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1

Measurement of the thermomechanical behaviour of the solder-lead interface in solder joints by laser probing : a new method for measuring the bond quality

S. Dilhaire, A. Cornet, C. Rauzan, W. Claeys, E. Schaub

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 292 KB

english, 1998

2

Measurement of the thermomechanical strain of electronic devices by shearography

S. Dilhaire, S. Jorez, A. Cornet, L.D. Patiño Lopez, W. Claeys

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 506 KB

english, 2000

3

Laser diode COFD analysis by thermoreflectance microscopy

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis-David Patino Lopez, Emmanuel Schaub, Wilfrid Claeys

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 306 KB

2001

4

Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer

S. Dilhaire, T. Phan, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 703 KB

english, 1998

5

Thermomechanical deformation imaging of power devices by electronic speckle pattern interferometry (ESPI)

K. Nassim, L. Joannes, A. Cornet, S. Dilhaire, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 456 KB

english, 1998

6

Optical method for the measurement of the thermomechanical behaviour of electronic devices

S. Dilhaire, S. Jorez, A. Cornet, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 406 KB

english, 1999

7

Fault localisation in ICs by goniometric laser probing of thermal induced surface waves

S. Dilhaire, J. Altet, S. Jorez, E. Schaub, A. Rubio, W. Claeys

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 406 KB

english, 1999

8

Quantitative Thermoreflectance Imaging: Calibration Method and Validation on a Dedicated Integrated Circuit

Tessier, Gilles, Pavageau, Sabrina, Charlot, Benoit, Filloy, Celine, Fournier, Daniele, Cretin, B., Dilhaire, S., Gomes, S., Trannoy, N., Vairac, P., Volz, S.

Journal:

IEEE Transactions on Components and Packaging Technologies

Year:

2007

Language:

english

File:

PDF, 1.31 MB

english, 2007

9

Temperature Study of Sub-Micrometric ICs by Scanning Thermal Microscopy

Gomes, Severine, Chapuis, Pierre-Olivier, Nepveu, F., Trannoy, N., Volz, S., Charlot, B., Tessier, G., Dilhaire, S., Cretin, B., Vairac, P.

Journal:

IEEE Transactions on Components and Packaging Technologies

Year:

2007

Language:

english

File:

PDF, 3.60 MB

english, 2007

10

Correlating the Seebeck coefficient of thermoelectric polymer thin films to their charge transport mechanism

Petsagkourakis, Ioannis, Pavlopoulou, Eleni, Cloutet, Eric, Chen, Yan Fang, Liu, Xjianjie, Fahlman, Mats, Berggren, Magnus, Crispin, Xavier, Dilhaire, Stefan, Fleury, Guillaume, Hadziioannou, Georges

Journal:

Organic Electronics

Year:

2018

Language:

english

File:

PDF, 2.18 MB

english, 2018

11

ElectroStatic Discharge Fault Localization by Laser Probing

S. Grauby, A. Salhi, W. Claeys, D. Trias, S. Dilhaire

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 1.20 MB

english, 2005

12

Thermal properties of carbon fibers at very high temperature

C. Pradere, J.C. Batsale, J.M. Goyhénèche, R. Pailler, S. Dilhaire

Journal:

Year:

2009

Language:

english

File:

PDF, 373 KB

english, 2009

13

Time gating imaging through thick silicon substrate: a new step towards backside characterisation

J.M. Rampnoux, H. Michel, M.A. Salhi, S. Grauby, W. Claeys, S. Dilhaire

Journal:

Microelectronics Reliability

Year:

2006

File:

PDF, 3.39 MB

2006

14

Applications of temperature phase measurements to IC testing

J. Altet, J.M. Rampnoux, J.C. Batsale, S. Dilhaire, A. Rubio, W. Claeys, S. Grauby

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 694 KB

english, 2004

15

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J.M. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, W. Claeys, C. Rossignol, B. Audoin

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.40 MB

2003

16

Determination of passive SiO2-Au microstructure resonant frequencies.

