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51

LEAD-FREE (Na 0.5 Bi 0.5 )1-xBaxTiO 3 SINGLE CRYSTALS (0 ≤ x ≤ 0.05) AND THEIR DIELECTRIC AND PYROELECTRIC PROPERTIES

SUCHANICZ, J., GLOS, B., STOPA, G., KRUZINA, T., KUSZ, J., ZUBKO, M., HOFMEISTER, W., JANKOWSKA-SUMARA, I., WCISŁO, D., KONIECZNY, K., ROSIEK, R., FINDER, A., PYTEL, K., DAMBEKALNE, M., STERNBERG, A.

Journal:

Integrated Ferroelectrics

Year:

2009

Language:

english

File:

PDF, 898 KB

english, 2009

52

Dielectric Properties of Na 0.5 K 0.5 (Nb 1-x Sb x )O 3 +MnO 2 Ceramics (x = 0.04, 0.05 and 0.06)

Suchanicz, J., Finder, A., Smeltere, I., Konieczny, K., Jankowska-Sumara, I., Garbarz-Glos, B., Sokolowski, M., Bujakiewicz-Korońska, R., Pytel, K., Antonova, M., Sternberg, A.

Journal:

Integrated Ferroelectrics

Year:

2011

Language:

english

File:

PDF, 329 KB

english, 2011

53

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 27 February 2011)] Optical Microlithography XXIV - Advanced wavefront engineering for improved imaging and overlay applications on a 1.35 NA immersion scanner

Staals, Frank, Andryzhyieuskaya, Alena, Bakker, Hans, Beems, Marcel, Finders, Jo, Hollink, Thijs, Mulkens, Jan, Nachtwein, Angelique, Willekers, Rob, Engblom, Peter, Gruner, Toralf, Zhang, Youping, Du

Year:

2011

Language:

english

File:

PDF, 2.43 MB

english, 2011

54

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Optical Microlithography XX - Pitch doubling through dual-patterning lithography challenges in integration and litho budgets

Dusa, Mircea, Quaedackers, John, Larsen, Olaf F. A., Meessen, Jeroen, van der Heijden, Eddy, Dicker, Gerald, Wismans, Onno, de Haas, Paul, van Ingen Schenau, Koen, Finders, Jo, Vleeming, Bert, Storms,

Year:

2007

Language:

english

File:

PDF, 575 KB

english, 2007

55

Fundamental study of placement errors in directed self-assembly

Wuister, Sander F., Ambesi, Davide, Druzhinina, Tamara S., Peeters, Emiel, Finders, Jo, Wolterink, Joanne Klein, Fraaije, Johannes G. E. M. (Hans)

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2014

Language:

english

File:

PDF, 2.77 MB

english, 2014

56

Toward 22 nm: fast and effective intrafield monitoring and optimization of process windows and critical dimension uniformity

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2011

Language:

english

File:

PDF, 2.66 MB

english, 2011

57

Health Benefits In 2010: Premiums Rise Modestly, Workers Pay More Toward Coverage

Claxton, G., DiJulio, B., Whitmore, H., Pickreign, J. D., McHugh, M., Osei-Anto, A., Finder, B.

Journal:

Year:

2010

Language:

english

File:

PDF, 204 KB

english, 2010

58

Wafer level critical dimension control in spacer-defined double patterning for sub-72 nm pitch logic technology

R. Kim, R. Watso, Y. Van Dommelen, J. Finders, M. E. Colburn, H. J. Levinson

Year:

2012

Language:

english

File:

PDF, 1.97 MB

english, 2012

59

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Enabling inspection solutions for future mask technologies through the development of massively parallel E-Beam inspection

Behringer, Uwe F.W., Finders, Jo, Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Jindal, Vibhu, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski,

Year:

2015

Language:

english

File:

PDF, 997 KB

english, 2015

60

Rhinologische Ratschläge für den Praktiker. 1, 2. Akuter und chronischer Schnupfen

Year:

1920

Language:

german

File:

PDF, 82 KB

german, 1920

61

Deep brain stimulation in early stage Parkinson's disease may reduce the relative risk of symptom worsening

Hacker, Mallory, Charles, David, Finder, Stuart

Journal:

Parkinsonism & Related Disorders

Year:

2016

Language:

english

File:

PDF, 156 KB

english, 2016

62

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Mask and lithography techniques for FPD

Behringer, Uwe F.W., Finders, Jo, Sandstrom, T., Wahlsten, M., Sundelin, E., Hansson, G., Svensson, A.

