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51

Chemie des Bieres

Andreas Grasser, Volker Woest

Journal:

Year:

2009

Language:

german

File:

PDF, 259 KB

german, 2009

52

Thermally stimulated processes in solids

A. Scharmann, R. Grasser, M. Böhm

Journal:

Journal of Electrostatics

Year:

1977

Language:

english

File:

PDF, 805 KB

english, 1977

53

Comparison of deposition models for a TEOS LPCVD process

Stefan Holzer, Alireza Sheikholeslami, Markus Karner, Tibor Grasser, Siegfried Selberherr

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 238 KB

english, 2007

54

VSP – A gate stack analyzer

M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Goes, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 176 KB

english, 2007

55

Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures

Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 131 KB

english, 2007

56

On the temperature dependence of NBTI recovery

Aichinger, T., Nelhiebel, M., Grasser, T.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 451 KB

english, 2008

57

On the temperature and voltage dependence of short-term negative bias temperature stress

Ph. Hehenberger, P.-J. Wagner, H. Reisinger, T. Grasser

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 567 KB

english, 2009

58

Direct extraction feature for scattering parameters of SiGe-HBTs

S Wagner, V Palankovski, G Röhrer, T Grasser, S Selberherr

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 134 KB

english, 2004

59

Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures

Stefan Holzer, Rainer Minixhofer, Clemens Heitzinger, Johannes Fellner, Tibor Grasser, Siegfried Selberherr

Journal:

Microelectronics Journal

Year:

2004

Language:

english

File:

PDF, 187 KB

english, 2004

60

Impact of O–Si–O bond angle fluctuations on the Si–O bond-breakage rate

Stanislav Tyaginov, Viktor Sverdlov, Ivan Starkov, Wolfgang Gös, Tibor Grasser

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 611 KB

english, 2009

61

Improving SiC lateral DMOSFET reliability under high field stress

T. Ayalew, A. Gehring, J.M. Park, T. Grasser, S. Selberherr

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 939 KB

2003

62

Design optimization of multi-barrier tunneling devices using the transfer-matrix method

A. Gehring, T. Grasser, B.-H. Cheong, S. Selberherr

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 230 KB

english, 2002

63

Optical properties of CaWO4 and CaMoO4 crystals in the 4 to 25 eV region

R. Grasser, E. Pitt, A. Scharmann, G. Zimmerer

Journal:

physica status solidi (b)

Year:

1975

Language:

english

File:

PDF, 632 KB

english, 1975

64

Selective liquid sorption properties of hydrophobized graphite oxide nanostructures

I. Dékány, R. Krüger-Grasser, A. Weiss

Journal:

Colloid & Polymer Science

Year:

1998

Language:

english

File:

PDF, 402 KB

english, 1998

65

Identification of microRNAs of the herpesvirus family

Pfeffer, Sébastien, Sewer, Alain, Lagos-Quintana, Mariana, Sheridan, Robert, Sander, Chris, Grässer, Friedrich A, van Dyk, Linda F, Ho, C Kiong, Shuman, Stewart, Chien, Minchen

Journal:

Year:

2005

Language:

english

File:

PDF, 376 KB

english, 2005

66

The Significance of Odor Cues and Dance Language Information for the Food Search Behavior of Honeybees (Hymenoptera: Apidae)

Wolfgang H. Kirchner, Andreas Grasser

Journal:

Journal of Insect Behavior

Year:

1998

Language:

english

File:

PDF, 636 KB

english, 1998

67

Reduced expression of the DOG1 gene in Arabidopsis mutant seeds lacking the transcript elongation factor TFIIS

Simon A. Mortensen, Mads Sønderkær, Carina Lynggaard, Marion Grasser, Kåre L. Nielsen, Klaus D. Grasser

Journal:

Year:

2011

Language:

english

File:

PDF, 604 KB

english, 2011

68

Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 3.43 MB

english, 2012

69

Improving strained-Si on Si1-xGex deep submicron MOSFETs performance by means of a stepped doping profile

Gani, F., Roldan, J.B., Kosina, H., Grasser, T.

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 145 KB

english, 2001

70

A Fully Analytical PEM Fuel Cell System Model for Control Applications

Grasser, F., Rufer, A.