Guillaume Marinier, Stefan Dilhaire, Luis David Patino Lopez, Mohamed Benzohra

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 852 KB

2003

17

High sensitivity and high resolution differential interferometer: Micrometric polariscope for thermomechanical studies in microelectronics

S. Dilhaire, T. Phan, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 370 KB

english, 1997

18

Localisation of heat sources in electronic circuits by microthermal laser probing

Stefan Dilhaire, Emmanuel Schaub, Wilfrid Claeys, Josep Altet, Antonio Rubio

Journal:

International Journal of Thermal Sciences

Year:

2000

Language:

english

File:

PDF, 786 KB

english, 2000

19

Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature

C. Pradère, J.M. Goyhénèche, J.C. Batsale, S. Dilhaire, R. Pailler

Journal:

International Journal of Thermal Sciences

Year:

2006

Language:

english

File:

PDF, 351 KB

english, 2006

20

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues

Stéphane Grauby, Amine Salhi, Luis-David Patino Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 747 KB

english, 2008

21

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Stefan Dilhaire, Amine Salhi, Stéphane Grauby, Wilfrid Claeys

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1014 KB

2003

22

Early detection of ageing in solder joints through laser probe thermal analysis of the peltier effect

W. Claeys, V. Quintard, S. Dilhaire, D. Lewis, Y. Danto

Journal:

Quality and Reliability Engineering International

Year:

1994

Language:

english

File:

PDF, 753 KB

english, 1994

23

Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe

W. Claeys, V. Quintard, S. Dilhaire, D. Lewis, Y. Danto

Journal:

Quality and Reliability Engineering International

Year:

1994

Language:

english

File:

PDF, 650 KB

english, 1994

24

Thermal coupling in integrated circuits: application to thermal testing

Altet, J., Rubio, A., Schaub, E., Dilhaire, S., Claeys, W.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2001

Language:

english

File:

PDF, 250 KB

english, 2001

25

[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Thermomechanical and electromigration studies with a high sensitive and high resolution laser probe

Dilhaire, S., Phan, T., Schaub, E., Claeys, W.

Year:

1997

Language:

english

File:

PDF, 693 KB

english, 1997

26

Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films

Petsagkourakis, Ioannis, Pavlopoulou, Eleni, Portale, Giuseppe, Kuropatwa, Bryan A., Dilhaire, Stefan, Fleury, Guillaume, Hadziioannou, Georges

Journal:

Scientific Reports

Year:

2016

Language:

english

File:

PDF, 1005 KB

english, 2016

27

Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction

Ben Amor, Aymen, Djomani, Doriane, Fakhfakh, Mariam, Dilhaire, Stefan, Vincent, Laetitia, Grauby, Stéphane

Journal:

Year:

2019

Language:

english

File:

PDF, 1.47 MB

english, 2019

28

Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction

Ben Amor, Aymen, Djomani, Doriane, Fakhfakh, Mariam, Dilhaire, Stefan, Vincent, Laetitia, Grauby, Stéphane

Journal:

Year:

2019

File:

PDF, 1.47 MB

2019

29

An improved technique for optical interferometric imaging of isolated cells

E. Laffon, S. Dilhaire, J.-L. Leveque, P. Corcuff

Journal:

Cytometry Part A

Year:

1996

Language:

english

File:

PDF, 371 KB

english, 1996

30

Organic material concentration in auditory outer hair cells measured by laser interferometry

Dr. E. Laffon, D. Dulon, C. Aurousseau, S. Dilhaire, W. Claeys

Journal:

Cytometry Part A

Year:

1995

Language:

english

File:

PDF, 644 KB

english, 1995

31

Organic material concentration in auditory outer hair cells measured by laser interferometry

Dr. E. Laffon, S. Dilhaire, C. Aurousseau, D. Dulon, W. Claeys

Journal:

Cytometry Part A

Year:

1995

Language:

english

File:

PDF, 117 KB

english, 1995

32

Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing

W. Claeys, S. Dilhaire, V. Quintard

Journal:

Microelectronic Engineering

Year:

1994

Language:

english

File:

PDF, 1.01 MB

english, 1994

33

Laser beam thermography of circuits in the particular case of passivated semiconductors

V. Quintard, G. Deboy, S. Dilhaire, D. Lewis, T. Phan, W. Claeys

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 423 KB

english, 1996

34

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy

Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale

Journal:

Microelectronics Journal

Year:

2004

Language:

english

File:

PDF, 207 KB

english, 2004

35

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope

Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz

Journal:

Microelectronics Journal

Year:

2004

Language:

english

File:

PDF, 491 KB

english, 2004

36

Joule expansion imaging techniques on microlectronic devices

Stéphane Grauby, Luis-David Patino Lopez, Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire

Journal:

Microelectronics Journal

Year:

2009

Language:

english

File:

PDF, 377 KB

english, 2009

37

Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers

Y. Ezzahri, L.D. Patiño Lopez, O. Chapuis, S. Dilhaire, S. Grauby, W. Claeys, S. Volz

Journal:

Superlattices and Microstructures

Year:

2005

Language:

english

File:

PDF, 882 KB

english, 2005

38

Picosecond ultrasonics time resolved spectroscopy using a photonic crystal fiber

C. Rossignol, J.M. Rampnoux, T. Dehoux, S. Dilhaire, B. Audoin

Journal:

Year:

2006

Language:

english

File:

PDF, 447 KB

english, 2006

39

Laser probes for the thermal and thermomechanical characterisation of microelectronic devices

Wilfrid Claeys, Stefan Dilhaire, Sébastien Jorez, Luis-David Patiño-Lopez

Journal:

Microelectronics Journal

Year:

2001

Language:

english

File:

PDF, 467 KB

english, 2001

40

Four different approaches for the measurement of IC surface temperature: application to thermal testing

Josep Altet, Stefan Dilhaire, Sebastian Volz, Jean-Michel Rampnoux, Antonio Rubio, Stephane Grauby, Luis David Patino Lopez, Wilfrid Claeys, Jean-Bernard Saulnier

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 500 KB

english, 2002

41

Modelling and experimental study of heat deposition and transport in a semiconductor laser diode

D. Lewis, S. Dilhaire, T. Phan, V. Quintard, V. Hornung, W. Claeys

Journal:

Microelectronics Journal

Year:

1998

Language:

english

File:

PDF, 665 KB

english, 1998

42

High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor

K Nassim, L Joannes, A Cornet, S Dilhaire, E Schaub, W Claeys

Journal:

Microelectronics Journal

Year:

1999

Language:

english

File:

PDF, 275 KB

english, 1999

43

Sondes laser et méthodologies pour l'analyse thermique à l'échelle micrométrique. Application à la microélectronique

Stefan Dilhaire, Tam Phan, Emmanuel Schaub, Wilfrid Claeys

Journal:

Revue Générale de Thermique

Year:

1998

File:

PDF, 1.56 MB

1998

44

Surface acoustic waves at the vacuum-thermoviscoelastic solid interface

M. Deschamps, O. Poncelet, S. Dilhaire, W. Claeys

Journal:

Year:

2000

Language:

english

File:

PDF, 113 KB

english, 2000

45

Femtosecond laser generation and detection of longitudinal and shear acoustic waves in a sub-micrometric film

C. Rossignol, H. Meri, M. Perton, B. Audoin, Jean-Michel Rampnoux, Stefan Dilhaire

Journal:

physica status solidi (c)

Year:

2004

Language:

english

File:

PDF, 184 KB

english, 2004

46

Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement

Luis-David Patiño-Lopez, M. Amine Salhi, Stefan Dilhaire, Stéphane Grauby, Jean-Michel Rampnoux, Sébastien Jorez, Wilfrid Claeys

Journal:

Superlattices and Microstructures

Year:

2004

Language:

english

File:

PDF, 1.12 MB

english, 2004

47

Dynamical behavior and cut-off frequency of Si/SiGe microcoolers

Y. Ezzahri, S. Dilhaire, L.D. Patiño-Lopez, S. Grauby, W. Claeys, Z. Bian, Y. Zhang, A. Shakouri

Journal:

Superlattices and Microstructures

Year:

2007

Language:

english

File:

PDF, 717 KB

english, 2007

48

Laser diode light efficiency determination by thermoreflectance microscopy

Stefan Dilhaire, Sebastien Jorez, Luis-David Patiño-Lopez, Wilfrid Claeys, Emmanuel Schaub

Journal:

Microelectronics Journal

Year:

2001

Language:

english

File:

PDF, 193 KB

english, 2001

49

Differential Thermal Testing: An Approach to its Feasibility

J. Altet, A. Rubio, W. Claeys, S. Dilhaire, E. Schaub, H. Tamamoto

Journal:

Journal of Electronic Testing

Year:

1999

Language:

english

File:

PDF, 132 KB

english, 1999

50

Generation and Detection of Shear Acoustic Waves in Metal Submicrometric Films with Ultrashort Laser Pulses

Rossignol, C., Rampnoux, J., Perton, M., Audoin, B., Dilhaire, S.

Journal:

Physical Review Letters

Year:

2005

Language:

english

File:

PDF, 251 KB

english, 2005

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