F. Tonisch: search on Z-Library

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51

Resonant Sensors for Microfluidic Applications

Niebelschütz, Florentina, Tonisch, Katja, Cimalla, Volker, Brückner, Klemens, Stephan, Ralf, Hein, Matthias, Schober, Andreas, Ambacher, Oliver

Journal:

MRS Proceedings

Year:

2006

Language:

english

File:

PDF, 489 KB

english, 2006

52

Property Modification of 3C-SiC MEMS on Ge-Modified Si(100) Substrates

Niebelschütz, Florentina, Zhao, Wei Hong, Brueckner, Klemens, Tonisch, Katja, Linß, Matthias, Hein, Matthias A., Pezoldt, Jörg

Journal:

Materials Science Forum

Year:

2010

Language:

english

File:

PDF, 474 KB

english, 2010

53

Structure and Lattice Location of Ge Implanted 4H-SiC

Kups, Thomas, Tonisch, Katja, Voelskow, M., Skorupa, Wolfgang, Konkin, Alexander, Pezoldt, Joerg

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 581 KB

english, 2009

54

Temperature Facilitated ECR-Etching for Isotropic SiC Structuring

Niebelschütz, Florentina, Stauden, Thomas, Tonisch, Katja, Pezoldt, Jörg

Journal:

Materials Science Forum

Year:

2010

Language:

english

File:

PDF, 1.69 MB

english, 2010

55

Fully Unstrained GaN on Thick AlN Layers for MEMS Application

Tonisch, Katja, Niebelschuetz, Florentina, Cimalla, Volker, Romanus, Henry, Ambacher, Oliver

Journal:

MRS Proceedings

Year:

2006

Language:

english

File:

PDF, 4.15 MB

english, 2006

56

Smooth ceramic titanium nitride contacts on AlGaN/GaN-heterostructures

Maus, C, Stauden, T, Ecke, G, Tonisch, K, Pezoldt, J

Journal:

Semiconductor Science and Technology

Year:

2012

Language:

english

File:

PDF, 1.49 MB

english, 2012

57

AlGaN/GaN Based Heterostructures for MEMS and NEMS Applications

Cimalla, Volker, Röhlig, C. C., Lebedev, V., Ambacher, Oliver, Tonisch, Katja, Niebelschütz, Florentina, Brueckner, Klemens, Hein, Matthias A.

Journal:

Solid State Phenomena

Year:

2010

Language:

english

File:

PDF, 640 KB

english, 2010

58

Comparative Study of 3C-GaN Grown on Semi-Insulating 3C-SiC/Si(100) Substrates

Tschumak, Elena, Tonisch, Katja, Pezoldt, Jörg, As, Donat J.

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 1.63 MB

english, 2009

59

Composition and Interface Chemistry Dependence in Ohmic Contacts to GaN HEMT Structures on the Ti/Al Ratio and Annealing Conditions

Kolaklieva, Lilyana, Kakanakov, Roumen, Stefanov, P., Cimalla, Volker, Maroldt, S., Ambacher, Oliver, Tonisch, Katja, Niebelschütz, Florentina

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 920 KB

english, 2009

60

[IEEE 2014 10th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2014.10.20-2014.10.22)] The Tenth International Conference on Advanced Semiconductor Devices and Microsystems - GaN HEMTs on Si substrate with high cutoff frequency

Jatal, W., Tonisch, K., Baumann, U., Schwierz, F., Pezoldt, J.

Year:

2014

Language:

english

File:

PDF, 109 KB

english, 2014

61

AlGaN Solid Solution Grown on 3C-SiC(111)/Si(111) Pseudosubstrates

Tonisch, Katja, Benzig, Robert, Ecke, Gernot, Pezoldt, Jörg

Journal:

Materials Science Forum

Year:

2013

Language:

english

File:

PDF, 646 KB

english, 2013

62

[IEEE 1997 Particle Accelerator Conference - Vancouver, BC, Canada (12-16 May 1997)] Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167) - First operating experiences of beam position monitors in the TELSA Test Facility Linac

Lorenz, R., Sachwitz, M., Schreiber, H.J., Tonisch, E., Castellano, M., Patteri, P., Tazzioli, E., Catani, L.

Year:

1998

Language:

english

File:

PDF, 362 KB

english, 1998

63

Side gate AlGaN/GaN FET on silicon and sapphire

Hiller, Lars, Tonisch, Katja, Pezoldt, Jörg

Journal:

Physica status solidi

Year:

2014

Language:

english

File:

PDF, 324 KB

english, 2014

64

[IEEE 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC) - Pisa, Italy (2019.9.16-2019.9.19)] 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC) - Investigation of ScAlN for piezoelectric and ferroelectric applications

Petrich, R., Strehle, S., Hoffmann, M., Muller, J., Bartsch, H., Tonisch, K., Jaekel, K., Barth, S., Bartzsch, H., Glos, D., Delan, A., Krischok, S.

Year:

2019

File:

PDF, 182 KB

2019

65

Structural Analysis of Sputtered Sc(x)Al(1-x)N Layers for Sensor Applications

HÃ¤hnlein, Bernd, Hofmann, Tim, Tonisch, Katja, Pezoldt, JÃ¶rg, Kovac, Jaroslav, Krischok, Stefan

Journal:

Key Engineering Materials

Year:

2020

File:

PDF, 989 KB

2020