Journal:

IEEE Transactions on Industry Applications

Year:

2007

Language:

english

File:

PDF, 790 KB

english, 2007

71

In Situ Poly Heater—A Reliable Tool for Performing Fast and Defined Temperature Switches on Chip

Aichinger, T., Nelhiebel, M., Einspieler, S., Grasser, T.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2010

Language:

english

File:

PDF, 439 KB

english, 2010

72

[IEEE 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2002 - Manchester, UK (18-19 Nov. 2002)] The 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications - Small-signal analysis and direct S-parameter extraction

Wagner, S., Palankovski, V., Grasser, T., Schultheis, R., Selberherr, S.

Year:

2002

Language:

english

File:

PDF, 285 KB

english, 2002

73

[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Charge-pumping extraction techniques for hot-carrier induced interface and oxide trap spatial distributions in MOSFETs

Starkov, I., Enichlmair, H., Tyaginov, S., Grasser, T.

Year:

2012

Language:

english

File:

PDF, 572 KB

english, 2012

74

Defect-centric perspective of time-dependent BTI variability

M. Toledano-Luque, B. Kaczer, J. Franco, Ph.J. Roussel, T. Grasser, G. Groeseneken

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 1.88 MB

english, 2012

75

BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

J. Franco, S. Graziano, B. Kaczer, F. Crupi, L.-Å. Ragnarsson, T. Grasser, G. Groeseneken

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 864 KB

english, 2012

76

A Technical Note on Quantum Dots for Multi-Color Fluorescence in situ Hybridization

M&uuml, ller, S., Cremer, M., Neusser, M., Grasser, F., Cremer, T.

Journal:

Cytogenetic and Genome Research

Year:

2009

Language:

english

File:

PDF, 6.71 MB

english, 2009

77

[Advances in Polymer Science] Organic Electronics Volume 223 || Drift Velocity and Drift Mobility Measurement in Organic Semiconductors Using Pulse Voltage

Grasser, Tibor, Meller, Gregor, Li, Ling

Year:

2010

Language:

english

File:

PDF, 1.44 MB

english, 2010

78

[American Institute of Aeronautics and Astronautics 47th AIAA Aerospace Sciences Meeting including The New Horizons Forum and Aerospace Exposition - Orlando, Florida ()] 47th AIAA Aerospace Sciences Meeting including The New Horizons Forum and Aerospace Exposition - Joint Temperature and Soot-Volume-Fraction Measurements in Turbulent Meter-Scale Pool Fires

Frederickson, Kraig, Kearney, Sean, Grasser, Thomas, Castaneda, Jaime

Year:

2009

Language:

english

File:

PDF, 1.71 MB

english, 2009

79

Hot-carrier degradation caused interface state profile—Simulation versus experiment

Starkov, I., Tyaginov, S., Enichlmair, H., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Ceric, H., Grasser, T.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2011

Language:

english

File:

PDF, 812 KB

english, 2011

80

[IEEE 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Osaka, Japan (2011.09.8-2011.09.10)] 2011 International Conference on Simulation of Semiconductor Processes and Devices - Analysis of worst-case hot-carrier degradation conditions in the case of n- and p-channel high-voltage MOSFETs

Starkov, Ivan, Ceric, Hajdin, Tyaginov, Stanislav, Grasser, Tibor, Enichlmair, Hubert, Park, Jong-Mun, Jungemann, Christoph

Year:

2011

Language:

english

File:

PDF, 3.21 MB

english, 2011

81

Refined NBTI characterization of arbitrarily stressed PMOS devices at ultra-low and unique temperatures

Aichinger, Thomas, Nelhiebel, Michael, Grasser, Tibor

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 679 KB

english, 2013

82

Analysis of cellular composition of co-culture spheroids

Dorst, Natalie, Oberringer, Martin, Grässer, Ute, Pohlemann, Tim, Metzger, Wolfgang

Journal:

Annals of Anatomy - Anatomischer Anzeiger

Year:

2014

Language:

english

File:

PDF, 350 KB

english, 2014

83

Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130nm technology p-channel transistors

Rott, Gunnar Andreas, Rott, Karina, Reisinger, Hans, Gustin, Wolfgang, Grasser, Tibor

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.01 MB

english, 2014

84

Predictive Hot-Carrier Modeling of n-Channel MOSFETs

Bina, Markus, Tyaginov, Stanislav, Franco, Jacopo, Rupp, Karl, Wimmer, Yannick, Osintsev, Dmitry, Kaczer, Ben, Grasser, Tibor

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.05 MB

english, 2014

85

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Oxide traps in MOS transistors: Semi-automatic extraction of trap parameters from time dependent defect spectroscopy

Wagner, P.-J., Grasser, T., Reisinger, H., Kaczer, B.

