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1

‘‘Nintendo’’

Ghidini, Gustavo

Journal:

IIC - International Review of Intellectual Property and Competition Law

Year:

2014

Language:

english

File:

PDF, 108 KB

english, 2014

2

A Comparative Study of Fashion and IP: Non-traditional Trademarks in Italy and Australia

Ciani, Jacopo, Ghidini, Gustavo, Atkinson, Violet, van Caenegem, William

Journal:

IIC - International Review of Intellectual Property and Competition Law

Year:

2019

Language:

english

File:

PDF, 413 KB

english, 2019

3

TRIPS and Developing Countries ||

Ghidini, Gustavo, Peritz, Rudolph, Ricolfi, Marco

Year:

2014

Language:

english

File:

PDF, 1.64 MB

english, 2014

4

Biotechnology and Software Patent Law ||

Arezzo, Emanuela, Ghidini, Gustavo

Year:

2011

Language:

english

File:

PDF, 1.84 MB

english, 2011

5

Kritika: Essays on Intellectual Property ||

Drahos, Peter, Ghidini, Gustavo, Ullrich, Hanns

Year:

2015

Language:

english

File:

PDF, 1.91 MB

english, 2015

6

In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability

M. Langenbuch, R. Bottini, M.E. Vitali, G. Ghidini

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 318 KB

english, 2005

7

Theories and uses of context in knowledge representation and reasoning

Paolo Bouquet, Chiara Ghidini, Fausto Giunchiglia, Enrico Blanzieri

Journal:

Journal of Pragmatics

Year:

2003

Language:

english

File:

PDF, 296 KB

english, 2003

8

[Lecture Notes in Computer Science] The Semantic Web. Latest Advances and New Domains Volume 9678 ||

Sack, Harald, Blomqvist, Eva, d'Aquin, Mathieu, Ghidini, Chiara, Ponzetto, Simone Paolo, Lange, Christoph

Year:

2016

Language:

english

File:

PDF, 46.11 MB

english, 2016

9

TRIPS and Developing Countries || Access to genetic resources and benefit sharing: The Nagoya Protocol in the light of the TRIPS Agreement

Ghidini, Gustavo, Peritz, Rudolph, Ricolfi, Marco

Year:

2014

Language:

english

File:

PDF, 216 KB

english, 2014

10

Kritika: Essays on Intellectual Property ||

Ghidini, Gustavo, Ullrich, Hanns, Drahos, Peter

Year:

2017

Language:

english

File:

PDF, 1.06 MB

english, 2017

11

O cuidado de enfermagem com o corpo sem vida

Nascimento, Maria Aparecida de Luca, Moraes, Marcelo de Paiva, Ghidini Junior, Rubens, Giannini, Ellen Lima

Journal:

Texto & Contexto - Enfermagem

Year:

2007

File:

PDF, 153 KB

2007

12

Trapped charge and stress induced leakage current (SILC) in tunnel SiO2 layers of de-processed MOS non-volatile memory devices observed at the nanoscale

M. Lanza, M. Porti, M. Nafría, X. Aymerich, G. Ghidini, A. Sebastiani

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 443 KB

english, 2009

13

Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides

M. Ceschia, A. Paccagnella, A. Scarpa, A. Cester, G. Ghidini

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 239 KB

english, 1999

14

Hydrophilic properties of aromatics

IGINO BONADEO, VERA LODI, D. GHIDINI

Journal:

International Journal of Cosmetic Science

Year:

1980

Language:

english

File:

PDF, 627 KB

english, 1980

15

[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - A Digitally Programmable On-Chip RC-Oscillator in 0.25μm CMOS Logic Process

Ghidini, C., Aranda, J.G., Gerna, D., Kelliher, K., Baumhof, C.

Year:

2005

Language:

english

File:

PDF, 223 KB

english, 2005

16

Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

Ceschia, M., Paccagnella, A., Cester, A., Scarpa, A., Ghidini, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 863 KB

english, 1998

17

[IEEE IEEE 1995 International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (22-25 Oct. 1995)] IEEE 1995 International Integrated Reliability Workshop. Final Report - F contamination effects on intrinsic and extrinsic gate oxide reliability

Ghidini, G., Drera, D., Maugain, F.

