wide spectral range characterization of antireflective coatings and their optimization

Duparré, Angela, Geyl, Roland, Franta, Daniel, Nečas, David, Ohlídal, Ivan, Jankuj, Jiří

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

100

Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization

Vohánka, Jiří, Ohlídal, Ivan, Ženíšek, Jaroslav, Vašina, Petr, Čermák, Martin, Franta, Daniel

Journal:

Surface and Interface Analysis

Year:

2018

Language:

english

File:

PDF, 822 KB

english, 2018

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