120

Joint special Issue from best papers of DTIS'10 and DTIS'11

Year:
2013
Language:
english
File:
PDF, 133 KB
english, 2013
147

A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Year:
2008
Language:
english
File:
PDF, 596 KB
english, 2008