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1

Study of the Interface between Polyacrylonitrile Thin Films and a Nickel Cathode: Ni 3d States Analysed by EXES

Jonnard, Philippe, Vergand, Fran�oise, Staub, Pierre-Fran�ois, Bonnelle, Christiane, Deniau, Guy, Bureau, Christophe, L�cayon, G�rard

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 603 KB

english, 1996

2

IntriX: a numerical model for electron probe analysis at high depth resolution. Part II—tests and confrontation with experiments

P.-F. Staub, P. Jonnard, F. Vergand, J. Thirion, and C. Bonnelle

Journal:

X-Ray Spectrometry

Year:

1998

Language:

english

File:

PDF, 565 KB

english, 1998

3

Discontinuous transition in Yb and Eu atomic volume as a function of the grain size

C. Bonnelle, F. Vergand

Journal:

Journal of Physics and Chemistry of Solids

Year:

1975

Language:

english

File:

PDF, 305 KB

english, 1975

4

Variation de la distance interatomique du gadolinium et de l'ytterbium en fonction de la taille des cristallites

F. Vergand, C. Bonnelle

Journal:

Solid State Communications

Year:

1972

Language:

french

File:

PDF, 230 KB

french, 1972

5

Discontinuous transition in Yb and Eu atomic volume as a function of the grain size

C. Bonnelle, F. Vergand, Marie Curie

Journal:

Solid State Communications

Year:

1975

File:

PDF, 108 KB

1975

6

Electron distribution of nickel particles encaged in X-zeolite

D. Fargues, F. Vergand, E. Belin, C. Bonnelle, D. Olivier, L. Bonneviot, M. Che

Journal:

Surface Science Letters

Year:

1981

Language:

english

File:

PDF, 90 KB

english, 1981

7

Electron distributions for thin Ni Film−MgF2 interfaces by electron induced X-ray emission

B. Iraqi, F. Vergand, D. Fargues, C. Bonnelle

Journal:

Surface Science Letters

Year:

1985

Language:

english

File:

PDF, 50 KB

english, 1985

8

Nickel 3d electron distribution of small particles embedded in SiO and of bulk nickel-SiO interface

D. Fargues, F. Vergand, C. Bonnelle

Journal:

Surface Science Letters

Year:

1985

Language:

english

File:

PDF, 44 KB

english, 1985

9

Electron distributions at bulk nickel-solid interfaces examined by electron induced X-ray emission spectroscopy

D. Fargues, F. Vergand, C. Bonnelle

Journal:

Surface Science Letters

Year:

1985

Language:

english

File:

PDF, 60 KB

english, 1985

10

Importance of the mixing of valence states on adhesion at solid/solid interfaces

P. Jonnard, F. Vergand, C. Bonnelle

Journal:

International Journal of Adhesion and Adhesives

Year:

1997

Language:

english

File:

PDF, 465 KB

english, 1997

11

Electron distribution of small Ni particles and Ce ions in X and Y zeolites related to their catalytic properties

F. Vergand, H. Roulet, G. Dufour, C. Bonnelle, E. Ramaroson, J. F. Tempere, M. F. Guilleux, D. Delafosse

Journal:

Zeitschrift für Physik D Atoms, Molecules and Clusters

Year:

1989

Language:

english

File:

PDF, 383 KB

english, 1989

12

Experimental study of partial densities of states in MoSi2

C. Sénémaud, F. Vergand, C. Bonnelle, O. Thomas, J.P. Sénateur, R. Madar

Journal:

Solid State Communications

Year:

1987

Language:

english

File:

PDF, 303 KB

english, 1987

13

Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies

T.P. Nguyen, P. Jonnard, F. Vergand, P.F. Staub, J. Thirion, M. Łapkowski, V.H. Tran

Journal:

Synthetic Metals

Year:

1995

Language:

english

File:

PDF, 636 KB

english, 1995

14

Electron distribution of nickel particles encaged in x-zeolite

D. Fargues, F. Vergand, E. Belin, C. Bonnelle, D. Olivier, L. Bonneviot, M. Che

Journal:

Surface Science

Year:

1981

Language:

english

File:

PDF, 203 KB

english, 1981

15

Nickel 3d electron distribution of small particles embedded in SiO and of bulk nickel-SiO interface

D. Fargues, F. Vergand, C. Bonnelle

Journal:

Surface Science

Year:

1985

Language:

english

File:

PDF, 432 KB

english, 1985

16

Electron distributions for thin Ni film-MgF2 interfaces by electron induced X-ray emission

B. Iraqi, F. Vergand, D. Fargues, C. Bonnelle

Journal:

Surface Science

Year:

1985

Language:

english

File:

PDF, 172 KB

english, 1985

17

Electron distributions at bulk nickel-solid interfaces examined by electron induced X-ray emission spectroscopy

D. Fargues, F. Vergand, C. Bonnelle

Journal:

Surface Science

Year:

1985

Language:

english

File:

PDF, 343 KB

english, 1985

18

Spectroscopic characterization and reactivity study of ceria-supported nickel catalysts

Ramaroson, E., Tempere, J. F., Guilleux, M. F., Vergand, F., Roulet, H., Dufour, G.

Journal:

Journal of the Chemical Society Faraday Transactions

Year:

1992

Language:

english

File:

PDF, 1.05 MB

english, 1992

19

[IEEE 1995 Conference on Electrical Insulation and Dielectric Phenomena - Virginia Beach, VA, USA (22-25 Oct. 1995)] Proceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena - Electron distributions of charged dielectrics

Bonnelle, C., Jonnard, P., Vergand, F.

