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51

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

W. Claeys, S. Dilhaire, V. Quintard, J. P. Dom, Y. Danto

Journal:

Quality and Reliability Engineering International

Year:

1993

Language:

english

File:

PDF, 526 KB

english, 1993

52

Optical ammeter for integrated circuit characterization and failure analysis

W. Claeys, S. Dilhaire, D. Lewis, V. Quintard, T. Phan, J. L. Aucouturier

Journal:

Quality and Reliability Engineering International

Year:

1995

Language:

english

File:

PDF, 481 KB

english, 1995

53

Temperature measurements of metal lines under current stress by high-resolution laser probing

Quintard, V., Dilhaire, S., Tam Phan, Claeys, W.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

1999

Language:

english

File:

PDF, 161 KB

english, 1999

54

Strain energy imaging of a power MOS transistor using speckle interferometry

Dilhaire, S., Grauby, S., Jorez, S., Claeys, W.

Journal:

IEEE Transactions on Reliability

Year:

2004

Language:

english

File:

PDF, 169 KB

english, 2004

55

Surface Displacement Imaging by Interferometry with a Light Emitting Diode

Dilhaire, Stefan, Grauby, Stéphane, Jorez, Sébastien, Lopez, Luis David Patino, Rampnoux, Jean-Michel, Claeys, Wilfrid

Journal:

Year:

2002

Language:

english

File:

PDF, 1.39 MB

english, 2002

56

Measurement of Thermally Induced Vibrations of Microelectronic Devices by Use of a Heterodyne Electronic Speckle Pattern Interferometry Imaging Technique

Grauby, Stéphane, Dilhaire, Stefan, Jorez, Sébastien, Lopez, Luis David Patino, Rampnoux, Jean-Michel, Claeys, Wilfrid

Journal:

Year:

2003

Language:

english

File:

PDF, 742 KB

english, 2003

57

Dynamic Surface Temperature Measurements in ICs

Altet, J., Claeys, W., Dilhaire, S., Rubio, A.

Journal:

Proceedings of the IEEE

Year:

2006

Language:

english

File:

PDF, 1.17 MB

english, 2006

58

Characterization of thermoelectric devices by laser induced Seebeck electromotive force (LIS-EMF) measurement

Lopez, Luis-David Patiño, Dilhaire, Stefan, Grauby, Stéphane, Salhi, M Amine, Ezzahri, Younès, Claeys, Wilfrid, Batsale, Jean-Christophe

Journal:

Journal of Physics D Applied Physics

Year:

2005

Language:

english

File:

PDF, 1.76 MB

english, 2005

59

Nanoscale Block Copolymer Ordering Induced by Visible Interferometric Micropatterning: A Route towards Large Scale Block Copolymer 2D Crystals

Aissou, Karim, Shaver, Jonah, Fleury, Guillaume, Pécastaings, Gilles, Brochon, Cyril, Navarro, Christophe, Grauby, Stéphane, Rampnoux, Jean-Michel, Dilhaire, Stefan, Hadziioannou, Georges

Journal:

Advanced Materials

Year:

2013

Language:

english

File:

PDF, 1.43 MB

english, 2013

60

Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy

Muñoz Rojo, M., Grauby, S., Rampnoux, J.-M., Caballero-Calero, O., Martin-Gonzalez, M., Dilhaire, S.

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 872 KB

english, 2013

61

[IEEE 2003 IEEE Ultrasonics Symposium - Honolulu, HI, USA (5-8 Oct. 2003)] IEEE Symposium on Ultrasonics, 2003 - Generation and detection of ultrasonic waves in micrometric and sub-micrometric films using picosecond laser pulses

Rossignol, C., Libgot, R., Audoin, B., Rampnoux, J.M., Dilhaire, S.

Year:

2003

Language:

english

File:

PDF, 215 KB

english, 2003

62

Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy

Grauby, Stéphane, Puyoo, Etienne, Rampnoux, Jean-Michel, Rouvière, Emmanuelle, Dilhaire, Stefan

Journal:

The Journal of Physical Chemistry C

Year:

2013

Language:

english

File:

PDF, 1.20 MB

english, 2013

63

Anomalous Light Absorption around Subwavelength Apertures in Metal Films

Lozan, O., Perrin, M., Ea-Kim, B., Rampnoux, J. M., Dilhaire, S., Lalanne, P.

