Goldberg, Kenneth: search on Z-Library

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51

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - EUV implementation of assist features in contact patterns

Panning, Eric M., Goldberg, Kenneth A., Jiang, Fan, Raghunathan, Ananthan, Burkhardt, Martin, Saulnier, Nicole, Tritchkov, Alexander, Jayaram, Srividya, Word, James

Year:

2016

Language:

english

File:

PDF, 1.17 MB

english, 2016

52

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Performance of new high-power HVM LPP-EUV source

Panning, Eric M., Goldberg, Kenneth A., Mizoguchi, Hakaru, Nakarai, Hiroaki, Abe, Tamotsu, Nowak, Krzysztof M., Kawasuji, Yasufumi, Tanaka, Hiroshi, Watanabe, Yukio, Hori, Tsukasa, Kodama, Takeshi, Sh

Year:

2016

Language:

english

File:

PDF, 1.64 MB

english, 2016

53

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Energy deposition and charging in EUV lithography: Monte Carlo studies

Panning, Eric M., Goldberg, Kenneth A., Wiseheart, Liam, Narasimhan, Amrit, Grzeskowiak, Steven, Neisser, Mark, Ocola, Leonidas E., Denbeaux, Greg, Brainard, Robert L.

Year:

2016

Language:

english

File:

PDF, 806 KB

english, 2016

54

THE MEAN VALUE THEOREM: NOW YOU C IT, NOW YOU DON'T

KENNETH GOLDBERG

Journal:

Mathematics Teacher

Year:

1976

Language:

english

File:

PDF, 519 KB

english, 1976

55

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Ultrathin EUV patterning stack using polymer brush as an adhesion promotion layer

Panning, Eric M., Goldberg, Kenneth A., Seshadri, Indira, De Silva, Anuja, Meli, Luciana, Liu, Chi-Chun, Chi, Cheng, Guo, Jing, Schmidt, Kristin, Truang, Hoa, Arnold, John C., Felix, Nelson, Singh, Lo

Year:

2017

Language:

english

File:

PDF, 4.21 MB

english, 2017

56

Bivariate Extensions of the Boxplot

Kenneth M. Goldberg and Boris Iglewicz

Journal:

Year:

1992

Language:

english

File:

PDF, 1.69 MB

english, 1992

57

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Extreme ultraviolet patterned mask inspection performance of advanced projection electron microscope system for 11nm half-pitch generation

Panning, Eric M., Goldberg, Kenneth A., Hirano, Ryoichi, Iida, Susumu, Amano, Tsuyoshi, Watanabe, Hidehiro, Hatakeyama, Masahiro, Murakami, Takeshi, Suematsu, Kenichi, Terao, Kenji

Year:

2016

Language:

english

File:

PDF, 5.31 MB

english, 2016

58

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Driving down defect density in composite EUV patterning film stacks

Panning, Eric M., Goldberg, Kenneth A., Meli, Luciana, Petrillo, Karen, De Silva, Anuja, Arnold, John, Felix, Nelson, Johnson, Richard, Murray, Cody, Hubbard, Alex, Durrant, Danielle, Hontake, Koichi,

Year:

2017

Language:

english

File:

PDF, 542 KB

english, 2017

59

What You Should Know About Omega-3 Fatty Acids and Prostate Cancer

Stohs, Sidney J., Goldberg, Kenneth

Journal:

Journal of Dietary Supplements

Year:

2014

Language:

english

File:

PDF, 57 KB

english, 2014

60

The early Upper Paleolithic occupations at Üçağızlı Cave (Hatay, Turkey)

Steven L. Kuhn, Mary C. Stiner, Erksin Güleç, Ismail Özer, Hakan Yılmaz, Ismail Baykara, Ayşen Açıkkol, Paul Goldberg, Kenneth Martínez Molina, Engin Ünay, Fadime Suata-Alpaslan

Journal:

Journal of Human Evolution

Year:

2009

Language:

english

File:

PDF, 2.43 MB

english, 2009

61

Dual-Domain Point Diffraction Interferometer

Naulleau, Patrick P., Goldberg, Kenneth A.

Journal:

Year:

1999

Language:

english

File:

PDF, 1.41 MB

english, 1999

62

Prospective evaluation of fexapotide triflutate injection treatment of Grade Group 1 prostate cancer: 4-year results

Shore, Neal, Kaplan, Steven A., Tutrone, Ronald, Levin, Richard, Bailen, James, Hay, Alan, Kalota, Susan, Bidair, Mohamed, Freedman, Sheldon, Goldberg, Kenneth, Snoy, Frederick, Epstein, Jonathan I.

