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1

Abnormal blue shift of InGaN micro-size light emitting diodes

Bao-Jen Pong, Chi-Hsing Chen, Sheng-Horng Yen, Jin-Fu Hsu, Chun-Ju Tun, Yen-Kuang Kuo, Cheng-Huang Kuo, Gou-Chung Chi

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 1.22 MB

english, 2006

2

Crosslink slot assignment in LEO networks

Jeng-Ji Huang,, Zse-Hong Tsai,, Jin-Fu Chang,, Chun-Ming Huang,

Journal:

IEEE Transactions on Aerospace and Electronic Systems

Year:

1997

Language:

english

File:

PDF, 2.97 MB

english, 1997

3

[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - A Design Methodology for Hybrid Carry-Lookahead/Carry-Select Adders with Reconfigurability

Jin-Fu Li,, Jiunn-Der Yu,, Yu-Jen Huang,

Year:

2005

Language:

english

File:

PDF, 113 KB

english, 2005

4

[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories

Yu-Jen Huang,, Jin-Fu Li,

Year:

2006

Language:

english

File:

PDF, 211 KB

english, 2006

5

Performance of a two-layer LEO satellite communication network

Le-Pond Chin,, Jin-Fu Chang,, Chun-Ming Huang,

Journal:

IEEE Transactions on Aerospace and Electronic Systems

Year:

1997

Language:

english

File:

PDF, 2.94 MB

english, 1997

6

Stabilizing volatile azido in a 3D nitrogen-rich energetic metal–organic framework with excellent energetic performance

Lin, Jian-Di, Li, Yang-Hua, Xu, Jian-Gang, Zheng, Fa-Kun, Guo, Guo-Cong, Lv, Ri-Xin, He, Wen-Cheng, Huang, Ze-Nan, Liu, Jin-Fu

Journal:

Journal of Solid State Chemistry

Year:

2018

Language:

english

File:

PDF, 1.95 MB

english, 2018

7

Chinese guidelines for the diagnosis and treatment of hospital-acquired pneumonia and ventilator-associated pneumonia in adults (2018 Edition)

Shi, Yi, Huang, Yi, Zhang, Tian-Tuo, Cao, Bin, Wang, Hui, Zhuo, Chao, Ye, Feng, Su, Xin, Fan, Hong, Xu, Jin-Fu, Zhang, Jing, Lai, Guo-Xiang, She, Dan-Yang, Zhang, Xiang-Yan, He, Bei, He, Li-Xian, Liu,

Journal:

Journal of Thoracic Disease

Year:

2019

Language:

english

File:

PDF, 606 KB

english, 2019

8

[IEEE 2019 International 3D Systems Integration Conference (3DIC) - Sendai, Japan (2019.10.8-2019.10.10)] 2019 International 3D Systems Integration Conference (3DIC) - A Built-in Self-Test Scheme for TSVs of Logic-DRAM Stacked 3D ICs

Yang, Wei-Hsuan, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien, Huang, Shih-Hsu

Year:

2019

File:

PDF, 2.80 MB

2019

9

Clinical and molecular delineation of 16p13.3 duplication in a patient with congenital heart defect and multiple congenital anomalies

Jin-Lan Chen, Yi-Feng Yang, Can Huang, Jian Wang, Jin-Fu Yang, Zhi-Ping Tan

Journal:

American Journal of Medical Genetics Part A

Year:

2012

Language:

english

File:

PDF, 411 KB

english, 2012

10

A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy

Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 384 KB

english, 2008

11

Fluid flow on centimeter-scale in deep paleosubduction zones in western Tianshan, China: Evidence from high-pressure veins

Jin-fu Zhang, De-zhi Huang, Shi-qi Huang, Guo-ming Li, Jun Gao, Yong-hong Shi

Journal:

Journal of Central South University

Year:

2008

Language:

english

File:

PDF, 1.01 MB

english, 2008

12

Ex vivo expansion and pluripotential differentiation of cryopreserved human bone marrow mesenchymal stem cells

Ying Xiang, Qiang Zheng, Bing-bing Jia, Guo-ping Huang, Yu-lin Xu, Jin-fu Wang, Zhi-jun Pan

