Richard C. Kullberg: search on Z-Library

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51

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Tribological behavior of micron-scale polycrystalline silicon structural films in ambient air

Alsem, D. H., Kullberg, Richard C., Ramesham, Rajeshuni, van der Hulst, R., Stach, E. A., Dugger, M. T., De Hosson, J. Th. M., Ritchie, R. O.

Year:

2009

Language:

english

File:

PDF, 1.68 MB

english, 2009

52

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Front Matter: Volume 7592

SPIE, Proceedings of, Kullberg, Richard C., Ramesham, Rajeshuni

Year:

2010

Language:

english

File:

PDF, 259 KB

english, 2010

53

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Dispersive evaluation and self-sensing of single-fiber/acid-treated CNT-epoxy nanocomposites using electromicromechanical techniques and acoustic emission

Park, Joung-Man, Kullberg, Richard C., Ramesham, Rajeshuni, Jang, Jung-Hoon, Wang, Zuo-Jia, GnidaKouong, Joel, Ngo, Duc-Huyen, Lee, Woo-Il, Park, Jong-Kyoo, DeVries, K. Lawrence

Year:

2009

Language:

english

File:

PDF, 2.24 MB

english, 2009

54

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Stability experiments on MEMS aluminum nitride RF resonators

Tanner, Danelle M., Kullberg, Richard C., Ramesham, Rajeshuni, Olsson III, Roy H., Parson, Ted B., Crouch, Shannon M., Walraven, Jeremy A., Ohlhausen, James A.

Year:

2010

Language:

english

File:

PDF, 2.79 MB

english, 2010

55

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - An acoustic phonon detection test setup for evaluating the frequency stability of clamped-clamped beam resonators

Wong, C.-L., Kullberg, Richard C., Ramesham, Rajeshuni, Palaniapan, M.

Year:

2009

Language:

english

File:

PDF, 525 KB

english, 2009

56

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Hermetic vacuum sealing of MEMS devices containing organic components

Tepolt, Gary B., Kullberg, Richard C., Ramesham, Rajeshuni, Mescher, Mark J., LeBlanc, John J., Lutwak, Robert, Varghese, Mathew

Year:

2010

Language:

english

File:

PDF, 1.73 MB

english, 2010

57

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Modeling time-dependent dielectric breakdown with and without barriers

Plawsky, J. L., Kullberg, Richard C., Ramesham, Rajeshuni, Gill, W. N., Achanta, R. S.

Year:

2010

Language:

english

File:

PDF, 1.59 MB

english, 2010

58

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Optical inspection of MOEMS devices using a configurable and suitable for production image processing system

Scholles, M., Kullberg, Richard C., Ramesham, Rajeshuni, Grafe, M., Miskowiec, P., Bock, V., Schenk, H.

Year:

2010

Language:

english

File:

PDF, 5.56 MB

english, 2010

59

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Novel test structures for characterization of microsystems parameters at wafer level

Shaporin, Alexey, Kullberg, Richard C., Ramesham, Rajeshuni, Streit, Petra, Specht, Hendrik, Mehner, Jan, Dötzel, Wolfram

Year:

2009

Language:

english

File:

PDF, 1.49 MB

english, 2009

60

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Reliability assessment of ceramic column grid array (CCGA717) interconnect packages under extreme temperatures for space applications (-185°C to +125°C)

Ramesham, Rajeshuni, Kullberg, Richard C., Ramesham, Rajeshuni

Year:

2010

Language:

english

File:

PDF, 11.43 MB

english, 2010

61

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Analysis of image quality for laser display scanner test

Specht, H., Kullberg, Richard C., Ramesham, Rajeshuni, Kurth, S., Billep, D., Gessner, T.

Year:

2009

Language:

english

File:

PDF, 1.50 MB

english, 2009

62

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - In situ measurement of gas diffusion properties of sealing polymers for MEMS packages by an optical gas leak test

Jang, Changsoo, Kullberg, Richard C., Ramesham, Rajeshuni, Goswami, Arindam, Han, Bongtae

Year:

2009

Language:

english

File:

PDF, 1022 KB

english, 2009

63

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - The influence of the arrangement and spacing of CNT column array on the characteristic of field emission

Han, Kyusung, Kullberg, Richard C., Ramesham, Rajeshuni, Jun, Dohan, Hong, Nguyen Tuan, Lee, Soonil, Yang, SangSik

Year:

2010

Language:

english

File:

PDF, 1.62 MB

english, 2010

64

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Low-cycle fatigue testing of silicon resonators

Theillet, Pierre-Olivier, Kullberg, Richard C., Ramesham, Rajeshuni, Pierron, Olivier

Year:

2009

Language:

english

File:

PDF, 986 KB

english, 2009

65

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Environmental testing of COTS components for space applications

Ramesham, Rajeshuni, Kullberg, Richard C., Ramesham, Rajeshuni

Year:

2009

Language:

english

File:

PDF, 1.87 MB

english, 2009

66

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Performance and reliability assessment of a dielectric charging guard in MEMS optical switch systems

Zhang, Ping, Kullberg, Richard C., Ramesham, Rajeshuni, Carr, Emily, Keebaugh, Doug, Chau, Kelvin

Year:

2010

Language:

english

File:

PDF, 1.74 MB

english, 2010

67

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - A new method for hermeticity testing of wafer-level packaging

Lellouchi, Djemel, Kullberg, Richard C., Ramesham, Rajeshuni, Dhennin, Jérémie, Lafontan, Xavier, Veyrie, David, Broue, Adrien, Le Neal, Jean-François, Pressecq, Francis

Year:

2010

Language:

english

File:

PDF, 390 KB

english, 2010

68

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Lifetime estimation and reliability study of electrothermal MEMS actuators

Sivakumar, Ganapathy, Kullberg, Richard C., Ramesham, Rajeshuni, Johns, Stephen, Nava, Jesus A., Dallas, Tim

Year:

2010

Language:

english

File:

PDF, 574 KB

english, 2010

69

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - The effects of plasma pretreatment and storage time on silicon fusion bonding

O'Neal, Chad B., Kullberg, Richard C., Ramesham, Rajeshuni, Soman, Joel

Year:

2010

Language:

english

File:

PDF, 3.96 MB

english, 2010

70

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Investigation into metamaterial structures operating at terahertz wavelength

Langley, Derrick, Kullberg, Richard C., Ramesham, Rajeshuni, Coutu, Jr., Ronald A., Starman, LaVern A., Marciniak, Michael A.

Year:

2010

Language:

english

File:

PDF, 2.11 MB

english, 2010

71

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Pressure sensing in vacuum hermetic micropackaging for MOEMS-MEMS

Sisto, Marco Michele, Kullberg, Richard C., Ramesham, Rajeshuni, García-Blanco, Sonia, Le Noc, Loïc, Tremblay, Bruno, Desroches, Yan, Caron, Jean-Sol, Provencal, Francis, Picard, Francis

Year:

2010

Language:

english

File:

PDF, 1.11 MB

english, 2010

72

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - Examining internal gas compositions of a variety of microcircuit package types and ages with a focus on sources of internal moisture

Lowry, R. K., Kullberg, Richard C., Ramesham, Rajeshuni, Kullberg, R. C.

Year:

2009

Language:

english

File:

PDF, 735 KB

english, 2009

73

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Mitigating the irreversible deformation with pressure in silicon/porous silicon composite membranes

Sujatha, L., Kullberg, Richard C., Ramesham, Rajeshuni, Goswami, Rahul, Bhattacharya, Enakshi

Year:

2010

Language:

english

File:

PDF, 306 KB

english, 2010

74

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Engineered nanowires, carbon nanotubes and graphene for sensors, actuators and electronics

Yang, E. H., Kullberg, Richard C., Ramesham, Rajeshuni

Year:

2010

Language:

english

File:

PDF, 6.12 MB

english, 2010

75

SPIE Proceedings [SPIE MOEMS-MEMS - San Francisco, California (Saturday 23 January 2010)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX - Optimal design of SAW-based gyroscope to improve sensitivity

Oh, Haekwan, Kullberg, Richard C., Ramesham, Rajeshuni, Yang, Sangsik, Lee, Keekeun

Year:

2010

Language:

english

File:

PDF, 1.29 MB

english, 2010

76

The lived neighborhood: understanding how people with dementia engage with their local environment

Ward, Richard, Clark, Andrew, Campbell, Sarah, Graham, Barbara, Kullberg, Agneta, Manji, Kainde, Rummery, Kirstein, Keady, John

Journal:

International Psychogeriatrics

Year:

2017

Language:

english

File:

PDF, 201 KB

english, 2017

77

An Analysis of Cell Membrane Noise

Bevan, Stuart, Kullberg, Richard, Rice, John

Journal:

The Annals of Statistics

Year:

1979

File:

PDF, 1.66 MB

1979

78

The effects of intracranial volume adjustment approaches on multiple regional MRI volumes in healthy aging and Alzheimer's disease

Voevodskaya, Olga, Simmons, Andrew, NordenskjÃ¶ld, Richard, Kullberg, Joel, AhlstrÃ¶m, HÃ¥kan, Lind, Lars, Wahlund, Lars-Olof, Larsson, Elna-Marie, Westman, Eric

Journal:

Frontiers in Aging Neuroscience

Year:

2014

Language:

english

File:

PDF, 2.15 MB

english, 2014

79

‘O verjoyed that I can go outside ’: Using walking interviews to learn about the lived experience and meaning of neighbourhood for people living with dementia

Odzakovic, Elzana, Hellström, Ingrid, Ward, Richard, Kullberg, Agneta

Journal:

Year:

2018

Language:

english

File:

PDF, 411 KB

english, 2018

80

‘It's our pleasure, we count cars here’: an exploration of the ‘neighbourhood-based connections’ for people living alone with dementia

Odzakovic, Elzana, Kullberg, Agneta, Hellström, Ingrid, Clark, Andrew, Campbell, Sarah, Manji, Kainde, Rummery, Kirstein, Keady, John, Ward, Richard

Journal:

Ageing and Society

Year:

2019

Language:

english

File:

PDF, 498 KB

english, 2019

81

Neighbourhoods as relational places for people living with dementia

Clark, Andrew, Campbell, Sarah, Keady, John, Kullberg, Agneta, Manji, Kainde, Rummery, Kirstein, Ward, Richard

Journal:

Social Science & Medicine

Year:

2020

File:

PDF, 259 KB

2020