Journal:

World Journal of Urology

Year:

2020

Language:

english

File:

PDF, 654 KB

english, 2020

63

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Free electron lasers for 13nm EUV lithography: RF design strategies to minimise investment and operational costs

Panning, Eric M., Goldberg, Kenneth A., Keens, Simon, Rossa, Bernhard, Frei, Marcel

Year:

2016

Language:

english

File:

PDF, 631 KB

english, 2016

64

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - A bottom-up pattern collapse mitigation strategy for EUV lithography

Panning, Eric M., Goldberg, Kenneth A., Kulmala, Tero S., Vockenhuber, Michaela, Ekinci, Yasin

Year:

2016

Language:

english

File:

PDF, 705 KB

english, 2016

65

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Improved Ru/Si multilayer reflective coatings for advanced extreme-ultraviolet lithography photomasks

Panning, Eric M., Goldberg, Kenneth A., Wood, Obert R., Wong, Keith, Parks, Valentin, Kearney, Patrick A., Meyer-Ilse, Julia, Luong, Vu, Philipsen, Vicky, Faheem, Mohammad, Liang, Yifan, Kumar, Ajay,

Year:

2016

Language:

english

File:

PDF, 4.66 MB

english, 2016

66

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - EUV Lithography: From the Very Beginning to the Eve of Manufacturing

Panning, Eric M., Goldberg, Kenneth A., Yen, Anthony

Year:

2016

Language:

english

File:

PDF, 5.26 MB

english, 2016

67

Altered peptidase and viral-specific T cell response in LMP2 mutant mice

Van Kaert, Luc, Ashton-Rickardt, Philip G., Eichelberger, Maryna, Gaczynska, Maria, Nagashima, Kumiko, Rock, Kenneth L., Goldberg, Alfred L., Doherty, Peter C., Tonegawa, Susumu

Journal:

Year:

1994

Language:

english

File:

PDF, 1.48 MB

english, 1994

68

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Single-expose patterning development for EUV lithography

Panning, Eric M., Goldberg, Kenneth A., De Silva, Anuja, Petrillo, Karen, Meli, Luciana, Shearer, Jeffrey C., Beique, Genevieve, Sun, Lei, Seshadri, Indira, Oh, Taehwan, Han, Seulgi, Saulnier, Nicole,

Year:

2017

Language:

english

File:

PDF, 690 KB

english, 2017

69

Serum Calcitonin Precursors in Sepsis and Systemic Inflammation 1

Whang, Kevin T., Steinwald, Paul M., White, Jon C., Nylen, Eric S., Snider, Richard H., Simon, Gary L., Goldberg, Robin L., Becker, Kenneth L.

Journal:

Journal of Clinical Endocrinology & Metabolism

Year:

1998

Language:

english

File:

PDF, 436 KB

english, 1998

70

Object behavior analysis

Rubin, Kenneth S., Goldberg, Adele

Journal:

Communications of the ACM

Year:

1992

Language:

english

File:

PDF, 1.38 MB

english, 1992

71

Views of Our Readers

James C. Havron, Richard R. Sigmon, Hayward H. Coburn, Clarence Lohman, Frances Thompson, Kenneth R. Cutler, Louis S. Goldberg, Edgar J. Schoen, Chauncey M. Depuy, Louis P. Haller and Richard H. Wade

Journal:

American Bar Association Journal

Year:

1964

Language:

english

File:

PDF, 1.00 MB

english, 1964

72

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - EUV lithography performance for manufacturing: status and outlook

Panning, Eric M., Goldberg, Kenneth A., Pirati, Alberto, Peeters, Rudy, Smith, Daniel, Lok, Sjoerd, van Noordenburg, Martijn, van Es, Roderik, Verhoeven, Eric, Meijer, Henk, Minnaert, Arthur, van der

Year:

2016

Language:

english

File:

PDF, 16.93 MB

english, 2016

73

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - EUV and optical lithographic pattern shift at the 5nm node

Panning, Eric M., Goldberg, Kenneth A., Hosler, Erik R., Thiruvengadam, Sathish, Cantone, Jason R., Civay, Deniz E., Schroeder, Paul

Year:

2016

Language:

english

File:

PDF, 1.45 MB

english, 2016

74

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Extreme Ultraviolet (EUV) Lithography II - An EUV Fresnel zoneplate mask-imaging microscope for lithography generations reaching 8 nm

Goldberg, Kenneth A., La Fontaine, Bruno M., Naulleau, Patrick P., Mochi, Iacopo, Rekawa, Senajith B., Smith, Nathan S., Macdougall, James B., Naulleau, Patrick P.

Year:

2011

Language:

english

File:

PDF, 2.00 MB

english, 2011

75

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Emerging Lithographic Technologies VIII - EUV interferometric testing and alignment of the 0.3-NA MET optic

Goldberg, Kenneth A., Mackay, R. Scott, Naulleau, Patrick, Denham, Paul, Rekawa, Senajith B., Jackson, Keith, Liddle, James A., Anderson, Erik H.

