5

Study of Electromigration Damage in Al Interconnect Lines inside a SEM

Year:
2000
Language:
english
File:
PDF, 515 KB
english, 2000
11

Stereological analysis and modelling of gradient structures

Year:
1999
Language:
english
File:
PDF, 433 KB
english, 1999
19

Topography of Defect Parameters on Si and GaAs Wafers

Year:
2004
Language:
english
File:
PDF, 287 KB
english, 2004
20

„Auftreten zweier Maxima der differentiellen Suszeptibilität”

Year:
1970
Language:
german
File:
PDF, 234 KB
german, 1970
29

Cell-area distributions of planar Voronoi mosaics

Year:
1989
Language:
english
File:
PDF, 395 KB
english, 1989
35

Nanostructured graphite prepared by ball-milling at low temperatures

Year:
2006
Language:
english
File:
PDF, 382 KB
english, 2006
44

Microstructural investigation of electrodeposited CuAg-thin films

Year:
2003
Language:
english
File:
PDF, 823 KB
english, 2003
46

On the microscopic structure of the EL6 defect in GaAs

Year:
2001
Language:
english
File:
PDF, 166 KB
english, 2001