Year:

2015

Language:

english

File:

PDF, 1.05 MB

english, 2015

63

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Imaging performance of the EUV high NA anamorphic system

Behringer, Uwe F.W., Finders, Jo, van Ingen Schenau, Koen, Bottiglieri, Gerardo, van Schoot, Jan, Neumann, Jens-Timo, Roesch, Matthias

Year:

2015

Language:

english

File:

PDF, 4.23 MB

english, 2015

64

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, USA (Tuesday 11 September 2012)] Photomask Technology 2012 - Impact of mask CDU and local CD variation on intra-field CDU

Miyazaki, Junji, Abboud, Frank E., Faure, Thomas B., Mouraille, Orion, Finders, Jo, Higuchi, Masaru, Kojima, Yosuke, Sato, Shunsuke, Morimoto, Hiroaki

Year:

2012

Language:

english

File:

PDF, 1.65 MB

english, 2012

65

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Understanding of Out-of-Band DUV light in EUV lithography: controlling impact on imaging and mitigation strategies

Behringer, Uwe F.W., Finders, Jo, Davydova, N., Kottumakulal, R., Hageman, J., McNamara, J., Hoefnagels, R., Vaenkatesan, V., van Dijk, A., Ricken, K., de Winter, L., de Kruif, R., Jonckheere, R., Hol

Year:

2015

Language:

english

File:

PDF, 1.43 MB

english, 2015

66

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Fast alternative method for measuring the wavefront of lithography exposure systems

Behringer, Uwe F.W., Finders, Jo, Kabardiadi, Alexander, Assmann, Heiko, Greiner, Andreas, Baselt, Tobias, Taudt, Christopher, Hartmann, Peter

Year:

2015

Language:

english

File:

PDF, 680 KB

english, 2015

67

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - SLM based semiconductor maskwriter

Behringer, Uwe F.W., Finders, Jo, Diez, Steffen, Jehle, Achim

Year:

2015

Language:

english

File:

PDF, 509 KB

english, 2015

68

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Advanced process characterization of a 10nm Metal 1 Logic layer using light source modulation and monitoring

Behringer, Uwe F.W., Finders, Jo, Alagna, Paolo, Zurita, Omar, Timoshkov, Vadim, Wong, Patrick, Rechtsteiner, Greg, Baselmans, Jan, Mailfert, Julien, Conley, Will, Hsieh, Simon

Year:

2015

Language:

english

File:

PDF, 839 KB

english, 2015

69

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Getting ready for EUV in HVM

Behringer, Uwe F.W., Finders, Jo, Dicker, Gerald, de Bruin, Diederik, Peterson, Brennan, Wöltgens, Pieter, Sluijk, Boudewijn, Jenkins, Peter

Year:

2015

Language:

english

File:

PDF, 795 KB

english, 2015

70

ZOFIA WOYCICKA. Arrested Mourning: Memory of the Nazi Camps in Poland, 1944-1950.

Journal:

The American Historical Review

Year:

2015

Language:

english

File:

PDF, 33 KB

english, 2015

71

Heiserkeit und ihre Behandlung

Journal:

DMW - Deutsche Medizinische Wochenschrift

Year:

1927

Language:

german

File:

PDF, 105 KB

german, 1927

72

The Art and Science of Office-Based Anesthesia in Dentistry: A 150-Year History

Finder, Richard L.

Journal:

International Anesthesiology Clinics

Year:

2003

Language:

english

File:

PDF, 509 KB

english, 2003

73

SPIE Proceedings [SPIE 24th European Mask and Lithography Conference - Dresden, Germany (Monday 21 January 2008)] 24th European Mask and Lithography Conference - Characterizing the imaging performance of flash memory masks using AIMS

van Setten, Eelco, Wismans, Onno, Grim, Kees, Finders, Jo, Dusa, Mircea, Birkner, Robert, Richter, Rigo, Scherübl, Thomas

Year:

2008

Language:

english

File:

PDF, 1.37 MB

english, 2008

74

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XV - Yokohama, Japan (Wednesday 16 April 2008)] Photomask and Next-Generation Lithography Mask Technology XV - An IntenCD map of a reticle as a feed-forward input to DoseMapper

Ben Yishai, Michael, Horiuchi, Toshiyuki, Finders, Jo, Kazinczi, Robert, Bleeker, Arno, Luehrmann, Paul, Janssen, Ingrid, Duray, Frank, Shoval, Lior, Couderc, Christophe, Piech, Rich, Hillel, Noam, En

Year:

2008

Language:

english

File:

PDF, 708 KB

english, 2008

75

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Contrast optimization for 0.33NA EUV lithography