Year:

2004

Language:

english

File:

PDF, 1.17 MB

english, 2004

76

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Sensitivity enhancement of the high-resolution xMT molecular resist for EUV lithography

Panning, Eric M., Goldberg, Kenneth A., Popescu, Carmen, Frommhold, Andreas, McClelland, Alexandra L., Roth, John, Ekinci, Yasin, Robinson, Alex P. G.

Year:

2017

Language:

english

File:

PDF, 1.62 MB

english, 2017

77

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Single-nm resolution approach by applying DDRP and DDRM

Panning, Eric M., Goldberg, Kenneth A., Shibayama, Wataru, Shigaki, Shuhei, Takeda, Satoshi, Nakajima, Makoto, Sakamoto, Rikimaru

Year:

2017

Language:

english

File:

PDF, 4.50 MB

english, 2017

78

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Feasibility of a new absorber material for high NA extreme ultraviolet lithography

Panning, Eric M., Goldberg, Kenneth A., Ko, Ki-Ho, Oh, Hye-Keun

Year:

2016

Language:

english

File:

PDF, 790 KB

english, 2016

79

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Optimization and sensitivity enhancement of high-resolution molecular resist for EUV lithography

Panning, Eric M., Goldberg, Kenneth A., Frommhold, Andreas, McClelland, Alexandra, Roth, John, Fallica, Roberto A., Ekinci, Yasin, Robinson, Alex P. G.

Year:

2016

Language:

english

File:

PDF, 5.50 MB

english, 2016

80

SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Modeling, Simulation, and Control Technologies for Manufacturing - DFX via the Internet

Wagner, Rick, Castanotto, Giuseppe, Goldberg, Kenneth A., Lumia, Ronald

Year:

1995

Language:

english

File:

PDF, 66 KB

english, 1995

81

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Image-based pupil plane characterization for anamorphic lithography systems

Panning, Eric M., Goldberg, Kenneth A., Levinson, Zac, Smith, Bruce W.

Year:

2017

Language:

english

File:

PDF, 1.35 MB

english, 2017

82

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - SAQP and EUV block patterning of BEOL metal layers on IMEC's iN7 platform

Panning, Eric M., Goldberg, Kenneth A., Bekaert, Joost, Di Lorenzo, Paolo, Mao, Ming, Decoster, Stefan, Larivière, Stéphane, Franke, Joern-Holger, Blanco Carballo, Victor M., Kutrzeba Kotowska, Bogumi

Year:

2017

Language:

english

File:

PDF, 2.53 MB

english, 2017

83

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - New methodologies for lower-K1 EUV OPC and RET optimization

Panning, Eric M., Goldberg, Kenneth A., Hooker, Kevin, Kazarian, Aram, Zhou, Xibin, Tuttle, Josh, Xiao, Guangming, Zhang, Yunqiang, Lucas, Kevin

Year:

2017

Language:

english

File:

PDF, 1.65 MB

english, 2017

84

Bacterial biogeography of the human digestive tract

Stearns, Jennifer C., Lynch, Michael D. J., Senadheera, Dilani B., Tenenbaum, Howard C., Goldberg, Michael B., Cvitkovitch, Dennis G., Croitoru, Kenneth, Moreno-Hagelsieb, Gabriel, Neufeld, Josh D.

Journal:

Scientific Reports

Year:

2011

Language:

english

File:

PDF, 2.04 MB

english, 2011

85

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Extreme Ultraviolet (EUV) Lithography VI - Phase measurements of EUV mask defects

Wood, Obert R., Panning, Eric M., Claus, Rene A., Wang, Yow-Gwo, Wojdyla, Antoine, Benk, Markus P., Goldberg, Kenneth A., Neureuther, Andrew R., Naulleau, Patrick P., Waller, Laura

Year:

2015

Language:

english

File:

PDF, 884 KB

english, 2015

86

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - LWR and defectivity improvement on EUV track system

Panning, Eric M., Goldberg, Kenneth A., Harumoto, Masahiko, Stokes, Harold, Thouroude, Yan, Kaneyama, Koji, Pieczulewski, Charles, Asai, Masaya

Year:

2016

Language:

english

File:

PDF, 4.14 MB

english, 2016

87

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Actinic review of EUV masks: performance data and status of the AIMS EUV System

Panning, Eric M., Goldberg, Kenneth A., Hellweg, Dirk, Perlitz, Sascha, Magnusson, Krister, Capelli, Renzo, Koch, Markus, Malloy, Matt

Year:

2016

Language:

english

File:

PDF, 2.31 MB

english, 2016

88

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, CA (Monday 14 September 2009)] Photomask Technology 2009 - Investigation of buried EUV mask defect printability using actinic inspection and fast simulation