Year:

1995

Language:

english

File:

PDF, 484 KB

english, 1995

18

Ionizing radiation induced leakage current on ultra-thin gate oxides

Scarpa, A., Paccagnella, A., Montera, F., Ghibaudo, G., Pananakakis, G., Ghidini, G., Fuochi, P.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1997

Language:

english

File:

PDF, 791 KB

english, 1997

19

[Lecture Notes in Computer Science] Knowledge Engineering and Knowledge Management Volume 8982 || WebVOWL: Web-based Visualization of Ontologies

Lambrix, Patrick, Hyvönen, Eero, Blomqvist, Eva, Presutti, Valentina, Qi, Guilin, Sattler, Uli, Ding, Ying, Ghidini, Chiara

Year:

2015

Language:

english

File:

PDF, 427 KB

english, 2015

20

[Lecture Notes in Computer Science] The Semantic Web. Latest Advances and New Domains Volume 9678 || Distributed Context-Aware Applications by Means of Web of Things and Semantic Web Technologies

Sack, Harald, Blomqvist, Eva, d'Aquin, Mathieu, Ghidini, Chiara, Ponzetto, Simone Paolo, Lange, Christoph

Year:

2016

Language:

english

File:

PDF, 704 KB

english, 2016

21

[Lecture Notes in Computer Science] The Semantic Web. Latest Advances and New Domains Volume 9678 || RMLEditor: A Graph-Based Mapping Editor for Linked Data Mappings

Sack, Harald, Blomqvist, Eva, d'Aquin, Mathieu, Ghidini, Chiara, Ponzetto, Simone Paolo, Lange, Christoph

Year:

2016

Language:

english

File:

PDF, 554 KB

english, 2016

22

Dynamic competition in software development: how copyrights and patents, and their overlapping, impact on derivative innovation

Ghidini, Gustavo, Arezzo, Emanuela

Journal:

Queen Mary Journal of Intellectual Property

Year:

2013

Language:

english

File:

PDF, 186 KB

english, 2013

23

Fatigue properties of AlSi10Mg obtained by additive manufacturing: Defect-based modelling and prediction of fatigue strength

Romano, S., Brückner-Foit, A., Brandão, A., Gumpinger, J., Ghidini, T., Beretta, S.

Journal:

Engineering Fracture Mechanics

Year:

2017

Language:

english

File:

PDF, 5.94 MB

english, 2017

24

The Book of the Dead by Orikuchi Shinobu

Ghidini, Chiara

Journal:

Journal of Japanese Studies

Year:

2018

Language:

english

File:

PDF, 321 KB

english, 2018

25

âI Access Your Data, You Access Mineâ: Requiring Data Reciprocity in Payment Services

Di Porto, Fabiana, Ghidini, Gustavo

Journal:

IIC - International Review of Intellectual Property and Competition Law

Year:

2020

File:

PDF, 334 KB

2020

26

[Lecture Notes in Business Information Processing] Business Process Management Forum Volume 392 (BPM Forum 2020, Seville, Spain, September 13â18, 2020, Proceedings) || Feature Development in BPMN-Based Process-Driven Applications

Fahland, Dirk, Ghidini, Chiara, Becker, JÃ¶rg, Dumas, Marlon

Year:

2020

File:

PDF, 1.66 MB

2020

27

Critical reappraisal of the utility of sonographic fetal femur length in the prediction of trisomy 21

Patrizia Vergani, Anna Locatelli, Maria Giovanna Piccoli, Eloisa Mariani, Nicola Strobelt, John C. Pezzullo, Alessandro Ghidini

Journal:

Prenatal Diagnosis

Year:

2000

Language:

english

File:

PDF, 71 KB

english, 2000

28

Fracture mechanics and scale effects in the fatigue of railway axles

S. Beretta, A. Ghidini, F. Lombardo

Journal:

Engineering Fracture Mechanics

Year:

2005

Language:

english

File:

PDF, 980 KB

english, 2005

29

Fatigue life predictions using fracture mechanics methods

T. Ghidini, C. Dalle Donne

Journal:

Engineering Fracture Mechanics

Year:

2009

Language:

english

File:

PDF, 601 KB

english, 2009

30

Impact of interface and bulk trapped charges on transistor reliability

G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 196 KB

english, 2005

31

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

J. Martín-Martínez, S. Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, A. Paccagnella, G. Ghidini

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 634 KB

english, 2007

32

Magnetic anisotropy of LaCo-substituted SrFe12O19 ferrites

G Asti, F Bolzoni, J.M Le Breton, M Ghidini, A Morel, M Solzi, F Kools, P Tenaud

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2004

Language:

english

File:

PDF, 163 KB

english, 2004

33

Magnetic analysis of MnAs films grown on GaAs and Si substrates for potential spintronics and magnetocaloric applications

Massimo Solzi, Chiara Pernechele, Massimo Ghidini, Marco Natali, Marco Bolzan

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2010

Language:

english

File:

PDF, 295 KB

english, 2010

34

Local Models Semantics, or contextual reasoning=locality+compatibility

Chiara Ghidini, Fausto Giunchiglia

Journal:

Artificial Intelligence

Year:

2001

Language:

english

File:

PDF, 519 KB

english, 2001

35

Optimization of WSi2 by SiH4 CVD: impact on oxide quality

D. Brazzelli, G. Ghidini, C. Riva

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 134 KB

english, 2001

36

MOSFET parameter degradation after Fowler–Nordheim injection stress

A Candelori, E Gomiero, G Ghidini, A Paccagnella

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 149 KB

english, 1998

37

The impact of F contamination induced by the process on the gate oxide reliability

G Ghidini, C Clementi, D Drera, F Maugain

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 110 KB

english, 1998

38

Influence of charge trapping on oxide scaling down

G Ghidini, M Alessandri, C Clementi, F Pellizzer

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 225 KB

english, 1998

39

Analysis of space and energy distribution of stress-induced oxide traps

A.S. Spinelli, A.L. Lacaita, D. Minelli, G. Ghidini

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 197 KB

english, 1999

40

Degradation of electron irradiated MOS capacitors

A. Candelori, A. Paccagnella, A. Scarpa, G. Ghidini, P.G. Fuochi

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 202 KB

english, 1999

41

On the correlation between SILC and hole fluence throughout the oxide

A. Scarpa, B. De Salvo, G. Ghibaudo, G. Pananakakis, A. Paccagnella, G. Ghidini

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 153 KB

english, 1999

42

A recombination model for transient and stationary stress-induced leakage current

D Ielmini, A.S Spinelli, A.L Lacaita, A Martinelli, G Ghidini

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 204 KB

english, 2000

43

Perinatal outcome associated with oligohydramnios in uncomplicated term pregnancies

Anna Locatelli, Patrizia Vergani, Laura Toso, Maria Verderio, JohnC. Pezzullo, Alessandro Ghidini

Journal:

Archives of Gynecology and Obstetrics

Year:

2004

Language:

english

File:

PDF, 141 KB

english, 2004

44

Impact of the As dose in 0.35 μm EEPROM technology: characterization and modeling

N. Galbiati, G. Ghidini, C. Cremonesi, L. Larcher

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 272 KB

english, 2001

45

Stress induced degradation features of very thin gate oxides

A Scarpa, G Ghibaudo, G Ghidini, G Pananakakis, A Paccagnella

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 230 KB

english, 1998

46

Electrically and radiation induced leakage currents in thin oxides

A Scarpa, P Riess, G Ghibaudo, A Paccagnella, G Pananakakis, M Ceschia, G Ghidini

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 403 KB

english, 2000

47

Time decay of stress induced leakage current in thin gate oxides by low-field electron injection

A Cester, A Paccagnella, G Ghidini

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 119 KB

english, 2000

48

Electrical characterisation of oxides grown in different RTP ambients

D Brazzelli, G Ghidini, B Crivelli, R Zonca, M Bersani, G.C Xing, G.E Miner, N D’Astici, S Kuppurao, D Lopes

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 267 KB

english, 2000

49

Antenatal variables associated with severe adverse neurodevelopmental outcome among neonates born at less than 32 weeks

Anna Locatelli, Marianna Andreani, Agnese Pizzardi, Giuseppe Paterlini, Patrizia Stoppa, Alessandro Ghidini

Journal:

European Journal of Obstetrics & Gynecology and Reproductive Biology

Year:

2010

Language:

english

File:

PDF, 106 KB

english, 2010

50

High incidence of antibiotic multi-resistant bacteria in coastal areas dedicated to fish farming

Labella, A., Gennari, M., Ghidini, V., Trento, I., Manfrin, A., Borrego, J.J., Lleo, M.M.

Journal:

Marine Pollution Bulletin

Year:

2013

Language:

english

File:

PDF, 1.19 MB

english, 2013

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