13

An analytical expression for predicting wearout lifetime of thin gate and tunneling oxide

Year:
2002
Language:
english
File:
PDF, 237 KB
english, 2002
22

Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides

Year:
2003
Language:
english
File:
PDF, 239 KB
english, 2003
48

Low field stress induced double donor defect in metal oxide silicon structures

Year:
2003
Language:
english
File:
PDF, 227 KB
english, 2003
49

The SILC study by PDO method

Year:
2004
Language:
english
File:
PDF, 286 KB
english, 2004