Year:

2010

Language:

english

File:

PDF, 586 KB

english, 2010

86

[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG devices

Bury, Erik, Degraeve, Robin, Cho, Moon Ju, Kaczer, Ben, Goes, Wolfgang, Grasser, Tibor, Horiguchi, Naoto, Groeseneken, Guido

Year:

2014

Language:

english

File:

PDF, 3.96 MB

english, 2014

87

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Towards Understanding Negative Bias Temperature Instability

Year:

2008

Language:

english

File:

PDF, 736 KB

english, 2008

88

[IEEE Electrical Performance of Electronic Packaging - Austin, TX (2004.10.27-2004.10.27)] Electrical Performance of Electronic Packaging IWCE-04 - A non-parabolic six moments model for the simulation of sub-100 nm devices

Grasser,, Kosik,, Jungemann,, Kosina,, Meinerzhagen,, Selberherr,

Year:

2004

Language:

english

File:

PDF, 116 KB

english, 2004

89

Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport Models

Grasser, T., Gos, W., Kaczer, B.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2008

Language:

english

File:

PDF, 750 KB

english, 2008

90

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability

Grasser, T., Reisinger, H., Wagner, P.-J., Schanovsky, F., Goes, W., Kaczer, B.

Year:

2010

Language:

english

File:

PDF, 521 KB

english, 2010

91

[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Comprehensive analysis of vacancy dynamics due to electromigration

Ceric, H., Deshpande, V., Hollauer, Ch., Holzer, S., Grasser, T., Selberherr, S.

Year:

2005

Language:

english

File:

PDF, 398 KB

english, 2005

92

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Analysis of the threshold voltage turn-around effect in high-voltage n-MOSFETs due to hot-carrier stress

Starkov, I., Enichlmair, H., Tyaginov, S., Grasser, T.

Year:

2012

Language:

english

File:

PDF, 577 KB

english, 2012

93

Charging and Discharging of Oxide Defects in Reliability Issues

Goes, W., Karner, M., Sverdlov, V., Grasser, T.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2008

Language:

english

File:

PDF, 963 KB

english, 2008

94

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Understanding correlated drain and gate current fluctuations

Goes, W., Toledano-Luque, M., Baumgartner, O., Bina, M., Schanovsky, F., Kaczer, B., Grasser, T.

Year:

2013

Language:

english

File:

PDF, 423 KB

english, 2013

95

[IEEE 2000 International Conference on Simulation of Semiconductor Processes and Devices - Seattle, WA, USA (6-8 Sept. 2000)] 2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502) - Simulation of gallium-arsenide based high electron mobility transistors

Quay, R., Massler, H., Kellner, W., Grasser, T., Palankovski, V., Selberherr, S.

Year:

2000

Language:

english

File:

PDF, 382 KB

english, 2000

96

50-kJ Ultracompact Pulsed-Power Supply Unit for Active Protection Launcher Systems

Spahn, E., Sterzelmeier, K., Gauthier-Blum, C., Brommer, V., Sinniger, L., Grasser, B.

Journal:

IEEE Transactions on Magnetics

Year:

2009

Language:

english

File:

PDF, 803 KB

english, 2009

97

Accurate High Temperature Measurements Using Local Polysilicon Heater Structures

Pobegen, Gregor, Nelhiebel, Michael, de Filippis, Stefano, Grasser, Tibor

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 780 KB

english, 2014

98

[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Three-Dimensional Transient Interconnect Analysis With Regard to Mechanical Stress

Holzer, S., Hollauer, C., Ceric, H., Karner, M., Grasser, T., Langer, E., Selberherr, S.

Year:

2006

Language:

english

File:

PDF, 1.72 MB

english, 2006

99

[IEEE 2001 International Semiconductor Device Research Symposium. Symposium - Washington, DC, USA (5-7 Dec. 2001)] 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497) - Numerical study of partial-SOI LDMOSFET power devices

Park, J.M., Grasser, T., Kosina, H., Selberherr, S.

Year:

2001

Language:

english

File:

PDF, 319 KB

english, 2001

100

A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided Oxides

Reisinger, H., Vollertsen, R.-P., Wagner, P.-J., Huttner, T., Martin, A., Aresu, S., Gustin, W., Grasser, T., Schlunder, C.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2009

Language:

english

File:

PDF, 565 KB

english, 2009