Lee C. Archie: search on Z-Library

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51

Scientific Man: The Humanistic Significance of Science. Introduction to Scientific Humanismby Enrico Cantore

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1979

Language:

english

File:

PDF, 348 KB

english, 1979

52

Science and Skepticismby John Watkins

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1986

Language:

english

File:

PDF, 568 KB

english, 1986

53

The Rhythm of Being: A Study of Temporalityby Howard Trivers

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1987

Language:

english

File:

PDF, 349 KB

english, 1987

54

Pragmatics and Empiricismby Brian Skyrms

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1985

Language:

english

File:

PDF, 349 KB

english, 1985

55

Foundations of Space–Time Theories. Minnesota Studies in Philosophy of Science, 8by John S. Earman; Clark N. Glymour; John J. Stachel

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1978

Language:

english

File:

PDF, 547 KB

english, 1978

56

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Enhanced hole shape of flash devices in ArF lithography by eliptical mask bias technique

Jeon, Young-Doo, Jun, Sungho, Kang, Jae-Hyun, Lee, Sang-Uk, Kim, Jeahee, Kim, Keeho, Archie, Chas N.

Year:

2007

Language:

english

File:

PDF, 553 KB

english, 2007

57

Increased risk of second malignant neoplasms in adolescents and young adults with cancer

Lee, Jean S., DuBois, Steven G., Coccia, Peter F., Bleyer, Archie, Olin, Rebecca L., Goldsby, Robert E.

Journal:

Year:

2016

Language:

english

File:

PDF, 236 KB

english, 2016

58

Cleaning during Initial Stages of Epitaxial Growth in an Ultrahigh Vacuum Rapid Thermal Chemical Vapor Deposition Reactor

Sanganeria, Mahesh K., Violette, Katherine E., ÖZtÜRk, Mehmet C., Harris, Gari, Lee, C. Archie, Maher, Dennis. M.

Journal:

MRS Proceedings

Year:

1993

Language:

english

File:

PDF, 494 KB

english, 1993

59

Nucleation and Growth of Polycrystalline Silicon Films in an Ultra high Vacuum Rapid Thermal Chemical Vapor Deposition Reactor Using Disilane and Hydrogen

Violette, Katherine E., Öztürk, Mehmet C., Harris, Gari, Sanganeria, Mahesh K., Lee, Archie, Maher, Dennis M.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 1.92 MB

english, 1994

60

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Characterizing pattern structures using X-ray reflectivity

Lee, Hae-Jeong, Archie, Chas N., Soles, Christopher L., Ro, Hyun Wook, Kang, Shuhui, Lin, Eric K., Karim, Alamgir, Wu, Wen-li, Hines, D. R.

Year:

2007

Language:

english

File:

PDF, 656 KB

english, 2007

61

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Methodical approach to improve defect detection sensitivity on lithography process using DUV inspection system

Lee, Changgoo, Archie, Chas N., Won, Sera, Seo, Daeyoung, Kim, Hyeonsoo, Kim, Jinwoong, Yeo, Jeong-Ho, Dolev, Ido, Kwak, Chan-Hee

Year:

2007

Language:

english

File:

PDF, 265 KB

english, 2007

62

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Characterizing optical proximity effect difference among exposure tools

Hong, Jongkyun, Archie, Chas N., Lee, Jeonkyu, Kang, Eunsuk, Yang, Hyunjo, Yim, Donggyu, Kim, Jinwoong

Year:

2006

Language:

english

File:

PDF, 271 KB

english, 2006

63

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Improvement of alignment and overlay accuracy on amorphous carbon layers

Hwang, Young-Sun, Archie, Chas N., Kang, Eung-kil, Lee, Ki-lyoung, Ban, Keun-Do, Bok, Cheol-Kyu, Lim, Chang-Moon, Kim, Hyeong-Soo, Moon, Seung-Chan

Year:

2006

Language:

english

File:

PDF, 530 KB

english, 2006

64

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Overlay metrology for dark hard mask process: simulation and experiment study