Panning, Eric M., Goldberg, Kenneth A., Finders, Jo, Wuister, Sander, Last, Thorsten, Rispens, Gijsbert, Psari, Eleni, Lubkoll, Jan, van Setten, Eelco, Wittebrood, Friso

Year:

2016

Language:

english

File:

PDF, 3.34 MB

english, 2016

76

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - Impact of reticle absorber on the imaging properties in ArFi lithography

Finders, Jo, Mouraille, O., Bouma, A., Ngai, A., Grim, K., van Praagh, J., Toma, C., Miyazaki, J., Higuchi, M., Kojima, Y., Connolly, B., Englard, I., Cohen, Y., Mangan, S., Ben Yishai, Michael, Julli

Year:

2012

Language:

english

File:

PDF, 758 KB

english, 2012

77

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Solutions for 22-nm node patterning using ArFi technology

Finders, Jo, Dusa, Mircea, Mulkens, Jan, Cao, Yu, Escalante, Maryana

Year:

2011

Language:

english

File:

PDF, 1.60 MB

english, 2011

78

Low-temperature crystallization and ferroelectric properties of sol-gel derived layer-structured perovskite thin films

Kato, Kazumi, Finder, Jeffrey Michael, Dey, Sandwip Kumar, Torii, Yasuyoshi

Journal:

Integrated Ferroelectrics

Year:

1997

Language:

english

File:

PDF, 530 KB

english, 1997

79

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - The impact of Mask 3D and Resist 3D effects in optical lithography

Lai, Kafai, Erdmann, Andreas, Finders, Jo

Year:

2014

Language:

english

File:

PDF, 6.92 MB

english, 2014

80

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Imaging challenges in 20nm and 14nm logic nodes: hot spots performance in Metal1 layer

Timoshkov, V., Rio, D., Liu, H., Gillijns, W., Wang, J., Wong, P., Van Den Heuvel, D., Wiaux, V., Nikolsky, P., Finders, J., Behringer, Uwe F. W., Maurer, Wilhelm

Year:

2013

Language:

english

File:

PDF, 959 KB

english, 2013

81

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Metrology, Inspection, and Process Control for Microlithography XXV - Towards 22 nm: fast and effective intra-field monitoring and optimization of process windows and CDU

Raymond, Christopher J., Cohen, Yaron, Finders, Jo, Knops, Roel, Mouraille, Orion, Minnaert-Janssen, Ingrid, Duray, Frank, Mos, Evert, Kremer, Alexander, Sagiv, Amir, Mangan, Shmoolik, Ben Yishay, Mic

Year:

2011

Language:

english

File:

PDF, 958 KB

english, 2011

82

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Optical Microlithography XVI - 65-nm full-chip implementation using double dipole lithography

Hsu, Stephen D., Chen, J. Fung, Cororan, Noel, Knose, William T., Van Den Broeke, Douglas J., Laidig, Thomas L., Wampler, Kurt E., Shi, Xuelong, Hsu, Michael, Eurlings, Mark, Finders, Jo, Chiou, Tsann

Year:

2003

Language:

english

File:

PDF, 1.41 MB

english, 2003

83

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, CA (Monday 14 September 2009)] Photomask Technology 2009 - Mask inspection placement maps for improving overlay

Parizat, Ziv, Zurbrick, Larry S., Montgomery, M. Warren, de Kruif, Robert, Finders, Jo, Minnaert-Janssen, Ingrid, Duray, Frank, Ben Yishai, Michael, Mangan, Shmoolik, Cohen, Yaron, Englard, Ilan

Year:

2009

Language:

english

File:

PDF, 1.26 MB

english, 2009

84

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Researching new EUV pellicle films for source powers beyond 250 watts

Behringer, Uwe F.W., Finders, Jo, Nasalevich, Maxim, van Zwol, Pieter Jan, Abegg, Erik, Voorthuijzen, Pim, Vles, David, Péter, Mária, van der Zande, Wim, Vermeulen, Hans

Year:

2016

Language:

english

File:

PDF, 506 KB

english, 2016

85

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Advanced photomask fabrication by e-beam lithography for mask aligner applications

Behringer, Uwe F.W., Finders, Jo, Weichelt, T., Bourgin, Y., Banasch, M., Zeitner, U. D.

Year:

2016

Language:

english

File:

PDF, 769 KB

english, 2016

86

Debugging hardware designs using dynamic dependency graphs

Malburg, Jan, Finder, Alexander, Fey, Görschwin

Journal:

Microprocessors and Microsystems

Year:

2016

Language:

english

File:

PDF, 1.87 MB

english, 2016

87

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - High performance gratings for DFB lasers fabricated by direct-write e-beam lithography

Behringer, Uwe F.W., Finders, Jo, Steingrüber, R., Zhang, Z.