Journal:

Journal of Zhejiang University SCIENCE B

Year:

2007

Language:

english

File:

PDF, 503 KB

english, 2007

13

Protective effect of DNA-mediated immunization with liposome-encapsulated GRA4 against infection ofToxoplasma gondii

Rui Chen, Shao-hong Lu, Qun-bo Tong, Di Lou, Dong-yan Shi, Bing-bing Jia, Guo-ping Huang, Jin-fu Wang

Journal:

Journal of Zhejiang University SCIENCE B

Year:

2009

Language:

english

File:

PDF, 272 KB

english, 2009

14

Microduplication of 3p25.2 encompassing RAF1 associated with congenital heart disease suggestive of Noonan syndrome

Cheng Luo, Yi-Feng Yang, Bang-Liang Yin, Jin-Lan Chen, Can Huang, Wei-Zhi Zhang, Jian Wang, Hong Zhang, Jin-Fu Yang, Zhi-Ping Tan

Journal:

American Journal of Medical Genetics Part A

Year:

2012

Language:

english

File:

PDF, 589 KB

english, 2012

15

Built-in redundancy analysis for memory yield improvement

Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu

Journal:

IEEE Transactions on Reliability

Year:

2003

Language:

english

File:

PDF, 619 KB

english, 2003

16

A 10-bit 60-MS/s Low-Power Pipelined ADC With Split-Capacitor CDS Technique

Jin-Fu Lin, Soon-Jyh Chang, Chun-Cheng Liu, Chih-Hao Huang

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2010

Language:

english

File:

PDF, 808 KB

english, 2010

17

A hierarchical test methodology for systems on chip

Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin

Journal:

Year:

2002

Language:

english

File:

PDF, 396 KB

english, 2002

18

Memory Built-in Self Test in Multicore Chips with Mesh-Based Networks

Hsiang-Ning Liu, Yu-Jen Huang, Jin-Fu Li

Journal:

Year:

2009

Language:

english

File:

PDF, 2.75 MB

english, 2009

19

DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs

Tsu-Wei Tseng, Yu-Jen Huang, Jin-Fu Li

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 1.30 MB

english, 2010

20

Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs With Asymmetric Cells

Jin-Fu Li, Yu-Jen Huang, Yong-Jyun Hu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 284 KB

english, 2010

21

Adaptive unsymmetrical dither region to improve dynamic false contour in PDPs

Jin-Fu Huang, Xiao-Ning Zhang, Yao-Gong Wang, Zhen-Tao Tu, Zhi-Hu Liang

Journal:

IEEE Transactions on Consumer Electronics

Year:

2010

Language:

english

File:

PDF, 172 KB

english, 2010

22

Isolation of LiLFY1 and Its Expression in Lily (Lilium longiflorum Thunb.)

Ai-ju WANG, Jin-fu TANG, Xiang-yun ZHAO, Li-huang ZHU

Journal:

Agricultural Sciences in China

Year:

2008

Language:

english

File:

PDF, 849 KB

english, 2008

23

Raisin: Redundancy Analysis Algorithm Simulation

Rei-Fu Huang, Jin-Fu Li, Jen-ChiehYeh, Cheng-Wen Wu

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 783 KB

english, 2007

24

Duplication of 8q12 encompassing CHD7 is associated with a distinct phenotype but without duane anomaly

Luo, Hong, Xie, Li, Wang, Shou-Zheng, Chen, Jin-Lan, Huang, Can, Wang, Jian, Yang, Jin-Fu, Zhang, Wei-Zhi, Yang, Yi-Feng, Tan, Zhi-Ping

Journal:

European Journal of Medical Genetics

Year:

2012

Language:

english

File:

PDF, 550 KB

english, 2012

25

[IEEE The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. - Tainan, Taiwan (Dec. 6-9, 2004)] The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings. - Design of reconfigurable carry select adders

Jin-Fu Li,, Yao-Chang Kuo,, Chao-Da Huang,, Tsu-Wei Tseng,, Chin-Long Wey,

Year:

2004

Language:

english

File:

PDF, 283 KB

english, 2004

26

A Built-In Self-Repair Scheme for 3-D RAMs With Interdie Redundancy

Chou, Che-Wei, Huang, Yu-Jen, Li, Jin-Fu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 6.73 MB

english, 2013

27

Preparation of Cold Brew Tea by Explosion Puffing Drying at Variable Temperature and Pressure

He, Xin-Yi, Liu, Jin-Fu, Huang, Zong-Hai

Journal:

Drying Technology

Year:

2011

Language:

english

File:

PDF, 463 KB

english, 2011

28

[IEEE APCCAS 2012-2012 IEEE Asia Pacific Conference on Circuits and Systems - Kaohsiung, Taiwan (2012.12.2-2012.12.5)] 2012 IEEE Asia Pacific Conference on Circuits and Systems - A 1-V CDS bandgap reference without on-chip resistors

Chen, Peng-Yu, Chang, Soon-Jyh, Huang, Chung-Ming, Lin, Jin-Fu

Year:

2012

Language:

english

File:

PDF, 1.01 MB

english, 2012

29

A 1.1Mb deletion in distal 13q deletion syndrome region with congenital heart defect and postaxial polydactyly: Additional support for a CHD locus at distal 13q34 region

Yang, Yi-Feng, Ai, Qi, Huang, Can, Chen, Jin-Lan, Wang, Jian, Xie, Li, Zhang, Wei-Zhi, Yang, Jin-Fu, Tan, Zhi-Ping

Journal:

Year:

2013

Language:

english

File:

PDF, 790 KB

english, 2013

30

A 60-GHz Power Amplifier Design Using Dual-Radial Symmetric Architecture in 90-nm Low-Power CMOS

Yeh, Jin-Fu, Tsai, Jeng-Han, Huang, Tian-Wei

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2013

Language:

english

File:

PDF, 2.93 MB

english, 2013

31

A Low-Power Ternary Content Addressable Memory With Pai-Sigma Matchlines

Yang, Shun-Hsun, Huang, Yu-Jen, Li, Jin-Fu

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2012

Language:

english

File:

PDF, 955 KB

english, 2012

32

[IEEE 2010 International Symposium on Next-Generation Electronics (ISNE) - Kaohsiung, Taiwan (2010.11.18-2010.11.19)] 2010 International Symposium on Next Generation Electronics - Conditional capacitor averaging technique to reduce nonlinearity induced by capacitor mismatch in 2.5-bit/stage pipelined ADCs

Shau, Tz-Jing, Lin, Jin-Fu, Chang, Soon-Jyh, Huang, Chih-Hao

Year:

2010

Language:

english

File:

PDF, 742 KB

english, 2010

33

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - A built-in self-test scheme for the post-bond test of TSVs in 3D ICs

Huang, Yu-Jen, Li, Jin-Fu, Chen, Ji-Jan, Kwai, Ding-Ming, Chou, Yung-Fa, Wu, Cheng-Wen

Year:

2011

Language:

english

File:

PDF, 1.47 MB

english, 2011

34

[IEEE APCCAS 2012-2012 IEEE Asia Pacific Conference on Circuits and Systems - Kaohsiung, Taiwan (2012.12.2-2012.12.5)] 2012 IEEE Asia Pacific Conference on Circuits and Systems - A pipelined SAR ADC with loading-separating technique in 90-nm CMOS technology

Lin, Sheng-Hsiung, Lin, Jin-Fu, Huang, Guan-Ying, Chang, Soon-Jyh

Year:

2012

Language:

english

File:

PDF, 1.04 MB

english, 2012

35

Built-In Self-Repair Scheme for the TSVs in 3-D ICs

Huang, Yu-Jen, Li, Jin-Fu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 8.52 MB

english, 2012

36

Solidification process and microstructure evolution of bulk undercooled Co–Sn alloys

LIU, Li, MA, Xiao-li, HUANG, Qi-sen, LI, Jin-fu, CHENG, Xian-hua, ZHOU, Yao-he

Journal:

Transactions of Nonferrous Metals Society of China

Year:

2013

Language:

english

File:

PDF, 2.33 MB

english, 2013

37

[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - An Efficient Diagnosis Scheme for Random Access Memories

