Volume 9; Issue 11

IEEE Electron Device Letters

Volume 9; Issue 11

1

AlGaAs/InGaAs/GaAs quantum-well power MISFET at millimeter-wave frequencies

Kim, B., Matyi, R.J., Wurtele, M., Tserng, H.Q.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 244 KB

english, 1988

2

Application of ink jet technology on photovoltaic metallization

Teng, K.F., Vest, R.W.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 150 KB

english, 1988

3

Thin-film transistors incorporating a thin, high-quality PECVD SiO/sub 2/ gate dielectric

D. Buchanan, J. Batey, E. Tierney

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 316 KB

english, 1988

4

p/sup +/-AlInAs/InP junction FETs by selective molecular beam epitaxy

J. Woodhouse, J. Donnelly, M. Manfra, R. Bailey

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 300 KB

english, 1988

5

Leakage current degradation in n-MOSFETs due to hot-electron stress

C. Duvvury, D. Redwine, H. Stiegler

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 236 KB

english, 1988

6

Electron space-charge effects on high-frequency performance of AlGaAs/GaAs HBTs under high-current-density operation

K. Morizuka, R. Katoh, K. Tsuda, M. Asaka, N. Iizuka, M. Obara

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 277 KB

english, 1988

7

Direct tungsten on silicon dioxide formed by RF plasma-enhanced chemical vapor deposition

Wong, M., Saraswat, K.C.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 284 KB

english, 1988

8

Failure in CMOS circuits induced by hot carriers in multi-gate transistors

Chatterjee, A., Aur, S.-W., Niuya, T., Yang, P., Seitchik, J.A.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 256 KB

english, 1988

9

AlGaAs/GaAs HBTs fabricated by a self-alignment technology using polyimide for electrode separation

Morizuka, K., Asaka, M., Iizuka, N., Tsuda, K., Obara, M.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 227 KB

english, 1988

10

An investigation of the optoelectronic response of GaAs/InGaAs MSM photodetectors

Schumacher, H., LeBlanc, H.P., Soole, J., Bhat, R.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 292 KB

english, 1988

11

Charge transport and trapping characteristics in thin nitride-oxide stacked films

Young, K.K., Hu, C., Oldham, W.G.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 272 KB

english, 1988

12

Leakage-current-induced hot-carrier degradation of p-channel MOSFETs

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 259 KB

english, 1988

13

High-performance In/sub 0.08/Ga/sub 0.92/As MESFETs on GaAs

Shih, H.-D., Kim, B., Bradshaw, K., Tserng, H.Q.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 249 KB

english, 1988

14

Transit-time reduction in AlGaAs/GaAs HBTs utilizing velocity overshoot in the p-type collector region

Morizuka, K., Katoh, R., Asaka, M., Iizuka, N., Tsuda, K., Obara, M.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 270 KB

english, 1988

15

Dependence of Al-Si/Si contact resistance on substrate surface orientation

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 281 KB

english, 1988

16

Drain-avalanche and hole-trapping induced gate leakage in thin-oxide MOS devices

Chang, C., Haddad, S., Swaminathan, B., Lien, J.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 289 KB

english, 1988

17

Electrical properties of Ga-implanted Si p/sup +/-n shallow junctions fabricated by low-temperature rapid thermal annealing

Lin, C.-M., Steckl, A.J., Chow, T.P.

Journal:

IEEE Electron Device Letters

Year:

1988

Language:

english

File:

PDF, 347 KB

english, 1988

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