Year:

2016

Language:

english

File:

PDF, 725 KB

english, 2016

88

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Improving contact layer patterning using SEM contour based etch model

Behringer, Uwe F.W., Finders, Jo, Weisbuch, François, Lutich, Andrey, Schatz, Jirka, Hertzsch, Tino, Moll, Hans-Peter

Year:

2016

Language:

english

File:

PDF, 915 KB

english, 2016

89

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Photonic integrated circuits: new challenges for lithography

Behringer, Uwe F.W., Finders, Jo, Bolten, Jens, Wahlbrink, Thorsten, Prinzen, Andreas, Porschatis, Caroline, Lerch, Holger, Giesecke, Anna Lena

Year:

2016

Language:

english

File:

PDF, 638 KB

english, 2016

90

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Improvements in resist performance towards EUV HVM

Panning, Eric M., Goldberg, Kenneth A., Yildirim, Oktay, Buitrago, Elizabeth, Hoefnagels, Rik, Meeuwissen, Marieke, Wuister, Sander, Rispens, Gijsbert, van Oosten, Anton, Derks, Paul, Finders, Jo, Voc

Year:

2017

Language:

english

File:

PDF, 1.80 MB

english, 2017

91

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - A parallel multibeam mask writing method and its impact on data volumes

Behringer, Uwe F.W., Finders, Jo, Chaudhary, N., Luo, Y., Savari, S. A.

Year:

2016

Language:

english

File:

PDF, 321 KB

english, 2016

92

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Towards expanding megasonic cleaning capability

Behringer, Uwe F.W., Finders, Jo, Han, Zhenxing, Ferstl, Berthold, Oetter, Günter, Dietze, Uwe, Samayoa, Martin, Dattilo, Davide

Year:

2016

Language:

english

File:

PDF, 617 KB

english, 2016

93

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Industrial implementation of spatial variability control by real-time SPC

Behringer, Uwe F.W., Finders, Jo, Roule, O., Pasqualini, F., Borde, M.

Year:

2016

Language:

english

File:

PDF, 957 KB

english, 2016

94

SPIE Proceedings [SPIE 32nd European Mask and Lithography Conference - Dresden, Germany (Tuesday 21 June 2016)] 32nd European Mask and Lithography Conference - Translation of lithography variability into after-etch performance: monitoring of golden hotspot

Behringer, Uwe F.W., Finders, Jo, Finders, Jo, Kiers, Ton, Le Gratiet, Bertrand, Lakcher, Amine

Year:

2016

Language:

english

File:

PDF, 1.81 MB

english, 2016

95

Asset poverty among children: A cross-national study of poverty risk

Rothwell, David W., Ottusch, Timothy, Finders, Jennifer K.

Journal:

Children and Youth Services Review

Year:

2019

File:

PDF, 1016 KB

2019

96

Prekindergarten classroom language environments and childrenâs vocabulary skills

Duncan, Robert J., King, Yemimah A., Finders, Jennifer K., Elicker, James, Schmitt, Sara A., Purpura, David J.

Journal:

Journal of Experimental Child Psychology

Year:

2020

Language:

english

File:

PDF, 1.04 MB

english, 2020

97

âA Horrific Impression of Jewish Martyrdomâ: Regarding Extermination of Polish Jews: Album of Pictures

Finder, Gabriel N.

Journal:

The Journal of Holocaust Research

Year:

2020

File:

PDF, 2.39 MB

2020

98

Introduction

Finder, Gabriel N., Skorczewski, Dawn, Stone, Dan

Journal:

The Journal of Holocaust Research

Year:

2020

File:

PDF, 921 KB

2020

99

Multiplexed Analysis of Hg2+ and Ag+ Ions by Nucleic Acid Functionalized CdSe/ZnS Quantum Dots and Their Use for Logic Gate Operations

Ronit Freeman, Tali Finder, Itamar Willner

Journal:

Angewandte Chemie International Edition

Year:

2009

Language:

english

File:

PDF, 625 KB

english, 2009

100

ChemInform Abstract: Sol—Gel Route to Ferroelectric Layer-Structured Perovskite SrBi2Ta2O9 and SrBi2Nb2O9 Thin Films.

K. KATO, C. ZHENG, J. M. FINDER, S. K. DEY, Y. TORII

Journal:

Year:

1998

File:

PDF, 35 KB

1998

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