Journal:

Physical Review Letters

Year:

2014

Language:

english

File:

PDF, 951 KB

english, 2014

64

Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis

S. Dilhaire, S. Grauby, W. Claeys

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 161 KB

english, 2005

65

[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers

Aldrete-Vidrio, E., Salhi, M.A., Altet, J., Grauby, S., Mateo, D., Michel, H., Clerjaud, L., Rampnoux, J.M., Rubio, A., Claeys, W., Dilhaire, S.

Year:

2008

Language:

english

File:

PDF, 1.02 MB

english, 2008

66

Fast Laser Scanning Imaging System for Surface Displacement Measurements

S. Grauby, A. Salhi, J. Rampnoux, W. Claeys, S. Dilhaire

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 266 KB

english, 2009

67

[IEEE 2013 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Berlin, Germany (2013.09.25-2013.09.27)] 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Effect of nanostructuration on the thermal conductivity of thermoelectric materials

Grauby, Stephane, Puyoo, Etienne, Rojo, Miguel Munoz, Martin-Gonzalez, Marisol, Claeys, Wilfrid, Dilhaire, Stefan

Year:

2013

Language:

english

File:

PDF, 675 KB

english, 2013

68

[IEEE 2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC) - Budapest, Hungary (2007.09.17-2007.09.19)] 2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC) - Joule expansion imaging techniques on microlectronic devices

Grauby, S., Patino Lopez, L-D., Salhi, A., Puyoo, E., Rampnoux, J-M., Claeys, W., Dilhaire, S.

Year:

2007

Language:

english

File:

PDF, 1.56 MB

english, 2007

69

Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging

Grauby, S., Dilhaire, S., Jorez, S., Claeys, W.

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 285 KB

english, 2005

70

[IEEE ICT'03. 22nd International Conference on Thermoelectrics - La Grande Motte, France (17-21 Aug. 2003)] Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726) - Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures

Dilhaire, S., Ezzahri, Y., Grauby, S., Claeys, W., Christofferson, J., Zhang, Y., Shakouri, A.

Year:

2003

Language:

english

File:

PDF, 351 KB

english, 2003

71

[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Absolute dynamic measurements of temperature changes in electronic components from a thermoreflectance optical test probe

Claeys, W., Dilhaire, S., Quintard, V., Dom, J.P.

Year:

1993

Language:

english

File:

PDF, 533 KB

english, 1993

72

[IEEE ICT2001. 20 International Conference on Thermoelectrics - Beijing, China (8-11 June 2001)] Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) - Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement

Patino-Lopez, L.D., Dilhaire, S., Grauby, S., Jorez, S., Claeys, W., Uemura, K., Stockholm, J.G.

Year:

2001

Language:

english

File:

PDF, 531 KB

english, 2001

73

[IEEE 2006 25th International Conference on Thermoelectrics - Vienna, Austria (2006.08.6-2006.08.10)] 2006 25th International Conference on Thermoelectrics - Harmonic Regime Analysis and Inverse Method Applied to The Simultaneous Determination of Thermoelectric Properties

Patino-Lopez, Luis-David, Grauby, Stephane, Ezzahri, Younes, Claeys, Wilfrid, Dilhaire, Stefan

Year:

2006

Language:

english

File:

PDF, 529 KB

english, 2006

74

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Sensing temperature in CMOS circuits for thermal testing

Altet, J., Rubio, A., Salhi, A., Galvez, J.L., Dilhaire, S., Syal, A., Ivanov, A.

Year:

2004

Language:

english

File:

PDF, 1.47 MB

english, 2004

75

[IEEE 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems (THERMINIC) - Rome, Italy (2008.09.24-2008.09.26)] 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems - Laser scanning thermomechanical imaging of microelectronic devices

Grauby, S., Salhi, A., Rampnoux, J-M., Claeys, W., Dilhaire, S.