Clifford, Chris H., Zurbrick, Larry S., Montgomery, M. Warren, Chan, Tina T., Neureuther, Andrew R., Goldberg, Kenneth A., Mochi, Iacopo, Liang, Ted

Year:

2009

Language:

english

File:

PDF, 729 KB

english, 2009

89

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Arc-shaped slit effect of EUV lithography with anamorphic high-NA system in terms of critical dimension variation

Panning, Eric M., Goldberg, Kenneth A., Kim, In-Seon, Kim, Guk-Jin, Yeung, Michael, Barouch, Eytan, Oh, Hye-Keun

Year:

2017

Language:

english

File:

PDF, 2.28 MB

english, 2017

90

Mycophenolic Acid Pharmacodynamics and Pharmacokinetics Provide a Basis for Rational Monitoring Strategies

Leslie M. Shaw, Magdalena Korecka, Raman Venkataramanan, Lee Goldberg, Roy Bloom, Kenneth L. Brayman

Journal:

American Journal of Transplantation

Year:

2003

Language:

english

File:

PDF, 112 KB

english, 2003

91

Facial Reanimation by Staged, Split Masseter Muscle Transfer

Lesavoy, Malcolm A., Fan, Kenneth L., Goldberg, Andrew G., Dickinson, Brian P., Herrera, Fernando

Journal:

Annals of Plastic Surgery

Year:

2014

Language:

english

File:

PDF, 3.68 MB

english, 2014

92

Trace Metals in Sea Water || The Behavior of Trace Metals in Marine Anoxic Waters: Solubilities at the Oxygen-Hydrogen Sulfide Interface

Wong, C. S., Boyle, Edward, Bruland, Kenneth W., Burton, J. D., Goldberg, Edward D.

Year:

1983

Language:

english

File:

PDF, 2.94 MB

english, 1983

93

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 27 February 2011)] Extreme Ultraviolet (EUV) Lithography II - Replicated mask surface roughness effects on EUV lithographic patterning and line edge roughness

George, Simi A., Naulleau, Patrick P., Gullikson, Eric M., Mochi, Iacopo, Salmassi, Farhad, Goldberg, Kenneth A., Anderson, Erik H., La Fontaine, Bruno M., Naulleau, Patrick P.

Year:

2011

Language:

english

File:

PDF, 376 KB

english, 2011

94

Series B, Managerial || Free for All

Martin Kenneth Starr and Edward D. Goldberg

Journal:

Management Science

Year:

1965

Language:

english

File:

PDF, 259 KB

english, 1965

95

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Irresistible Materials multi-trigger resist: the journey towards high volume manufacturing readiness

Panning, Eric M., Goldberg, Kenneth A., Montgomery, Warren, McClelland, Alexandra L., Ure, David, Roth, John, Robinson, Alex P. G.

Year:

2017

Language:

english

File:

PDF, 961 KB

english, 2017

96

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - High-NA metrology and sensing on Berkeley MET5

Panning, Eric M., Goldberg, Kenneth A., Miyakawa, Ryan, Anderson, Chris, Naulleau, Patrick

Year:

2017

Language:

english

File:

PDF, 1023 KB

english, 2017

97

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Study of Gd/Tb LPP emission near λ = 6.7nm for beyond EUV lithography

Panning, Eric M., Goldberg, Kenneth A., Yin, Liang, Wang, Hanchen, Reagan, Brendan, Baumgarten, Cory, Shlyaptsev, Vyacheslav, Gullikson, Eric, Rocca, Jorge

Year:

2016

File:

PDF, 526 KB

2016

98

SPIE Proceedings [SPIE 26th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 25 February 2001)] Emerging Lithographic Technologies V - Adding static printing capabilities to the EUV phase-shifting point diffraction interferometer

Naulleau, Patrick P., Goldberg, Kenneth A., Anderson, Erik H., Batson, Phillip J., Denham, Paul, Jackson, Keith H., Rekawa, Senajith, Bokor, Jeffrey, Dobisz, Elizabeth A.

Year:

2001

Language:

english

File:

PDF, 460 KB

english, 2001

99

Burial diagenesis of middle Ordovician carbonate buildups (Alabama, USA): documentation of the dominance of shallow burial conditions

Kenneth J. Tobin, Kenneth R. Walker, Steven G. Goldberg

Journal:

Sedimentary Geology

Year:

1997

Language:

english

File:

PDF, 1.05 MB

english, 1997

100

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Energy effective dual-pulse bispectral laser for EUV lithography

Panning, Eric M., Goldberg, Kenneth A., Zhevlakov, A. P., Seisyan, R. P., Bespalov, V. G., Elizarov, V. V., Grishkanich, A. S., Kascheev, S. V., Sidorov, I. S.

Year:

2016

File:

PDF, 612 KB

2016

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