Jin-Fu Li,, Chao-Da Huang,

Year:

2004

Language:

english

File:

PDF, 164 KB

english, 2004

38

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - A simulator for evaluating redundancy analysis algorithms of repairable embedded memories

Rei-Fu Huang,, Jin-Fu Li,, Jen-Chieh Yeh,, Cheng-Wen Wu,

Year:

2002

Language:

english

File:

PDF, 274 KB

english, 2002

39

[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Post-bond test techniques for TSVs with crosstalk faults in 3D ICs

Yu-Jen Huang,, Jin-Fu Li,, Che-Wei Chou,

Year:

2012

Language:

english

File:

PDF, 762 KB

english, 2012

40

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A low-cost built-in self-test scheme for an array of memories

Huang, Yu-Jen, Chou, Che-Wei, Li, Jin-Fu

Year:

2010

Language:

english

File:

PDF, 372 KB

english, 2010

41

[IEEE 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT) - Hsinchu, Taiwan (2009.08.31-2009.09.2)] 2009 IEEE International Workshop on Memory Technology, Design, and Testing - Variability-Tolerant Binary Content Addressable Memory Cells

Yong, Sheng-Ping, Li, Jin-Fu, Huang, Yu-Jen

Year:

2009

Language:

english

File:

PDF, 222 KB

english, 2009

42

[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy

Huang, Yu-jen, Chang, Da-ming, Li, Jin-fu

Year:

2006

Language:

english

File:

PDF, 134 KB

english, 2006

43

[IEEE 1st International Conference on Information Communications and Signal Processing - Singapore (9-12 Sept. 1997)] Proceedings of ICICS, 1997 International Conference on Information, Communications and Signal Processing. Theme: Trends in Information Systems Engineering and Wireless Multimedia Communications (Cat. No.97TH8237) - The design and performance analysis for the multimedia function unit of the NSC-98 CPU

Jin-Fu Ueng,, I-Chen Wu,, Kuo, Y.-H., Ling-Yuan Kao,, Chao-Lieh Chen,, Yi-Jai Huang,, Sheng-Yuan Lin,, Chien-Hua Hsu,

Year:

1997

Language:

english

File:

PDF, 488 KB

english, 1997

44

[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Design-for-Test Circuit for the Reduced Code Based Linearity Test Method in Pipelined ADCs with Digital Error Correction Technique

Lin, Jin-Fu, Chang, Soon-Jyh, Huang, Chih-Hao

Year:

2009

Language:

english

File:

PDF, 613 KB

english, 2009

45

Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction

Lin, Jin-Fu, Chang, Soon-Jyh, Kung, Te-Chieh, Ting, Hsin-Wen, Huang, Chih-Hao

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2011

Language:

english

File:

PDF, 1.51 MB

english, 2011

46

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells

Hu, Yong-Jyun, Huang, Yu-Jen, Li, Jin-Fu

Year:

2009

Language:

english

File:

PDF, 654 KB

english, 2009

47

[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - A hierarchical test scheme for system-on-chip designs

Jin-Fu Li,, Hsin-Jung Huang,, Jeng-Bin Chen,, Chih-Ping Su,, Cheng-Wen Wu,, Chuang Cheng,, Shao-I Chen,, Chi-Yi Hwang,, Hsiao-Ping Lin,

Year:

2002

Language:

english

File:

PDF, 261 KB

english, 2002

48

[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - A built-in redundancy-analysis scheme for RAMs with 3D redundancy

Chang, Yi-Ju, Huang, Yu-Jen, Li, Jin-Fu

Year:

2011

Language:

english

File:

PDF, 132 KB

english, 2011

49

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - March-based RAM diagnosis algorithms for stuck-at and coupling faults

Jin-Fu Li,, Kuo-Liang Cheng,, Chih-Tsun Huang,, Cheng-Wen Wu,

Year:

2001

Language:

english

File:

PDF, 900 KB

english, 2001

50

[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Area and reliability efficient ECC scheme for 3D RAMs

Li-Jung Chang,, Yu-Jen Huang,, Jin-Fu Li,

Year:

2012

Language:

english

File:

PDF, 348 KB

english, 2012

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