Piero Olivo: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Architectural and Integration Options for 3D NAND Flash Memories

Micheloni, Rino, Crippa, Luca, Zambelli, Cristian, Olivo, Piero

Journal:

Year:

2017

Language:

english

File:

PDF, 5.58 MB

english, 2017

2

Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance

Zambelli, Cristian, Micheloni, Rino, Crippa, Luca, Zuolo, Lorenzo, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2018

Language:

english

File:

PDF, 640 KB

english, 2018

3

Reliability of erasing operation in NOR-Flash memories

Andrea Chimenton, Piero Olivo

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 1.04 MB

english, 2005

4

[IEEE 2017 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2017.5.14-2017.5.17)] 2017 IEEE International Memory Workshop (IMW) - Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization

Zambelli, Cristian, Cancelliere, Giuseppe, Riguzzi, Fabrizio, Lamma, Evelina, Olivo, Piero, Marelli, Alessia, Micheloni, Rino

Year:

2017

Language:

english

File:

PDF, 402 KB

english, 2017

5

Impact of temperature on conduction mechanisms and switching parameters in HfO 2 -based 1T-1R resistive random access memories devices

Pérez, Eduardo, Wenger, Christian, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Roelofs, Robin

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.41 MB

english, 2017

6

Modeling the Endurance Reliability of Intradisk RAID Solutions for Mid-1X TLC NAND Flash Solid-State Drives

Zambelli, Cristian, Marelli, Alessia, Micheloni, Rino, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.84 MB

english, 2017

7

Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification

Zambelli, Cristian, Koebernik, Gert, Ullmann, Rudolf, Bauer, Matthias, Tempel, Georg, Di Tano, Fabrizio, Atti, Massimo, Pistone, Francesco Paolo, Siviero, Andrea, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.80 MB

english, 2014

8

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Miranda, Enrique, Stikanov, Valeriy, Walczyk, Christian, Wenger, Christian

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 1.48 MB

english, 2016

9

Quality-of-Service Implications of Enhanced Program Algorithms for Charge-Trapping NAND in Future Solid-State Drives

Grossi, Alessandro, Zuolo, Lorenzo, Restuccia, Francesco, Zambelli, Cristian, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.62 MB

english, 2015

10

Characterization of the Over-Erase Algorithm in FN/FN Embedded nor Flash Arrays

Zambelli, Cristian, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 709 KB

english, 2015

11

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Automated characterization of TAS-MRAM test arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Pellati, Paolo, Ramponi, Michele, Alvarez-Herault, Jeremy, Mackay, Ken

Year:

2015

Language:

english

File:

PDF, 497 KB

english, 2015

12

[IEEE 2015 15th Non-Volatile Memory Technology Symposium (NVMTS) - Beijing, China (2015.10.12-2015.10.14)] 2015 15th Non-Volatile Memory Technology Symposium (NVMTS) - Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Alvarez-Herault, Jeremy, Mackay, Ken

Year:

2015

Language:

english

File:

PDF, 393 KB

english, 2015

13

Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays

Crupi, Felice, Filice, Francesco, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Perez, Eduardo, Wenger, Christian

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 1.44 MB

english, 2016

14

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Power-supply impact on the reliability of mid-1X TLC NAND flash memories

Zambelli, Cristian, King, Pietro, Olivo, Piero, Crippa, Luca, Micheloni, Rino

Year:

2016

Language:

english

File:

PDF, 506 KB

english, 2016

15

LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Marelli, Alessia, Micheloni, Rino, Olivo, Piero

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2017

Language:

english

File:

PDF, 1.13 MB

english, 2017

16

Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Olivo, Piero

Journal:

Proceedings of the IEEE

Year:

2017

Language:

english

File:

PDF, 3.31 MB

english, 2017

17

Solid-State Drives (SSDs) [Scanning the Issue]

Micheloni, Rino, Olivo, Piero

Journal:

Proceedings of the IEEE

Year:

2017

Language:

english

File:

PDF, 218 KB

english, 2017

18

[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories

Zambelli, Cristian, Crippa, Luca, Micheloni, Rino, Olivo, Piero

Year:

2018

Language:

english

File:

PDF, 319 KB

english, 2018

19

First Evidence of Temporary Read Errors in TLC 3D-NAND Flash Memories Exiting From an Idle State