Year:

2008

Language:

english

File:

PDF, 740 KB

english, 2008

76

[IEEE ICT2001. 20 International Conference on Thermoelectrics - Beijing, China (8-11 June 2001)] Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) - Strain imaging in thermoelectric devices by laser probe shearography

Jorez, S., Dilhaire, S., Lopez, L.P., Granby, S., Claeys, W., Uemura, K., Stockholm, J.G.

Year:

2001

Language:

english

File:

PDF, 496 KB

english, 2001

77

[IEEE ICT'02. 21st International Conference on Thermoelectrics - Long Beach, CA, USA (25-29 Aug. 2002)] Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02. - Determination of ZT of PN thermoelectric couples by AC electrical measurement

Dilhaire, S., Patino-Lopez, L.-D., Grauby, S., Rampnoux, J.-M., Jorez, S., Claeys, W.

Year:

2002

Language:

english

File:

PDF, 248 KB

english, 2002

78

Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization

Altet, J., Aldrete-Vidrio, E., Mateo, D., Salhi, A., Grauby, S., Claeys, W., Dilhaire, S., Perpiñà, X., Jordà, X.

Journal:

Review of Scientific Instruments

Year:

2009

Language:

english

File:

PDF, 538 KB

english, 2009

79

Thermoreflectance temperature measurement with millimeter wave

Pradere, C., Caumes, J.-P., BenKhemis, S., Pernot, G., Palomo, E., Dilhaire, S., Batsale, J.-C.

Journal:

Review of Scientific Instruments

Year:

2014

Language:

english

File:

PDF, 613 KB

english, 2014

80

Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions

Dilhaire, S., Grauby, S., Claeys, W.

Journal:

Applied Physics Letters

Year:

2004

Language:

english

File:

PDF, 359 KB

english, 2004

81

Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices

S. Grauby, A. Salhi, J. Rampnoux, H. Michel, W. Claeys, S. Dilhaire

Year:

2007

Language:

english

File:

PDF, 778 KB

english, 2007

82

Study of thermomechanical properties of Si∕SiGe superlattices using femtosecond transient thermoreflectance technique

Ezzahri, Y., Dilhaire, S., Grauby, S., Rampnoux, J. M., Claeys, W., Zhang, Y., Zeng, G., Shakouri, A.

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 296 KB

english, 2005

83

Picosecond ultrasonics time resolved spectroscopy using a photonic crystal fiber

Rossignol, C., Rampnoux, J. M., Dehoux, T., Dilhaire, S., Audoin, B.

Journal:

Review of Scientific Instruments

Year:

2006

Language:

english

File:

PDF, 365 KB

english, 2006

84

[IEEE 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC - Munich, Germany (2013.05.12-2013.05.16)] 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC - Asynchronous ultrafast pump-probe experiments: Towards high speed ultrafast imaging with ultrahigh spectral resolution

Abbas, A., Guillet, Y., Rampnoux, J.-M., Curlier, J., Rigail, P., Mottay, E., Audoin, B., Dilhaire, S.

Year:

2013

Language:

english

File:

PDF, 181 KB

english, 2013

85

Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring

Altet, J., Mateo, D., Perpiñà, X., Grauby, S., Dilhaire, S., Jordà, X.

Journal:

Review of Scientific Instruments

Year:

2011

Language:

english

File:

PDF, 665 KB

english, 2011

86

Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature

Pradère, C., Goyhénèche, J. M., Batsale, J. C., Dilhaire, S., Pailler, R.

Journal:

Review of Scientific Instruments

Year:

2005

Language:

english

File:

PDF, 550 KB

english, 2005

87

Thermal exchange radius measurement: Application to nanowire thermal imaging

Puyoo, Etienne, Grauby, Stéphane, Rampnoux, Jean-Michel, Rouvière, Emmanuelle, Dilhaire, Stefan

Journal:

Review of Scientific Instruments

Year:

2010

Language:

english

File:

PDF, 646 KB

english, 2010

88

High speed heterodyne infrared thermography applied to thermal diffusivity identification

Pradere, C., Clerjaud, L., Batsale, J. C., Dilhaire, S.