Shin, Jangho, Archie, Chas N., Chalykh, Roman, Kang, Hyunjae, Kim, SeongSue, Lee, SukJoo, Cho, Han-Ku

Year:

2007

Language:

english

File:

PDF, 652 KB

english, 2007

65

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Inspection sensitivity improvement through optimization of lobe blocking on high-end memory devices

Lee, Changgoo, Archie, Chas N., Won, Sera, Seo, Daeyoung, Kim, Hyeonsoo, Kim, Jinwoong, Yeo, Jeong-Ho, Dolev, Ido, Kwak, Chan-Hee

Year:

2007

Language:

english

File:

PDF, 580 KB

english, 2007

66

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - CD-etch depth measurement from advanced phase-shift masks and wafers using optical scatterometry

Lee, Kyung M., Archie, Chas N., Yedur, Sanjay, Henrichs, Sven, Tavassoli, Malahat

Year:

2006

Language:

english

File:

PDF, 299 KB

english, 2006

67

Broadcast Programming and Management

Dessart, George, Coleman, Howard W., Johnson, Joseph S., Jones, Kenneth K., Clift, Charles, Greer, Archie, Goldsen, Rose K., Logan, Ben, Polk, Lee, LeShan, Lda, Benny, Mary Livingstone, Marks, Hilliar

Journal:

Communication Booknotes

Year:

1978

Language:

english

File:

PDF, 3.15 MB

english, 1978

68

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Macro analysis of line edge and line width roughness

Shin, Jangho, Archie, Chas N., Yoon, Jinyoung, Jung, Youngjae, Lee, SukJoo, Woo, Sang-Gyun, Cho, Han-Ku, Moon, Joo-Tae

Year:

2006

Language:

english

File:

PDF, 372 KB

english, 2006

69

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Tools to measure CD-SEM performance

Kim, Jihoon, Archie, Chas N., Jalhadi, Kiran, Deo, Sachin, Lee, Soo-Young, Joy, David

Year:

2006

Language:

english

File:

PDF, 278 KB

english, 2006

70

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Advances in process overlay: alignment solutions for future technology nodes

Megens, Henry, Archie, Chas N., van Haren, Richard, Musa, Sami, Doytcheva, Maya, Lalbahadoersing, Sanjay, van Kemenade, Marc, Lee, Hyun-Woo, Hinnen, Paul, van Bilsen, Frank

Year:

2007

Language:

english

File:

PDF, 380 KB

english, 2007

71

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Improved scatterometry method of critical dimension measurements and its application for control of development process

Pundaleva, Irina, Archie, Chas N., Nam, Dongseok, Han, Hakseung, Lee, Donggun, Han, Woosung

Year:

2006

Language:

english

File:

PDF, 330 KB

english, 2006

72

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Investigation on polarization monitoring mask: pattern design and experimental verification

Hwang, Chan, Archie, Chas N., Park, Dong-Woon, Shin, Jang-Ho, Nam, Dong-Seok, Lee, Suk-Joo, Woo, Sang-Gyun, Cho, Han-Ku, Moon, Joo-Tae

Year:

2006

Language:

english

File:

PDF, 171 KB

english, 2006

73

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Statistical analysis of CD-SEM measurement and process control in the indistinguishable multi-process patterns

Yang, Duck-Sun, Archie, Chas N., Jung, Myung-Ho, Lee, Young-Mi, Koh, Cha-Won, Yeo, Gi-Sung, Woo, Sang-Gyun, Cho, Han-Ku, Moon, Joo-Tae

Year:

2006

Language:

english

File:

PDF, 349 KB

english, 2006

74

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Scatterometry on pelliclized masks: an option for wafer fabs

Gallagher, Emily, Archie, Chas N., Benson, Craig, Higuchi, Masaru, Okumoto, Yasuhiro, Kwon, Michael, Yedur, Sanjay, Li, Shifang, Lee, Sangbong, Tabet, Milad

Year:

2007

Language:

english

File:

PDF, 179 KB

english, 2007

75

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Detailed analysis of capability and limitations of CD scatterometry measurements for 65- and 45-nm nodes

Pundaleva, Irina, Archie, Chas N., Chalykh, Roman, Lee, JeungWoo, Choi, SeongWoon, Han, Woosung

Year:

2007

Language:

english

File:

PDF, 236 KB

english, 2007

76

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Scatterometry measurement of nested lines, dual space, and rectangular contact CD on phase-shift masks

Lee, Kyung M., Archie, Chas N., Yedur, Sanjay, Henrichs, Sven, Tavassoli, Malahat, Baik, Kiho

Year:

2007

Language:

english

File:

PDF, 257 KB

english, 2007

77

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Study of rigorous effects and polarization on phase shifting masks through simulations and in-die phase measurements

Lee, Kyung M., Archie, Chas N., Tavassoli, Malahat, Lau, Max, Baik, Kiho, Lieberman, Barry, Perlitz, Sascha, Buttgereit, Ute, Scherübl, Thomas

Year:

2007

Language:

english

File:

PDF, 281 KB

english, 2007

78

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Methodology to set-up accurate OPC model using optical CD metrology and atomic force microscopy

Shim, Yeon-Ah, Archie, Chas N., Kang, Jaehyun, Lee, Sang-Uk, Kim, Jeahee, Kim, Keeho

Year:

2007

Language:

english

File:

PDF, 976 KB

english, 2007

79

Review of the systematic status of Sceloporus arenicolus Degenhardt and Jones, 1972 with an estimate of divergence time

CHAN, LAUREN M., ARCHIE, JAMES W., YODER, ANNE D., FITZGERALD, LEE A.

Journal:

Year:

2013

Language:

english

File:

PDF, 767 KB

english, 2013

80

SAE Technical Paper Series [SAE International Noise & Vibration Conference & Exposition - (MAY. 17, 1999)] SAE Technical Paper Series - Integration of SEA Tire Model with Vehicle Model

Lee, James J., Powell, Robert E., Ni, Archie E., Tsou, Poyu

Year:

1999

Language:

english

File:

PDF, 102 KB

english, 1999

81

LAUREN M. CHAN, JAMES W. ARCHIE, ANNE D. YODER & LEE A. FITZGERALD (2013) Review of the systematic status of Sceloporus arenicolus Degenhardt and Jones, 1972 with an estimate of divergence time. Zootaxa, 3664(3), 312–320.

CHAN, LAUREN M., ARCHIE, JAMES W., YODER, ANNE D., FITZGERALD, LEE A.

Journal:

Year:

2013

Language:

english

File:

PDF, 147 KB

english, 2013

82

XBP1-KLF9 Axis Acts as a Molecular Rheostat to Control the Transition from Adaptive to Cytotoxic Unfolded Protein Response

Fink, Emily E., Moparthy, Sudha, Bagati, Archis, Bianchi-Smiraglia, Anna, Lipchick, Brittany C., Wolff, David W., Roll, Matthew V., Wang, Jianmin, Liu, Song, Bakin, Andrei V., Kandel, Eugene S., Lee,

Journal:

Year:

2018

Language:

english

File:

PDF, 2.55 MB

english, 2018

83

Bayesian spatial modelling and the significance of agricultural land use to scrub typhus infection in Taiwan

Wardrop, Nicola A., Kuo, Chi-Chien, Wang, Hsi-Chieh, Clements, Archie C. A., Lee, Pei-Fen, Atkinson, Peter M.

Journal:

Geospatial health

Year:

2013

Language:

english

File:

PDF, 1.54 MB

english, 2013

84

EXPERIENCES WITH THE PHOTOROENTGEN METHOD IN CHEST SURVEYS

Lee, Robert E., Fine, Archie, Steinhausen, Theodore B.

Journal:

Southern Medical Journal

Year:

1944

File:

PDF, 100 KB

1944

85

Who's Who: The Old Testament, Together with the Apocrypha (review)

Lee, Archie C. C.

Journal:

Year:

1996

File:

PDF, 296 KB

1996