Zambelli, Cristian, Micheloni, Rino, Scommegna, Salvatrice, Olivo, Piero

Journal:

IEEE Journal of the Electron Devices Society

Year:

2020

File:

PDF, 2.73 MB

2020

20

Characterization of flash structures erased with ultra-short pulses

Massimo Lanzoni, Carlo Riva, Piero Olivo

Journal:

Microelectronics Journal

Year:

1994

Language:

english

File:

PDF, 260 KB

english, 1994

21

Quantum effects in accumulated MOS thin dielectric structures

Piero Olivo, Jordi Suñé

Journal:

Microelectronics Journal

Year:

1994

Language:

english

File:

PDF, 681 KB

english, 1994

22

Threshold voltage spread in flash memories under a constant ΔQ erasing scheme

Andrea Chimenton, Paolo Pellati, Piero Olivo

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 254 KB

english, 2001

23

Dynamic effects in the detection of bridging faults in CMOS ICs

Michele Favalli, Piero Olivo, Bruno Riccò

Journal:

Journal of Electronic Testing

Year:

1992

Language:

english

File:

PDF, 600 KB

english, 1992

24

A Bist Scheme for Non-Volatile Memories

Piero Olivo, Marcello Dalpasso

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 1.16 MB

english, 1998

25

Testing of E2PROM aging and endurance: A case study

Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt

Journal:

Transactions on Emerging Telecommunications Technologies

Year:

1990

Language:

english

File:

PDF, 641 KB

english, 1990

26

Ecotown - Ecoway : Utopia rationalized

Marcello D'Olivo, Piero Mainardis De Campo

Journal:

Science of The Total Environment

Year:

1986

Language:

english

File:

PDF, 163 KB

english, 1986

27

Modeling Erratic Bits Temperature Dependence for Monte Carlo Simulation of Flash Arrays

Zambelli, Cristian, Koebernik, Gert, Ullmann, Rudolf, Bauer, Matthias, Tempel, Georg, Olivo, Piero

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 136 KB

english, 2013

28

[IEEE 2013 International Symposium on System-on-Chip (SoC) - Tampere, Finland (2013.10.23-2013.10.24)] 2013 International Symposium on System on Chip (SoC) - System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems

Zuolo, Lorenzo, Miorandi, Gabriele, Zambelli, Cristian, Olivo, Piero, Bertozzi, Davide

Year:

2013

Language:

english

File:

PDF, 1.23 MB

english, 2013

29

[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Experimental characterization of SET seasoning on Phase Change Memory arrays

Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2010

Language:

english

File:

PDF, 437 KB

english, 2010

30

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Analysis of reliability/performance trade-off in Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Bertozzi, Davide, Olivo, Piero

Year:

2014

Language:

english

File:

PDF, 599 KB

english, 2014

31

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Statistical analysis of resistive switching characteristics in ReRAM test arrays

Zambelli, Cristian, Grossi, Alessandro, Olivo, Piero, Walczyk, Damian, Bertaud, Thomas, Tillack, Bernd, Schroeder, Thomas, Stikanov, Valeriy, Walczyk, Christian

Year:

2014

Language:

english

File:

PDF, 1.31 MB

english, 2014

32

[IEEE 2007 Ph.D Research in Microelectronics and Electronics Conference - (2007.07.2-2007.07.5)] 2007 Ph.D Research in Microelectronics and Electronics Conference - Statistical methodologies for integrated circuits design

Padovani, Andrea, Chimenton, Andrea, Olivo, Piero, Fantini, Paolo, Vendrame, Loris, Mennillo, Serena

Year:

2007

Language:

english

File:

PDF, 166 KB

english, 2007

33

Statistical Investigation of Anomalous Fast Erase Dynamics in Charge Trapping NAND Flash

Zambelli, Cristian, Olivo, Piero

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 693 KB

english, 2013

34

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Analysis of Edge Wordline Disturb in multimegabit charge trapping flash NAND arrays

Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2011

Language:

english

File:

PDF, 193 KB

english, 2011

35

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Reliability and performance characterization of a mems-based non-volatile switch

Gaddi, Roberto, Schepens, Cor, Smith, Charles, Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2011

Language:

english

File:

PDF, 761 KB

english, 2011

36

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Analysis and optimization of erasing waveform in phase change memory arrays

Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2009

Language:

english

File:

PDF, 1.03 MB

english, 2009

37

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Galfano, Salvatore, Indaco, Marco, Carlo, Stefano Di, Prinetto, Paolo, Olivo, Piero, Bertozzi, Davide

Year:

2014

Language:

english

File:

PDF, 790 KB

english, 2014

38

[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Characterization of a MEMS-Based Embedded Non Volatile Memory Array for Extreme Environments

Zambelli, Cristian, Olivo, Piero, Gaddi, Roberto, Schepens, Cor, Smith, Charles

Year:

2011

Language:

english

File:

PDF, 590 KB

english, 2011

39

[IEEE 2014 IEEE 6th International Memory Workshop (IMW) - Taipei, Taiwan (2014.5.18-2014.5.21)] 2014 IEEE 6th International Memory Workshop (IMW) - Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions

Zambelli, Cristian, Grossi, Alessandro, Olivo, Piero, Walczyk, Damian, Dabrowski, Jarek, Tillack, Bernd, Schroeder, Thomas, Kraemer, Rolf, Stikanov, Valeriy, Walczyk, Christian

Year:

2014

Language:

english

File:

PDF, 755 KB

english, 2014

40

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Bit error rate analysis in Charge Trapping memories for SSD applications

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero

Year:

2014

Language:

english

File:

PDF, 1.04 MB

english, 2014

41

FLARES

Carlo, Stefano Di, Galfano, Salvatore, Indaco, Marco, Prinetto, Paolo, Bertozzi, Davide, Olivo, Piero, Zambelli, Cristian

Journal:

ACM Transactions on Architecture and Code Optimization

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

42

[ECS 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) - Barga, Italy (July 28 - August 3, 2007)] ECS Transactions - Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach

Padovani, Andrea, Larcher, Luca, Chimenton, Andrea, Pavan, Paolo, Olivo, Piero

Year:

2007

Language:

english

File:

PDF, 452 KB

english, 2007

43

A Compact Model for Erratic Event Simulation in Flash Memory Arrays

Zambelli, Cristian, Vincenzi, Tommaso, Olivo, Piero

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.92 MB

english, 2014

44

Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers

Bertozzi, Davide, Carlo, Stefano Di, Galfano, Salvatore, Indaco, Marco, Olivo, Piero, Prinetto, Paolo, Zambelli, Cristian

Journal:

ACM Transactions on Embedded Computing Systems

Year:

2015

Language:

english

File:

PDF, 1.51 MB

english, 2015

45

Erratic Bits in Flash Memories under Fowler-Nordheim Programming

Chimenton, Andrea, Pellati, Paolo, Olivo, Piero

Journal:

Japanese Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 653 KB

english, 2003

46

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Miranda, Enrique, Stikanov, Valeriy, Schroeder, Thomas, Walczyk, Christian, Wenger, Christian

Year:

2015

Language:

english

File:

PDF, 291 KB

english, 2015

47

SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Indaco, Marco, Carlo, Stefano Di, Prinetto, Paolo, Bertozzi, Davide, Olivo, Piero

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 1.70 MB

english, 2015

48

Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

Grossi, Alessandro, Walczyk, Damian, Zambelli, Cristian, Miranda, Enrique, Olivo, Piero, Stikanov, Valeriy, Feriani, Alessandro, Sune, Jordi, Schoof, Gunter, Kraemer, Rolf, Tillack, Bernd, Fox, Alexan

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 4.89 MB

english, 2015

49

[IEEE 2015 International Conference on Memristive Systems (MEMRISYS) - Paphos, Cyprus (2015.11.8-2015.11.10)] 2015 International Conference on Memristive Systems (MEMRISYS) - Radiation hard design of HfO2 based 1T1R cells and memory arrays

Grossi, Alessandro, Calligaro, Cristiano, Perez, Eduardo, Schmidt, Jens, Teply, Florian, Mausolf, Thomas, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Year:

2015

Language:

english

File:

PDF, 278 KB

english, 2015

50

Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories

Zambelli, Cristian, Andrian, Fabio, Aritome, Seiichi, Olivo, Piero

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.78 MB

english, 2016