Year:

1995

Language:

english

File:

PDF, 414 KB

english, 1995

20

Instrument for research on interfaces and surfaces

Bonnelle, C., Vergand, F., Jonnard, P., André, J.-M., Staub, P. F., Avila, P., Chargelègue, P., Fontaine, M.-F., Laporte, D., Paquier, P., Ringuenet, A., Rodriguez, B.

Journal:

Review of Scientific Instruments

Year:

1994

Language:

english

File:

PDF, 927 KB

english, 1994

21

Electron distribution in MgO probed by x-ray emission

Jonnard, P., Vergand, F., Bonnelle, C., Orgaz, E., Gupta, M.

Journal:

Physical Review B

Year:

1998

Language:

english

File:

PDF, 146 KB

english, 1998

22

As heterostructures as a function of growth process

Jonnard, P., Vergand, F., Bonnelle, C., Leroux, M., Massies, J.

Journal:

Physical Review B

Year:

1997

Language:

english

File:

PDF, 155 KB

english, 1997

23

Electron trapping in α-alumina observed by electron-induced x-ray emission

Jonnard, P., Vergand, F., Kefi, M., Bonnelle, C.

Journal:

Journal of Applied Physics

Year:

1996

Language:

english

File:

PDF, 347 KB

english, 1996

24

Temperature-dependent sample holder for x-ray spectrometer

Jonnard, P., Chargelègue, P., Hombourger, C., Thirion, J., Vergand, F.

Journal:

Review of Scientific Instruments

Year:

1996

Language:

english

File:

PDF, 348 KB

english, 1996

25

Correlation between electronic and atomic structures in Ag-Ni multilayers

Jonnard, P., Vergand, F., Bonnelle, C., Badawi, K. F.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 475 KB

english, 1995

26

Valence States of MgO, AI2O3 and Metal-Oxide Interfaces

Jonnard, P., Hombourger, C., Vergand, F., Bonnelle, C.

Journal:

Key Engineering Materials

Year:

1997

File:

PDF, 338 KB

1997

27

Radiative Decay of Al 1 s Core Hole in Monocrystalline AlAs

Vergand, F, Jonnard, P, Bonnelle, C

Journal:

EPL (Europhysics Letters)

Year:

1989

Language:

english

File:

PDF, 606 KB

english, 1989

28

Localisation of the electron distribution in small nickel particles embedded in metallic or insulating matrices

Fargues, D, Vergand, F, Bonnelle, C

Journal:

Journal of Physics F Metal Physics

Year:

1984

Language:

english

File:

PDF, 498 KB

english, 1984

29

Comparison of Cu-MgO Interfaces Studied by EXES and XPS

Jonnard, P., Hombourger, C., Vergand, F., Bonnelle, C., Ealet, B., Renou, A., Gillet, E.

Journal:

Surface Review and Letters

Year:

1998

Language:

english

File:

PDF, 307 KB

english, 1998

30

Aluminium valence and core excitonic states in GaAs-Ga0.7Al0.3As systems

F. Vergand, P. Jonnard, M. Kefi, C. Bonnelle, C. Deparis, J. Massies

Year:

1993

Language:

english

File:

PDF, 490 KB

english, 1993

31

Electron energy distributions at AuPd/alumina interfaces

M. Kefi, P. Jonnard, F. Vergand, A. Amamou, C. Bonnelle

Year:

1994

Language:

english

File:

PDF, 470 KB

english, 1994

32

Electronic structure of Ni-Al interfaces

Bonnelle, C, Cyrot-Lackmann, F, Jonnard, P, Julien, J P, Mayou, D, Vergand, F

Journal:

Physica Scripta

Year:

1988

Language:

english

File:

PDF, 327 KB

english, 1988

33

Local electronic distribution on Al sites at GaAs/AlAs interface

P. Jonnard, F. Vergand, C. Bonnelle, C. Deparis, J. Massies

Year:

1991

Language:

english

File:

PDF, 316 KB

english, 1991

34

Atomic structure, size and shape of small nickel particles in thin films

Vergand, F., Fargues, D., Oliver, D., Bonneviot, L., Che, M.

Journal:

Journal of Physical Chemistry

Year:

1983

Language:

english

File:

PDF, 461 KB

english, 1983

35

Influence de la taille des grains sur la distance interatomique des terres rares lourdes

Vergand, Par F.

Journal:

Philosophical Magazine

Year:

1975

File:

PDF, 848 KB

1975

36

ChemInform Abstract: Electron Distribution Change of Small Nickel Particles Encaged in X Zeolite in the Presence of Ce3+ Ions, Related to Their Catalytic Properties.

VERGAND, F., IRAQI, B., BONNELLE, C., RAMAROSON, E., GUILLEUX, M. F., TEMPERE, J. F., DELAFOSSE, D.

Journal:

Year:

1987

File:

PDF, 127 KB

1987

37

Caractérisation électronique d'interfaces profondes Al-InP

Barret, C., Vergand, F., Maaref, H., Sénémaud, C., Bonnelle, C.

Journal:

Revue de Physique Appliquée

Year:

1989

Language:

french

File:

PDF, 1.33 MB

french, 1989

38

ChemInform Abstract: Atomic Structure, Size, and Shape of Small Nickel Particles in Thin Films.

VERGAND, F., FARGUES, D., OLIVIER, D., BONNEVIOT, L., CHE, M.

Journal:

Chemischer Informationsdienst

Year:

1983

File:

PDF, 128 KB

1983

39

[AIP The proceedings of the 53rd international meeting of physical chemistry: Organic coatings - Paris, France (Jan 1995)] AIP Conference Proceedings - Study of the metallized poly(phenylene-vinylene) film interface

Nguyen, T. P., Lapkowski, M., Jonnard, P., Vergand, F., Staub, P.-F., Bonnelle, C., Tran, V. H.

Year:

1996

File:

PDF, 616 KB

1996