Volume 157; Issue 4

Applied Surface Science

Volume 157; Issue 4
1

Index

Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 38 KB
english, 2000
2

Index

Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 72 KB
english, 2000
3

Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy

T Arai, M Tomitori
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 172 KB
english, 2000
5

Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM

H Hosoi, K Sueoka, K Hayakawa, K Mukasa
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 335 KB
english, 2000
8

Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy

C.L Pang, H Raza, S.A Haycock, G Thornton
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 454 KB
english, 2000
12

Kelvin probe force microscopy using near-field optical tips

R Shikler, Y Rosenwaks
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 372 KB
english, 2000
16

Study of tip–sample interaction in scanning force microscopy

M Luna, J Colchero, J Gómez-Herrero, A.M Baró
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 227 KB
english, 2000
26

Frequency shift and energy dissipation in non-contact atomic-force microscopy

S.H Ke, T Uda, K Terakura
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 93 KB
english, 2000
34

Quantitative electrostatic force measurement in AFM

Steve Jeffery, Ahmet Oral, John B Pethica
Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 127 KB
english, 2000
37

Editorial

Journal:
Applied Surface Science
Year:
2000
Language:
english
File:
PDF, 11 KB
english, 2000