Journal:

Review of Scientific Instruments

Year:

2011

Language:

english

File:

PDF, 799 KB

english, 2011

89

Heterodyne method with an infrared camera for the thermal diffusivity estimation with periodic local heating in a large range of frequencies (25 Hz to upper than 1 kHz)

Clerjaud, Lilian, Pradere, Christophe, Batsale, Jean-Christophe, Dilhaire, Stefan

Journal:

Quantitative InfraRed Thermography Journal

Year:

2010

Language:

english

File:

PDF, 1.30 MB

english, 2010

90

Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation

Phan, T., Dilhaire, S., Quintard, V., Lewis, D., Claeys, W.

Journal:

Journal of Applied Physics

Year:

1997

Language:

english

File:

PDF, 536 KB

english, 1997

91

superlattices

Ezzahri, Y., Grauby, S., Rampnoux, J. M., Michel, H., Pernot, G., Claeys, W., Dilhaire, S., Rossignol, C., Zeng, G., Shakouri, A.

Journal:

Physical Review B

Year:

2007

Language:

english

File:

PDF, 1.01 MB

english, 2007

92

[IEEE ICT 2005. 24th International Conference on Thermoelectrics, 2005. - Clemson, SC, USA (2005.06.19-2005.06.23)] ICT 2005. 24th International Conference on Thermoelectrics, 2005. - Simulation of Si/SiGe micro-cooler by thermal quadrupoles method

Ezzahri, Y., Dilhaire, S., Grauby, S., Patino-Lopez, L.D., Claeys, W., Zhang, Y., Bian, Z., Shakouri, A.

Year:

2005

Language:

english

File:

PDF, 455 KB

english, 2005

93

Correction: Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials

Rojo, Miguel Muñoz, Martín, Jaime, Grauby, Stéphane, Borca-Tasciuc, Theodorian, Dilhaire, Stefan, Martin-Gonzalez, Marisol

Journal:

Year:

2015

Language:

english

File:

PDF, 246 KB

english, 2015

94

All-optical broadband ultrasonography of single cells

Dehoux, T., Ghanem, M. Abi, Zouani, O. F., Rampnoux, J.-M., Guillet, Y., Dilhaire, S., Durrieu, M.-C., Audoin, B.

Journal:

Scientific Reports

Year:

2015

Language:

english

File:

PDF, 1.04 MB

english, 2015

95

Frequency-Dependent Thermal Conductivity in Time Domain Thermoreflectance Analysis of Thin Films

Pernot, Gilles, Michel, Hélène, Vermeersch, Bjorn, Burke, Peter, Lu, H., Rampnoux, Jean-Michel, Dilhaire, Stefan, Ezzahri, Younès, Gossard, Arthur, Shakouri, Ali

Journal:

MRS Proceedings

Year:

2011

Language:

english

File:

PDF, 560 KB

english, 2011

96

Investigating Coherent Zone-Folded Acoustic Phonons in Si/SiGe Superlattices by Transient Thermoreflectance Technique

Michel, Hélène, Pernot, Gilles, Rampnoux, Jean-Michel, Dilhaire, Stefan, Grauby, Stéphane, Ezzahri, Younès, Shakouri, Ali

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 640 KB

english, 2009

97

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Aldrete-Vidrio, Eduardo, Mateo, Diego, Altet, Josep, Salhi, M Amine, Grauby, Stéphane, Dilhaire, Stefan, Onabajo, Marvin, Silva-Martinez, Jose

Journal:

Measurement Science and Technology

Year:

2010

Language:

english

File:

PDF, 2.41 MB

english, 2010

98

Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature

Pradere, C., Batsale, J. C., Goyheneche, J. M., Pailler, R., Dilhaire, S.

Journal:

Inverse Problems in Science and Engineering

Year:

2007

Language:

english

File:

PDF, 337 KB

english, 2007

99

Calibration-free heat source localisation in ICs entirely covered by metal layers

Altet, J., Salhi, M.A., Dilhaire, S., Ivanov, A.

Journal:

Electronics Letters

Year:

2004

Language:

english

File:

PDF, 454 KB

english, 2004

100

Picosecond time resolved opto-acoustic imaging with 48 MHz frequency resolution

Abbas, A., Guillet, Y., Rampnoux, J.-M., Rigail, P., Mottay, E., Audoin, B., Dilhaire, S.

Journal:

Year:

2014

Language:

english

File:

PDF, 1.93 MB

english, 2014

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